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Electrically-Tunable Stochasticity for Spin-based Neuromorphic Circuits: Self-Adjusting to Variation
Authors:
Hossein Pourmeidani,
Punyashloka Debashis,
Zhihong Chen,
Ronald F. DeMara,
Ramtin Zand
Abstract:
Energy-efficient methods are addressed for leveraging low energy barrier nanomagnetic devices within neuromorphic architectures. Using a Magnetoresistive Random Access Memory (MRAM) probabilistic device (p-bit) as the basis of neuronal structures in Deep Belief Networks (DBNs), the impact of reducing the Magnetic Tunnel Junction's (MTJ's) energy barrier is assessed and optimized for the resulting…
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Energy-efficient methods are addressed for leveraging low energy barrier nanomagnetic devices within neuromorphic architectures. Using a Magnetoresistive Random Access Memory (MRAM) probabilistic device (p-bit) as the basis of neuronal structures in Deep Belief Networks (DBNs), the impact of reducing the Magnetic Tunnel Junction's (MTJ's) energy barrier is assessed and optimized for the resulting stochasticity present in the learning system. This can mitigate the process variation sensitivity of stochastic DBNs which encounter a sharp drop-off when energy barriers exceed near-zero kT. As evaluated for the MNIST dataset for energy barriers at near-zero kT to 2.0 kT in increments of 0.5 kT, it is shown that the stability factor changes by 5 orders of magnitude. The self-compensating circuit developed herein provides a compact, and low complexity approach to mitigating process variation impacts towards practical implementation and fabrication.
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Submitted 2 May, 2020;
originally announced May 2020.
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Modular Simulation Framework for Process Variation Analysis of MRAM-based Deep Belief Networks
Authors:
Paul Wood,
Hossein Pourmeidani,
Ronald F. DeMara
Abstract:
Magnetic Random-Access Memory (MRAM) based p-bit neuromorphic computing devices are garnering increasing interest as a means to compactly and efficiently realize machine learning operations in Restricted Boltzmann Machines (RBMs). When embedded within an RBM resistive crossbar array, the p-bit based neuron realizes a tunable sigmoidal activation function. Since the stochasticity of activation is d…
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Magnetic Random-Access Memory (MRAM) based p-bit neuromorphic computing devices are garnering increasing interest as a means to compactly and efficiently realize machine learning operations in Restricted Boltzmann Machines (RBMs). When embedded within an RBM resistive crossbar array, the p-bit based neuron realizes a tunable sigmoidal activation function. Since the stochasticity of activation is dependent on the energy barrier of the MRAM device, it is essential to assess the impact of process variation on the voltage-dependent behavior of the sigmoid function. Other influential performance factors arise from varying energy barriers on power consumption requiring a simulation environment to facilitate the multi-objective optimization of device and network parameters. Herein, transportable Python scripts are developed to analyze the output variation under changes in device dimensions on the accuracy of machine learning applications. Evaluation with RBM circuits using the MNIST dataset reveal impacts and limits for processing variation of device fabrication in terms of the resulting energy vs. accuracy tradeoffs, and the resulting simulation framework is available via a Creative Commons license.
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Submitted 3 February, 2020;
originally announced February 2020.
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A Range Matching CAM for Hierarchical Defect Tolerance Technique in NRAM Structures
Authors:
Hossein Pourmeidani,
Mehdi Habibi
Abstract:
Due to the small size of nanoscale devices, they are highly prone to process disturbances which results in manufacturing defects. Some of the defects are randomly distributed throughout the nanodevice layer. Other disturbances tend to be local and lead to cluster defects caused by factors such as layer misintegration and line width variations. In this paper, we propose a method for identifying clu…
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Due to the small size of nanoscale devices, they are highly prone to process disturbances which results in manufacturing defects. Some of the defects are randomly distributed throughout the nanodevice layer. Other disturbances tend to be local and lead to cluster defects caused by factors such as layer misintegration and line width variations. In this paper, we propose a method for identifying cluster defects from random ones. The motivation is to repair the cluster defects using rectangular ranges in a range matching content-addressable memory (RM-CAM) and random defects using triple-modular redundancy (TMR). It is believed a combination of these two approaches is more effective for repairing defects at high error rate with less resource. With the proposed fault repairing technique, defect recovery results are examined for different fault distribution scenarios. Also the map** circuit structure required for two conceptual 32*32 and 64*64 bit RAMs are presented and their speed, power and transistor count are reported.
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Submitted 10 July, 2019;
originally announced July 2019.
