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Random Forest Prediction of Crystal Structure from Electron Diffraction Patterns Incorporating Multiple Scattering
Authors:
Samuel P. Gleason,
Alexander Rakowski,
Stephanie M. Ribet,
Steven E. Zeltmann,
Benjamin H. Savitzky,
Matthew Henderson,
Jim Ciston,
Colin Ophus
Abstract:
Diffraction is the most common method to solve for unknown or partially known crystal structures. However, it remains a challenge to determine the crystal structure of a new material that may have nanoscale size or heterogeneities. Here we train an architecture of hierarchical random forest models capable of predicting the crystal system, space group, and lattice parameters from one or more unknow…
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Diffraction is the most common method to solve for unknown or partially known crystal structures. However, it remains a challenge to determine the crystal structure of a new material that may have nanoscale size or heterogeneities. Here we train an architecture of hierarchical random forest models capable of predicting the crystal system, space group, and lattice parameters from one or more unknown 2D electron diffraction patterns. Our initial model correctly identifies the crystal system of a simulated electron diffraction pattern from a 20 nm thick specimen of arbitrary orientation 67% of the time. We achieve a topline accuracy of 79% when aggregating predictions from 10 patterns of the same material but different zone axes. The space group and lattice predictions range from 70-90% accuracy and median errors of 0.01-0.5 angstroms, respectively, for cubic, hexagonal, trigonal and tetragonal crystal systems while being less reliable on orthorhombic and monoclinic systems. We apply this architecture to a 4D-STEM scan of gold nanoparticles, where it accurately predicts the crystal structure and lattice constants. These random forest models can be used to significantly accelerate the analysis of electron diffraction patterns, particularly in the case of unknown crystal structures. Additionally, due to the speed of inference, these models could be integrated into live TEM experiments, allowing real-time labeling of a specimen.
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Submitted 24 June, 2024;
originally announced June 2024.
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Iterative Phase Retrieval Algorithms for Scanning Transmission Electron Microscopy
Authors:
Georgios Varnavides,
Stephanie M. Ribet,
Steven E. Zeltmann,
Yue Yu,
Benjamin H. Savitzky,
Dana O. Byrne,
Frances I. Allen,
Vinayak P. Dravid,
Mary C. Scott,
Colin Ophus
Abstract:
Scanning transmission electron microscopy (STEM) has been extensively used for imaging complex materials down to atomic resolution. The most commonly employed STEM modality, annular dark-field imaging, produces easily-interpretable contrast, but is dose-inefficient and produces little to no discernible contrast for light elements and weakly-scattering samples. An alternative is to use STEM phase r…
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Scanning transmission electron microscopy (STEM) has been extensively used for imaging complex materials down to atomic resolution. The most commonly employed STEM modality, annular dark-field imaging, produces easily-interpretable contrast, but is dose-inefficient and produces little to no discernible contrast for light elements and weakly-scattering samples. An alternative is to use STEM phase retrieval imaging, enabled by high speed detectors able to record full images of a diffracted STEM probe over a grid of scan positions. Phase retrieval imaging in STEM is highly dose-efficient, enabling the measurement of the structure of beam-sensitive materials such as biological samples. Here, we comprehensively describe the theoretical background, algorithmic implementation details, and perform both simulated and experimental tests for three iterative phase retrieval STEM methods: focused-probe differential phase contrast, defocused-probe parallax imaging, and a generalized ptychographic gradient descent method implemented in two and three dimensions. We discuss the strengths and weaknesses of each of these approaches by comparing the transfer of information using analytical expressions and numerical results for a white-noise model. This presentation of STEM phase retrieval methods aims to make these methods more approachable, reproducible, and more readily adoptable for many classes of samples.
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Submitted 20 May, 2024; v1 submitted 11 September, 2023;
originally announced September 2023.
