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Fast Small-Angle X-ray Scattering Tensor Tomography: An Outlook into Future Applications in Life Sciences
Authors:
Christian Appel,
Margaux Schmeltz,
Irene Rodriguez-Fernandez,
Lukas Anschuetz,
Leonard C. Nielsen,
Ezequiel Panepucci,
Tomislav Marijolovic,
Klaus Wakonig,
Aleksandra Ivanovic,
Anne Bonnin,
Filip Leonarski,
Justyna Wojdyla,
Takashi Tomizaki,
Manuel Guizar-Sicairos,
Kate Smith,
John H. Beale,
Wayne Glettig,
Katherine McAuley,
Oliver Bunk,
Meitian Wang,
Marianne Liebi
Abstract:
Small Angle-X-ray Scattering Tensor Tomography (SAS-TT) is a relatively new, but powerful technique for studying the multiscale architecture of hierarchical structures, which is of particular interest for life science applications. Currently, the technique is very demanding on synchrotron beamtime, which limits its applications, especially for cases requiring a statistically relevant amount of sam…
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Small Angle-X-ray Scattering Tensor Tomography (SAS-TT) is a relatively new, but powerful technique for studying the multiscale architecture of hierarchical structures, which is of particular interest for life science applications. Currently, the technique is very demanding on synchrotron beamtime, which limits its applications, especially for cases requiring a statistically relevant amount of sample. This study reports the first SAS-TT measurement at a macromolecular X-ray crystallography beamline, PX-I at the SLS, with an improvement in data acquisition time from 96 h/Mvoxel in the pilot experiments to 6 h/Mvoxel, defining a new standard for fast SAS-TT and allowing the measurement of a full tomogram in 1.2 hours. Measurements were performed on the long and lenticular process of the incus bone, one of the three human auditory ossicles. The main orientation and degree of alignment of the mineralised collagen fibrils are characterised, as well as the size and shape of the mineral particles which show relevant variations in different tissue locations. The study reveals three distinct regions of high fibril alignment, most likely important pathways of sound throughout the ossicular chain, and highlights the potential of the technique to aid in future developments in middle ear reconstructive surgery.
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Submitted 19 June, 2024;
originally announced June 2024.
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Imaging ultrafast dynamical diffraction wavefronts in strained Si with coherent X-rays
Authors:
Angel Rodriguez-Fernandez,
Ana Diaz,
Anand H. S. Iyer,
Mariana Verezhak,
Klaus Wakonig,
Magnus H. Colliander,
Dina Carbone
Abstract:
Dynamical diffraction effects in single crystals produce highly monochromatic parallel X-ray beams with a mutual separation of a few micrometer and a time-delay of a few fs -the so-called echoes. This ultrafast diffraction effect is used at X-ray Free Electron Lasers in self-seeding schemes to improve beam monochromaticity. Here, we present a coherent X-ray imaging measurement of echoes from Si cr…
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Dynamical diffraction effects in single crystals produce highly monochromatic parallel X-ray beams with a mutual separation of a few micrometer and a time-delay of a few fs -the so-called echoes. This ultrafast diffraction effect is used at X-ray Free Electron Lasers in self-seeding schemes to improve beam monochromaticity. Here, we present a coherent X-ray imaging measurement of echoes from Si crystals and demonstrate that a small surface strain can be used to tune their temporal delay. These results represent a first step towards the ambitious goal of strain-tailoring new X-ray optics.
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Submitted 11 October, 2021; v1 submitted 16 December, 2020;
originally announced December 2020.
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X-ray ptychographic topography, a new tool for strain imaging
Authors:
Mariana Verezhak,
Steven Van Petegem,
Angel Rodriguez-Fernandez,
Pierre Godard,
Klaus Wakonig,
Dmitry Karpov,
Vincent L. R. Jacques,
Andreas Menzel,
Ludovic Thilly,
Ana Diaz
Abstract:
Strain and defects in crystalline materials are responsible for the distinct mechanical, electric and magnetic properties of a desired material, making their study an essential task in material characterization, fabrication and design. Existing techniques for the visualization of strain fields, such as transmission electron microscopy and diffraction, are destructive and limited to thin slices of…
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Strain and defects in crystalline materials are responsible for the distinct mechanical, electric and magnetic properties of a desired material, making their study an essential task in material characterization, fabrication and design. Existing techniques for the visualization of strain fields, such as transmission electron microscopy and diffraction, are destructive and limited to thin slices of the materials. On the other hand, non-destructive X-ray imaging methods either have a reduced resolution or are not robust enough for a broad range of applications. Here we present X-ray ptychographic topography, a new method for strain imaging, and demonstrate its use on an InSb micro-pillar after micro-compression, where the strained region is visualized with a spatial resolution of 30 nm. Thereby, X-ray ptychographic topography proves itself as a robust non-destructive approach for the imaging of strain fields within bulk crystalline specimens with a spatial resolution of a few tens of nanometers.
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Submitted 6 December, 2020;
originally announced December 2020.
