Showing 1–14 of 14 results for author: Zeltmann, S

Random Forest Prediction of Crystal Structure from Electron Diffraction Patterns Incorporating Multiple Scattering

Authors: Samuel P. Gleason, Alexander Rakowski, Stephanie M. Ribet, Steven E. Zeltmann, Benjamin H. Savitzky, Matthew Henderson, Jim Ciston, Colin Ophus

Abstract: Diffraction is the most common method to solve for unknown or partially known crystal structures. However, it remains a challenge to determine the crystal structure of a new material that may have nanoscale size or heterogeneities. Here we train an architecture of hierarchical random forest models capable of predicting the crystal system, space group, and lattice parameters from one or more unknow… ▽ More Diffraction is the most common method to solve for unknown or partially known crystal structures. However, it remains a challenge to determine the crystal structure of a new material that may have nanoscale size or heterogeneities. Here we train an architecture of hierarchical random forest models capable of predicting the crystal system, space group, and lattice parameters from one or more unknown 2D electron diffraction patterns. Our initial model correctly identifies the crystal system of a simulated electron diffraction pattern from a 20 nm thick specimen of arbitrary orientation 67% of the time. We achieve a topline accuracy of 79% when aggregating predictions from 10 patterns of the same material but different zone axes. The space group and lattice predictions range from 70-90% accuracy and median errors of 0.01-0.5 angstroms, respectively, for cubic, hexagonal, trigonal and tetragonal crystal systems while being less reliable on orthorhombic and monoclinic systems. We apply this architecture to a 4D-STEM scan of gold nanoparticles, where it accurately predicts the crystal structure and lattice constants. These random forest models can be used to significantly accelerate the analysis of electron diffraction patterns, particularly in the case of unknown crystal structures. Additionally, due to the speed of inference, these models could be integrated into live TEM experiments, allowing real-time labeling of a specimen. △ Less

Submitted 24 June, 2024; originally announced June 2024.

A method for crystallographic map** of an alpha-beta titanium alloy with nanometre resolution using scanning precession electron diffraction and open-source software libraries

Authors: Ian MacLaren, Enrique Frutos-Myro, Steven Zeltmann, Colin Ophus

Abstract: An approach for the crystallographic map** of two-phase alloys on the nanoscale using a combination of scanned precession electron diffraction and open-source python libraries is introduced in this paper. This method is demonstrated using the example of a two-phase alpha / beta titanium alloy. The data was recorded using a direct electron detector to collect the patterns, and recently developed… ▽ More An approach for the crystallographic map** of two-phase alloys on the nanoscale using a combination of scanned precession electron diffraction and open-source python libraries is introduced in this paper. This method is demonstrated using the example of a two-phase alpha / beta titanium alloy. The data was recorded using a direct electron detector to collect the patterns, and recently developed algorithms to perform automated indexing and analyse the crystallography from the results. Very high-quality map** is achieved at a 3nm step size. The results show the expected Burgers orientation relationships between the alpha laths and beta matrix, as well as the expected misorientations between alpha laths. A minor issue was found that one area was affected by 180° ambiguities in indexing occur due to this area being aligned too close to a zone axis of the alpha with 2-fold projection symmetry (not present in 3D) in the Zero Order Laue Zone, and this should be avoided in data acquisition in the future. Nevertheless, this study demonstrates a good workflow for the analysis of nanocrystalline two- or multi-phase materials, which will be of widespread use in analysing two-phase titanium and other systems and how they evolve as a function of thermomechanical treatments. △ Less

Submitted 2 February, 2024; v1 submitted 17 October, 2023; originally announced October 2023.

Comments: Accepted and in-press at Journal of Microscopy

Iterative Phase Retrieval Algorithms for Scanning Transmission Electron Microscopy

Authors: Georgios Varnavides, Stephanie M. Ribet, Steven E. Zeltmann, Yue Yu, Benjamin H. Savitzky, Dana O. Byrne, Frances I. Allen, Vinayak P. Dravid, Mary C. Scott, Colin Ophus

Abstract: Scanning transmission electron microscopy (STEM) has been extensively used for imaging complex materials down to atomic resolution. The most commonly employed STEM modality, annular dark-field imaging, produces easily-interpretable contrast, but is dose-inefficient and produces little to no discernible contrast for light elements and weakly-scattering samples. An alternative is to use STEM phase r… ▽ More Scanning transmission electron microscopy (STEM) has been extensively used for imaging complex materials down to atomic resolution. The most commonly employed STEM modality, annular dark-field imaging, produces easily-interpretable contrast, but is dose-inefficient and produces little to no discernible contrast for light elements and weakly-scattering samples. An alternative is to use STEM phase retrieval imaging, enabled by high speed detectors able to record full images of a diffracted STEM probe over a grid of scan positions. Phase retrieval imaging in STEM is highly dose-efficient, enabling the measurement of the structure of beam-sensitive materials such as biological samples. Here, we comprehensively describe the theoretical background, algorithmic implementation details, and perform both simulated and experimental tests for three iterative phase retrieval STEM methods: focused-probe differential phase contrast, defocused-probe parallax imaging, and a generalized ptychographic gradient descent method implemented in two and three dimensions. We discuss the strengths and weaknesses of each of these approaches by comparing the transfer of information using analytical expressions and numerical results for a white-noise model. This presentation of STEM phase retrieval methods aims to make these methods more approachable, reproducible, and more readily adoptable for many classes of samples. △ Less

Submitted 20 May, 2024; v1 submitted 11 September, 2023; originally announced September 2023.