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The 4D Camera: an 87 kHz direct electron detector for scanning/transmission electron microscopy
Authors:
Peter Ercius,
Ian J. Johnson,
Philipp Pelz,
Benjamin H. Savitzky,
Lauren Hughes,
Hamish G. Brown,
Steven E. Zeltmann,
Shang-Lin Hsu,
Cassio C. S. Pedroso,
Bruce E. Cohen,
Ramamoorthy Ramesh,
David Paul,
John M. Joseph,
Thorsten Stezelberger,
Cory Czarnik,
Matthew Lent,
Erin Fong,
Jim Ciston,
Mary C. Scott,
Colin Ophus,
Andrew M. Minor,
and Peter Denes
Abstract:
We describe the development, operation, and application of the 4D Camera -- a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 87,000 Hz. The detector generates data at approximately 480 Gbit/s which is captured by dedicated receiver computers with a parallelized software infrastructure that has been implemented to process the resulting 10 - 700…
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We describe the development, operation, and application of the 4D Camera -- a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 87,000 Hz. The detector generates data at approximately 480 Gbit/s which is captured by dedicated receiver computers with a parallelized software infrastructure that has been implemented to process the resulting 10 - 700 Gigabyte-sized raw datasets. The back illuminated detector provides the ability to detect single electron events at accelerating voltages from 30 - 300 keV. Through electron counting, the resulting sparse data sets are reduced in size by 10 - 300x compared to the raw data, and open-source sparsity-based processing algorithms offer rapid data analysis. The high frame rate allows for large and complex 4D-STEM experiments to be accomplished with typical STEM scanning parameters.
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Submitted 19 May, 2023;
originally announced May 2023.
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Design of Electrostatic Aberration Correctors for Scanning Transmission Electron Microscopy
Authors:
Stephanie M. Ribet,
Steven E. Zeltmann,
Karen C. Bustillo,
Rohan Dhall,
Peter Denes,
Andrew M. Minor,
Roberto dos Reis,
Vinayak P. Dravid,
Colin Ophus
Abstract:
In a scanning transmission electron microscope (STEM), producing a high-resolution image generally requires an electron beam focused to the smallest point possible. However, the magnetic lenses used to focus the beam are unavoidably imperfect, introducing aberrations that limit resolution. Modern STEMs overcome this by using hardware aberration correctors comprised of many multipole lenses, but th…
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In a scanning transmission electron microscope (STEM), producing a high-resolution image generally requires an electron beam focused to the smallest point possible. However, the magnetic lenses used to focus the beam are unavoidably imperfect, introducing aberrations that limit resolution. Modern STEMs overcome this by using hardware aberration correctors comprised of many multipole lenses, but these devices are complex, expensive, and can be difficult to tune. We demonstrate a design for an electrostatic phase plate that can act as an aberration corrector. The corrector is comprised of annular segments, each of which is an independent two-terminal device that can apply a constant or ramped phase shift to a portion of the electron beam. We show the improvement in image resolution using an electrostatic corrector. Engineering criteria impose that much of the beam within the probe-forming aperture be blocked by support bars, leading to large probe tails for the corrected probe that sample the specimen beyond the central lobe. We also show how this device can be used to create other STEM beam profiles such as vortex beams and beams with a high degree of phase diversity, which improve information transfer in ptychographic reconstructions.
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Submitted 16 March, 2023;
originally announced March 2023.
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Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave model
Authors:
Steven E Zeltmann,
Shang-Lin Hsu,
Hamish G Brown,
Sandhya Susarla,
Ramamoorthy Ramesh,
Andrew M Minor,
Colin Ophus
Abstract:
Nanobeam electron diffraction can probe local structural properties of complex crystalline materials including phase, orientation, tilt, strain, and polarization. Ideally, each diffraction pattern from a projected area of a few unit cells would produce clear a Bragg diffraction pattern, where the reciprocal lattice vectors can be measured from the spacing of the diffracted spots, and the spot inte…
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Nanobeam electron diffraction can probe local structural properties of complex crystalline materials including phase, orientation, tilt, strain, and polarization. Ideally, each diffraction pattern from a projected area of a few unit cells would produce clear a Bragg diffraction pattern, where the reciprocal lattice vectors can be measured from the spacing of the diffracted spots, and the spot intensities are equal to the square of the structure factor amplitudes. However, many samples are too thick for this simple interpretation of their diffraction patterns, as multiple scattering of the electron beam can produce a highly nonlinear relationship between the spot intensities and the underlying structure. Here, we develop a stacked Bloch wave method to model the diffracted intensities from thick samples with structure that varies along the electron beam. Our method reduces the large parameter space of electron scattering to just a few structural variables per probe position, making it fast enough to apply to very large fields of view. We apply our method to SrTiO$_3$/PbTiO$_3$/SrTiO$_3$ multilayer samples, and successfully disentangle specimen tilt from the mean polarization of the PbTiO$_3$ layers. We elucidate the structure of complex vortex topologies in the PbTiO$_3$ layers, demonstrating the promise of our method to extract material properties from thick samples.
