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The Noise of the Charge Density Waves in NbSe$_3$ Nanowires -- Contributions of Electrons and Quantum Condensate
Authors:
Subhajit Ghosh,
Sergey Rumyantsev,
Alexander A. Balandin
Abstract:
Low-frequency electronic noise in charge-density-wave van der Waals materials has been an important characteristic, providing information about the material quality, phase transitions, and collective current transport. However, the noise sources and mechanisms have not been completely understood, particularly for the materials with a non-fully gapped Fermi surface where the electrical current incl…
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Low-frequency electronic noise in charge-density-wave van der Waals materials has been an important characteristic, providing information about the material quality, phase transitions, and collective current transport. However, the noise sources and mechanisms have not been completely understood, particularly for the materials with a non-fully gapped Fermi surface where the electrical current includes components from individual electrons and the sliding charge-density wave. We investigated noise in nanowires of quasi-one-dimensional NbSe$_3$, focusing on a temperature range near the Pearls transition ~ 145 K. The data analysis allowed us to separate the noise produced by the individual conduction electrons and the quantum condensate of the charge density waves before and after the onset of sliding. The noise as a function of temperature and electric bias reveals several intriguing peaks. We explained the observed features by the depinning threshold field, the creep and sliding of the charge density waves, and the possible existence of the hidden phases. It was found that the charge density wave condensate is particularly noisy at the moment of depinning. The noise of the collective current reduces with the increasing bias voltage in contrast to the noise of the individual electrons. Our results shed light on the behavior of the charge density wave quantum condensate and demonstrate the potential of noise spectroscopy for investigating the properties of low-dimensional quantum materials.
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Submitted 26 December, 2023;
originally announced December 2023.
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Conductance Fluctuations and Domain Depinning in Quasi-2D Charge-Density-Wave 1T-TaS$_2$ Thin Films
Authors:
Jonas O. Brown,
Maedeh Taheri,
Fariborz Kargar,
Ruben Salgado,
Tekwam Geremew,
Sergey Rumyantsev,
Roger K. Lake,
Alexander A. Balandin
Abstract:
We investigated the temperature dependence of the conductance fluctuations in thin films of the quasi-two-dimensional 1T-TaS$_2$ van der Waals material. The conductance fluctuations, determined from the derivative current-voltage characteristics of two-terminal 1T-TaS$_2$ devices, appear prominently at the electric fields that correspond to the transitions between various charge-density-wave macro…
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We investigated the temperature dependence of the conductance fluctuations in thin films of the quasi-two-dimensional 1T-TaS$_2$ van der Waals material. The conductance fluctuations, determined from the derivative current-voltage characteristics of two-terminal 1T-TaS$_2$ devices, appear prominently at the electric fields that correspond to the transitions between various charge-density-wave macroscopic quantum condensate phases and at the onset of the depinning of the charge density wave domains. The depinning threshold field, $E_D$, monotonically increases with decreasing temperature within the nearly commensurate charge-density-wave phase. The $E_D$ value increases with the decreasing 1T-TaS$_2$ film thickness, revealing the surface pinning of the charge density waves. Our analysis suggests that depinning is absent in the commensurate phase. It is induced by the electric field but facilitated by local heating. The measured trends for $E_D$ of the domain depinning are important for understanding the physics of charge density waves in quasi-two-dimensional crystals and for develo** electronic devices based on this type of quantum materials.
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Submitted 16 July, 2023;
originally announced July 2023.
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Low-Frequency Electronic Noise in the Aluminum Gallium Oxide Schottky Barrier Diodes
Authors:
Subhajit Ghosh,
Dinusha Herath Mudiyanselage,
Sergey Rumyantsev,
Yuji Zhao,
Houqiang Fu,
Stephen Goodnick,
Robert Nemanich,
Alexander A. Balandin
Abstract:
We report on the low-frequency electronic noise in (Al$_x$Ga$_{1-x}$)$_2$O$_3$ Schottky barrier diodes. The noise spectral density reveals 1/f dependence, characteristic of the flicker noise, with superimposed Lorentzian bulges at the intermediate current levels (f is the frequency). The normalized noise spectral density in such diodes was determined to be on the order of 10$^{-12}$ cm$^2$/Hz (f=1…
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We report on the low-frequency electronic noise in (Al$_x$Ga$_{1-x}$)$_2$O$_3$ Schottky barrier diodes. The noise spectral density reveals 1/f dependence, characteristic of the flicker noise, with superimposed Lorentzian bulges at the intermediate current levels (f is the frequency). The normalized noise spectral density in such diodes was determined to be on the order of 10$^{-12}$ cm$^2$/Hz (f=10 Hz) at 1 A/cm$^2$ current density. At the intermediate current regime, we observed the random telegraph signal noise, correlated with the appearance of Lorentzian bulges in the noise spectrum. The random telegraph signal noise was attributed to the defects near the Schottky barrier. The defects can affect the local electric field and the potential barrier, and correspondingly, impact the electric current. The obtained results help to understand noise in Schottky barrier diodes made of ultra-wide-band-gap semiconductors and can be used for the material and device quality assessment.
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Submitted 10 April, 2023;
originally announced April 2023.
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Electrical Gating of the Charge-Density-Wave Phases in Quasi-2D h-BN/1T-TaS$_2$ Devices
Authors:
Maedeh Taheri,
Jonas Brown,
Adil Rehman,
Nicholas R. Sesing,
Fariborz Kargar,
Tina T. Salguero,
Sergey Rumyantsev,
Alexander A. Balandin
Abstract:
We report on electrical gating of the charge-density-wave phases and current in h-BN capped three-terminal 1T-TaS$_2$ heterostructure devices. It is demonstrated that the application of a gate bias can shift the source-drain current-voltage hysteresis associated with the transition between the nearly commensurate and incommensurate charge-density wave phases. The evolution of the hysteresis and th…
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We report on electrical gating of the charge-density-wave phases and current in h-BN capped three-terminal 1T-TaS$_2$ heterostructure devices. It is demonstrated that the application of a gate bias can shift the source-drain current-voltage hysteresis associated with the transition between the nearly commensurate and incommensurate charge-density wave phases. The evolution of the hysteresis and the presence of abrupt spikes in the current while swee** the gate voltage suggest that the effect is electrical rather than self-heating. We attribute the gating to an electric-field effect on the commensurate charge-density-wave domains in the atomic planes near the gate dielectric. The transition between the nearly commensurate and incommensurate charge-density-wave phases can be induced by both the source-drain current and the electrostatic gate. Since the charge-density-wave phases are persistent in 1T-TaS2 at room temperature, one can envision memory applications of such devices when scaled down to the dimensions of individual commensurate domains and few-atomic plane thicknesses.
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Submitted 10 August, 2022;
originally announced August 2022.
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Low-Frequency Noise in Quasi-1D (TaSe$_4$)$_2$I Weyl Semimetal Nanoribbons
Authors:
Subhajit Ghosh,
Fariborz Kargar,
Nick R. Sesing,
Zahra Barani,
Tina T. Salguero,
Dong Yan,
Sergey Rumyantsev,
Alexander A. Balandin
Abstract:
We report on low-frequency current fluctuations, i.e. electronic noise, in quasi-one-dimensional (TaSe$_4$)$_2$I Weyl semimetal nanoribbons. It was found that the noise spectral density is of the 1/f type and scales with the square of the current, S~I^2 (f is the frequency). The noise spectral density increases by almost an order of magnitude and develops Lorentzian features near the temperature T…
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We report on low-frequency current fluctuations, i.e. electronic noise, in quasi-one-dimensional (TaSe$_4$)$_2$I Weyl semimetal nanoribbons. It was found that the noise spectral density is of the 1/f type and scales with the square of the current, S~I^2 (f is the frequency). The noise spectral density increases by almost an order of magnitude and develops Lorentzian features near the temperature T~225 K. These spectral changes were attributed to the charge-density-wave phase transition even though the temperature of the noise maximum deviates from the reported Peierls transition temperature in bulk (TaSe$_4$)$_2$I crystals. The noise level, normalized by the channel area, in these Weyl semimetal nanoribbons was surprisingly low, $\sim 10^{-9}$ um$^2$Hz$^{-1}$ at f=10 Hz, when measured below and above the Peierls transition temperature. Obtained results shed light on the specifics of electron transport in quasi-1D topological Weyl semimetals and can be important for their proposed applications as downscaled interconnects.
