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Polarons in supersolids: path-integral treatment of an impurity in a one-dimensional dipolar supersolid
Authors:
Laurent H. A. Simons,
Michiel Wouters,
Jacques Tempere
Abstract:
The supersolid phase of a dipolar Bose-Einstein condensate has an intriguing excitation spectrum displaying a band structure. Here, the dressing of an impurity in a one-dimensional dipolar supersolid with the excitations of the supersolid is studied. The ground-state energy of the supersolid polaron is calculated using a variational path integral approach, which obtained accurate results for other…
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The supersolid phase of a dipolar Bose-Einstein condensate has an intriguing excitation spectrum displaying a band structure. Here, the dressing of an impurity in a one-dimensional dipolar supersolid with the excitations of the supersolid is studied. The ground-state energy of the supersolid polaron is calculated using a variational path integral approach, which obtained accurate results for other polaron systems within the Bogoliubov and Fröhlich approximations. A divergence is observed at the superfluid-supersolid phase transition. The polaron radius is also computed, showing that for strong impurity-atom interactions, the polaron can become localized to a single droplet, behaving like a small solid-state polaron.
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Submitted 8 July, 2024; v1 submitted 3 July, 2024;
originally announced July 2024.
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Path-integral treatment of charged Bose polarons
Authors:
Laurent H. A. Simons,
Michiel Wouters,
Jacques Tempere
Abstract:
The system of a charged impurity in an interacting Bose gas has gained significant attention due to the long-range ion-atom interactions and the study of transport properties. Here, the ground state energy of a charged Bose polaron is calculated within the Bogoliubov approximation for both the Fröhlich and beyond-Fröhlich Hamiltonians using a generalized Feynman variational path-integral approach,…
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The system of a charged impurity in an interacting Bose gas has gained significant attention due to the long-range ion-atom interactions and the study of transport properties. Here, the ground state energy of a charged Bose polaron is calculated within the Bogoliubov approximation for both the Fröhlich and beyond-Fröhlich Hamiltonians using a generalized Feynman variational path-integral approach, which obtained accurate results for other polaron problems. The generalized approach, which was used to improve the energy result for the neutral polaron, has resulted in a minor improvement, indicating that Feynman's approach is sufficient when the impurity-boson interaction is long-range. Beyond-Fröhlich corrections results in the emergence of a divergence in the polaronic energy indicating a transition between the repulsive and attractive polaron regime. The path-integral approach with the beyond-Fröhlich Hamiltonian is also compared to a field-theory calculation from Christensen et al, 2021. The validity of the Bogoliubov approximation is investigated. The optical absorption has also been calculated within the Bogoliubov approximation for weak ion-atom interactions, and the effect of finite temperature has been studied. We show that the coupling of the ion to an oscillating external electric field offers a straigtforward experimental probe for the charged polaron in a Bose gas, different from but complementary to existing spectroscopic techniques.
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Submitted 8 July, 2024; v1 submitted 7 June, 2024;
originally announced June 2024.
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Heterogeneous antiferroelectric ordering in NaNbO3-SrSnO3 ceramics revealed by direct superstructure imaging
Authors:
Leonardo Oliveira,
Mao-Hua Zhang,
Jurij Koruza,
Raquel Rodiquez-Lamas,
Can Yildirim,
Hugh Simons
Abstract:
NaNbO3-based antiferroelectric materials offer a promising pathway towards greener and more cost-effective energy storage devices. However, their intrinsic structural instabilities often lead to reduced energy density that compromises their performance and longevity. In this brief communication, we demonstrate how Dark-Field X-ray Microscopy, when carried out on the characteristically weak 1/4{843…
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NaNbO3-based antiferroelectric materials offer a promising pathway towards greener and more cost-effective energy storage devices. However, their intrinsic structural instabilities often lead to reduced energy density that compromises their performance and longevity. In this brief communication, we demonstrate how Dark-Field X-ray Microscopy, when carried out on the characteristically weak 1/4{843}pc superstructure reflection, can map the antiferroelectric phase and its strain heterogeneity in typically small, deeply-embedded grains of a NaNbO3 and 0.95NaNbO3-0.05SrSnO3 ceramics, representative of different phase transition behavior. Our results clearly evidences the stabilizing effect of SrSnO3 on the antiferroelectric phase by enhancing the degree of mesostructural order. In doing so, our method establishes a new platform for exploring the impact of disorder on the long-range strain heterogeneity within antiferroelectrics and other materials with modulated crystal structures.