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Submitted 10 April, 2023; v1 submitted 10 November, 2022;
originally announced November 2022.
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One Dimensional Wormhole Corrosion in Metals
Authors:
Yang Yang,
Weiyue Zhou,
Sheng Yin,
Sarah Y. Wang,
Qin Yu,
Matthew J. Olszta,
Ya-Qian Zhang,
Steven E. Zeltmann,
Mingda Li,
Miaomiao **,
Daniel K. Schreiber,
Jim Ciston,
M. C. Scott,
John R. Scully,
Robert O. Ritchie,
Mark Asta,
Ju Li,
Michael P. Short,
Andrew M. Minor
Abstract:
Corrosion is a ubiquitous failure mode of materials in extreme environments. The more localized it is, the more difficult it is to detect and more deleterious its effects. Often, the progression of localized corrosion is accompanied by the evolution of porosity in materials, creating internal void-structures that facilitate the ingress of the external environment into the interior of the material,…
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Corrosion is a ubiquitous failure mode of materials in extreme environments. The more localized it is, the more difficult it is to detect and more deleterious its effects. Often, the progression of localized corrosion is accompanied by the evolution of porosity in materials, creating internal void-structures that facilitate the ingress of the external environment into the interior of the material, further accelerating the internal corrosion. Previously, the dominant morphology of such void-structures has been reported to be either three-dimensional (3D) or two-dimensional (2D). Here, we report a more localized form of corrosion, which we call 1D wormhole corrosion. Using electron tomography, we show multiple examples of this 1D and percolating morphology that manifests a significantly high aspect ratio differentiable from 2D and 3D corrosion. To understand the origin of this mechanism in a Ni-Cr alloy corroded by molten salt, we combined energy-filtered four-dimensional scanning transmission electron microscopy (EF-4D-STEM) and ab initio density functional theory (DFT) calculations to develop a vacancy map** method with nanometer-resolution, identifying a remarkably high vacancy concentration in the diffusion-induced grain boundary migration (DIGM) zone, up to 100 times the equilibrium value at the melting point. These vacancy supersaturation regions act as the precursors of wormholes, and lead to the asymmetrical growth of voids along GBs. We show that similar 1D penetrating corrosion morphologies could also occur in other materials or corrosion conditions, implying the broad impact of this extremely localized corrosion mechanism. Deciphering the origins of 1D corrosion is an important step towards designing structural materials with enhanced corrosion resistance, and also offers new pathways to create ordered-porous materials for functional applications.
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Submitted 30 March, 2022;
originally announced March 2022.
