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Unravelling structural rearrangement of polymer colloidal crystals under dry sintering conditions
Authors:
Alexey V. Zozulya,
Ivan A. Zaluzhnyy,
Nastasia Mukharamova,
Sergey Lazarev,
Janne-Mieke Meijer,
Ruslan P. Kurta,
Anatoly Shabalin,
Michael Sprung,
Andrei V. Petukhov,
Ivan A. Vartanyants
Abstract:
Structural rearrangement of polystyrene colloidal crystals under dry sintering conditions has been revealed by in situ grazing incidence X-ray scattering. Measured diffraction patterns were analysed using distorted wave Born approximation (DWBA) theory and the structural parameters of as-grown colloidal crystals of three different particle sizes were determined for in-plane and out-of-plane direct…
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Structural rearrangement of polystyrene colloidal crystals under dry sintering conditions has been revealed by in situ grazing incidence X-ray scattering. Measured diffraction patterns were analysed using distorted wave Born approximation (DWBA) theory and the structural parameters of as-grown colloidal crystals of three different particle sizes were determined for in-plane and out-of-plane directions in a film. By analysing the temperature evolution of diffraction peak positions, integrated intensities, and widths the detailed scenario of structural rearrangement of crystalline domains at a nanoscale has been revealed, including thermal expansion, particle shape transformation and crystal amorphisation. Based on DWBA analysis we demonstrate that in the process of dry sintering the shape of colloidal particles in a crystal transforms from a sphere to a polyhedron. Our results deepen the understanding of thermal annealing of polymer colloidal crystals as an efficient route to the design of new nano-materials.
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Submitted 2 July, 2018;
originally announced July 2018.
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Nucleation of dislocations and their dynamics in layered oxides cathode materials during battery charging
Authors:
A. Singer,
S. Hy,
M. Zhang,
D. Cela,
C. Fang,
B. Qiu,
Y. Xia,
Z. Liu,
A. Ulvestad,
N. Hua,
J. Wingert,
H. Liu,
M. Sprung,
A. V. Zozulya,
E. Maxey,
R. Harder,
Y. S. Meng,
O. G. Shpyrko
Abstract:
Defects and their interactions in crystalline solids often underpin material properties and functionality as they are decisive for stability, result in enhanced diffusion, and act as a reservoir of vacancies. Recently, lithium-rich layered oxides have emerged among the leading candidates for the next-generation energy storage cathode material, delivering 50 % excess capacity over commercially used…
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Defects and their interactions in crystalline solids often underpin material properties and functionality as they are decisive for stability, result in enhanced diffusion, and act as a reservoir of vacancies. Recently, lithium-rich layered oxides have emerged among the leading candidates for the next-generation energy storage cathode material, delivering 50 % excess capacity over commercially used compounds. Oxygen-redox reactions are believed to be responsible for the excess capacity, however, voltage fading has prevented commercialization of these new materials. Despite extensive research the understanding of the mechanisms underpinning oxygen-redox reactions and voltage fade remain incomplete. Here, using operando three-dimensional Bragg coherent diffractive imaging, we directly observe nucleation of a mobile dislocation network in nanoparticles of lithium-rich layered oxide material. Surprisingly, we find that dislocations form more readily in the lithium-rich layered oxide material as compared with a conventional layered oxide material, suggesting a link between the defects and the anomalously high capacity in lithium-rich layered oxides. The formation of a network of partial dislocations dramatically alters the local lithium environment and contributes to the voltage fade. Based on our findings we design and demonstrate a method to recover the original high voltage functionality. Our findings reveal that the voltage fade in lithium-rich layered oxides is reversible and call for new paradigms for improved design of oxygen-redox active materials.
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Submitted 9 June, 2017;
originally announced June 2017.
