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Streaming Large-Scale Electron Microscopy Data to a Supercomputing Facility
Authors:
Samuel S. Welborn,
Chris Harris,
Stephanie M. Ribet,
Georgios Varnavides,
Colin Ophus,
Bjoern Enders,
Peter Ercius
Abstract:
Data management is a critical component of modern experimental workflows. As data generation rates increase, transferring data from acquisition servers to processing servers via conventional file-based methods is becoming increasingly impractical. The 4D Camera at the National Center for Electron Microscopy (NCEM) generates data at a nominal rate of 480 Gbit/s (87,000 frames/s) producing a 700 GB…
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Data management is a critical component of modern experimental workflows. As data generation rates increase, transferring data from acquisition servers to processing servers via conventional file-based methods is becoming increasingly impractical. The 4D Camera at the National Center for Electron Microscopy (NCEM) generates data at a nominal rate of 480 Gbit/s (87,000 frames/s) producing a 700 GB dataset in fifteen seconds. To address the challenges associated with storing and processing such quantities of data, we developed a streaming workflow that utilizes a high-speed network to connect the 4D Camera's data acquisition (DAQ) system to supercomputing nodes at the National Energy Research Scientific Computing Center (NERSC), bypassing intermediate file storage entirely. In this work, we demonstrate the effectiveness of our streaming pipeline in a production setting through an hour-long experiment that generated over 10 TB of raw data, yielding high-quality datasets suitable for advanced analyses. Additionally, we compare the efficacy of this streaming workflow against the conventional file-transfer workflow by conducting a post-mortem analysis on historical data from experiments performed by real users. Our findings show that the streaming workflow significantly improves data turnaround time, enables real-time decision-making, and minimizes the potential for human error by eliminating manual user interactions.
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Submitted 3 July, 2024;
originally announced July 2024.
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Disentangling multiple scattering with deep learning: application to strain map** from electron diffraction patterns
Authors:
Joydeep Munshi,
Alexander Rakowski,
Benjamin H Savitzky,
Steven E Zeltmann,
Jim Ciston,
Matthew Henderson,
Shreyas Cholia,
Andrew M Minor,
Maria KY Chan,
Colin Ophus
Abstract:
Implementation of a fast, robust, and fully-automated pipeline for crystal structure determination and underlying strain map** for crystalline materials is important for many technological applications. Scanning electron nanodiffraction offers a procedure for identifying and collecting strain maps with good accuracy and high spatial resolutions. However, the application of this technique is limi…
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Implementation of a fast, robust, and fully-automated pipeline for crystal structure determination and underlying strain map** for crystalline materials is important for many technological applications. Scanning electron nanodiffraction offers a procedure for identifying and collecting strain maps with good accuracy and high spatial resolutions. However, the application of this technique is limited, particularly in thick samples where the electron beam can undergo multiple scattering, which introduces signal nonlinearities. Deep learning methods have the potential to invert these complex signals, but previous implementations are often trained only on specific crystal systems or a small subset of the crystal structure and microscope parameter phase space. In this study, we implement a Fourier space, complex-valued deep neural network called FCU-Net, to invert highly nonlinear electron diffraction patterns into the corresponding quantitative structure factor images. We trained the FCU-Net using over 200,000 unique simulated dynamical diffraction patterns which include many different combinations of crystal structures, orientations, thicknesses, microscope parameters, and common experimental artifacts. We evaluated the trained FCU-Net model against simulated and experimental 4D-STEM diffraction datasets, where it substantially out-performs conventional analysis methods. Our simulated diffraction pattern library, implementation of FCU-Net, and trained model weights are freely available in open source repositories, and can be adapted to many different diffraction measurement problems.
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Submitted 31 January, 2022;
originally announced February 2022.
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Deep Learning Segmentation of Complex Features in Atomic-Resolution Phase Contrast Transmission Electron Microscopy Images
Authors:
Robbie Sadre,
Colin Ophus,
Anstasiia Butko,
Gunther H Weber
Abstract:
Phase contrast transmission electron microscopy (TEM) is a powerful tool for imaging the local atomic structure of materials. TEM has been used heavily in studies of defect structures of 2D materials such as monolayer graphene due to its high dose efficiency. However, phase contrast imaging can produce complex nonlinear contrast, even for weakly-scattering samples. It is therefore difficult to dev…
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Phase contrast transmission electron microscopy (TEM) is a powerful tool for imaging the local atomic structure of materials. TEM has been used heavily in studies of defect structures of 2D materials such as monolayer graphene due to its high dose efficiency. However, phase contrast imaging can produce complex nonlinear contrast, even for weakly-scattering samples. It is therefore difficult to develop fully-automated analysis routines for phase contrast TEM studies using conventional image processing tools. For automated analysis of large sample regions of graphene, one of the key problems is segmentation between the structure of interest and unwanted structures such as surface contaminant layers. In this study, we compare the performance of a conventional Bragg filtering method to a deep learning routine based on the U-Net architecture. We show that the deep learning method is more general, simpler to apply in practice, and produces more accurate and robust results than the conventional algorithm. We provide easily-adaptable source code for all results in this paper, and discuss potential applications for deep learning in fully-automated TEM image analysis.
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Submitted 9 December, 2020;
originally announced December 2020.