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Submitted 21 May, 2024;
originally announced May 2024.
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X-ray induced grain structure dynamics in Bi2Se3
Authors:
Kento Katagiri,
Bernard Kozioziemski,
Eric Folsom,
Yifan Wang,
Karen Appel,
Philip K. Cook,
Jon Eggert,
Sebastian Göde,
Marylesa Howard,
Sungwon Kim,
Mikako Matsuda,
Motoaki Nakatsutsumi,
Martin M. Nielsen,
Henning F. Poulsen,
Frank Seiboth,
Hugh Simons,
Bihan Wang,
Wenge Yang,
Ulf Zastrau,
Hyunjung Kim,
Leora E. Dresselhaus-Marais
Abstract:
Grain rotation in crystals often results in coarsening or refinement of the grains that modify the mechanical and thermal properties of materials. While many studies have explored how externally applied stress and temperature drive grain structure dynamics in nano-polycrystalline materials, the analogous studies on colossal grains have been limited, especially in the absence of external force. In…
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Grain rotation in crystals often results in coarsening or refinement of the grains that modify the mechanical and thermal properties of materials. While many studies have explored how externally applied stress and temperature drive grain structure dynamics in nano-polycrystalline materials, the analogous studies on colossal grains have been limited, especially in the absence of external force. In this work, we used X-ray free electron laser pulses to irradiate single-crystalline bismuth selenide (Bi2Se3) and observed grain boundary formation and subsequent grain rotation in response to the X-ray radiation. Our observations with simultaneous X-ray diffraction and transmission X-ray microscopy demonstrate how intense X-ray radiation can rapidly change grain morphologies of initially single-crystalline material.
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Submitted 12 March, 2024;
originally announced March 2024.
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Spatially resolved map** of coherent twin relationships in DFXM measurements
Authors:
Mads Carlsen,
Marion Hoefling,
Carsten Detlefs,
Hugh Simons
Abstract:
With dark firld x-ray microscopy, it is possible to measure reciprocal space manps of localized volumes embedded deeply in a large sample. Ferroelastic materials contains elastic twins that display characteristing splitting of diffraction peaks. We show how to utilize established methods for analysing reciprocal space maps of elastically twinned materials to the analysis of dark-field x-ray micros…
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With dark firld x-ray microscopy, it is possible to measure reciprocal space manps of localized volumes embedded deeply in a large sample. Ferroelastic materials contains elastic twins that display characteristing splitting of diffraction peaks. We show how to utilize established methods for analysing reciprocal space maps of elastically twinned materials to the analysis of dark-field x-ray microscopy data to detemin the exact kind of domain wall present in each probed volume, even when the domains are not spatially resolved.
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Submitted 12 January, 2024;
originally announced January 2024.
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Imaging the Electric Field with X-Ray Diffraction Microscopy
Authors:
Trygve Magnus Ræder,
Urko Petralanda,
Thomas Olsen,
Hugh Simons
Abstract:
The properties of semiconductors and functional dielectrics are defined by their response in electric fields, which may be perturbed by defects and the strain they generate. In this work, we demonstrate how diffraction-based X-ray microscopy techniques may be utilized to image the electric field in insulating crystalline materials. By analysing a prototypical ferro- and piezoelectric material, BaT…
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The properties of semiconductors and functional dielectrics are defined by their response in electric fields, which may be perturbed by defects and the strain they generate. In this work, we demonstrate how diffraction-based X-ray microscopy techniques may be utilized to image the electric field in insulating crystalline materials. By analysing a prototypical ferro- and piezoelectric material, BaTiO$_{3}$, we identify trends that can guide experimental design towards imaging the electric field using any diffraction-based X-ray microscopy technique. We explain these trends in the context of dark-field X-ray microscopy, but the framework is also valid for Bragg scanning probe X-ray microscopy, Bragg coherent diffraction imaging and Bragg X-ray ptychography. The ability to quantify electric field distributions alongside the defects and strain already accessible via these techniques offers a more comprehensive picture of the often complex structure-property relationships that exist in many insulating and semiconducting materials.
