Showing 1–2 of 2 results for author: Khaw, J
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Advanced In-Design Auto-Fixing Flow for Cell Abutment Pattern Matching Weakpoints
Authors:
Yongfu Li,
Valerio Perez,
I-Lun Tseng,
Zhao Chuan Lee,
Vikas Tripathi,
Jason Khaw,
Yoong Seang Jonathan Ong
Abstract:
Pattern matching design verification has gained noticeable attention in semiconductor technologies as it can precisely identify more localized problematic areas (weakpoints) in the layout. To address these weakpoints, engineers adopt 'Rip-up and Reroute' methodology to reroute the nets and avoid these weakpoints. However, the technique is unable to address weakpoints due to the cell placement. The…
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Pattern matching design verification has gained noticeable attention in semiconductor technologies as it can precisely identify more localized problematic areas (weakpoints) in the layout. To address these weakpoints, engineers adopt 'Rip-up and Reroute' methodology to reroute the nets and avoid these weakpoints. However, the technique is unable to address weakpoints due to the cell placement. The only present approach is to manually shift or flip the standard cells to eradicate the weakpoint. To overcome the challenge in going from a manual and laborious process to a fully automated fixing, we have proposed an in-design auto-fixing feature, tested with the commercial design tool, Synopsys IC Compiler. Our experimental result has demonstrated close to one hundred percent lithography weakpoints fixing on all of our 14nm designs.
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Submitted 25 May, 2018;
originally announced May 2018.
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In Design DFM Rule Scoring and Fixing Method using ICV
Authors:
Vikas Tripathi,
Yongfu Li,
Zhao Chuan Lee,
I-Lun Tseng,
Jason Khaw,
Jonathan Ong
Abstract:
As compared to DRC rules, DFM rules are a list of selected recommended rules which aim to improve the design margins for better manufacturability. In GLOBALFOUNDRIES, we use DFM scoring methodology as an effective technique to analyze design quality in terms of manufacturability. Physical design engineers can perform our Manufacturability Check Deck (MCD) to asset their design quality during the s…
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As compared to DRC rules, DFM rules are a list of selected recommended rules which aim to improve the design margins for better manufacturability. In GLOBALFOUNDRIES, we use DFM scoring methodology as an effective technique to analyze design quality in terms of manufacturability. Physical design engineers can perform our Manufacturability Check Deck (MCD) to asset their design quality during the sign-off stage. In the past, Synopsys users have to convert their design though milkyway database to GDSII format and execute the verification through the third party EDA tools. This method is costly and time-consuming for our Synopsys users. Today, we propose a new and easy-to-use integrated flow which leverages on the ICV engine to provide DFM scoring and in-design fixing techniques. The new methodology address DFM violations early in the design flow and achieve DFM compliance design during sign-off phase.
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Submitted 25 May, 2018;
originally announced May 2018.