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Submitted 12 August, 2022;
originally announced August 2022.
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Excess Noise in High-Current Diamond Diodes -- Physical Mechanisms and Implications for Reliability Assessment
Authors:
Subhajit Ghosh,
Harshad Surdi,
Fariborz Kargar,
Franz A. Koeck,
Sergey Rumyantsev,
Stephen Goodnick,
Robert Nemanich,
Alexander A. Balandin
Abstract:
We report results of an investigation of low-frequency excess noise in high-current diamond diodes. It was found that the electronic excess noise of the diamond diodes is dominated by generation - recombination noise, which reveals itself either as Lorentzian spectral features or as a 1/f noise spectrum (f is the frequency). The generation - recombination bulges are characteristic for diamond diod…
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We report results of an investigation of low-frequency excess noise in high-current diamond diodes. It was found that the electronic excess noise of the diamond diodes is dominated by generation - recombination noise, which reveals itself either as Lorentzian spectral features or as a 1/f noise spectrum (f is the frequency). The generation - recombination bulges are characteristic for diamond diodes with lower turn-on voltages. The noise spectral density dependence on forward current, I, reveals three distinctive regions in all examined devices - it scales as I^2 at the low (I<10 uA) and high (I>10 mA) currents, and, rather unusually, remain nearly constant at the intermediate current range. The characteristic trap time constants, extracted from the noise data, reveal a uniquely strong dependence on current. Interestingly, the performance of the diamond diodes improves with increasing temperature. The obtained results are important for development of noise spectroscopy-based approaches for device reliability assessment for the high-power diamond electronics.
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Submitted 26 December, 2021;
originally announced December 2021.
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Low-Frequency Noise Characteristics of GaN Vertical PIN Diodes -- Effects of Current and Temperature
Authors:
Subhajit Ghosh,
Kai Fu,
Fariborz Kargar,
Sergey Rumyantsev,
Yuji Zhao,
Alexander A. Balandin
Abstract:
We report low-frequency noise characteristics of vertical GaN PIN diodes, focusing on the effects of the diode design, current and temperature. The as-grown and regrown diodes, with and without surface treatment have been studied. The noise in most of the GaN devices had a characteristic 1/f spectrum at high and moderate currents, while some devices revealed generation-recombination bulges at low…
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We report low-frequency noise characteristics of vertical GaN PIN diodes, focusing on the effects of the diode design, current and temperature. The as-grown and regrown diodes, with and without surface treatment have been studied. The noise in most of the GaN devices had a characteristic 1/f spectrum at high and moderate currents, while some devices revealed generation-recombination bulges at low currents (f is the frequency). The predominant trend of the noise spectral density, S, dependence on the current was S ~ I. All tested GaN PIN diodes had rather low normalized noise spectral densities of 10^-18 cm2/Hz -- 10^-16 cm2/Hz (f=10 Hz) at the current density J=1 A/cm2 at room temperature. The noise temperature dependences at different currents revealed peaks at T=375 K -- 400 K. Temperature, current, and frequency dependences of noise suggest that the noise mechanism is of the recombination origin. We argue that the noise measurements at low currents can be used to efficiently assess the quality of GaN PIN diodes.
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Submitted 12 December, 2021;
originally announced December 2021.
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Nature of the 1/f Noise in Graphene, Direct Evidence for the Mobility Fluctuations Mechanism
Authors:
Adil Rehman,
Juan Antonio Delgado Notario,
Juan Salvador Sanchez,
Yahya Moubarak Meziani,
Grzegorz Cywiński,
Wojciech Knap,
Alexander A. Balandin,
Michael Levinshtein,
Sergey Rumyantsev
Abstract:
The nature of the low-frequency current fluctuations, i.e. carrier number vs. mobility, defines the strategies for noise reduction in electronic devices. While the 1/f noise in metals has been attributed to the electron mobility fluctuations, the direct evidence is lacking (f is the frequency). Here we measured noise in h-BN encapsulated graphene transistor under the condition of geometrical magne…
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The nature of the low-frequency current fluctuations, i.e. carrier number vs. mobility, defines the strategies for noise reduction in electronic devices. While the 1/f noise in metals has been attributed to the electron mobility fluctuations, the direct evidence is lacking (f is the frequency). Here we measured noise in h-BN encapsulated graphene transistor under the condition of geometrical magnetoresistance to directly assess the mechanism of low-frequency electronic current fluctuations. It was found that the relative noise spectral density of the graphene resistance fluctuations depends non-monotonically on the magnetic field (B) with a minimum at approximately uB=1 (u is the electron mobility). This observation proves unambiguously that the mobility fluctuations are the dominant mechanism of the electronic noise in high-quality graphene. Our results are important for all proposed applications of graphene in electronics and add to the fundamental understanding of the 1/f noise origin in any electronic device.
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Submitted 7 November, 2021;
originally announced November 2021.
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Efficient Absorption of Terahertz Radiation in Graphene Polymer Composites
Authors:
Zahra Barani,
Kamil Stelmaszczyk,
Fariborz Kargar,
Yevhen Yashchyshyn,
Grzegorz Cywiński,
Sergey Rumyantsev,
Alexander A. Balandin
Abstract:
We demonstrate that polymer composites with a low loading of graphene, below 1.2 wt. %, are efficient as electromagnetic absorbers in the THz frequency range. The epoxy-based graphene composites were tested at frequencies from 0.25 THz to 4 THz, revealing total shielding effectiveness of 85 dB (1 mm thickness) with graphene loading of 1.2 wt. % at the frequency f=1.6 THz. The THz radiation is most…
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We demonstrate that polymer composites with a low loading of graphene, below 1.2 wt. %, are efficient as electromagnetic absorbers in the THz frequency range. The epoxy-based graphene composites were tested at frequencies from 0.25 THz to 4 THz, revealing total shielding effectiveness of 85 dB (1 mm thickness) with graphene loading of 1.2 wt. % at the frequency f=1.6 THz. The THz radiation is mostly blocked by absorption rather than reflection. The efficiency of the THz radiation shielding by the lightweight, electrically insulating composites, increases with increasing frequency. Our results suggest that even the thin-film or spray coatings of graphene composites with thickness in the few-hundred-micrometer range can be sufficient for blocking THz radiation in many practical applications.
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Submitted 2 September, 2021;
originally announced September 2021.
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Depinning of the Charge-Density Waves in Quasi-2D 1T-TaS2 Devices Operating at Room Temperature
Authors:
A. Mohammadzadeh,
A. Rehman,
F. Kargar,
S. Rumyantsev,
J. M. Smulko,
W. Knap,
R. K. Lake,
A. A. Balandin
Abstract:
We report on depinning of nearly-commensurate charge-density waves in 1T-TaS2 thin-films at room temperature. A combination of the differential current-voltage measurements with the low-frequency noise spectroscopy provide unambiguous means for detecting the depinning threshold field in quasi-2D materials. The depinning process in 1T-TaS2 is not accompanied by an observable abrupt increase in elec…
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We report on depinning of nearly-commensurate charge-density waves in 1T-TaS2 thin-films at room temperature. A combination of the differential current-voltage measurements with the low-frequency noise spectroscopy provide unambiguous means for detecting the depinning threshold field in quasi-2D materials. The depinning process in 1T-TaS2 is not accompanied by an observable abrupt increase in electric current - in striking contrast to depinning in the conventional charge-density-wave materials with quasi-1D crystal structure. We explained it by the fact that the current density from the charge-density waves in the 1T-TaS2 devices is orders of magnitude smaller than the current density of the free carriers available in the discommensuration network surrounding the commensurate charge-density-wave islands. The depinning fields in 1T-TaS2 thin-film devices are several orders of magnitude larger than those in quasi-1D van der Waals materials. Obtained results are important for the proposed applications of the charge-density-wave devices in electronics.
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Submitted 28 April, 2021;
originally announced April 2021.