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Structural studies of the bond-orientational order and hexatic-smectic transition in liquid crystals of various compositions
Authors:
I. A. Zaluzhnyy,
R. P. Kurta,
E. A. Sulyanova,
O. Yu. Gorobtsov,
A. G. Shabalin,
A. V. Zozulya,
A. P. Menushenkov,
M. Sprung,
A. Krowczynski,
E. Gorecka,
B. I. Ostrovskii,
I. A. Vartanyants
Abstract:
We report on X-ray studies of freely suspended hexatic films of three different liquid crystal compounds. By applying angular X-ray cross-correlation analysis (XCCA) to the measured diffraction patterns the parameters of the bond-orientational (BO) order in the hexatic phase were directly determined. The temperature evolution of the BO order parameters was analyzed on the basis of the multicritica…
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We report on X-ray studies of freely suspended hexatic films of three different liquid crystal compounds. By applying angular X-ray cross-correlation analysis (XCCA) to the measured diffraction patterns the parameters of the bond-orientational (BO) order in the hexatic phase were directly determined. The temperature evolution of the BO order parameters was analyzed on the basis of the multicritical scaling theory (MCST). Our results confirmed the validity of the MCST in the whole temperature range of existence of the hexatic phase for all three compounds. The temperature dependence of the BO order parameters in the vicinity of the hexatic-smectic transition was fitted by a conventional power law with a critical exponent $β\approx0.1$ of extremely small value. We found that the temperature dependence of higher order harmonics of the BO order scales as the powers of the first harmonic, with exponent equal to harmonic number. This indicates a nonlinear coupling of the BO order parameters of different order. It is shown that compounds of various composition, possessing different phase sequences, display the same thermodynamic behavior in the hexatic phase and in the vicinity of the smectic-hexatic phase transition.
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Submitted 3 March, 2017;
originally announced March 2017.
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Quantifying Angular Correlations between the Atomic Lattice and Superlattice of Nanocrystals Assembled with Directional Linking
Authors:
Ivan. A. Zaluzhnyy,
Ruslan P. Kurta,
Alexander Andre,
Oleg Y. Gorobtsov,
Max Rose,
Petr Skopintsev,
Ilya Besedin,
Alexey V. Zozulya,
Michael Sprung,
Frank Schreiber,
Ivan A. Vartanyants,
Marcus Scheele
Abstract:
We show that the combination of X-ray scattering with a nanofocused beam and X-ray cross correlation analysis is an efficient means for the full structural characterization of mesocrystalline nanoparticle assemblies with a single experiment. We analyze several hundred diffraction patterns of individual sample locations, i.e. individual grains, to obtain a meaningful statistical distribution of the…
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We show that the combination of X-ray scattering with a nanofocused beam and X-ray cross correlation analysis is an efficient means for the full structural characterization of mesocrystalline nanoparticle assemblies with a single experiment. We analyze several hundred diffraction patterns of individual sample locations, i.e. individual grains, to obtain a meaningful statistical distribution of the superlattice and atomic lattice ordering. Simultaneous small- and wide-angle X-ray scattering of the same sample location allows us to determine the structure and orientation of the superlattice as well as the angular correlation of the first two Bragg peaks of the atomic lattices, their orientation with respect to the superlattice, and the average orientational misfit due to local structural disorder. This experiment is particularly advantageous for synthetic mesocrystals made by the simultaneous self-assembly of colloidal nanocrystals and surface-functionalization with conductive ligands. While the structural characterization of such materials has been challenging so far, the present method now allows correlating mesocrystalline structure with optoelectronic properties.
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Submitted 19 February, 2017;
originally announced February 2017.
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Revealing three-dimensional structure of individual colloidal crystal grain by coherent x-ray diffractive imaging
Authors:
A. G. Shabalin,
J. -M. Meijer,
R. Dronyak,
O. M. Yefanov,
A. Singer,
R. P. Kurta,
U. Lorenz,
O. Y. Gorobtsov,
D. Dzhigaev,
S. Kalbfleisch,
J. Gulden,
A. V. Zozulya,
M. Sprung,
A. V. Petukhov,
I. A. Vartanyants
Abstract:
We present results of a coherent x-ray diffractive imaging experiment performed on a single colloidal crystal grain. The full three-dimensional (3D) reciprocal space map measured by an azimuthal rotational scan contained several orders of Bragg reflections together with the coherent interference signal between them. Applying the iterative phase retrieval approach, the 3D structure of the crystal g…
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We present results of a coherent x-ray diffractive imaging experiment performed on a single colloidal crystal grain. The full three-dimensional (3D) reciprocal space map measured by an azimuthal rotational scan contained several orders of Bragg reflections together with the coherent interference signal between them. Applying the iterative phase retrieval approach, the 3D structure of the crystal grain was reconstructed and positions of individual colloidal particles were resolved. As a result, an exact stacking sequence of hexagonal close-packed layers including planar and linear defects were identified.
