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Testable Array Multipliers for a Better Utilization of C-Testability and Bijectivity
Authors:
Fatemeh Sheikh Shoaei,
Alireza Nahvy,
Zainalabedin Navabi
Abstract:
This paper presents a design for test (DFT)architecture for fast and scalable testing of array multipliers (MULTs). Regardless of the MULT size, our proposed testable architecture, without major changes in the original architecture, requires only five test vectors. Test pattern generation (TPG) is done by combining C-testability, bijectivity and deterministic TPG methods. Experimental results show…
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This paper presents a design for test (DFT)architecture for fast and scalable testing of array multipliers (MULTs). Regardless of the MULT size, our proposed testable architecture, without major changes in the original architecture, requires only five test vectors. Test pattern generation (TPG) is done by combining C-testability, bijectivity and deterministic TPG methods. Experimental results show 100% fault coverage for single stuck-at faults. The proposed method requires minor testability hardware insertion into the multiplier with extra delay and area overhead of less than 0.5% for a 64-bit multiplier.
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Submitted 28 January, 2022;
originally announced January 2022.
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An Improved Scheme for Pre-computed Patterns in Core-based SoC Architecture
Authors:
Elaheh Sadredini,
Reza Rahimi,
Paniz Foroutan,
Mahmood Fathy,
Zainalabedin Navabi
Abstract:
By advances in technology, integrated circuits have come to include more functionality and more complexity in a single chip. Although methods of testing have improved, but the increase in complexity of circuits, keeps testing a challenging problem. Two important challenges in testing of digital circuits are test time and accessing the circuit under test (CUT) for testing. These challenges become e…
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By advances in technology, integrated circuits have come to include more functionality and more complexity in a single chip. Although methods of testing have improved, but the increase in complexity of circuits, keeps testing a challenging problem. Two important challenges in testing of digital circuits are test time and accessing the circuit under test (CUT) for testing. These challenges become even more important in complex system on chip (SoC) zone. This paper presents an improved scheme for generating precomputed test patterns in core based systems on chip. This approach reduces the number of pre computed test patterns and as the result, test application time (TAT) will be decreased. Experimental results on ISCAS89 benchmark circuits show improvement in the number of test clock cycles.
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Submitted 21 November, 2017;
originally announced November 2017.
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Test Generation and Scheduling for a Hybrid BIST Considering Test Time and Power Constraint
Authors:
Elaheh Sadredini,
Mohammad Hashem Haghbayan,
Mahmood Fathy,
Zainalabedin Navabi
Abstract:
This paper presents a novel approach for test generation and test scheduling for multi-clock domain SoCs. A concurrent hybrid BIST architecture is proposed for testing cores. Furthermore, a heuristic for selecting cores to be tested concurrently and order of applying test patterns is proposed. Experimental results show that the proposed heuristics give us an optimized method for multi clock domain…
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This paper presents a novel approach for test generation and test scheduling for multi-clock domain SoCs. A concurrent hybrid BIST architecture is proposed for testing cores. Furthermore, a heuristic for selecting cores to be tested concurrently and order of applying test patterns is proposed. Experimental results show that the proposed heuristics give us an optimized method for multi clock domain SoC testing in comparison with the previous works.
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Submitted 16 January, 2018; v1 submitted 21 November, 2017;
originally announced November 2017.
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BILBO-friendly Hybrid BIST Architecture with Asymmetric Polynomial Reseeding
Authors:
Elaheh Sadredini,
Mohammadreza Najafi,
Mahmood Fathy,
Zaialabedin Navabi
Abstract:
By advances in technology, integrated circuits have come to include more functionality and more complexity in a single chip. Although methods of testing have improved, but the increase in complexity of circuits, keeps testing a challenging problem. Two important challenges in testing of digital circuits are test time and accessing the circuit under test (CUT) for testing. These challenges become e…
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By advances in technology, integrated circuits have come to include more functionality and more complexity in a single chip. Although methods of testing have improved, but the increase in complexity of circuits, keeps testing a challenging problem. Two important challenges in testing of digital circuits are test time and accessing the circuit under test (CUT) for testing. These challenges become even more important in complex system on chip (SoC) zone. This paper presents a multistage test strategy to be implemented on a BIST architecture for reducing test time of a simple core as solution for more global application of SoC testing strategy. This strategy implements its test pattern generation and output response analyzer in a BILBO architecture. The proposed method benefits from an irregular polynomial BILBO (IP-BILBO) structure to improve its test results. Experimental results on ISCAS-89 benchmark circuits show an average of 35% improvement in test time in proportion to pervious work.
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Submitted 21 November, 2017;
originally announced November 2017.
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Simultaneous Reduction of Dynamic and Static Power in Scan Structures
Authors:
Shervin Sharifi,
Javid Jaffari,
Mohammad Hosseinabady,
Ali Afzali-Kusha,
Zainalabedin Navabi
Abstract:
Power dissipation during test is a major challenge in testing integrated circuits. Dynamic power has been the dominant part of power dissipation in CMOS circuits, however, in future technologies the static portion of power dissipation will outreach the dynamic portion. This paper proposes an efficient technique to reduce both dynamic and static power dissipation in scan structures. Scan cell out…
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Power dissipation during test is a major challenge in testing integrated circuits. Dynamic power has been the dominant part of power dissipation in CMOS circuits, however, in future technologies the static portion of power dissipation will outreach the dynamic portion. This paper proposes an efficient technique to reduce both dynamic and static power dissipation in scan structures. Scan cell outputs which are not on the critical path(s) are multiplexed to fixed values during scan mode. These constant values and primary inputs are selected such that the transitions occurred on non-multiplexed scan cells are suppressed and the leakage current during scan mode is decreased. A method for finding these vectors is also proposed. Effectiveness of this technique is proved by experiments performed on ISCAS89 benchmark circuits.
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Submitted 25 October, 2007;
originally announced October 2007.