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Low-Frequency Electronic Noise Spectroscopy of Quasi-2D van der Waals Antiferromagnetic Semiconductors
Authors:
Subhajit Ghosh,
Fariborz Kargar,
Amirmahdi Mohammadzadeh,
Sergey Rumyantsev,
Alexander A. Balandin
Abstract:
We investigated low-frequency current fluctuations, i.e. noise, in the quasi-two-dimensional (2D) van der Waals antiferromagnetic semiconductor FePS3 with the electronic bandgap of 1.5 eV. The electrical and noise characteristics of the p-type, highly resistive, thin films of FePS3 were measured at different temperatures. The noise spectral density was of the 1/f - type over most of the examined t…
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We investigated low-frequency current fluctuations, i.e. noise, in the quasi-two-dimensional (2D) van der Waals antiferromagnetic semiconductor FePS3 with the electronic bandgap of 1.5 eV. The electrical and noise characteristics of the p-type, highly resistive, thin films of FePS3 were measured at different temperatures. The noise spectral density was of the 1/f - type over most of the examined temperature range but revealed well-defined Lorentzian bulges, and increased strongly near the Neel temperature of 118 K (f is the frequency). Intriguingly, the noise spectral density attained its minimum at temperature T~200 K, which was attributed to an interplay of two opposite trends in noise scaling - one for semiconductors and another for materials with the phase transitions. The Lorentzian corner frequencies revealed unusual dependence on temperature and bias voltage, suggesting that their origin is different from the generation - recombination noise in conventional semiconductors. The obtained results are important for proposed applications of antiferromagnetic semiconductors in spintronic devices. They also attest to the power of the noise spectroscopy for monitoring various phase transitions.
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Submitted 13 April, 2021;
originally announced April 2021.
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Beatings of ratchet current magneto-oscillations in GaN-based grating gate structures: manifestation of spin-orbit band splitting
Authors:
P. Sai,
S. O. Potashin,
M. Szola,
D. Yavorskiy,
G. Cywinski,
P. Prystawko,
J. Lusakowski,
S. D. Ganichev,
S. Rumyantsev,
W. Knap,
V. Yu. Kachorovskii
Abstract:
We report on the study of the magnetic ratchet effect in AlGaN/GaN heterostructures superimposed with lateral superlattice formed by dual-grating gate structure. We demonstrate that irradiation of the superlattice with terahertz beam results in the dc ratchet current, which shows giant magneto-oscillations in the regime of Shubnikov de Haas oscillations. The oscillations have the same period and a…
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We report on the study of the magnetic ratchet effect in AlGaN/GaN heterostructures superimposed with lateral superlattice formed by dual-grating gate structure. We demonstrate that irradiation of the superlattice with terahertz beam results in the dc ratchet current, which shows giant magneto-oscillations in the regime of Shubnikov de Haas oscillations. The oscillations have the same period and are in phase with the resistivity oscillations. Remarkably, their amplitude is greatly enhanced as compared to the ratchet current at zero magnetic field, and the envelope of these oscillations exhibits large beatings as a function of the magnetic field. We demonstrate that the beatings are caused by the spin-orbit splitting of the conduction band. We develop a theory which gives a good qualitative explanation of all experimental observations and allows us to extract the spin-orbit splitting constant α_{\rm SO}= 7.5 \pm 1.5 meV \unicode{x212B}. We also discuss how our results are modified by plasmonic effects and show that these effects become more pronounced with decreasing the period of the gating gate structures down to sub-microns.
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Submitted 25 February, 2021;
originally announced February 2021.
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Electrically-Insulating Flexible Films with Quasi-One-Dimensional van-der-Waals Fillers as Efficient Electromagnetic Shields
Authors:
Zahra Barani,
Fariborz Kargar,
Yassamin Ghafouri,
Subhajit Ghosh,
Konrad Godziszewski,
Saba Seyedmahmoudbaraghani,
Yevhen Yashchyshyn,
Grzegorz Cywiński,
Sergey Rumyantsev,
Tina T. Salguero,
Alexander A. Balandin
Abstract:
We report polymer composite films containing fillers comprised of quasi-one-dimensional (1D) van der Waals materials, specifically transition metal trichalcogenides containing 1D structural motifs that enable their exfoliation into bundles of atomic threads. These nanostructures are characterized by extremely large aspect ratios of up to 10^6. The polymer composites with low loadings of quasi-1D T…
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We report polymer composite films containing fillers comprised of quasi-one-dimensional (1D) van der Waals materials, specifically transition metal trichalcogenides containing 1D structural motifs that enable their exfoliation into bundles of atomic threads. These nanostructures are characterized by extremely large aspect ratios of up to 10^6. The polymer composites with low loadings of quasi-1D TaSe3 fillers (below 3 vol. %) revealed excellent electromagnetic interference shielding in the X-band GHz and EHF sub-THz frequency ranges, while remaining DC electrically insulating. The unique electromagnetic shielding characteristics of these films are attributed to effective coupling of the electromagnetic waves to the high-aspect-ratio electrically-conductive TaSe3 atomic-thread bundles even when the filler concentration is below the electrical percolation threshold. These novel films are promising for high-frequency communication technologies, which require electromagnetic shielding films that are flexible, lightweight, corrosion resistant, electrically insulating and inexpensive.
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Submitted 20 January, 2021;
originally announced January 2021.
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Graphene Composites as Efficient Electromagnetic Absorbers in the Extremely High Frequency Band
Authors:
Zahra Barani,
Fariborz Kargar,
Konrad Godziszewski,
Adil Rehman,
Yevhen Yashchyshyn,
Sergey Rumyantsev,
Grzegorz Cywiński,
Wojciech Knap,
Alexander A. Balandin
Abstract:
We report on the synthesis of the epoxy-based composites with graphene fillers and testing their electromagnetic shielding efficiency by the quasi-optic free-space method in the extremely high frequency (EHF) band (220 - 325 GHz). The curing adhesive composites were produced by a scalable technique with a mixture of single-layer and few-layer graphene layers of a few-micron lateral dimensions. It…
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We report on the synthesis of the epoxy-based composites with graphene fillers and testing their electromagnetic shielding efficiency by the quasi-optic free-space method in the extremely high frequency (EHF) band (220 - 325 GHz). The curing adhesive composites were produced by a scalable technique with a mixture of single-layer and few-layer graphene layers of a few-micron lateral dimensions. It was found that the electromagnetic transmission, T, is low even at small concentrations of graphene fillers: T<1% at frequency of 300 GHz for a composite with only 1 wt% of graphene. The main shielding mechanism in composites with the low graphene loading is absorption. The composites of 1 mm thickness and graphene loading of 8 wt% provide excellent electromagnetic shielding of 70 dB in the sub-terahertz EHF frequency with negligible energy reflection to the environment. The developed lightweight adhesive composites with graphene fillers can be used as electromagnetic absorbers in the high-frequency microwave radio relays, microwave remote sensors, millimeter wave scanners, and wireless local area networks.
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Submitted 13 April, 2020;
originally announced April 2020.
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Current Oscillations in Quasi-2D Charge-Density-Wave 1T-TaS2 Devices: Revisiting the "Narrow Band Noise" Concept
Authors:
Adane K. Geremew,
Sergey Rumyantsev,
Roger Lake,
Alexander A. Balandin
Abstract:
We report on current oscillations in quasi two-dimensional (2D) 1T-TaS2 charge-density-wave devices. The MHz-frequency range of the oscillations and the linear dependence of the frequency of the oscillations on the current resemble closely the "narrow band noise," which was often observed in the classical bulk quasi-one-dimensional (1D) trichalcogenide charge-density-wave materials. In bulk quasi-…
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We report on current oscillations in quasi two-dimensional (2D) 1T-TaS2 charge-density-wave devices. The MHz-frequency range of the oscillations and the linear dependence of the frequency of the oscillations on the current resemble closely the "narrow band noise," which was often observed in the classical bulk quasi-one-dimensional (1D) trichalcogenide charge-density-wave materials. In bulk quasi-1D materials, the "narrow band noise" was interpreted as a direct evidence of the charge-density-wave sliding. Despite the similarities, we argue that the nature of the MHz oscillations in quasi-2D 1T-TaS2 is different from the "narrow band noise." Analysis of the biasing conditions and current indicate that the observed oscillations are related to the current instabilities due to the voltage-induced transition from the nearly commensurate to incommensurate charge-density-wave phase.
