Showing 1–1 of 1 results for author: Kalinin, E
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Life cycle models and security threats to a microcircuit during its development and operation
Authors:
D. S. Belyakov,
E. O. Kalinin,
A. A. Konev,
A. A. Shelupanov,
A. K. Novokhrestov
Abstract:
The growth of Internet of Things devices has shown the need to develop the direction of information security in the field of development and operation of microcircuits, since modern information systems are built around the latter. This article presents the life cycle of secure chips used as a root of trust ( Root of Trust ) information systems. The main stages of the life cycle of protected microc…
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The growth of Internet of Things devices has shown the need to develop the direction of information security in the field of development and operation of microcircuits, since modern information systems are built around the latter. This article presents the life cycle of secure chips used as a root of trust ( Root of Trust ) information systems. The main stages of the life cycle of protected microcircuits are described, namely, the life cycle models during development and during operation by the end user.
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Submitted 30 January, 2023;
originally announced January 2023.