Comments: 25 pages, 14 figures, 1 table

The 4D Camera: an 87 kHz direct electron detector for scanning/transmission electron microscopy

Authors: Peter Ercius, Ian J. Johnson, Philipp Pelz, Benjamin H. Savitzky, Lauren Hughes, Hamish G. Brown, Steven E. Zeltmann, Shang-Lin Hsu, Cassio C. S. Pedroso, Bruce E. Cohen, Ramamoorthy Ramesh, David Paul, John M. Joseph, Thorsten Stezelberger, Cory Czarnik, Matthew Lent, Erin Fong, Jim Ciston, Mary C. Scott, Colin Ophus, Andrew M. Minor, and Peter Denes

Abstract: We describe the development, operation, and application of the 4D Camera -- a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 87,000 Hz. The detector generates data at approximately 480 Gbit/s which is captured by dedicated receiver computers with a parallelized software infrastructure that has been implemented to process the resulting 10 - 700… ▽ More We describe the development, operation, and application of the 4D Camera -- a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 87,000 Hz. The detector generates data at approximately 480 Gbit/s which is captured by dedicated receiver computers with a parallelized software infrastructure that has been implemented to process the resulting 10 - 700 Gigabyte-sized raw datasets. The back illuminated detector provides the ability to detect single electron events at accelerating voltages from 30 - 300 keV. Through electron counting, the resulting sparse data sets are reduced in size by 10 - 300x compared to the raw data, and open-source sparsity-based processing algorithms offer rapid data analysis. The high frame rate allows for large and complex 4D-STEM experiments to be accomplished with typical STEM scanning parameters. △ Less

Submitted 19 May, 2023; originally announced May 2023.

Design of Electrostatic Aberration Correctors for Scanning Transmission Electron Microscopy

Authors: Stephanie M. Ribet, Steven E. Zeltmann, Karen C. Bustillo, Rohan Dhall, Peter Denes, Andrew M. Minor, Roberto dos Reis, Vinayak P. Dravid, Colin Ophus

Abstract: In a scanning transmission electron microscope (STEM), producing a high-resolution image generally requires an electron beam focused to the smallest point possible. However, the magnetic lenses used to focus the beam are unavoidably imperfect, introducing aberrations that limit resolution. Modern STEMs overcome this by using hardware aberration correctors comprised of many multipole lenses, but th… ▽ More In a scanning transmission electron microscope (STEM), producing a high-resolution image generally requires an electron beam focused to the smallest point possible. However, the magnetic lenses used to focus the beam are unavoidably imperfect, introducing aberrations that limit resolution. Modern STEMs overcome this by using hardware aberration correctors comprised of many multipole lenses, but these devices are complex, expensive, and can be difficult to tune. We demonstrate a design for an electrostatic phase plate that can act as an aberration corrector. The corrector is comprised of annular segments, each of which is an independent two-terminal device that can apply a constant or ramped phase shift to a portion of the electron beam. We show the improvement in image resolution using an electrostatic corrector. Engineering criteria impose that much of the beam within the probe-forming aperture be blocked by support bars, leading to large probe tails for the corrected probe that sample the specimen beyond the central lobe. We also show how this device can be used to create other STEM beam profiles such as vortex beams and beams with a high degree of phase diversity, which improve information transfer in ptychographic reconstructions. △ Less

Submitted 16 March, 2023; originally announced March 2023.

Comments: 12 pages, 10 figures

Crystal Toolkit: A Web App Framework to Improve Usability and Accessibility of Materials Science Research Algorithms

Authors: Matthew Horton, Jimmy-Xuan Shen, Jordan Burns, Orion Cohen, François Chabbey, Alex M. Ganose, Rishabh Guha, Patrick Huck, Hamming Howard Li, Matthew McDermott, Joseph Montoya, Guy Moore, Jason Munro, Cody O'Donnell, Colin Ophus, Guido Petretto, Janosh Riebesell, Steven Wetizner, Brook Wander, Donald Winston, Ruoxi Yang, Steven Zeltmann, Anubhav Jain, Kristin A. Persson