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Submitted 29 February, 2020;
originally announced March 2020.
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Amplitude and Phase Noise of Magnons
Authors:
Sergey Rumyantsev,
Michael Balinskiy,
Fariborz Kargar,
Alexander Khitun,
Alexander A. Balandin
Abstract:
The low-frequency amplitude and phase noise spectra of magnetization waves, i.e. magnons, was measured in the yttrium iron garnet (YIG) waveguides. This type of noise, which originates from the fluctuations of the physical properties of the YIG crystals, has to be taken into account in the design of YIG-based RF generators and magnonic devices for data processing, sensing and imaging applications.…
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The low-frequency amplitude and phase noise spectra of magnetization waves, i.e. magnons, was measured in the yttrium iron garnet (YIG) waveguides. This type of noise, which originates from the fluctuations of the physical properties of the YIG crystals, has to be taken into account in the design of YIG-based RF generators and magnonic devices for data processing, sensing and imaging applications. It was found that the amplitude noise level of magnons depends strongly on the power level, increasing sharply at the on-set of nonlinear dissipation. The noise spectra of both the amplitude and phase noise have the Lorentzian shape with the characteristic frequencies below 100 Hz.
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Submitted 30 August, 2019;
originally announced September 2019.
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Low-Frequency Noise in Low-Dimensional van der Waals Materials
Authors:
Alexander A. Balandin,
Sergey Rumyantsev
Abstract:
The emergence of graphene and two-dimensional van der Walls materials renewed interest to investigation of the low-frequency noise in the low-dimensional systems. The layered van der Waals materials offers unique opportunities for studying the low-frequency noise owing to the properties controlled by the thickness of these materials, and tunable carrier concentration. In this review, we describe u…
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The emergence of graphene and two-dimensional van der Walls materials renewed interest to investigation of the low-frequency noise in the low-dimensional systems. The layered van der Waals materials offers unique opportunities for studying the low-frequency noise owing to the properties controlled by the thickness of these materials, and tunable carrier concentration. In this review, we describe unusual low-frequency noise phenomena in quasi-2D and quasi-1D van der Waals materials. We also demonstrate that the low-frequency noise spectroscopy is a powerful tool for investigation of the electron transport and charge-density-wave phase transitions in this class of materials.
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Submitted 16 August, 2019;
originally announced August 2019.
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Low-Frequency Electronic Noise in Superlattice and Random-Packed Thin Films of Colloidal Quantum Dots
Authors:
Adane Geremew,
Caroline Qian,
Alex Abelson,
Sergey Rumyantsev,
Fariborz Kargar,
Matt Law,
Alexander A. Balandin
Abstract:
We report measurements of low-frequency electronic noise in ordered superlattice, weakly-ordered and random-packed thin films of 6.5 nm PbSe quantum dots prepared using several different ligand chemistries. For all samples, the normalized noise spectral density of the dark current revealed a Lorentzian component, reminiscent of the generation-recombination noise, superimposed on the 1/f background…
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We report measurements of low-frequency electronic noise in ordered superlattice, weakly-ordered and random-packed thin films of 6.5 nm PbSe quantum dots prepared using several different ligand chemistries. For all samples, the normalized noise spectral density of the dark current revealed a Lorentzian component, reminiscent of the generation-recombination noise, superimposed on the 1/f background (f is the frequency). An activation energy of 0.3 eV was extracted from the temperature dependence of the noise spectra. The noise level in the ordered films was lower than that in the weakly-ordered and random-packed films. A large variation in the magnitude of the noise spectral density was also observed in samples with different ligand treatments. The obtained results are important for application of colloidal quantum dot films in photodetectors.
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Submitted 10 August, 2019;
originally announced August 2019.
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Low Resistivity and High Breakdown Current Density of 10-nm Diameter van der Waals TaSe3 Nanowires by Chemical Vapor Deposition
Authors:
Thomas A. Empante,
Aimee Martinez,
Michelle Wurch,
Yanbing Zhu,
Adane K. Geremew,
Koichi Yamaguchi,
Miguel Isarraraz,
Sergey Rumyantsev,
Evan J. Reed,
Alexander A. Balandin,
Ludwig Bartels
Abstract:
Micron-scale single-crystal nanowires of metallic TaSe3, a material that forms -Ta-Se3-Ta-Se3- stacks separated from one another by a tubular van der Waals (vdW) gap, have been synthesized using chemical vapor deposition (CVD) on a SiO2/Si substrate, in a process compatible with semiconductor industry requirements. Their electrical resistivity was found unaffected by downscaling from the bulk to a…
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Micron-scale single-crystal nanowires of metallic TaSe3, a material that forms -Ta-Se3-Ta-Se3- stacks separated from one another by a tubular van der Waals (vdW) gap, have been synthesized using chemical vapor deposition (CVD) on a SiO2/Si substrate, in a process compatible with semiconductor industry requirements. Their electrical resistivity was found unaffected by downscaling from the bulk to as little as 7 nm in width and height, in striking contrast to the resistivity of copper for the same dimensions. While the bulk resistivity of TaSe3 is substantially higher than that of bulk copper, at the nanometer scale the TaSe3 wires become competitive to similar-sized copper ones. Moreover, we find that the vdW TaSe3 nanowires sustain current densities in excess of 108 A/cm2 and feature an electromigration energy barrier twice that of copper. The results highlight the promise of quasi-one-dimensional transition metal trichalcogenides for electronic interconnect applications and the potential of van der Waals materials for downscaled electronics.
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Submitted 14 March, 2019;
originally announced March 2019.
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Electric Switching of the Charge-Density-Wave and Normal Metallic Phases in Tantalum Disulfide Thin-Film Devices
Authors:
A. Geremew,
S. Rumyantsev,
F. Kargar,
B. Debnath,
A. Nosek,
M. Bloodgood,
M. Bockrath,
T. Salguero,
R. K. Lake,
A. A. Balandin
Abstract:
We report on switching among three charge-density-wave phases - commensurate, nearly commensurate, incommensurate - and the high-temperature normal metallic phase in thin-film 1T-TaS2 devices induced by application of an in-plane electric field. The electric switching among all phases has been achieved over a wide temperature range, from 77 K to 400 K. The low-frequency electronic noise spectrosco…
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We report on switching among three charge-density-wave phases - commensurate, nearly commensurate, incommensurate - and the high-temperature normal metallic phase in thin-film 1T-TaS2 devices induced by application of an in-plane electric field. The electric switching among all phases has been achieved over a wide temperature range, from 77 K to 400 K. The low-frequency electronic noise spectroscopy has been used as an effective tool for monitoring the transitions, particularly the switching from the incommensurate charge-density-wave phase to the normal metal phase. The noise spectral density exhibits sharp increases at the phase transition points, which correspond to the step-like changes in resistivity. Assignment of the phases is consistent with low-field resistivity measurements over the temperature range from 77 K to 600 K. Analysis of the experimental data and calculations of heat dissipation suggest that Joule heating plays a dominant role in the electric-field induced transitions in the tested 1T-TaS2 devices on Si/SiO2 substrates. The possibility of electrical switching among four different phases of 1T-TaS2 is a promising step toward nanoscale device applications. The results also demonstrate the potential of noise spectroscopy for investigating and identifying phase transitions in materials.
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Submitted 14 March, 2019;
originally announced March 2019.
