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Showing 1–1 of 1 results for author: Pett, T

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  1. MulTi-Wise Sampling: Trading Uniform T-Wise Feature Interaction Coverage for Smaller Samples

    Authors: Tobias Pett, Sebastian Krieter, Thomas Thüm, Ina Schaefer

    Abstract: Ensuring the functional safety of highly configurable systems often requires testing representative subsets of all possible configurations to reduce testing effort and save resources. The ratio of covered t-wise feature interactions (i.e., T-Wise Feature Interaction Coverage) is a common criterion for determining whether a subset of configurations is representative and capable of finding faults. E… ▽ More

    Submitted 28 June, 2024; originally announced June 2024.

    ACM Class: D.2