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Submitted 31 August, 2023;
originally announced August 2023.
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Electric-field-induced non-ergodic relaxor to ferroelectric transition in BiFeO3-xSrTiO3 ceramics
Authors:
Leonardo Oliveira,
Jeppe Ormstrup,
Marta Majkut,
Maja Makarovic,
Tadej Rojac,
Julian Walker,
Hugh Simons
Abstract:
While BiFeO3-based solid solutions show great promise for applications in energy conversion and storage, realizing this promise necessitates understanding the structure-property relationship in particular pertaining to the relaxor-like characteristics often exhibited by solid solutions with polar-to-non-polar morphotropic phase boundaries. To this end, we investigated the role of the compositional…
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While BiFeO3-based solid solutions show great promise for applications in energy conversion and storage, realizing this promise necessitates understanding the structure-property relationship in particular pertaining to the relaxor-like characteristics often exhibited by solid solutions with polar-to-non-polar morphotropic phase boundaries. To this end, we investigated the role of the compositionally-driven relaxor state in (100-x)BiFeO3-xSrTiO3 [BFO-xSTO], via in situ synchrotron X-ray diffraction under bipolar electric-field cycling. The electric-field induced changes to the crystal structure, phase fraction and domain textures were monitored via the {111}pc, {200}pc, and 1/2{311}pc Bragg peaks. The dynamics of the intensities and positions of the (111) and (11-1) reflections reveal an initial non-ergodic regime followed by long-range ferroelectric ordering after extended poling cycles. The increased degree of random multi-site occupation in BFO-42STO compared to BFO-35STO is correlated with an increase of the critical electric field needed to induce the non-ergodic-to-ferroelectric transition, and a decrease in the degree of domain reorientation. Although both compositions show an irreversible transition to a long-range ferroelectric state, our results suggest that the weaker ferroelectric response in BFO-42STO is related to an increase in ergodicity. This, in turn, serves to guide the development of BFO-based systems into promising platform for further property engineering towards specific capacitor applications.
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Submitted 14 April, 2023;
originally announced April 2023.
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Real-time imaging of acoustic waves in bulk materials with X-ray microscopy
Authors:
Theodor S. Holstad,
Leora E. Dresselhaus-Marais,
Trygve Magnus Ræder,
Bernard Kozioziemski,
Tim van Driel,
Matthew Seaberg,
Eric Folsom,
Jon H. Eggert,
Erik Bergbäck Knudsen,
Martin Meedom Nielsen,
Hugh Simons,
Kristoffer Haldrup,
Henning Friis Poulsen
Abstract:
Materials modelling and processing require experiments to visualize and quantify how external excitations drive the evolution of deep subsurface structure and defects that determine properties. Today, 3D movies with ~100-nm resolution of crystalline structure are regularly acquired in minutes to hours using X-ray diffraction based imaging. We present an X-ray microscope that improves this time res…
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Materials modelling and processing require experiments to visualize and quantify how external excitations drive the evolution of deep subsurface structure and defects that determine properties. Today, 3D movies with ~100-nm resolution of crystalline structure are regularly acquired in minutes to hours using X-ray diffraction based imaging. We present an X-ray microscope that improves this time resolution to <100 femtoseconds, with images attainable even from a single X-ray pulse. Using this, we resolve the propagation of 18-km/s acoustic waves in mm-sized diamond crystals, and demonstrate how mechanical energy thermalizes from picosecond to microsecond timescales. Our approach unlocks a vast range of new experiments of materials phenomena with intricate structural dynamics at ultrafast timescales.
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Submitted 14 November, 2022; v1 submitted 2 November, 2022;
originally announced November 2022.
