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SMC Is All You Need: Parallel Strong Scaling
Authors:
Xinzhu Liang,
Joseph M. Lukens,
Sanjaya Lohani,
Brian T. Kirby,
Thomas A. Searles,
Kody J. H. Law
Abstract:
The Bayesian posterior distribution can only be evaluated up-to a constant of proportionality, which makes simulation and consistent estimation challenging. Classical consistent Bayesian methods such as sequential Monte Carlo (SMC) and Markov chain Monte Carlo (MCMC) have unbounded time complexity requirements. We develop a fully parallel sequential Monte Carlo (pSMC) method which provably deliver…
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The Bayesian posterior distribution can only be evaluated up-to a constant of proportionality, which makes simulation and consistent estimation challenging. Classical consistent Bayesian methods such as sequential Monte Carlo (SMC) and Markov chain Monte Carlo (MCMC) have unbounded time complexity requirements. We develop a fully parallel sequential Monte Carlo (pSMC) method which provably delivers parallel strong scaling, i.e. the time complexity (and per-node memory) remains bounded if the number of asynchronous processes is allowed to grow. More precisely, the pSMC has a theoretical convergence rate of Mean Square Error (MSE)$ = O(1/NP)$, where $N$ denotes the number of communicating samples in each processor and $P$ denotes the number of processors. In particular, for suitably-large problem-dependent $N$, as $P \rightarrow \infty$ the method converges to infinitesimal accuracy MSE$=O(\varepsilon^2)$ with a fixed finite time-complexity Cost$=O(1)$ and with no efficiency leakage, i.e. computational complexity Cost$=O(\varepsilon^{-2})$. A number of Bayesian inference problems are taken into consideration to compare the pSMC and MCMC methods.
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Submitted 2 June, 2024; v1 submitted 8 February, 2024;
originally announced February 2024.
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Accelerating Look-ahead in Bayesian Optimization: Multilevel Monte Carlo is All you Need
Authors:
Shangda Yang,
Vitaly Zankin,
Maximilian Balandat,
Stefan Scherer,
Kevin Carlberg,
Neil Walton,
Kody J. H. Law
Abstract:
We leverage multilevel Monte Carlo (MLMC) to improve the performance of multi-step look-ahead Bayesian optimization (BO) methods that involve nested expectations and maximizations. Often these expectations must be computed by Monte Carlo (MC). The complexity rate of naive MC degrades for nested operations, whereas MLMC is capable of achieving the canonical MC convergence rate for this type of prob…
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We leverage multilevel Monte Carlo (MLMC) to improve the performance of multi-step look-ahead Bayesian optimization (BO) methods that involve nested expectations and maximizations. Often these expectations must be computed by Monte Carlo (MC). The complexity rate of naive MC degrades for nested operations, whereas MLMC is capable of achieving the canonical MC convergence rate for this type of problem, independently of dimension and without any smoothness assumptions. Our theoretical study focuses on the approximation improvements for twoand three-step look-ahead acquisition functions, but, as we discuss, the approach is generalizable in various ways, including beyond the context of BO. Our findings are verified numerically and the benefits of MLMC for BO are illustrated on several benchmark examples. Code is available at https://github.com/Shangda-Yang/MLMCBO .
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Submitted 25 June, 2024; v1 submitted 3 February, 2024;
originally announced February 2024.
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Digital Fingerprinting of Microstructures
Authors:
Michael D. White,
Alexander Tarakanov,
Christopher P. Race,
Philip J. Withers,
Kody J. H. Law
Abstract:
Finding efficient means of fingerprinting microstructural information is a critical step towards harnessing data-centric machine learning approaches. A statistical framework is systematically developed for compressed characterisation of a population of images, which includes some classical computer vision methods as special cases. The focus is on materials microstructure. The ultimate purpose is t…
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Finding efficient means of fingerprinting microstructural information is a critical step towards harnessing data-centric machine learning approaches. A statistical framework is systematically developed for compressed characterisation of a population of images, which includes some classical computer vision methods as special cases. The focus is on materials microstructure. The ultimate purpose is to rapidly fingerprint sample images in the context of various high-throughput design/make/test scenarios. This includes, but is not limited to, quantification of the disparity between microstructures for quality control, classifying microstructures, predicting materials properties from image data and identifying potential processing routes to engineer new materials with specific properties. Here, we consider microstructure classification and utilise the resulting features over a range of related machine learning tasks, namely supervised, semi-supervised, and unsupervised learning.