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Disentangling multiple scattering with deep learning: application to strain map** from electron diffraction patterns
Authors:
Joydeep Munshi,
Alexander Rakowski,
Benjamin H Savitzky,
Steven E Zeltmann,
Jim Ciston,
Matthew Henderson,
Shreyas Cholia,
Andrew M Minor,
Maria KY Chan,
Colin Ophus
Abstract:
Implementation of a fast, robust, and fully-automated pipeline for crystal structure determination and underlying strain map** for crystalline materials is important for many technological applications. Scanning electron nanodiffraction offers a procedure for identifying and collecting strain maps with good accuracy and high spatial resolutions. However, the application of this technique is limi…
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Implementation of a fast, robust, and fully-automated pipeline for crystal structure determination and underlying strain map** for crystalline materials is important for many technological applications. Scanning electron nanodiffraction offers a procedure for identifying and collecting strain maps with good accuracy and high spatial resolutions. However, the application of this technique is limited, particularly in thick samples where the electron beam can undergo multiple scattering, which introduces signal nonlinearities. Deep learning methods have the potential to invert these complex signals, but previous implementations are often trained only on specific crystal systems or a small subset of the crystal structure and microscope parameter phase space. In this study, we implement a Fourier space, complex-valued deep neural network called FCU-Net, to invert highly nonlinear electron diffraction patterns into the corresponding quantitative structure factor images. We trained the FCU-Net using over 200,000 unique simulated dynamical diffraction patterns which include many different combinations of crystal structures, orientations, thicknesses, microscope parameters, and common experimental artifacts. We evaluated the trained FCU-Net model against simulated and experimental 4D-STEM diffraction datasets, where it substantially out-performs conventional analysis methods. Our simulated diffraction pattern library, implementation of FCU-Net, and trained model weights are freely available in open source repositories, and can be adapted to many different diffraction measurement problems.
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Submitted 31 January, 2022;
originally announced February 2022.
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Automated Crystal Orientation Map** in py4DSTEM using Sparse Correlation Matching
Authors:
Colin Ophus,
Steven E Zeltmann,
Alexandra Bruefach,
Alexander Rakowski,
Benjamin H Savitzky,
Andrew M Minor,
MC Scott
Abstract:
Crystalline materials used in technological applications are often complex assemblies composed of multiple phases and differently oriented grains. Robust identification of the phases and orientation relationships from these samples is crucial, but the information extracted from the diffraction condition probed by an electron beam is often incomplete. We therefore have developed an automated crysta…
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Crystalline materials used in technological applications are often complex assemblies composed of multiple phases and differently oriented grains. Robust identification of the phases and orientation relationships from these samples is crucial, but the information extracted from the diffraction condition probed by an electron beam is often incomplete. We therefore have developed an automated crystal orientation map** (ACOM) procedure which uses a converged electron probe to collect diffraction patterns from multiple locations across a complex sample. We provide an algorithm to determine the orientation of each diffraction pattern based on a fast sparse correlation method. We test the speed and accuracy of our method by indexing diffraction patterns generated using both kinematical and dynamical simulations. We have also measured orientation maps from an experimental dataset consisting of a complex polycrystalline twisted helical AuAgPd nanowire. From these maps we identify twin planes between adjacent grains, which may be responsible for the twisted helical structure. All of our methods are made freely available as open source code, including tutorials which can be easily adapted to perform ACOM measurements on diffraction pattern datasets.
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Submitted 30 October, 2021;
originally announced November 2021.
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Multibeam Electron Diffraction
Authors:
Xuhao Hong,
Steven E Zeltmann,
Benjamin H Savitzky,
Luis Rangel DaCosta,
Alexander Mueller,
Andrew M Minor,
Karen Bustillo,
Colin Ophus
Abstract:
One of the primary uses for transmission electron microscopy (TEM) is to measure diffraction pattern images in order to determine a crystal structure and orientation. In nanobeam electron diffraction (NBED) we scan a moderately converged electron probe over the sample to acquire thousands or even millions of sequential diffraction images, a technique that is especially appropriate for polycrystall…
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One of the primary uses for transmission electron microscopy (TEM) is to measure diffraction pattern images in order to determine a crystal structure and orientation. In nanobeam electron diffraction (NBED) we scan a moderately converged electron probe over the sample to acquire thousands or even millions of sequential diffraction images, a technique that is especially appropriate for polycrystalline samples. However, due to the large Ewald sphere of TEM, excitation of Bragg peaks can be extremely sensitive to sample tilt, varying strongly for even a few degrees of sample tilt for crystalline samples. In this paper, we present multibeam electron diffraction (MBED), where multiple probe forming apertures are used to create mutiple STEM probes, all of which interact with the sample simultaneously. We detail designs for MBED experiments, and a method for using a focused ion beam (FIB) to produce MBED apertures. We show the efficacy of the MBED technique for crystalline orientation map** using both simulations and proof-of-principle experiments. We also show how the angular information in MBED can be used to perform 3D tomographic reconstruction of samples without needing to tilt or scan the sample multiple times. Finally, we also discuss future opportunities for the MBED method.