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Low-Frequency Noise Spectroscopy of Charge-Density-Wave Phase Transitions in Vertical Quasi-2D Devices
Authors:
Ruben Salgado,
Amirmahdi Mohammadzadeh,
Fariborz Kargar,
Adane Geremew,
Chun-Yu Huang,
Matthew A. Bloodgood,
Sergey Rumyantsev,
Tina T. Salguero,
Alexander A. Balandin
Abstract:
We report results regarding the electron transport in vertical quasi-2D layered 1T-TaS2 charge-density-wave devices. The low-frequency noise spectroscopy was used as a tool to study changes in the cross-plane electrical characteristics of the quasi-2D material below room temperature. The noise spectral density revealed strong peaks - changing by more than an order-of-magnitude - at the temperature…
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We report results regarding the electron transport in vertical quasi-2D layered 1T-TaS2 charge-density-wave devices. The low-frequency noise spectroscopy was used as a tool to study changes in the cross-plane electrical characteristics of the quasi-2D material below room temperature. The noise spectral density revealed strong peaks - changing by more than an order-of-magnitude - at the temperatures closely matching the electrical resistance steps. Some of the noise peaks appeared below the temperature of the commensurate to nearly-commensurate charge-density-wave transition, possibly indicating the presence of the debated "hidden" phase transitions. These results confirm the potential of the noise spectroscopy for investigations of electron transport and phase transitions in novel materials.
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Submitted 5 January, 2019;
originally announced January 2019.
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Proton-Irradiation-Immune Electronics Implemented with Two-Dimensional Charge-Density-Wave Devices
Authors:
A. Geremew,
F. Kargar,
E. X. Zhang,
S. E. Zhao,
E. Aytan,
M. A. Bloodgood,
T. T. Salguero,
S. Rumyantsev,
A. Fedoseyev,
D. M. Fleetwood,
A. A. Balandin
Abstract:
Proton radiation damage is an important failure mechanism for electronic devices in near-Earth orbits, deep space and high energy physics facilities. Protons can cause ionizing damage and atomic displacements, resulting in device degradation and malfunction. Shielding of electronics increases the weight and cost of the systems but does not eliminate destructive single events produced by energetic…
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Proton radiation damage is an important failure mechanism for electronic devices in near-Earth orbits, deep space and high energy physics facilities. Protons can cause ionizing damage and atomic displacements, resulting in device degradation and malfunction. Shielding of electronics increases the weight and cost of the systems but does not eliminate destructive single events produced by energetic protons. Modern electronics based on semiconductors - even those specially designed for radiation hardness - remain highly susceptible to proton damage. Here we demonstrate that room temperature (RT) charge-density-wave (CDW) devices with quasi-two-dimensional (2D) 1T-TaS2 channels show remarkable immunity to bombardment with 1.8 MeV protons to a fluence of at least 10^14 H+cm^2. Current-voltage I-V characteristics of these 2D CDW devices do not change as a result of proton irradiation, in striking contrast to most conventional semiconductor devices or other 2D devices. Only negligible changes are found in the low-frequency noise spectra. The radiation immunity of these "all-metallic" CDW devices can be attributed to their two-terminal design, quasi-2D nature of the active channel, and high concentration of charge carriers in the utilized CDW phases. Such devices, capable of operating over a wide temperature range, can constitute a crucial segment of future electronics for space, particle accelerator and other radiation environments.
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Submitted 2 January, 2019;
originally announced January 2019.
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The Discrete Noise of Magnons
Authors:
S. Rumyantsev,
M. Balinskiy,
F. Kargar,
A. Khitun,
A. A. Balandin
Abstract:
Magnonics is a rapidly develo** subfield of spintronics, which deals with devices and circuits that utilize spin currents carried by magnons - quanta of spin waves. Magnon current, i.e. spin waves, can be used for information processing, sensing, and other applications. A possibility of using the amplitude and phase of magnons for sending signals via electrical insulators creates conditions for…
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Magnonics is a rapidly develo** subfield of spintronics, which deals with devices and circuits that utilize spin currents carried by magnons - quanta of spin waves. Magnon current, i.e. spin waves, can be used for information processing, sensing, and other applications. A possibility of using the amplitude and phase of magnons for sending signals via electrical insulators creates conditions for avoiding Ohmic losses, and achieving ultra-low power dissipation. Most of the envisioned magnonic logic devices are based on spin wave interference, where the minimum energy per operation is limited by the noise level. The sensitivity and selectivity of magnonic sensors is also limited by the low frequency noise. However, the fundamental question "do magnons make noise?" has not been answered yet. It is not known how noisy magnonic devices are compared to their electronic counterparts. Here we show that the low-frequency noise of magnonic devices is dominated by the random telegraph signal noise rather than 1/f noise - a striking contrast to electronic devices (f is a frequency). We found that the noise level of surface magnons depends strongly on the power level, increasing sharply at the on-set of nonlinear dissipation. The presence of the random telegraph signal noise indicates that the current fluctuations involve random discrete macro events. We anticipate that our results will help in develo** the next generation of magnonic devices for information processing and sensing.
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Submitted 2 October, 2018;
originally announced October 2018.
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Anomalous Characteristics of the Generation - Recombination Noise in Quasi-One-Dimensional Van der Waals Nanoribbons
Authors:
Adane K. Geremew,
Sergey Rumyantsev,
Matthew A. Bloodgood,
Tina T. Salguero,
Alexander A. Balandin
Abstract:
We describe the low-frequency current fluctuations, i.e. electronic noise, in quasi-one-dimensional ZrTe3 van der Waals nanoribbons, which have recently attracted attention owing to their extraordinary high current carrying capacity. Whereas the low-frequency noise spectral density reveals 1/f behavior near room temperature, it is dominated by the Lorentzian bulges of the generation - recombinatio…
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We describe the low-frequency current fluctuations, i.e. electronic noise, in quasi-one-dimensional ZrTe3 van der Waals nanoribbons, which have recently attracted attention owing to their extraordinary high current carrying capacity. Whereas the low-frequency noise spectral density reveals 1/f behavior near room temperature, it is dominated by the Lorentzian bulges of the generation - recombination noise at low temperatures (f is the frequency). Unexpectedly, the corner frequency of the observed Lorentzian peaks shows strong sensitivity to the applied source - drain bias. This dependence on electric field can be explained by the Frenkel-Poole effect in the scenario where the voltage drop happens predominantly on the defects, which block the quasi-1D conduction channels. We also have found that the activation energy of the characteristic frequencies of the G-R noise in quasi-1D ZrTe3 is defined primarily by the temperature dependence of the capture cross-section of the defects rather than by their energy position. These results are important for the application of quasi-1D van der Waals materials in ultimately downscaled electronics.
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Submitted 28 August, 2018;
originally announced August 2018.
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Low-Frequency Noise and Sliding of the Charge Density Waves in Two-Dimensional Materials
Authors:
Guanxiong Liu,
Sergey Rumyantsev,
Matthew. A. Bloodgood,
Tina T. Salguero,
Alexander A. Balandin
Abstract:
There has been a recent renewal of interest in charge-density-wave (CDW) phenomena, primarily driven by the emergence of two-dimensional (2D) layered CDW materials, such as 1T-TaS2, characterized by very high transition temperatures to CDW phases. In the extensively studied classical bulk CDW materials with quasi-1D crystal structure, the charge carrier transport exhibits intriguing sliding behavi…
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There has been a recent renewal of interest in charge-density-wave (CDW) phenomena, primarily driven by the emergence of two-dimensional (2D) layered CDW materials, such as 1T-TaS2, characterized by very high transition temperatures to CDW phases. In the extensively studied classical bulk CDW materials with quasi-1D crystal structure, the charge carrier transport exhibits intriguing sliding behavior, which reveals itself in the frequency domain as "narrowband" and "broadband" noise. Despite the increasing attention on physics of 2D CDWs, there have been few reports of CDW sliding, specifically in quasi-2D rare-earth tritellurides and none on the noise in any of 2D CDW systems. Here we report the results of low-frequency noise (LFN) measurements on 1T-TaS2 thin films - archetypal 2D CDW systems, as they are driven from the nearly commensurate (NC) to incommensurate (IC) CDW phases by voltage and temperature stimuli. We have found that noise in 1T-TaS2 devices has two pronounced maxima at the bias voltages, which correspond to the onset of CDW sliding and the NC-to-IC phase transition. We observed unusual Lorentzian noise features and exceptionally strong noise dependence on electric bias and temperature. We argue that LFN in 2D CDW systems has unique physical origin, different from known fundamental noise types. The specifics of LFN in 2D CDW materials can be explained by invoking the concept of interacting discrete fluctuators in the NC-CDW phase. Noise spectroscopy can serve as a useful tool for understanding electronic transport phenomena in 2D CDW materials characterized by coexistence of different phases and strong CDW pinning.