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Simultaneous Bright- and Dark-Field X-ray Microscopy at X-ray Free Electron Lasers
Authors:
Leora E. Dresselhaus-Marais,
Bernard Kozioziemski,
Theodor S. Holstad,
Trygve Magnus Ræder,
Matthew Seaberg,
Daewoong Nam,
Sangsoo Kim,
Sean Breckling,
Seonghyuk Choi,
Matthieu Chollet,
Philip K. Cook,
Eric Folsom,
Eric Galtier,
Arnulfo Gonzalez,
Tais Gorhover,
Serge Guillet,
Kristoffer Haldrup,
Marylesa Howard,
Kento Katagiri,
Seonghan Kim,
Sunam Kim,
Sungwon Kim,
Hyunjung Kim,
Erik Bergback Knudsen,
Stephan Kuschel
, et al. (18 additional authors not shown)
Abstract:
The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the str…
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The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, Dark Field X-ray Microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the $10^{12}$ photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics.
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Submitted 5 September, 2023; v1 submitted 15 October, 2022;
originally announced October 2022.
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Unveiling the interaction mechanisms of electron and X-ray radiation with halide perovskite semiconductors using scanning nano-probe diffraction
Authors:
Jordi Ferrer Orri,
Tiarnan A. S. Doherty,
Duncan Johnstone,
Sean M. Collins,
Hugh Simons,
Paul A. Midgley,
Caterina Ducati,
Samuel D. Stranks
Abstract:
The interaction of high-energy electrons and X-ray photons with soft semiconductors such as halide perovskites is essential for the characterisation and understanding of these optoelectronic materials. Using nano-probe diffraction techniques, which can investigate physical properties on the nanoscale, we perform studies of the interaction of electron and X-ray radiation with state-of-the-art (FA…
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The interaction of high-energy electrons and X-ray photons with soft semiconductors such as halide perovskites is essential for the characterisation and understanding of these optoelectronic materials. Using nano-probe diffraction techniques, which can investigate physical properties on the nanoscale, we perform studies of the interaction of electron and X-ray radiation with state-of-the-art (FA$_{0.79}$MA$_{0.16}$Cs$_{0.05}$)Pb(I$_{0.83}$Br$_{0.17}$)$_3$ hybrid halide perovskite films (FA, formamidinium; MA, methylammonium). We track the changes in the local crystal structure as a function of fluence using scanning electron diffraction and synchrotron nano X-ray diffraction techniques. We identify perovskite grains from which additional reflections, corresponding to PbBr$_2$, appear as a crystalline degradation phase after fluences of ~200 e$^-$Å$^{-2}$. These changes are concomitant with the formation of small PbI$_2$ crystallites at the adjacent high-angle grain boundaries, with the formation of pinholes, and with a phase transition from tetragonal to cubic. A similar degradation pathway is caused by photon irradiation in nano-X-ray diffraction, suggesting common underlying mechanisms. Our approach explores the radiation limits of these materials and provides a description of the degradation pathways on the nanoscale. Addressing high-angle grain boundaries will be critical for the further improvement of halide polycrystalline film stability, especially for applications vulnerable to high-energy radiation such as space photovoltaics.
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Submitted 28 January, 2022;
originally announced January 2022.
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Simulating dark-field x-ray microscopy images with wave front propagation techniques
Authors:
Mads Carlsen,
Carsten Detlefs,
Can Yildirim,
Trygve Ræder,
Hugh Simons
Abstract:
Dark-Field X-ray Microscopy (DFXM) is a diffraction-based synchrotron imaging techique capable of imaging defects in the bulk of extended crystalline samples. We present numerical simulations of image-formation in such a microscope using numerical integration of the dynamical Takagi-Taupin Equations (TTE) and wave front propagation. We validate our approach by comparing simulated images to experim…
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Dark-Field X-ray Microscopy (DFXM) is a diffraction-based synchrotron imaging techique capable of imaging defects in the bulk of extended crystalline samples. We present numerical simulations of image-formation in such a microscope using numerical integration of the dynamical Takagi-Taupin Equations (TTE) and wave front propagation. We validate our approach by comparing simulated images to experimental data from a near-perfect single crystal of diamond containing a single stacking fault defect in the illuminated volume.
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Submitted 23 February, 2022; v1 submitted 19 January, 2022;
originally announced January 2022.
