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Variable-wavelength quick scanning nano-focused X-ray microscopy for in situ strain and tilt map**
Authors:
Marie-ingrid Richard,
Thomas W Cornelius,
Florian Lauraux,
Jean-Baptiste Molin,
Christoph Kirchlechner,
Steven J Leake,
Jérôme Carnis,
Tobias U Schülli,
Ludovic Thilly,
Olivier Thomas
Abstract:
Compression of micro-pillars is followed in situ by a quick nano-focused X-ray scanning microscopy technique combined with three-dimensional reciprocal space map**. Compared to other attempts using 2 X-ray nanobeams, it avoids any motion or vibration that would lead to a destruction of the sample. The technique consists of scanning both the energy of the incident nano-focused X-ray beam and the…
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Compression of micro-pillars is followed in situ by a quick nano-focused X-ray scanning microscopy technique combined with three-dimensional reciprocal space map**. Compared to other attempts using 2 X-ray nanobeams, it avoids any motion or vibration that would lead to a destruction of the sample. The technique consists of scanning both the energy of the incident nano-focused X-ray beam and the in-plane translations of the focusing optics along the X-ray beam. Here, we demonstrate the approach by imaging the strain and lattice orientation of Si micro-pillars and their pedestals during in situ compression. Varying the energy of the incident beam instead of rocking the sample and map** the focusing optics instead of moving the sample supplies a vibration-free measurement of the reciprocal space maps without removal of the mechanical load. The maps of strain and lattice orientation are in good agreement with the ones recorded by ordinary rocking-curve scans. Variable-wavelength quick scanning X-ray microscopy opens the route for in situ strain and tilt map** towards more diverse and complex materials environments, especially where sample manipulation is difficult.
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Submitted 27 June, 2022;
originally announced June 2022.
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Nanoindentation-induced deformation twinning in MAX phase Ti$_2$AlN
Authors:
Christophe Tromas,
Salomé Parent,
Wilgens Sylvain,
Ludovic Thilly,
Gilles Renou,
Christopher Zehnder,
Sebastian Schröders,
Sandra Korte-Kerzel,
Anne Joulain
Abstract:
Plastic deformation mechanisms have been investigated in the MAX phase Ti2AlN. Nanoindentation has been used to induce plastic deformation in a single grain, and a Transmission Electron Microscopy (TEM) lamella has been extracted in cross section through the indent by using Focused Ion Beam (FIB) technique. By combining TEM observations and automated crystal orientation map** (ACOM), highly miso…
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Plastic deformation mechanisms have been investigated in the MAX phase Ti2AlN. Nanoindentation has been used to induce plastic deformation in a single grain, and a Transmission Electron Microscopy (TEM) lamella has been extracted in cross section through the indent by using Focused Ion Beam (FIB) technique. By combining TEM observations and automated crystal orientation map** (ACOM), highly misoriented domains (HMD) have been revealed below a nanoindentation imprint. Thanks to a careful analysis of the relative crystal orientations between these HMD, {11-22} and {11-21} deformation twins have been identified for the first time in a MAX phase. Complex structures, involving secondary twinning or different {11-22} twin variants have also been characterized.
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Submitted 26 January, 2022;
originally announced January 2022.
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X-ray ptychographic topography, a new tool for strain imaging
Authors:
Mariana Verezhak,
Steven Van Petegem,
Angel Rodriguez-Fernandez,
Pierre Godard,
Klaus Wakonig,
Dmitry Karpov,
Vincent L. R. Jacques,
Andreas Menzel,
Ludovic Thilly,
Ana Diaz
Abstract:
Strain and defects in crystalline materials are responsible for the distinct mechanical, electric and magnetic properties of a desired material, making their study an essential task in material characterization, fabrication and design. Existing techniques for the visualization of strain fields, such as transmission electron microscopy and diffraction, are destructive and limited to thin slices of…
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Strain and defects in crystalline materials are responsible for the distinct mechanical, electric and magnetic properties of a desired material, making their study an essential task in material characterization, fabrication and design. Existing techniques for the visualization of strain fields, such as transmission electron microscopy and diffraction, are destructive and limited to thin slices of the materials. On the other hand, non-destructive X-ray imaging methods either have a reduced resolution or are not robust enough for a broad range of applications. Here we present X-ray ptychographic topography, a new method for strain imaging, and demonstrate its use on an InSb micro-pillar after micro-compression, where the strained region is visualized with a spatial resolution of 30 nm. Thereby, X-ray ptychographic topography proves itself as a robust non-destructive approach for the imaging of strain fields within bulk crystalline specimens with a spatial resolution of a few tens of nanometers.
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Submitted 6 December, 2020;
originally announced December 2020.
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Multiscale modeling of the elastic behavior of architectured and nanostructured Cu-Nb composite wires
Authors:
T. Gu,
O. Castelnau,
S. Forest,
E. Hervé-Luanco,
F. Lecouturier,
H. Proudhon,
L. Thilly
Abstract:
Nanostructured and architectured copper niobium composite wires are excellent candidates for the generation of intense pulsed magnetic fields (>90T) as they combine both high strength and high electrical conductivity. Multi-scaled Cu-Nb wires are fabricated by accumulative drawing and bundling (a severe plastic deformation technique), leading to a multiscale, architectured, and nanostructured micr…
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Nanostructured and architectured copper niobium composite wires are excellent candidates for the generation of intense pulsed magnetic fields (>90T) as they combine both high strength and high electrical conductivity. Multi-scaled Cu-Nb wires are fabricated by accumulative drawing and bundling (a severe plastic deformation technique), leading to a multiscale, architectured, and nanostructured microstructure exhibiting a strong fiber crystallographic texture and elongated grain shapes along the wire axis. This paper presents a comprehensive study of the effective elastic behavior of this composite material by three multi-scale models accounting for different microstructural contents: two mean-field models and a full-field finite element model. As the specimens exhibit many characteristic scales, several scale transition steps are carried out iteratively from the grain scale to the macro-scale. The general agreement among the model responses allows suggesting the best strategy to estimate the effective behavior of Cu-Nb wires and save computational time. The importance of crystallographical and morphological textures in various cases is discussed. Finally, the models are validated by available experimental data with a good agreement.
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Submitted 3 August, 2017; v1 submitted 19 December, 2016;
originally announced December 2016.