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Submitted 7 February, 2018;
originally announced February 2018.
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Low-Frequency Electronic Noise in Exfoliated Quasi-1D TaSe3 van Der Waals Nanowires
Authors:
Guanxiong Liu,
Sergey Rumyantsev,
Matthew A. Bloodgood,
Tina T. Salguero,
Michael Shur,
Alexander A. Balandin
Abstract:
We report results of investigation of the low-frequency electronic excess noise in quasi-1D nanowires of TaSe3 capped with quasi-2D h-BN layers. Semi-metallic TaSe3 is a quasi-1D van der Waals material with exceptionally high breakdown current density. It was found that TaSe3 nanowires have lower levels of the normalized noise spectral density, compared to carbon nanotubes and graphene. The temper…
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We report results of investigation of the low-frequency electronic excess noise in quasi-1D nanowires of TaSe3 capped with quasi-2D h-BN layers. Semi-metallic TaSe3 is a quasi-1D van der Waals material with exceptionally high breakdown current density. It was found that TaSe3 nanowires have lower levels of the normalized noise spectral density, compared to carbon nanotubes and graphene. The temperature-dependent measurements revealed that the low-frequency electronic 1/f noise becomes the 1/f^2-type as temperature increases to about 400 K, suggesting the onset of electromigration (f is the frequency). Using the Dutta- Horn random fluctuation model of the electronic noise in metals we determined that the noise activation energy for quasi-1D TaSe3 nanowires is approximately E_P=1.0 eV. In the framework of the empirical noise model for metallic interconnects, the extracted activation energy, related to electromigration, is E_A=0.88 eV, consistent with that for Cu and Al interconnects. Our results shed light on the physical mechanism of low-frequency 1/f noise in quasi-1D van der Waals semi-metals and suggest that such material systems have potential for ultimately downscaled local interconnect applications.
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Submitted 16 October, 2016;
originally announced October 2016.
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Gas Sensing with h-BN Capped MoS2 Heterostructure Thin Film Transistors
Authors:
G. Liu,
S. L. Rumyantsev,
C. Jiang,
M. S. Shur,
A. A. Balandin
Abstract:
We have demonstrated selective gas sensing with molybdenum disulfide (MoS2) thin films transistors capped with a thin layer of hexagonal boron nitride (h-BN). The resistance change was used as a sensing parameter to detect chemical vapors such as ethanol, acetonitrile, toluene, chloroform and methanol. It was found that h-BN dielectric passivation layer does not prevent gas detection via changes i…
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We have demonstrated selective gas sensing with molybdenum disulfide (MoS2) thin films transistors capped with a thin layer of hexagonal boron nitride (h-BN). The resistance change was used as a sensing parameter to detect chemical vapors such as ethanol, acetonitrile, toluene, chloroform and methanol. It was found that h-BN dielectric passivation layer does not prevent gas detection via changes in the source-drain current in the active MoS2 thin film channel. The use of h-BN cap layers (thickness H=10 nm) in the design of MoS2 thin film gas sensors improves device stability and prevents device degradation due to environmental and chemical exposure. The obtained results are important for applications of van der Waals materials in chemical and biological sensing.
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Submitted 1 July, 2015;
originally announced July 2015.
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Suppression of 1/f Noise in Near-Ballistic h-BN-Graphene-h-BN Heterostructure Field-Effect Transistors
Authors:
Maxim A. Stolyarov,
Guanxiong Liu,
Sergey L. Rumyantsev,
Michael Shur,
Alexander A. Balandin
Abstract:
We have investigated low-frequency 1/f noise in the boron nitride - grapheme - boron nitride heterostructure field - effect transistors on Si/SiO2 substrates (f is a frequency). The device channel was implemented with a single layer graphene encased between two layers of hexagonal boron nitride. The transistors had the charge carrier mobility in the range from 30000 to 36000 cm2/Vs at room tempera…
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We have investigated low-frequency 1/f noise in the boron nitride - grapheme - boron nitride heterostructure field - effect transistors on Si/SiO2 substrates (f is a frequency). The device channel was implemented with a single layer graphene encased between two layers of hexagonal boron nitride. The transistors had the charge carrier mobility in the range from 30000 to 36000 cm2/Vs at room temperature. It was established that the noise spectral density normalized to the channel area in such devices can be suppressed to 5 x 10^-9 μm2 Hz^-1, which is a factor of x5 - x10 lower than that in non-encapsulated graphene devices on Si/SiO2. The physical mechanism of noise suppression was attributed to screening of the charge carriers in the channel from traps in SiO2 gate dielectric and surface defects. The obtained results are important for the electronic and optoelectronic applications of graphene.
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Submitted 12 June, 2015;
originally announced June 2015.
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Low-Frequency 1/f Noise in MoS2 Thin-Film Transistors: Comparison of Single and Multilayer Structures
Authors:
S. L. Rumyantsev,
C. Jiang,
R. Samnakay,
M. S. Shur,
A. A. Balandin
Abstract:
We report on the transport and low-frequency noise measurements of MoS2 thin-film transistors with "thin" (2-3 atomic layers) and "thick" (15-18 atomic layers) channels. The back-gated transistors made with the relatively thick MoS2 channels have advantages of the higher electron mobility and lower noise level. The normalized noise spectral density of the low-frequency 1/f noise in "thick" MoS2 tr…
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We report on the transport and low-frequency noise measurements of MoS2 thin-film transistors with "thin" (2-3 atomic layers) and "thick" (15-18 atomic layers) channels. The back-gated transistors made with the relatively thick MoS2 channels have advantages of the higher electron mobility and lower noise level. The normalized noise spectral density of the low-frequency 1/f noise in "thick" MoS2 transistors is of the same level as that in graphene. The MoS2 transistors with the atomically thin channels have substantially higher noise levels. It was established that, unlike in graphene devices, the noise characteristics of MoS2 transistors with "thick" channels (15-18 atomic planes) could be described by the McWhorter model. Our results indicate that the channel thickness optimization is crucial for practical applications of MoS2 thin-film transistors.
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Submitted 5 March, 2015;
originally announced March 2015.
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High-Temperature Performance of MoS2 Thin-Film Transistors: DC and Pulse Current-Voltage Characteristics
Authors:
C. Jiang,
S. L. Rumyantsev,
R. Samnakay,
M. S. Shur,
A. A. Balandin
Abstract:
The measurements of the high - temperature current - voltage characteristics of MoS2 thin - film transistors show that the devices remain functional to temperatures of at least as high as 500 K. The temperature increase results in decreased threshold voltage and mobility. The comparison of the DC and pulse measurements shows that the DC sub - linear and super - linear output characteristics of MoS…
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The measurements of the high - temperature current - voltage characteristics of MoS2 thin - film transistors show that the devices remain functional to temperatures of at least as high as 500 K. The temperature increase results in decreased threshold voltage and mobility. The comparison of the DC and pulse measurements shows that the DC sub - linear and super - linear output characteristics of MoS2 thin - films devices result from the Joule heating and the interplay of the threshold voltage and mobility temperature dependences. At temperatures above 450 K, an intriguing phenomenon of the "memory step" - a kink in the drain current - occurs at zero gate voltage irrespective of the threshold voltage value. The memory step effect was attributed to the slow relaxation processes in thin films similar to those in graphene and electron glasses. The obtained results suggest new applications for MoS2 thin - film transistors in extreme - temperature electronics and sensors.
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Submitted 20 December, 2014;
originally announced December 2014.
