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X-ray induced grain structure dynamics in Bi2Se3
Authors:
Kento Katagiri,
Bernard Kozioziemski,
Eric Folsom,
Yifan Wang,
Karen Appel,
Philip K. Cook,
Jon Eggert,
Sebastian Göde,
Marylesa Howard,
Sungwon Kim,
Mikako Matsuda,
Motoaki Nakatsutsumi,
Martin M. Nielsen,
Henning F. Poulsen,
Frank Seiboth,
Hugh Simons,
Bihan Wang,
Wenge Yang,
Ulf Zastrau,
Hyunjung Kim,
Leora E. Dresselhaus-Marais
Abstract:
Grain rotation in crystals often results in coarsening or refinement of the grains that modify the mechanical and thermal properties of materials. While many studies have explored how externally applied stress and temperature drive grain structure dynamics in nano-polycrystalline materials, the analogous studies on colossal grains have been limited, especially in the absence of external force. In…
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Grain rotation in crystals often results in coarsening or refinement of the grains that modify the mechanical and thermal properties of materials. While many studies have explored how externally applied stress and temperature drive grain structure dynamics in nano-polycrystalline materials, the analogous studies on colossal grains have been limited, especially in the absence of external force. In this work, we used X-ray free electron laser pulses to irradiate single-crystalline bismuth selenide (Bi2Se3) and observed grain boundary formation and subsequent grain rotation in response to the X-ray radiation. Our observations with simultaneous X-ray diffraction and transmission X-ray microscopy demonstrate how intense X-ray radiation can rapidly change grain morphologies of initially single-crystalline material.
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Submitted 12 March, 2024;
originally announced March 2024.
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Dark-Field X-ray Microscopy for 2D and 3D imaging of Microstructural Dynamics at the European X-ray Free Electron Laser
Authors:
Sara J. Irvine,
Kento Katagiri,
Trygve M. Ræder,
Darshan Chalise,
Dayeeta Pal,
Jade I. Stanton,
Gabriele Ansaldi,
Ulrike Boesenberg,
Felix Brauße,
Jon H. Eggert,
Lichao Fang,
Eric Folsom,
Jörg Hallmann,
Morten Haubro,
Theodor S. Holstad,
Anders Madsen,
Johannes Möller,
Martin M. Nielsen,
Henning F. Poulsen,
Jan-Etienne Pudel,
Angel Rodriguez-Fernandez,
Frank Schoofs,
Frank Seiboth,
Yifan Wang,
Jo Wonhyuk
, et al. (4 additional authors not shown)
Abstract:
Dark field X-ray microscopy (DXFM) has enabled experiments to visualize microstructural distortions in bulk crystals. Using the femtosecond X-ray pulses generated by X-ray free-electron lasers (XFEL), DFXM can achieve ~1-um spatial resolution and <100 fs time resolution simultaneously. In this paper, we present the first ultrafast DFXM measurements at the European XFEL. In this work, we demonstrat…
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Dark field X-ray microscopy (DXFM) has enabled experiments to visualize microstructural distortions in bulk crystals. Using the femtosecond X-ray pulses generated by X-ray free-electron lasers (XFEL), DFXM can achieve ~1-um spatial resolution and <100 fs time resolution simultaneously. In this paper, we present the first ultrafast DFXM measurements at the European XFEL. In this work, we demonstrate DFXM of laser-induced phonon wavepackets propagating through dislocations inside a diamond single crystal. In addition to demonstrating this new capability, we present two new DFXM scanning techniques for XFEL applications, 3D and axial-strain scans with sub-μm spatial resolution. With this progress to XFEL DFXM, we discuss new opportunities to study multi-timescale spatio-temporal dynamics of defects, strain waves, and other localized phenomena deep inside crystals.
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Submitted 7 November, 2023;
originally announced November 2023.
