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Showing 1–3 of 3 results for author: Sasaki, T T

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  1. arXiv:2405.08994  [pdf

    cond-mat.mtrl-sci

    Growth of [001]-oriented polycrystalline Heusler alloy thin films using [001]-textured Ag buffer layer on thermally oxidized Si substrate for spintronics applications

    Authors: Dolly Taparia, Taisuke T. Sasaki, Tomoya Nakatani, Hirofumi Suto, Seiji Mitani, Yuya Sakuraba

    Abstract: To utilize half-metallic Heusler alloys in practical spintronic devices, such as magnetic sensors and magnetic memories, the key is to realize highly textured and structurally ordered polycrystalline thin films. In this study, we fabricated polycrystalline Co2FeGa0.5Ge0.5 (CFGG) Heusler alloy films deposited on a [001]-oriented Ag buffer layer, which was achieved by introducing N2 into Ar during t… ▽ More

    Submitted 14 May, 2024; originally announced May 2024.

    Comments: 16 papers, 5 figures

  2. arXiv:2405.06362  [pdf

    cond-mat.mtrl-sci

    Enhancing atomic ordering, magnetic and transport properties of Mn2VGa Heusler alloy thin films toward negatively spin-polarized charge injection

    Authors: Z. H. Li, H. Suto, V. Barwal, K. Masuda, T. T. Sasaki, Z. X. Chen, H. Tajiri, L. S. R. Kumara, T. Koganezawa, K. Amemiya, S. Kokado, K. Hono, Y. Sakuraba

    Abstract: Magnetic materials with negative spin polarization have attracted attention for their potential to increase the design freedom of spintronic devices. This study investigated the effects of off-stoichiometry on the atomic ordering, microstructure, and magneto-transport properties in Mn2+xV1-xGa (x = -0.2, 0, +0.2, +0.4) Heusler alloy films, which are predicted to have large negative spin polarizati… ▽ More

    Submitted 10 May, 2024; originally announced May 2024.

  3. arXiv:2403.09677  [pdf, other

    cond-mat.mtrl-sci stat.AP

    Rapid and Robust construction of an ML-ready peak feature table from X-ray diffraction data using Bayesian peak-top fitting

    Authors: Ryo Murakami, Taisuke T. Sasaki, Hideki Yoshikawa, Yoshitaka Matsushita, Keitaro Sodeyama, Tadakatsu Ohkubo, Hiroshi Shinotsuka, Kenji Nagata

    Abstract: To advance the development of materials through data-driven scientific methods, appropriate methods for building machine learning (ML)-ready feature tables from measured and computed data must be established. In materials development, X-ray diffraction (XRD) is an effective technique for analysing crystal structures and other microstructural features that have information that can explain material… ▽ More

    Submitted 6 February, 2024; originally announced March 2024.