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Selective Chemical Vapor Sensing with Few-Layer MoS2 Thin-Film Transistors
Authors:
R. Samnakay,
C. Jiang,
S. L. Rumyantsev,
M. S. Shur,
A. A. Balandin
Abstract:
We demonstrated selective gas sensing with MoS2 thin-film transistors using the change in the channel conductance, characteristic transient time and low-frequency current fluctuations as the sensing parameters. The back-gated MoS2 thin-film field-effect transistors were fabricated on Si/SiO2 substrates and intentionally aged for a month to verify reliability and achieve better current stability. T…
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We demonstrated selective gas sensing with MoS2 thin-film transistors using the change in the channel conductance, characteristic transient time and low-frequency current fluctuations as the sensing parameters. The back-gated MoS2 thin-film field-effect transistors were fabricated on Si/SiO2 substrates and intentionally aged for a month to verify reliability and achieve better current stability. The same devices with the channel covered by 10 nm of Al2O3 were used as reference samples. The exposure to ethanol, acetonitrile, toluene, chloroform, and methanol vapors results in drastic changes in the source-drain current. The current can increase or decrease by more than two-orders of magnitude depending on the analyte. The reference devices with coated channel did not show any response. It was established that transient time of the current change and the normalized spectral density of the low-frequency current fluctuations can be used as additional sensing parameters for selective gas detection with thin-film MoS2 transistors.
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Submitted 19 November, 2014;
originally announced November 2014.
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Low-Frequency 1/f Noise in Molybdenum Disulfide Transistors
Authors:
J. Renteria,
R. Samnakay,
S. L. Rumyantsev,
P. Goli,
M. S. Shur,
A. A. Balandin
Abstract:
We report on the results of the low-frequency (1/f, where f is frequency) noise measurements in MoS2 field-effect transistors revealing the relative contributions of the MoS2 channel and Ti/Au contacts to the overall noise level. The investigation of the 1/f noise was performed for both as fabricated and aged transistors. It was established that the McWhorter model of the carrier number fluctuatio…
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We report on the results of the low-frequency (1/f, where f is frequency) noise measurements in MoS2 field-effect transistors revealing the relative contributions of the MoS2 channel and Ti/Au contacts to the overall noise level. The investigation of the 1/f noise was performed for both as fabricated and aged transistors. It was established that the McWhorter model of the carrier number fluctuations describes well the 1/f noise in MoS2 transistors, in contrast to what is observed in graphene devices. The trap densities extracted from the 1/f noise data for MoS2 transistors, are 1.5 x 10^19 eV-1cm-3 and 2 x 10^20 eV-1cm-3 for the as fabricated and aged devices, respectively. It was found that the increase in the noise level of the aged MoS2 transistors is due to the channel rather than the contact degradation. The obtained results are important for the proposed electronic applications of MoS2 and other van der Waals materials.
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Submitted 24 December, 2013;
originally announced December 2013.
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Performance Limits for Field Effect Transistors as Terahertz Detectors
Authors:
V. Yu. Kachorovskii,
S. L. Rumyantsev,
W. Knap,
M. Shur
Abstract:
We present estimates of the performance limits of terahertz detectors based on the field effect transistors (FET) in the regime of broadband detection. The maximal responsivity is predicted for short-channel FETs in the subthreshold regime. We also calculate the conversion efficiency Q of the device defined as the ratio of the power dissipated by radiation-induced dc current to the THz dissipated…
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We present estimates of the performance limits of terahertz detectors based on the field effect transistors (FET) in the regime of broadband detection. The maximal responsivity is predicted for short-channel FETs in the subthreshold regime. We also calculate the conversion efficiency Q of the device defined as the ratio of the power dissipated by radiation-induced dc current to the THz dissipated power. We show that Q has an absolute maximum as a function of two variables: the power and the frequency of the incoming radiation. The maximal value of Q is on the order of 10%
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Submitted 28 February, 2013;
originally announced February 2013.
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Reduction of 1/f Noise in Graphene after Electron-Beam Irradiation
Authors:
Md. Zahid Hossain,
Sergey Rumyantsev,
Michael S. Shur,
Alexander A. Balandin
Abstract:
We investigated the effect of the electron-beam irradiation on the level of the low-frequency 1/f noise in graphene devices. It was found that 1/f noise in graphene reveals an anomalous characteristic - it reduces with increasing concentration of defects induced by irradiation. The increased amount of structural disorder in graphene under irradiation was verified with micro-Raman spectroscopy. The…
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We investigated the effect of the electron-beam irradiation on the level of the low-frequency 1/f noise in graphene devices. It was found that 1/f noise in graphene reveals an anomalous characteristic - it reduces with increasing concentration of defects induced by irradiation. The increased amount of structural disorder in graphene under irradiation was verified with micro-Raman spectroscopy. The bombardment of graphene devices with 20-keV electrons reduced the noise spectral density, S(I)/I^2 (I is the source-drain current) by an order-of magnitude at the radiation dose of 104 micro-C/cm^2. Our theoretical considerations suggest that the observed noise reduction after irradiation can be more readily explained if the mechanism of 1/f noise in graphene is related to the electron-mobility fluctuations. The obtained results are important for the proposed graphene applications in analog, mixed-signal and radio-frequency systems, integrated circuit interconnects and sensors.
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Submitted 21 November, 2012;
originally announced November 2012.
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Direct Probing of 1/f Noise Origin with Graphene Multilayers: Surface vs. Volume
Authors:
Guanxiong Liu,
Sergey Rumyantsev,
Michael S. Shur,
Alexander A. Balandin
Abstract:
Low-frequency noise with the spectral density S(f)~1/f^g (f is the frequency and g~1) is a ubiquitous phenomenon, which hampers operation of many devices and circuits. A long-standing question of particular importance for electronics is whether 1/f noise is generated on the surface of electrical conductors or inside their volumes. Using high-quality graphene multilayers we were able to directly ad…
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Low-frequency noise with the spectral density S(f)~1/f^g (f is the frequency and g~1) is a ubiquitous phenomenon, which hampers operation of many devices and circuits. A long-standing question of particular importance for electronics is whether 1/f noise is generated on the surface of electrical conductors or inside their volumes. Using high-quality graphene multilayers we were able to directly address this fundamental problem of the noise origin. Unlike the thickness of metal or semiconductor films, the thickness of graphene multilayers can be continuously and uniformly varied all the way down to a single atomic layer of graphene - the actual surface. We found that 1/f noise becomes dominated by the volume noise when the thickness exceeds ~7 atomic layers (~2.5 nm). The 1/f noise is the surface phenomenon below this thickness. The obtained results are important for continuous downscaling of conventional electronics and for the proposed graphene applications in sensors and communications.
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Submitted 21 November, 2012;
originally announced November 2012.
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Selective Gas Sensing with a Single Pristine Graphene Transistor
Authors:
Sergey Rumyantsev,
Guanxiong Liu,
Michael S. Shur,
Radislav A. Potyrailo,
Alexander A. Balandin
Abstract:
We show that vapors of different chemicals produce distinguishably different effects on the low-frequency noise spectra of graphene. It was found in a systematic study that some gases change the electrical resistance of graphene devices without changing their low-frequency noise spectra while other gases modify the noise spectra by inducing Lorentzian components with distinctive features. The char…
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We show that vapors of different chemicals produce distinguishably different effects on the low-frequency noise spectra of graphene. It was found in a systematic study that some gases change the electrical resistance of graphene devices without changing their low-frequency noise spectra while other gases modify the noise spectra by inducing Lorentzian components with distinctive features. The characteristic frequency fc of the Lorentzian noise bulges in graphene devices is different for different chemicals and varies from fc=10 - 20 Hz to fc=1300 - 1600 Hz for tetrahydrofuran and chloroform vapors, respectively. The obtained results indicate that the low-frequency noise in combination with other sensing parameters can allow one to achieve the selective gas sensing with a single pristine graphene transistor. Our method of gas sensing with graphene does not require graphene surface functionalization or fabrication of an array of the devices with each tuned to a certain chemical.
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Submitted 23 April, 2012;
originally announced April 2012.
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Graphene Thickness-Graded Transistors with Reduced Low-Frequency 1/f Noise
Authors:
Guanxiong Liu,
Sergey Rumyantsev,
Michael Shur,
Alexander A. Balandin
Abstract:
We demonstrate graphene thickness-graded transistors with high electron mobility and low 1/f noise (f is a frequency). The device channel is implemented with few-layer graphene with the thickness varied from a single layer in the middle to few-layers at the source and drain contacts. It was found that such devices have electron mobility comparable to the reference single-layer graphene devices whi…
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We demonstrate graphene thickness-graded transistors with high electron mobility and low 1/f noise (f is a frequency). The device channel is implemented with few-layer graphene with the thickness varied from a single layer in the middle to few-layers at the source and drain contacts. It was found that such devices have electron mobility comparable to the reference single-layer graphene devices while producing lower noise levels. The metal do** of graphene and difference in the electron density of states between the single-layer and few-layer graphene cause the observed noise reduction. The results shed light on the noise origin in graphene.