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Submitted 29 May, 2016;
originally announced May 2016.
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Versatile AFM setup combined with micro-focused X-ray beam
Authors:
T. Slobodskyy,
A. V. Zozulya,
R. Tholapi,
L. Liefeith,
M. Fester,
M. Sprung,
W. Hansen
Abstract:
Micro-focused X-ray beams produced by third generation synchrotron sources offer new perspective of studying strains and processes at nanoscale. Atomic force microscope setup combined with a micro-focused synchrotron beam allows precise positioning and nanomanipulation of nanostructures under illumination. In this paper, we report on integration of a portable commercial atomic force microscope set…
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Micro-focused X-ray beams produced by third generation synchrotron sources offer new perspective of studying strains and processes at nanoscale. Atomic force microscope setup combined with a micro-focused synchrotron beam allows precise positioning and nanomanipulation of nanostructures under illumination. In this paper, we report on integration of a portable commercial atomic force microscope setup into a hard X-ray synchrotron beamline. Details of design, sample alignment procedure and performance of the setup are presented.
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Submitted 2 June, 2015; v1 submitted 1 June, 2015;
originally announced June 2015.
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Spatially resolved x-ray studies of liquid crystals with strongly developed bond-orientational order
Authors:
I. A. Zaluzhnyy,
R. P. Kurta,
E. A. Sulyanova,
O. Y. Gorobtsov,
A. G. Shabalin,
A. V. Zozulya,
A. P. Menushenkov,
M. Sprung,
B. I. Ostrovskii,
I. A. Vartanyants
Abstract:
We present an x-ray study of freely suspended hexatic films of the liquid crystal 3(10)OBC. Our results reveal spatial inhomogeneities of the bond-orientational (BO) order in the vicinity of the hexatic-smectic phase transition and the formation of large scale hexatic domains at lower temperatures. Deep in the hexatic phase up to 25 successive sixfold BO order parameters have been directly determi…
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We present an x-ray study of freely suspended hexatic films of the liquid crystal 3(10)OBC. Our results reveal spatial inhomogeneities of the bond-orientational (BO) order in the vicinity of the hexatic-smectic phase transition and the formation of large scale hexatic domains at lower temperatures. Deep in the hexatic phase up to 25 successive sixfold BO order parameters have been directly determined by means of angular x-ray cross-correlation analysis (XCCA). Such strongly developed hexatic order allowed us to determine higher order correction terms in the scaling relation predicted by the multicritical scaling theory over a full temperature range of the hexatic phase existence.
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Submitted 3 December, 2014; v1 submitted 25 November, 2014;
originally announced November 2014.
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X-ray cross-correlation analysis of liquid crystal membranes in the vicinity of hexatic-smectic phase transition
Authors:
R. P. Kurta,
B. I. Ostrovskii,
A. Singer,
O. Y. Gorobtsov,
A. Shabalin,
D. Dzhigaev,
O. M. Yefanov,
A. V. Zozulya,
M. Sprung,
I. A. Vartanyants
Abstract:
We present an x-ray study of liquid crystal membranes in the vicinity of hexatic-smectic phase transition by means of angular x-ray cross-correlation analysis (XCCA). By applying two-point angular intensity cross-correlation functions to the measured series of diffraction patterns the parameters of bond-orientational (BO) order in hexatic phase were directly determined. The temperature dependence…
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We present an x-ray study of liquid crystal membranes in the vicinity of hexatic-smectic phase transition by means of angular x-ray cross-correlation analysis (XCCA). By applying two-point angular intensity cross-correlation functions to the measured series of diffraction patterns the parameters of bond-orientational (BO) order in hexatic phase were directly determined. The temperature dependence of the positional correlation lengths was analyzed as well. The obtained correlation lengths show larger values for the higher-order Fourier components of BO order. These findings indicate a strong coupling between BO and positional order that has not been studied in detail up to now.
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Submitted 14 August, 2013;
originally announced August 2013.