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X-ray Free Electron Laser based Dark-Field X-ray Microscopy
Authors:
Theodor Secanell Holstad,
Trygve Magnus Raeder,
Mads Allerup Carlsen,
Erik Bergback Knudsen,
Leora Dresselhaus-Marais,
Kristoffer Haldrup,
Hugh Simons,
Martin Meedom Nielsen,
Henning Friis Poulsen
Abstract:
Dark-field X-ray microscopy (DFXM) is a nondestructive full-field imaging technique providing three dimensional map** of microstructure and local strain fields in deeply embedded crystalline elements. This is achieved by placing an objective lens in the diffracted beam, giving a magnified projection image. So far, the method has been applied with a time resolution of milliseconds to hours. In th…
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Dark-field X-ray microscopy (DFXM) is a nondestructive full-field imaging technique providing three dimensional map** of microstructure and local strain fields in deeply embedded crystalline elements. This is achieved by placing an objective lens in the diffracted beam, giving a magnified projection image. So far, the method has been applied with a time resolution of milliseconds to hours. In this work, we consider the feasibility of DFXM at the picosecond time scale using an X-ray free electron laser source and a pump-probe scheme. We combine thermomechanical strain wave simulations with geometrical optics and wavefront propagation optics to simulate DFXM images of phonon dynamics in a diamond single crystal. Using the specifications of the XCS instrument at the Linac Coherent Light Source (LCLS) as an example results in simulated DFXM images clearly showing the propagation of a strain wave.
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Submitted 2 November, 2021;
originally announced November 2021.
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Oxygen vacancies nucleate charged domain walls in ferroelectrics
Authors:
Urko Petralanda,
Mads Kruse,
Hugh Simons,
Thomas Olsen
Abstract:
We study the influence of oxygen vacancies on the formation of charged 180$^\circ$ domain walls in ferroelectric BaTiO$_3$ using first principles calculations. We show that it is favorable for vacancies to assemble in crystallographic planes, and that such clustering is accompanied by the formation of a charged domain wall. The domain wall has negative bound charge, which compensates the nominal p…
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We study the influence of oxygen vacancies on the formation of charged 180$^\circ$ domain walls in ferroelectric BaTiO$_3$ using first principles calculations. We show that it is favorable for vacancies to assemble in crystallographic planes, and that such clustering is accompanied by the formation of a charged domain wall. The domain wall has negative bound charge, which compensates the nominal positive charge of the vacancies and leads to a vanishing density of free charge at the wall. This is in contrast to the positively charged domain walls, which are nearly completely compensated by free charge from the bulk. The results thus explain the experimentally observed difference in electronic conductivity of the two types of domain walls, as well as the generic prevalence of charged domain walls in ferroelectrics. Moreover, the explicit demonstration of vacancy driven domain wall formation implies that specific charged domain wall configurations may be realized by bottom-up design for use in domain wall based information processing.
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Submitted 21 December, 2020;
originally announced December 2020.
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In-Situ Visualization of Long-Range Defect Interactions at the Edge of Melting
Authors:
Leora E. Dresselhaus-Marais,
Grethe Winther,
Marylesa Howard,
Arnulfo Gonzalez,
Sean R. Breckling,
Can Yildirim,
Philip K. Cook,
Mustafacan Kutsal,
Hugh Simons,
Carsten Detlefs,
Jon H. Eggert,
Henning Friis Poulsen
Abstract:
Connecting a bulk material's microscopic defects to its macroscopic properties is an age-old problem in materials science. Long-range interactions between dislocations (line defects) are known to play a key role in how materials deform or melt, but we lack the tools to connect these dynamics to the macroscopic properties. We introduce time-resolved dark-field X-ray microscopy to directly visualize…
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Connecting a bulk material's microscopic defects to its macroscopic properties is an age-old problem in materials science. Long-range interactions between dislocations (line defects) are known to play a key role in how materials deform or melt, but we lack the tools to connect these dynamics to the macroscopic properties. We introduce time-resolved dark-field X-ray microscopy to directly visualize how dislocations move and interact over hundreds of micrometers, deep inside bulk aluminum. With real-time movies, we reveal the thermally-activated motion and interactions of dislocations that comprise a boundary, and show how weakened binding forces inhomogeneously destabilize the structure at 99% of the melting temperature. Connecting dynamics of the microstructure to its stability, we provide important opportunities to guide and validate multiscale models that are yet untested.
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Submitted 14 September, 2020; v1 submitted 10 September, 2020;
originally announced September 2020.