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Submitted 24 December, 2011;
originally announced December 2011.
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Low-Frequency Current Fluctuations in Graphene-like Exfoliated Thin-Films of Topological Insulators
Authors:
M. Z. Hossain,
S. L. Rumyantsev,
K. M. F. Shahil,
D. Teweldebrhan,
M. Shur,
A. A. Balandin
Abstract:
We report on the low-frequency current fluctuations and electronic noise in thin-films made of bismuth selenide topological insulators. The films were prepared via the graphene-like mechanical exfoliation and used as the current conducting channels in the four- and two-contact devices. Analysis of the resistance dependence on the film thickness indicates that the surface contribution to conductanc…
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We report on the low-frequency current fluctuations and electronic noise in thin-films made of bismuth selenide topological insulators. The films were prepared via the graphene-like mechanical exfoliation and used as the current conducting channels in the four- and two-contact devices. Analysis of the resistance dependence on the film thickness indicates that the surface contribution to conductance is dominant in our samples. It was established that the current fluctuations have the noise spectrum close to the pure 1/f in the frequency range from 1 to 10 kHz (f is the frequency). The relative noise amplitude S/I^2 for the examined films was increasing from ~5x10^-8 to 5x10^-6 (1/Hz) as the resistance of the channels varied from ~10^3 to 10^5 Ohms. The obtained noise data is important for understanding electron transport through the surface and volume of topological insulators, and proposed applications of this class of materials.
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Submitted 4 February, 2011;
originally announced February 2011.
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Observation of the "Memory Steps" in Graphene at Elevated Temperatures
Authors:
Sergey L. Rumyantsev,
Guanxiong Liu,
Michael S. Shur,
Alexander A. Balandin
Abstract:
We found that the current-voltage characteristics of the single-layer graphene field-effect transistors exhibit an intriguing feature - an abrupt change of the current near zero gate bias at elevated temperatures T > 500 K. The strength of the effect - referred to as the "memory step" by analogy with the "memory dips" - known phenomenon in electron glasses - depends on the rate of the voltage swee…
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We found that the current-voltage characteristics of the single-layer graphene field-effect transistors exhibit an intriguing feature - an abrupt change of the current near zero gate bias at elevated temperatures T > 500 K. The strength of the effect - referred to as the "memory step" by analogy with the "memory dips" - known phenomenon in electron glasses - depends on the rate of the voltage sweep. The slower the sweep - the more pronounced is the step in the current. Despite differences in examined graphene transistor characteristics, the "memory step" always appears near zero gate bias. The effect is reproducible and preserved after device aging. A similar feature has been previously observed in electronic glasses albeit at cryogenic temperatures and with opposite dependence on the rate of the voltage sweep. The observed "memory step" can be related to the slow relaxation processes in graphene. This new characteristic of electron transport in graphene can be used for applications in high-temperature sensors and switches.
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Submitted 18 January, 2011;
originally announced January 2011.
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1/f Noise in Thin Films of Topological Insulator Materials
Authors:
M. Zahid Hossain,
Sergey L. Rumyantsev,
Desalegne Teweldebrhan,
Khan M. F. Shahil,
Michael Shur,
Alexander A. Balandin
Abstract:
We report results of investigation of the low-frequency excess noise in device channels made from topological insulators - a new class of materials with a bulk insulating gap and conducting surface states. The thin-film bismuth selenide samples were prepared by the "graphene-like" mechanical exfoliation from bulk crystals. The fabricated four-contact devices had linear current - voltage characteri…
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We report results of investigation of the low-frequency excess noise in device channels made from topological insulators - a new class of materials with a bulk insulating gap and conducting surface states. The thin-film bismuth selenide samples were prepared by the "graphene-like" mechanical exfoliation from bulk crystals. The fabricated four-contact devices had linear current - voltage characteristics in the low-bias regime. The current fluctuations had the noise spectral density proportional to 1/f for the frequency f below 10 kHz. The noise spectral density followed the quadratic dependence on the drain - source current. The obtained data is important for planning transport experiments with topological insulators. We suggest that achieving the pure topological insulator phase with the current conduction through the "protected" surface states can lead to noise reduction via suppression of certain scattering mechanisms.
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Submitted 3 October, 2010;
originally announced October 2010.
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Electrical and Noise Characteristics of Graphene Field-Effect Transistors: Ambient Effects and Noise Sources
Authors:
S. Rumyantsev,
G. Liu,
W. Stillman,
M. Shur,
A. A. Balandin
Abstract:
We fabricated a large number of single and bilayer graphene transistors and carried out a systematic experimental study of their low-frequency noise characteristics. A special attention was given to determining the dominant noise sources in these devices and the effect of aging on the current-voltage and noise characteristics. The analysis of the noise spectral density dependence on the area of gr…
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We fabricated a large number of single and bilayer graphene transistors and carried out a systematic experimental study of their low-frequency noise characteristics. A special attention was given to determining the dominant noise sources in these devices and the effect of aging on the current-voltage and noise characteristics. The analysis of the noise spectral density dependence on the area of graphene channel showed that the dominant contributions to the low-frequency electronic noise come from the graphene layer itself rather than from the contacts. Aging of graphene transistors due to exposure to ambient for over a month resulted in substantially increased noise attributed to the decreasing mobility of graphene and increasing contact resistance. The noise spectral density in both single and bilayer graphene transistors either increased with deviation from the charge neutrality point or depended weakly on the gate bias. This observation confirms that the low-frequency noise characteristics of graphene transistors are qualitatively different from those of conventional silicon metal-oxide-semiconductor field-effect transistors.
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Submitted 17 August, 2010;
originally announced August 2010.
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Terahertz Response of Field-Effect Transistors in Saturation Regime
Authors:
T. A. Elkhatib,
V. Yu. Kachorovskii,
W. J. Stillman,
S. Rumyantsev,
X. -C. Zhang,
M. S. Shur
Abstract:
We report on the broadband THz response of InGaAs/GaAs HEMTs operating at 1.63 THz and room temperature deep in the saturation regime. We demonstrate that responses show linear increase with drain-to-source voltage (or drain bias current) and reach very high values up to 170V/W. We also develop a phenomenological theory valid both in the ohmic and in the saturation regimes.
We report on the broadband THz response of InGaAs/GaAs HEMTs operating at 1.63 THz and room temperature deep in the saturation regime. We demonstrate that responses show linear increase with drain-to-source voltage (or drain bias current) and reach very high values up to 170V/W. We also develop a phenomenological theory valid both in the ohmic and in the saturation regimes.
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Submitted 21 April, 2010;
originally announced April 2010.
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Low-noise top-gate graphene transistors
Authors:
G. Liu,
W. Stillman,
S. Rumyantsev,
Q. Shao,
M. Shur,
A. A. Balandin
Abstract:
We report results of experimental investigation of the low-frequency noise in the top-gate graphene transistors. The back-gate graphene devices were modified via addition of the top gate separated by 20 nm of HfO2 from the single-layer graphene channels. The measurements revealed low flicker noise levels with the normalized noise spectral density close to 1/f (f is the frequency) and Hooge param…
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We report results of experimental investigation of the low-frequency noise in the top-gate graphene transistors. The back-gate graphene devices were modified via addition of the top gate separated by 20 nm of HfO2 from the single-layer graphene channels. The measurements revealed low flicker noise levels with the normalized noise spectral density close to 1/f (f is the frequency) and Hooge parameter below 2 x 10^-3. The analysis of the noise spectral density dependence on the top and bottom gate biases helped us to elucidate the noise sources in these devices and develop a strategy for the electronic noise reduction. The obtained results are important for all proposed graphene applications in electronics and sensors.
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Submitted 23 August, 2009;
originally announced August 2009.
