Systematic effects on a Compton polarimeter at the focus of an X-ray mirror
Authors:
M. Aoyagi,
R. G. Bose,
S. Chun,
E. Gau,
K. Hu,
K. Ishiwata,
N. K. Iyer,
F. Kislat,
M. Kiss,
K. Klepper,
H. Krawczynski,
L. Lisalda,
Y. Maeda,
F. af Malmborg,
H. Matsumoto,
A. Miyamoto,
T. Miyazawa,
M. Pearce,
B. F. Rauch,
N. Rodriguez Cavero,
S. Spooner,
H. Takahashi,
Y. Uchida,
A. T. West,
K. Wimalasena
, et al. (1 additional authors not shown)
Abstract:
XL-Calibur is a balloon-borne Compton polarimeter for X-rays in the $\sim$15-80 keV range. Using an X-ray mirror with a 12 m focal length for collecting photons onto a beryllium scattering rod surrounded by CZT detectors, a minimum-detectable polarization as low as $\sim$3% is expected during a 24-hour on-target observation of a 1 Crab source at 45$^{\circ}$ elevation. Systematic effects alter the…
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XL-Calibur is a balloon-borne Compton polarimeter for X-rays in the $\sim$15-80 keV range. Using an X-ray mirror with a 12 m focal length for collecting photons onto a beryllium scattering rod surrounded by CZT detectors, a minimum-detectable polarization as low as $\sim$3% is expected during a 24-hour on-target observation of a 1 Crab source at 45$^{\circ}$ elevation. Systematic effects alter the reconstructed polarization as the mirror focal spot moves across the beryllium scatterer, due to pointing offsets, mechanical misalignment or deformation of the carbon-fiber truss supporting the mirror and the polarimeter. Unaddressed, this can give rise to a spurious polarization signal for an unpolarized flux, or a change in reconstructed polarization fraction and angle for a polarized flux. Using bench-marked Monte-Carlo simulations and an accurate mirror point-spread function characterized at synchrotron beam-lines, systematic effects are quantified, and mitigation strategies discussed. By recalculating the scattering site for a shifted beam, systematic errors can be reduced from several tens of percent to the few-percent level for any shift within the scattering element. The treatment of these systematic effects will be important for any polarimetric instrument where a focused X-ray beam is im**ing on a scattering element surrounded by counting detectors.
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Submitted 23 February, 2024;
originally announced February 2024.
