Taking a PEEK into YOLOv5 for Satellite Component Recognition via Entropy-based Visual Explanations
Authors:
Mackenzie J. Meni,
Trupti Mahendrakar,
Olivia D. M. Raney,
Ryan T. White,
Michael L. Mayo,
Kevin Pilkiewicz
Abstract:
The escalating risk of collisions and the accumulation of space debris in Low Earth Orbit (LEO) has reached critical concern due to the ever increasing number of spacecraft. Addressing this crisis, especially in dealing with non-cooperative and unidentified space debris, is of paramount importance. This paper contributes to efforts in enabling autonomous swarms of small chaser satellites for targe…
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The escalating risk of collisions and the accumulation of space debris in Low Earth Orbit (LEO) has reached critical concern due to the ever increasing number of spacecraft. Addressing this crisis, especially in dealing with non-cooperative and unidentified space debris, is of paramount importance. This paper contributes to efforts in enabling autonomous swarms of small chaser satellites for target geometry determination and safe flight trajectory planning for proximity operations in LEO. Our research explores on-orbit use of the You Only Look Once v5 (YOLOv5) object detection model trained to detect satellite components. While this model has shown promise, its inherent lack of interpretability hinders human understanding, a critical aspect of validating algorithms for use in safety-critical missions. To analyze the decision processes, we introduce Probabilistic Explanations for Entropic Knowledge extraction (PEEK), a method that utilizes information theoretic analysis of the latent representations within the hidden layers of the model. Through both synthetic in hardware-in-the-loop experiments, PEEK illuminates the decision-making processes of the model, hel** identify its strengths, limitations and biases.
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Submitted 25 November, 2023; v1 submitted 3 November, 2023;
originally announced November 2023.
Entropy-based Guidance of Deep Neural Networks for Accelerated Convergence and Improved Performance
Authors:
Mackenzie J. Meni,
Ryan T. White,
Michael Mayo,
Kevin Pilkiewicz
Abstract:
Neural networks have dramatically increased our capacity to learn from large, high-dimensional datasets across innumerable disciplines. However, their decisions are not easily interpretable, their computational costs are high, and building and training them are not straightforward processes. To add structure to these efforts, we derive new mathematical results to efficiently measure the changes in…
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Neural networks have dramatically increased our capacity to learn from large, high-dimensional datasets across innumerable disciplines. However, their decisions are not easily interpretable, their computational costs are high, and building and training them are not straightforward processes. To add structure to these efforts, we derive new mathematical results to efficiently measure the changes in entropy as fully-connected and convolutional neural networks process data. By measuring the change in entropy as networks process data effectively, patterns critical to a well-performing network can be visualized and identified. Entropy-based loss terms are developed to improve dense and convolutional model accuracy and efficiency by promoting the ideal entropy patterns. Experiments in image compression, image classification, and image segmentation on benchmark datasets demonstrate these losses guide neural networks to learn rich latent data representations in fewer dimensions, converge in fewer training epochs, and achieve higher accuracy.
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Submitted 3 July, 2024; v1 submitted 28 August, 2023;
originally announced August 2023.