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Disentangling the Evolution of Electrons and Holes in photoexcited ZnO nanoparticles
Authors:
Christopher J. Milne,
Natalia Nagornova,
Thomas Pope,
Hui-Yuan Chen,
Thomas Rossi,
Jakub Szlachetko,
Wojciech Gawelda,
Alexander Britz,
Tim B. van Drie,
Leonardo Sala,
Simon Ebner,
Tetsuo Katayama,
Stephen H. Southworth,
Gilles Doumy,
Anne Marie March,
C. Stefan Lehmann,
Melanie Mucke,
Denys Iablonskyi,
Yoshiaki Kumagai,
Gregor Knopp,
Koji Motomura,
Tadashi Togashi,
Shigeki Owada,
Makina Yabashi,
Martin M. Nielsen
, et al. (5 additional authors not shown)
Abstract:
The evolution of charge carriers in photoexcited room temperature ZnO nanoparticles in solution is investigated using ultrafast ultraviolet photoluminescence spectroscopy, ultrafast Zn K-edge absorption spectroscopy and ab-initio molecular dynamics (MD) simulations. The photoluminescence is excited at 4.66 eV, well above the band edge, and shows that electron cooling in the conduction band and exc…
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The evolution of charge carriers in photoexcited room temperature ZnO nanoparticles in solution is investigated using ultrafast ultraviolet photoluminescence spectroscopy, ultrafast Zn K-edge absorption spectroscopy and ab-initio molecular dynamics (MD) simulations. The photoluminescence is excited at 4.66 eV, well above the band edge, and shows that electron cooling in the conduction band and exciton formation occur in <500 fs, in excellent agreement with theoretical predictions. The X-ray absorption measurements, obtained upon excitation close to the band edge at 3.49 eV, are sensitive to the migration and trap** of holes. They reveal that the 2 ps transient largely reproduces the previously reported transient obtained at 100 ps time delay in synchrotron studies. In addition, the X-ray absorption signal is found to rise in ~1.4 ps, which we attribute to the diffusion of holes through the lattice prior to their trap** at singly-charged oxygen vacancies. Indeed, the MD simulations show that impulsive trap** of holes induces an ultrafast expansion of the cage of Zn atoms in <200 fs, followed by an oscillatory response at a frequency of ~100 cm-1, which corresponds to a phonon mode of the system involving the Zn sub-lattice.
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Submitted 6 October, 2023;
originally announced October 2023.
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Real-time imaging of acoustic waves in bulk materials with X-ray microscopy
Authors:
Theodor S. Holstad,
Leora E. Dresselhaus-Marais,
Trygve Magnus Ræder,
Bernard Kozioziemski,
Tim van Driel,
Matthew Seaberg,
Eric Folsom,
Jon H. Eggert,
Erik Bergbäck Knudsen,
Martin Meedom Nielsen,
Hugh Simons,
Kristoffer Haldrup,
Henning Friis Poulsen
Abstract:
Materials modelling and processing require experiments to visualize and quantify how external excitations drive the evolution of deep subsurface structure and defects that determine properties. Today, 3D movies with ~100-nm resolution of crystalline structure are regularly acquired in minutes to hours using X-ray diffraction based imaging. We present an X-ray microscope that improves this time res…
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Materials modelling and processing require experiments to visualize and quantify how external excitations drive the evolution of deep subsurface structure and defects that determine properties. Today, 3D movies with ~100-nm resolution of crystalline structure are regularly acquired in minutes to hours using X-ray diffraction based imaging. We present an X-ray microscope that improves this time resolution to <100 femtoseconds, with images attainable even from a single X-ray pulse. Using this, we resolve the propagation of 18-km/s acoustic waves in mm-sized diamond crystals, and demonstrate how mechanical energy thermalizes from picosecond to microsecond timescales. Our approach unlocks a vast range of new experiments of materials phenomena with intricate structural dynamics at ultrafast timescales.
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Submitted 14 November, 2022; v1 submitted 2 November, 2022;
originally announced November 2022.
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Simultaneous Bright- and Dark-Field X-ray Microscopy at X-ray Free Electron Lasers
Authors:
Leora E. Dresselhaus-Marais,
Bernard Kozioziemski,
Theodor S. Holstad,
Trygve Magnus Ræder,
Matthew Seaberg,
Daewoong Nam,
Sangsoo Kim,
Sean Breckling,
Seonghyuk Choi,
Matthieu Chollet,
Philip K. Cook,
Eric Folsom,
Eric Galtier,
Arnulfo Gonzalez,
Tais Gorhover,
Serge Guillet,
Kristoffer Haldrup,
Marylesa Howard,
Kento Katagiri,
Seonghan Kim,
Sunam Kim,
Sungwon Kim,
Hyunjung Kim,
Erik Bergback Knudsen,
Stephan Kuschel
, et al. (18 additional authors not shown)
Abstract:
The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the str…
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The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, Dark Field X-ray Microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the $10^{12}$ photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics.
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Submitted 5 September, 2023; v1 submitted 15 October, 2022;
originally announced October 2022.
