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X-ray induced grain structure dynamics in Bi2Se3
Authors:
Kento Katagiri,
Bernard Kozioziemski,
Eric Folsom,
Yifan Wang,
Karen Appel,
Philip K. Cook,
Jon Eggert,
Sebastian Göde,
Marylesa Howard,
Sungwon Kim,
Mikako Matsuda,
Motoaki Nakatsutsumi,
Martin M. Nielsen,
Henning F. Poulsen,
Frank Seiboth,
Hugh Simons,
Bihan Wang,
Wenge Yang,
Ulf Zastrau,
Hyunjung Kim,
Leora E. Dresselhaus-Marais
Abstract:
Grain rotation in crystals often results in coarsening or refinement of the grains that modify the mechanical and thermal properties of materials. While many studies have explored how externally applied stress and temperature drive grain structure dynamics in nano-polycrystalline materials, the analogous studies on colossal grains have been limited, especially in the absence of external force. In…
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Grain rotation in crystals often results in coarsening or refinement of the grains that modify the mechanical and thermal properties of materials. While many studies have explored how externally applied stress and temperature drive grain structure dynamics in nano-polycrystalline materials, the analogous studies on colossal grains have been limited, especially in the absence of external force. In this work, we used X-ray free electron laser pulses to irradiate single-crystalline bismuth selenide (Bi2Se3) and observed grain boundary formation and subsequent grain rotation in response to the X-ray radiation. Our observations with simultaneous X-ray diffraction and transmission X-ray microscopy demonstrate how intense X-ray radiation can rapidly change grain morphologies of initially single-crystalline material.
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Submitted 12 March, 2024;
originally announced March 2024.
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Transonic Dislocation Propagation in Diamond
Authors:
Kento Katagiri,
Tatiana Pikuz,
Lichao Fang,
Bruno Albertazzi,
Shunsuke Egashira,
Yuichi Inubushi,
Genki Kamimura,
Ryosuke Kodama,
Michel Koenig,
Bernard Kozioziemski,
Gooru Masaoka,
Kohei Miyanishi,
Hirotaka Nakamura,
Masato Ota,
Gabriel Rigon,
Youichi Sakawa,
Takayoshi Sano,
Frank Schoofs,
Zoe J. Smith,
Keiichi Sueda,
Tadashi Togashi,
Tommaso Vinci,
Yifan Wang,
Makina Yabashi,
Toshinori Yabuuchi
, et al. (2 additional authors not shown)
Abstract:
The motion of line defects (dislocations) has been studied for over 60 years but the maximum speed at which they can move is unresolved. Recent models and atomistic simulations predict the existence of a limiting velocity of dislocation motions between the transonic and subsonic ranges at which the self-energy of dislocation diverges, though they do not deny the possibility of the transonic disloc…
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The motion of line defects (dislocations) has been studied for over 60 years but the maximum speed at which they can move is unresolved. Recent models and atomistic simulations predict the existence of a limiting velocity of dislocation motions between the transonic and subsonic ranges at which the self-energy of dislocation diverges, though they do not deny the possibility of the transonic dislocations. We use femtosecond x-ray radiography to track ultrafast dislocation motion in shock-compressed single-crystal diamond. By visualizing stacking faults extending faster than the slowest sound wave speed of diamond, we show the evidence of partial dislocations at their leading edge moving transonically. Understanding the upper limit of dislocation mobility in crystals is essential to accurately model, predict, and control the mechanical properties of materials under extreme conditions.
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Submitted 6 October, 2023; v1 submitted 7 March, 2023;
originally announced March 2023.
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Real-time imaging of acoustic waves in bulk materials with X-ray microscopy
Authors:
Theodor S. Holstad,
Leora E. Dresselhaus-Marais,
Trygve Magnus Ræder,
Bernard Kozioziemski,
Tim van Driel,
Matthew Seaberg,
Eric Folsom,
Jon H. Eggert,
Erik Bergbäck Knudsen,
Martin Meedom Nielsen,
Hugh Simons,
Kristoffer Haldrup,
Henning Friis Poulsen
Abstract:
Materials modelling and processing require experiments to visualize and quantify how external excitations drive the evolution of deep subsurface structure and defects that determine properties. Today, 3D movies with ~100-nm resolution of crystalline structure are regularly acquired in minutes to hours using X-ray diffraction based imaging. We present an X-ray microscope that improves this time res…
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Materials modelling and processing require experiments to visualize and quantify how external excitations drive the evolution of deep subsurface structure and defects that determine properties. Today, 3D movies with ~100-nm resolution of crystalline structure are regularly acquired in minutes to hours using X-ray diffraction based imaging. We present an X-ray microscope that improves this time resolution to <100 femtoseconds, with images attainable even from a single X-ray pulse. Using this, we resolve the propagation of 18-km/s acoustic waves in mm-sized diamond crystals, and demonstrate how mechanical energy thermalizes from picosecond to microsecond timescales. Our approach unlocks a vast range of new experiments of materials phenomena with intricate structural dynamics at ultrafast timescales.
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Submitted 14 November, 2022; v1 submitted 2 November, 2022;
originally announced November 2022.
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Simultaneous Bright- and Dark-Field X-ray Microscopy at X-ray Free Electron Lasers
Authors:
Leora E. Dresselhaus-Marais,
Bernard Kozioziemski,
Theodor S. Holstad,
Trygve Magnus Ræder,
Matthew Seaberg,
Daewoong Nam,
Sangsoo Kim,
Sean Breckling,
Seonghyuk Choi,
Matthieu Chollet,
Philip K. Cook,
Eric Folsom,
Eric Galtier,
Arnulfo Gonzalez,
Tais Gorhover,
Serge Guillet,
Kristoffer Haldrup,
Marylesa Howard,
Kento Katagiri,
Seonghan Kim,
Sunam Kim,
Sungwon Kim,
Hyunjung Kim,
Erik Bergback Knudsen,
Stephan Kuschel
, et al. (18 additional authors not shown)
Abstract:
The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the str…
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The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, Dark Field X-ray Microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the $10^{12}$ photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics.
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Submitted 5 September, 2023; v1 submitted 15 October, 2022;
originally announced October 2022.