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Resonant inelastic x-ray scattering in warm-dense Fe compounds beyond the SASE FEL resolution limit
Authors:
Alessandro Forte,
Thomas Gawne,
Karim K. Alaa El-Din,
Oliver S. Humphries,
Thomas R. Preston,
Céline Crépisson,
Thomas Campbell,
Pontus Svensson,
Sam Azadi,
Patrick Heighway,
Yuanfeng Shi,
David A. Chin,
Ethan Smith,
Carsten Baehtz,
Victorien Bouffetier,
Hauke Höppner,
David McGonegle,
Marion Harmand,
Gilbert W. Collins,
Justin S. Wark,
Danae N. Polsin,
Sam M. Vinko
Abstract:
Resonant inelastic x-ray scattering (RIXS) is a widely used spectroscopic technique, providing access to the electronic structure and dynamics of atoms, molecules, and solids. However, RIXS requires a narrow bandwidth x-ray probe to achieve high spectral resolution. The challenges in delivering an energetic monochromated beam from an x-ray free electron laser (XFEL) thus limit its use in few-shot…
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Resonant inelastic x-ray scattering (RIXS) is a widely used spectroscopic technique, providing access to the electronic structure and dynamics of atoms, molecules, and solids. However, RIXS requires a narrow bandwidth x-ray probe to achieve high spectral resolution. The challenges in delivering an energetic monochromated beam from an x-ray free electron laser (XFEL) thus limit its use in few-shot experiments, including for the study of high energy density systems. Here we demonstrate that by correlating the measurements of the self-amplified spontaneous emission (SASE) spectrum of an XFEL with the RIXS signal, using a dynamic kernel deconvolution with a neural surrogate, we can achieve electronic structure resolutions substantially higher than those normally afforded by the bandwidth of the incoming x-ray beam. We further show how this technique allows us to discriminate between the valence structures of Fe and Fe$_2$O$_3$, and provides access to temperature measurements as well as M-shell binding energies estimates in warm-dense Fe compounds.
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Submitted 11 January, 2024;
originally announced February 2024.
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Modulation calorimetry in diamond anvil cells I: heat flow models
Authors:
Zachary M. Geballe,
Gilbert W. Collins,
Raymond Jeanloz
Abstract:
Numerical simulations of heat transport in diamond anvil cells reveal a possibility for absolute measurements of specific heat via high-frequency modulation calorimetry. Such experiments could reveal and help characterize temperature-driven phase transitions at high-pressure, such as melting, the glass transition, magnetic and electric orderings, or superconducting transitions. Specifically, we sh…
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Numerical simulations of heat transport in diamond anvil cells reveal a possibility for absolute measurements of specific heat via high-frequency modulation calorimetry. Such experiments could reveal and help characterize temperature-driven phase transitions at high-pressure, such as melting, the glass transition, magnetic and electric orderings, or superconducting transitions. Specifically, we show that calorimetric information of a sample cannot be directly extracted from measurements at frequencies slower than the timescale of conduction to the diamond anvils (10s to 100s of kHz) since the experiment is far from adiabatic. At higher frequencies, laser-heating experiments allow relative calorimetric measurements, where changes in specific heat of the sample are discriminated from changes in other material properties by scanning the heating frequency from $\sim 1$ MHz to 1 GHz. But laser-heating generates large temperature gradients in metal samples, preventing absolute heat capacities to be inferred. High-frequency Joule heating, on the other hand, allows accurate, absolute specific heat measurements if it can be performed at high-enough frequency: assuming a thin layer of KBr insulation, the specific heat of a 5 $μ$m-thick metal sample heated at 100 kHz, 1 MHz, or 10 MHz frequency would be measured with 30%, 8% or 2% accuracy, respectively.
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Submitted 7 January, 2017;
originally announced January 2017.
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Single Hit Energy-resolved Laue Diffraction
Authors:
Shamim Patel,
Matthew J. Suggit,
Paul G. Stubley,
James A. Hawreliak,
Orlando Ciricosta,
Andrew J. Comley,
Gilbert W. Collins,
Jon H. Eggert,
John M. Foster,
Justin S. Wark,
Andrew Higginbotham
Abstract:
In-situ white light Laue diffraction has been successfully used to interrogate the structure of single crystal materials undergoing rapid (nanosecond) dynamic compression up to megabar pressures. However, information on strain state accessible via this technique is limited, reducing its applicability for a range of applications. We present an extension to the existing Laue diffraction platform in…
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In-situ white light Laue diffraction has been successfully used to interrogate the structure of single crystal materials undergoing rapid (nanosecond) dynamic compression up to megabar pressures. However, information on strain state accessible via this technique is limited, reducing its applicability for a range of applications. We present an extension to the existing Laue diffraction platform in which we record the photon energy of a subset of diffraction peaks. This allows for a measurement of the longitudinal and transverse strains in-situ during compression. Consequently, we demonstrate measurement of volumetric compression of the unit cell, in addition to the limited aspect ratio information accessible in conventional white light Laue. We present preliminary results for silicon, where only an elastic strain is observed. VISAR measurements show the presence of a two wave structure and measurements show that material downstream of the second wave does not contribute to the observed diffraction peaks, supporting the idea that this material may be highly disordered, or has undergone large scale rotation.
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Submitted 31 May, 2015; v1 submitted 17 March, 2015;
originally announced March 2015.
