Skip to main content

Showing 1–3 of 3 results for author: Harding, L M

Searching in archive cond-mat. Search in all archives.
.
  1. arXiv:2404.14929  [pdf, other

    cond-mat.mtrl-sci

    Polyepitaxial grain matching to study the oxidation of uranium dioxide

    Authors: Jacek Wasik, Joseph Sutcliffe, Renaud Podor, Jarrod Lewis, James Edward Darnbrough, Sophie Rennie, Syed Akbar Hussain, Chris Bell, Daniel Alexander Chaney, Gareth Griffiths, Lottie Mae Harding, Florence Legg, Eleanor Lawrence Bright, Rebecca Nicholls, Yadukrishnan Sasikumar, Angus Siberry, Philip Smith, Ross Springell

    Abstract: Although the principal physical behaviour of a material is inherently connected to its fundamental crystal structure, the behaviours observed in the real-world are often driven by the microstructure, which for many polycrystalline materials, equates to the size and shape of the constituent crystal grains. Here we highlight a cutting edge synthesis route to the controlled engineering of grain struc… ▽ More

    Submitted 23 April, 2024; originally announced April 2024.

    Comments: 21 pages, 3 figures

  2. arXiv:2402.00546  [pdf, other

    cond-mat.mtrl-sci cond-mat.str-el

    Absence of Induced Ferromagnetism in Epitaxial Uranium Dioxide Thin Films

    Authors: William Thomas, Fabrice Wilhelm, Sean Langridge, Lottie. M Harding, Christopher Bell, Ross Springell, Sven Friedemann, Roberto Caciuffo, Gerrard. H Lander

    Abstract: Recently, Sharma et al. [Adv. Sci. 9, 2203473 (2022)] claimed that thin films (around 20 nm) of UO2 deposited on perovskite substrates exhibit strongly enhanced paramagnetism (called induced ferromagnetism by the authors). Moments of up to 3 Bohr magneton/U atom were claimed in magnetic fields of 6 T. We have reproduced such films and, after characterisation, have examined them with X-ray circular… ▽ More

    Submitted 1 February, 2024; originally announced February 2024.

  3. arXiv:2307.01018  [pdf, other

    cond-mat.mtrl-sci cond-mat.other

    A review of uranium-based thin films

    Authors: R. Springell, E. Lawrence Bright, D. A. Chaney, L. M. Harding, C. Bell, R. C. C. Ward, G. H. Lander

    Abstract: Thin films based on silicon and transition-metal elements dominate the semiconducting industry and are ubiquitous in all modern devices. Films have also been produced in the rare-earth series of elements for both research and specialized applications. Thin films of uranium and uranium dioxide were fabricated in the 1960s and 1970s, but there was little sustained effort until the early 2000s. Signi… ▽ More

    Submitted 3 July, 2023; originally announced July 2023.

    Comments: 87 pages, 4 tables, 42 figures. Submitted to Advances in Physics