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Polarimetric iToF: Measuring High-Fidelity Depth through Scattering Media
Authors:
Daniel S. Jeon,
Andreas Meuleman,
Seung-Hwan Baek,
Min H. Kim
Abstract:
Indirect time-of-flight (iToF) imaging allows us to capture dense depth information at a low cost. However, iToF imaging often suffers from multipath interference (MPI) artifacts in the presence of scattering media, resulting in severe depth-accuracy degradation. For instance, iToF cameras cannot measure depth accurately through fog because ToF active illumination scatters back to the sensor befor…
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Indirect time-of-flight (iToF) imaging allows us to capture dense depth information at a low cost. However, iToF imaging often suffers from multipath interference (MPI) artifacts in the presence of scattering media, resulting in severe depth-accuracy degradation. For instance, iToF cameras cannot measure depth accurately through fog because ToF active illumination scatters back to the sensor before reaching the farther target surface. In this work, we propose a polarimetric iToF imaging method that can capture depth information robustly through scattering media. Our observations on the principle of indirect ToF imaging and polarization of light allow us to formulate a novel computational model of scattering-aware polarimetric phase measurements that enables us to correct MPI errors. We first devise a scattering-aware polarimetric iToF model that can estimate the phase of unpolarized backscattered light. We then combine the optical filtering of polarization and our computational modeling of unpolarized backscattered light via scattering analysis of phase and amplitude. This allows us to tackle the MPI problem by estimating the scattering energy through the participating media. We validate our method on an experimental setup using a customized off-the-shelf iToF camera. Our method outperforms baseline methods by a significant margin by means of our scattering model and polarimetric phase measurements.
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Submitted 30 June, 2023;
originally announced June 2023.
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Sparse Ellipsometry: Portable Acquisition of Polarimetric SVBRDF and Shape with Unstructured Flash Photography
Authors:
Inseung Hwang,
Daniel S. Jeon,
Adolfo Muñoz,
Diego Gutierrez,
Xin Tong,
Min H. Kim
Abstract:
Ellipsometry techniques allow to measure polarization information of materials, requiring precise rotations of optical components with different configurations of lights and sensors. This results in cumbersome capture devices, carefully calibrated in lab conditions, and in very long acquisition times, usually in the order of a few days per object. Recent techniques allow to capture polarimetric sp…
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Ellipsometry techniques allow to measure polarization information of materials, requiring precise rotations of optical components with different configurations of lights and sensors. This results in cumbersome capture devices, carefully calibrated in lab conditions, and in very long acquisition times, usually in the order of a few days per object. Recent techniques allow to capture polarimetric spatially-varying reflectance information, but limited to a single view, or to cover all view directions, but limited to spherical objects made of a single homogeneous material. We present sparse ellipsometry, a portable polarimetric acquisition method that captures both polarimetric SVBRDF and 3D shape simultaneously. Our handheld device consists of off-the-shelf, fixed optical components. Instead of days, the total acquisition time varies between twenty and thirty minutes per object. We develop a complete polarimetric SVBRDF model that includes diffuse and specular components, as well as single scattering, and devise a novel polarimetric inverse rendering algorithm with data augmentation of specular reflection samples via generative modeling. Our results show a strong agreement with a recent ground-truth dataset of captured polarimetric BRDFs of real-world objects.
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Submitted 8 February, 2023; v1 submitted 9 July, 2022;
originally announced July 2022.
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Single-shot Hyperspectral-Depth Imaging with Learned Diffractive Optics
Authors:
Seung-Hwan Baek,
Hayato Ikoma,
Daniel S. Jeon,
Yuqi Li,
Wolfgang Heidrich,
Gordon Wetzstein,
Min H. Kim
Abstract:
Imaging depth and spectrum have been extensively studied in isolation from each other for decades. Recently, hyperspectral-depth (HS-D) imaging emerges to capture both information simultaneously by combining two different imaging systems; one for depth, the other for spectrum. While being accurate, this combinational approach induces increased form factor, cost, capture time, and alignment/registr…
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Imaging depth and spectrum have been extensively studied in isolation from each other for decades. Recently, hyperspectral-depth (HS-D) imaging emerges to capture both information simultaneously by combining two different imaging systems; one for depth, the other for spectrum. While being accurate, this combinational approach induces increased form factor, cost, capture time, and alignment/registration problems. In this work, departing from the combinational principle, we propose a compact single-shot monocular HS-D imaging method. Our method uses a diffractive optical element (DOE), the point spread function of which changes with respect to both depth and spectrum. This enables us to reconstruct spectrum and depth from a single captured image. To this end, we develop a differentiable simulator and a neural-network-based reconstruction that are jointly optimized via automatic differentiation. To facilitate learning the DOE, we present a first HS-D dataset by building a benchtop HS-D imager that acquires high-quality ground truth. We evaluate our method with synthetic and real experiments by building an experimental prototype and achieve state-of-the-art HS-D imaging results.
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Submitted 15 August, 2021; v1 submitted 1 September, 2020;
originally announced September 2020.