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X-ray Free Electron Laser based Dark-Field X-ray Microscopy
Authors:
Theodor Secanell Holstad,
Trygve Magnus Raeder,
Mads Allerup Carlsen,
Erik Bergback Knudsen,
Leora Dresselhaus-Marais,
Kristoffer Haldrup,
Hugh Simons,
Martin Meedom Nielsen,
Henning Friis Poulsen
Abstract:
Dark-field X-ray microscopy (DFXM) is a nondestructive full-field imaging technique providing three dimensional map** of microstructure and local strain fields in deeply embedded crystalline elements. This is achieved by placing an objective lens in the diffracted beam, giving a magnified projection image. So far, the method has been applied with a time resolution of milliseconds to hours. In th…
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Dark-field X-ray microscopy (DFXM) is a nondestructive full-field imaging technique providing three dimensional map** of microstructure and local strain fields in deeply embedded crystalline elements. This is achieved by placing an objective lens in the diffracted beam, giving a magnified projection image. So far, the method has been applied with a time resolution of milliseconds to hours. In this work, we consider the feasibility of DFXM at the picosecond time scale using an X-ray free electron laser source and a pump-probe scheme. We combine thermomechanical strain wave simulations with geometrical optics and wavefront propagation optics to simulate DFXM images of phonon dynamics in a diamond single crystal. Using the specifications of the XCS instrument at the Linac Coherent Light Source (LCLS) as an example results in simulated DFXM images clearly showing the propagation of a strain wave.
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Submitted 2 November, 2021;
originally announced November 2021.
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Aligning tetracyanoplatinate thin films
Authors:
Christian Rein,
Jens W. Andreasen,
Martin M. Nielsen,
Morten Christensen
Abstract:
By using a zone-casting derivative method it is possible to create well-aligned 200 nm thin films of tetracyano platinate crystal wires, which cover more than 50% of the surface of the substrate. The aligned crystal wires deviate only slightly from the casting direction and can each exceed 100 um in length. Grazing incidence X-ray diffraction shows a 3.5 Å periodicity corresponding to the intracha…
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By using a zone-casting derivative method it is possible to create well-aligned 200 nm thin films of tetracyano platinate crystal wires, which cover more than 50% of the surface of the substrate. The aligned crystal wires deviate only slightly from the casting direction and can each exceed 100 um in length. Grazing incidence X-ray diffraction shows a 3.5 Å periodicity corresponding to the intrachain Pt-Pt distance found in single crystals and a 110 (crystal) orientation along the surface normal.
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Submitted 23 June, 2018;
originally announced June 2018.
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Ge(001)-(2 1 0 3)-Pb <-> (2 1 0 6)-Pb: low-temperature two-dimensional phase transition
Authors:
O. Bunk,
M. M. Nielsen,
J. H. Zeysing,
G. Falkenberg,
F. Berg-Rasmussen,
M. Nielsen,
C. Kumpf,
Y. Su,
R. Feidenhans'l,
R. L. Johnson
Abstract:
The Ge(001)-(2 1 0 3)-Pb surface reconstruction with a lead coverage of 5/3 monolayer is on the borderline between the low-coverage covalently-bonded and high-coverage metallic lead overlayers. This gives rise to an unusual low-temperature phase transition with concomitant changes in the bonding configuration. Both the room-temperature and low-temperature phases of this system were investigated…
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The Ge(001)-(2 1 0 3)-Pb surface reconstruction with a lead coverage of 5/3 monolayer is on the borderline between the low-coverage covalently-bonded and high-coverage metallic lead overlayers. This gives rise to an unusual low-temperature phase transition with concomitant changes in the bonding configuration. Both the room-temperature and low-temperature phases of this system were investigated by surface x-ray diffraction using synchrotron radiation. The room-temperature Ge(001)-(2 1 0 3) phase is best described by a model with dynamically flip** germanium dimers underneath a distorted Pb(111) overlayer with predominantly metallic properties. In the low-temperature Ge(001)-(2 1 0 6) phase the dimers are static and the interaction between adsorbate and substrate and within the adsorbate is stronger than at room temperature. These results suggest that the phase transition is of order-disorder type.
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Submitted 10 July, 2001;
originally announced July 2001.
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Phase transitions in two dimensions - the case of Sn adsorbed on Ge(111) surfaces
Authors:
O. Bunk,
J. H. Zeysing,
G. Falkenberg,
R. L. Johnson,
M. Nielsen,
M. M. Nielsen,
R. Feidenhans'l
Abstract:
Accurate atomic coordinates of the room-temperature (root3xroot3)R30degree and low-temperature (3x3) phases of 1/3 ML Sn on Ge(111) have been established by grazing-incidence x-ray diffraction with synchrotron radiation. The Sn atoms are located solely at T4-sites in the (root3xroot3)R30degree structure. In the low temperature phase one of the three Sn atoms per (3x3) unit cell is displaced outw…
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Accurate atomic coordinates of the room-temperature (root3xroot3)R30degree and low-temperature (3x3) phases of 1/3 ML Sn on Ge(111) have been established by grazing-incidence x-ray diffraction with synchrotron radiation. The Sn atoms are located solely at T4-sites in the (root3xroot3)R30degree structure. In the low temperature phase one of the three Sn atoms per (3x3) unit cell is displaced outwards by 0.26 +/- 0.04 A relative to the other two. This displacement is accompanied by an increase in the first to second double-layer spacing in the Ge substrate.
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Submitted 20 September, 1999;
originally announced September 1999.