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Showing 1–2 of 2 results for author: Krieter, S

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  1. MulTi-Wise Sampling: Trading Uniform T-Wise Feature Interaction Coverage for Smaller Samples

    Authors: Tobias Pett, Sebastian Krieter, Thomas Thüm, Ina Schaefer

    Abstract: Ensuring the functional safety of highly configurable systems often requires testing representative subsets of all possible configurations to reduce testing effort and save resources. The ratio of covered t-wise feature interactions (i.e., T-Wise Feature Interaction Coverage) is a common criterion for determining whether a subset of configurations is representative and capable of finding faults. E… ▽ More

    Submitted 28 June, 2024; originally announced June 2024.

    ACM Class: D.2

  2. arXiv:2205.15180  [pdf, other

    cs.SE

    T-Wise Presence Condition Coverage and Sampling for Configurable Systems

    Authors: Sebastian Krieter, Thomas Thüm, Sandro Schulze, Sebastian Ruland, Malte Lochau, Gunter Saake, Thomas Leich

    Abstract: Sampling techniques, such as t-wise interaction sampling are used to enable efficient testing for configurable systems. This is achieved by generating a small yet representative sample of configurations for a system, which circumvents testing the entire solution space. However, by design, most recent approaches for t-wise interaction sampling only consider combinations of configuration options fro… ▽ More

    Submitted 30 May, 2022; originally announced May 2022.

    Comments: 28 pages