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Submitted 18 September, 2020;
originally announced September 2020.
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py4DSTEM: a software package for multimodal analysis of four-dimensional scanning transmission electron microscopy datasets
Authors:
Benjamin H Savitzky,
Lauren A Hughes,
Steven E Zeltmann,
Hamish G Brown,
Shiteng Zhao,
Philipp M Pelz,
Edward S Barnard,
Jennifer Donohue,
Luis Rangel DaCosta,
Thomas C. Pekin,
Ellis Kennedy,
Matthew T Janish,
Matthew M Schneider,
Patrick Herring,
Chirranjeevi Gopal,
Abraham Anapolsky,
Peter Ercius,
Mary Scott,
Jim Ciston,
Andrew M Minor,
Colin Ophus
Abstract:
Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a full 2D image of the diffracted electron beam at each probe position, typically a 2D grid of probe positions. These 4D-STEM datasets are rich in information, in…
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Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a full 2D image of the diffracted electron beam at each probe position, typically a 2D grid of probe positions. These 4D-STEM datasets are rich in information, including signatures of the local structure, orientation, deformation, electromagnetic fields and other sample-dependent properties. However, extracting this information requires complex analysis pipelines, from data wrangling to calibration to analysis to visualization, all while maintaining robustness against imaging distortions and artifacts. In this paper, we present py4DSTEM, an analysis toolkit for measuring material properties from 4D-STEM datasets, written in the Python language and released with an open source license. We describe the algorithmic steps for dataset calibration and various 4D-STEM property measurements in detail, and present results from several experimental datasets. We have also implemented a simple and universal file format appropriate for electron microscopy data in py4DSTEM, which uses the open source HDF5 standard. We hope this tool will benefit the research community, helps to move the develo** standards for data and computational methods in electron microscopy, and invite the community to contribute to this ongoing, fully open-source project.
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Submitted 20 March, 2020;
originally announced March 2020.
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Patterned Probes for High Precision 4D-STEM Bragg Measurements
Authors:
Steven E Zeltmann,
Alexander Müller,
Karen C Bustillo,
Benjamin Savitzky,
Lauren Hughes,
Andrew M Minor,
Colin Ophus
Abstract:
Nanoscale strain map** by four-dimensional scanning transmission electron microscopy (4D-STEM) relies on determining the precise locations of Bragg-scattered electrons in a sequence of diffraction patterns, a task which is complicated by dynamical scattering, inelastic scattering, and shot noise. These features hinder accurate automated computational detection and position measurement of the dif…
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Nanoscale strain map** by four-dimensional scanning transmission electron microscopy (4D-STEM) relies on determining the precise locations of Bragg-scattered electrons in a sequence of diffraction patterns, a task which is complicated by dynamical scattering, inelastic scattering, and shot noise. These features hinder accurate automated computational detection and position measurement of the diffracted disks, limiting the precision of measurements of local deformation. Here, we investigate the use of patterned probes to improve the precision of strain map**. We imprint a "bullseye" pattern onto the probe, by using a binary mask in the probe-forming aperture, to improve the robustness of the peak finding algorithm to intensity modulations inside the diffracted disks. We show that this imprinting leads to substantially improved strain-map** precision at the expense of a slight decrease in spatial resolution. In experiments on an unstrained silicon reference sample, we observe an improvement in strain measurement precision from 2.7% of the reciprocal lattice vectors with standard probes to 0.3% using bullseye probes for a thin sample, and an improvement from 4.7% to 0.8% for a thick sample. We also use multislice simulations to explore how sample thickness and electron dose limit the attainable accuracy and precision for 4D-STEM strain measurements.
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Submitted 8 November, 2019; v1 submitted 11 July, 2019;
originally announced July 2019.