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Detecting Gas Vapor Leaks Using Uncalibrated Sensors
Authors:
Diaa Badawi,
Tuba Ayhan,
Sule Ozev,
Chengmo Yang,
Alex Orailoglu,
A. Enis Çetin
Abstract:
Chemical and infra-red sensors generate distinct responses under similar conditions because of sensor drift, noise or resolution errors. In this work, we use different time-series data sets obtained by infra-red and E-nose sensors in order to detect Volatile Organic Compounds (VOCs) and Ammonia vapor leaks. We process time-series sensor signals using deep neural networks (DNN). Three neural networ…
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Chemical and infra-red sensors generate distinct responses under similar conditions because of sensor drift, noise or resolution errors. In this work, we use different time-series data sets obtained by infra-red and E-nose sensors in order to detect Volatile Organic Compounds (VOCs) and Ammonia vapor leaks. We process time-series sensor signals using deep neural networks (DNN). Three neural network algorithms are utilized for this purpose. Additive neural networks (termed AddNet) are based on a multiplication-devoid operator and consequently exhibit energy-efficiency compared to regular neural networks. The second algorithm uses generative adversarial neural networks so as to expose the classifying neural network to more realistic data points in order to help the classifier network to deliver improved generalization. Finally, we use conventional convolutional neural networks as a baseline method and compare their performance with the two aforementioned deep neural network algorithms in order to evaluate their effectiveness empirically.
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Submitted 20 August, 2019;
originally announced August 2019.
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An In-Field Programmable Adaptive CMOS LNA for Intelligent IOT Sensor Node Applications
Authors:
Maryam Shafiee,
Sule Ozev
Abstract:
As the Internet of Things (IOT) is growing rapidly, there is an emerging need to facilitate development of IOT devices in the design cycle while optimized performance is obtained in the field of operation. This paper develops reconfiguration approaches that enable post-production adaptation of circuit performance to enable RF IC re-use across different IOT applications. An adaptable low noise ampl…
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As the Internet of Things (IOT) is growing rapidly, there is an emerging need to facilitate development of IOT devices in the design cycle while optimized performance is obtained in the field of operation. This paper develops reconfiguration approaches that enable post-production adaptation of circuit performance to enable RF IC re-use across different IOT applications. An adaptable low noise amplifier is designed and fabricated in 130nm CMOS technology to investigate the post-production reconfiguration concept. A statistical model that relates circuit-level reconfiguration parameters to circuit performances is generated by characterizing a limited number of samples. This model is used to predict the performance parameters of the device in the field. The estimation error for LNA performance parameters are obtained in the simulation environment as well as chip measurements.
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Submitted 29 April, 2019;
originally announced April 2019.
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Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown
Authors:
Jonathan R. Carter,
Sule Ozev,
Daniel J. Sorin
Abstract:
As device sizes shrink and current densities increase, the probability of device failures due to gate oxide breakdown (OBD) also increases. To provide designs that are tolerant to such failures, we must investigate and understand the manifestations of this physical phenomenon at the circuit and system level. In this paper, we develop a model for operational OBD defects, and we explore how to tes…
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As device sizes shrink and current densities increase, the probability of device failures due to gate oxide breakdown (OBD) also increases. To provide designs that are tolerant to such failures, we must investigate and understand the manifestations of this physical phenomenon at the circuit and system level. In this paper, we develop a model for operational OBD defects, and we explore how to test for faults due to OBD. For a NAND gate, we derive the necessary input conditions that excite and detect errors due to OBD defects at the gate level. We show that traditional pattern generators fail to exercise all of these defects. Finally, we show that these test patterns can be propagated and justified for a combinational circuit in a manner similar to traditional ATPG.
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Submitted 25 October, 2007;
originally announced October 2007.
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Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores
Authors:
Anuja Sehgal,
Fang Liu,
Sule Ozev,
Krishnendu Chakrabarty
Abstract:
Many SOCs today contain both digital and analog embedded cores. Even though the test cost for such mixed-signal SOCs is significantly higher than that for digital SOCs, most prior research in this area has focused exclusively on digital cores. We propose a low-cost test development methodology for mixed-signal SOCs that allows the analog and digital cores to be tested in a unified manner, thereb…
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Many SOCs today contain both digital and analog embedded cores. Even though the test cost for such mixed-signal SOCs is significantly higher than that for digital SOCs, most prior research in this area has focused exclusively on digital cores. We propose a low-cost test development methodology for mixed-signal SOCs that allows the analog and digital cores to be tested in a unified manner, thereby minimizing the overall test cost. The analog cores in the SOC are wrapped such that they can be accessed using a digital test access mechanism (TAM). We evaluate the impact of the use of analog test wrappers on area overhead and test time. To reduce area overhead, we present an analog test wrapper optimization technique, which is then combined with TAM optimization in a cost-oriented heuristic approach for test scheduling. We also demonstrate the feasibility of using analog wrappers by presenting transistor-level simulations for an analog wrapper and a representative core. We present experimental results on test scheduling for an ITC'02 benchmark SOC that has been augmented with five analog cores.
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Submitted 25 October, 2007;
originally announced October 2007.