The approach is applied to two distinct datasets to illustrate various aspects and some recommendations are made based on the findings. In particular, methods that leverage transfer learning with convolutional neural networks (CNNs), pretrained on the ImageNet dataset, are generally shown to outperform other methods. Additionally, dimensionality reduction of these CNN-based fingerprints is shown to have negligible impact on classification accuracy for the supervised learning approaches considered. In situations where there is a large dataset with only a handful of images labelled, graph-based label propagation to unlabelled data is shown to be favourable over discarding unlabelled data and performing supervised learning. In particular, label propagation by Poisson learning is shown to be highly effective at low label rates.
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Submitted 22 January, 2024; v1 submitted 25 March, 2022;
originally announced March 2022.
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Materials Fingerprinting Classification
Authors:
Adam Spannaus,
Kody J. H. Law,
Piotr Luszczek,
Farzana Nasrin,
Cassie Putman Micucci,
Peter K. Liaw,
Louis J. Santodonato,
David J. Keffer,
Vasileios Maroulas
Abstract:
Significant progress in many classes of materials could be made with the availability of experimentally-derived large datasets composed of atomic identities and three-dimensional coordinates. Methods for visualizing the local atomic structure, such as atom probe tomography (APT), which routinely generate datasets comprised of millions of atoms, are an important step in realizing this goal. However…
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Significant progress in many classes of materials could be made with the availability of experimentally-derived large datasets composed of atomic identities and three-dimensional coordinates. Methods for visualizing the local atomic structure, such as atom probe tomography (APT), which routinely generate datasets comprised of millions of atoms, are an important step in realizing this goal. However, state-of-the-art APT instruments generate noisy and sparse datasets that provide information about elemental type, but obscure atomic structures, thus limiting their subsequent value for materials discovery. The application of a materials fingerprinting process, a machine learning algorithm coupled with topological data analysis, provides an avenue by which here-to-fore unprecedented structural information can be extracted from an APT dataset. As a proof of concept, the material fingerprint is applied to high-entropy alloy APT datasets containing body-centered cubic (BCC) and face-centered cubic (FCC) crystal structures. A local atomic configuration centered on an arbitrary atom is assigned a topological descriptor, with which it can be characterized as a BCC or FCC lattice with near perfect accuracy, despite the inherent noise in the dataset. This successful identification of a fingerprint is a crucial first step in the development of algorithms which can extract more nuanced information, such as chemical ordering, from existing datasets of complex materials.
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Submitted 14 January, 2021;
originally announced January 2021.
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Cluster, Classify, Regress: A General Method For Learning Discountinous Functions
Authors:
David E. Bernholdt,
Mark R. Cianciosa,
Clement Etienam,
David L. Green,
Kody J. H. Law,
J. M. Park
Abstract:
This paper presents a method for solving the supervised learning problem in which the output is highly nonlinear and discontinuous. It is proposed to solve this problem in three stages: (i) cluster the pairs of input-output data points, resulting in a label for each point; (ii) classify the data, where the corresponding label is the output; and finally (iii) perform one separate regression for eac…
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This paper presents a method for solving the supervised learning problem in which the output is highly nonlinear and discontinuous. It is proposed to solve this problem in three stages: (i) cluster the pairs of input-output data points, resulting in a label for each point; (ii) classify the data, where the corresponding label is the output; and finally (iii) perform one separate regression for each class, where the training data corresponds to the subset of the original input-output pairs which have that label according to the classifier. It has not yet been proposed to combine these 3 fundamental building blocks of machine learning in this simple and powerful fashion. This can be viewed as a form of deep learning, where any of the intermediate layers can itself be deep. The utility and robustness of the methodology is illustrated on some toy problems, including one example problem arising from simulation of plasma fusion in a tokamak.
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Submitted 16 May, 2019; v1 submitted 15 May, 2019;
originally announced May 2019.