Abstract: Crystal Toolkit is an open source tool for viewing, analyzing and transforming crystal structures, molecules and other common forms of materials science data in an interactive way. It is intended to help beginners rapidly develop web-based apps to explore their own data or to help developers make their research algorithms accessible to a broader audience of scientists who might not have any traini… ▽ More Crystal Toolkit is an open source tool for viewing, analyzing and transforming crystal structures, molecules and other common forms of materials science data in an interactive way. It is intended to help beginners rapidly develop web-based apps to explore their own data or to help developers make their research algorithms accessible to a broader audience of scientists who might not have any training in computer programming and who would benefit from graphical interfaces. Crystal Toolkit comes with a library of ready-made components that can be assembled to make complex web apps: simulation of powder and single crystalline diffraction patterns, convex hull phase diagrams, Pourbaix diagrams, electronic band structures, analysis of local chemical environments and symmetry, and more. Crystal Toolkit is now powering the Materials Project website frontend, providing user-friendly access to its database of computed materials properties. In the future, it is hoped that new visualizations might be prototyped using Crystal Toolkit to help explore new forms of data being generated by the materials science community, and that this in turn can help new materials scientists develop intuition for how their data behaves and the insights that might be found within. Crystal Toolkit will remain a work-in-progress and is open to contributions from the community. △ Less

Submitted 27 February, 2023; v1 submitted 13 February, 2023; originally announced February 2023.

Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave model

Authors: Steven E Zeltmann, Shang-Lin Hsu, Hamish G Brown, Sandhya Susarla, Ramamoorthy Ramesh, Andrew M Minor, Colin Ophus

Abstract: Nanobeam electron diffraction can probe local structural properties of complex crystalline materials including phase, orientation, tilt, strain, and polarization. Ideally, each diffraction pattern from a projected area of a few unit cells would produce clear a Bragg diffraction pattern, where the reciprocal lattice vectors can be measured from the spacing of the diffracted spots, and the spot inte… ▽ More Nanobeam electron diffraction can probe local structural properties of complex crystalline materials including phase, orientation, tilt, strain, and polarization. Ideally, each diffraction pattern from a projected area of a few unit cells would produce clear a Bragg diffraction pattern, where the reciprocal lattice vectors can be measured from the spacing of the diffracted spots, and the spot intensities are equal to the square of the structure factor amplitudes. However, many samples are too thick for this simple interpretation of their diffraction patterns, as multiple scattering of the electron beam can produce a highly nonlinear relationship between the spot intensities and the underlying structure. Here, we develop a stacked Bloch wave method to model the diffracted intensities from thick samples with structure that varies along the electron beam. Our method reduces the large parameter space of electron scattering to just a few structural variables per probe position, making it fast enough to apply to very large fields of view. We apply our method to SrTiO$_3$/PbTiO$_3$/SrTiO$_3$ multilayer samples, and successfully disentangle specimen tilt from the mean polarization of the PbTiO$_3$ layers. We elucidate the structure of complex vortex topologies in the PbTiO$_3$ layers, demonstrating the promise of our method to extract material properties from thick samples. △ Less

Submitted 10 April, 2023; v1 submitted 10 November, 2022; originally announced November 2022.

One Dimensional Wormhole Corrosion in Metals

Authors: Yang Yang, Weiyue Zhou, Sheng Yin, Sarah Y. Wang, Qin Yu, Matthew J. Olszta, Ya-Qian Zhang, Steven E. Zeltmann, Mingda Li, Miaomiao **, Daniel K. Schreiber, Jim Ciston, M. C. Scott, John R. Scully, Robert O. Ritchie, Mark Asta, Ju Li, Michael P. Short, Andrew M. Minor

Abstract: Corrosion is a ubiquitous failure mode of materials in extreme environments. The more localized it is, the more difficult it is to detect and more deleterious its effects. Often, the progression of localized corrosion is accompanied by the evolution of porosity in materials, creating internal void-structures that facilitate the ingress of the external environment into the interior of the material,… ▽ More Corrosion is a ubiquitous failure mode of materials in extreme environments. The more localized it is, the more difficult it is to detect and more deleterious its effects. Often, the progression of localized corrosion is accompanied by the evolution of porosity in materials, creating internal void-structures that facilitate the ingress of the external environment into the interior of the material, further accelerating the internal corrosion. Previously, the dominant morphology of such void-structures has been reported to be either three-dimensional (3D) or two-dimensional (2D). Here, we report a more localized form of corrosion, which we call 1D wormhole corrosion. Using electron tomography, we show multiple examples of this 1D and percolating morphology that manifests a significantly high aspect ratio differentiable from 2D and 3D corrosion. To understand the origin of this mechanism in a Ni-Cr alloy corroded by molten salt, we combined energy-filtered four-dimensional scanning transmission electron microscopy (EF-4D-STEM) and ab initio density functional theory (DFT) calculations to develop a vacancy map** method with nanometer-resolution, identifying a remarkably high vacancy concentration in the diffusion-induced grain boundary migration (DIGM) zone, up to 100 times the equilibrium value at the melting point. These vacancy supersaturation regions act as the precursors of wormholes, and lead to the asymmetrical growth of voids along GBs. We show that similar 1D penetrating corrosion morphologies could also occur in other materials or corrosion conditions, implying the broad impact of this extremely localized corrosion mechanism. Deciphering the origins of 1D corrosion is an important step towards designing structural materials with enhanced corrosion resistance, and also offers new pathways to create ordered-porous materials for functional applications. △ Less

Submitted 30 March, 2022; originally announced March 2022.

Disentangling multiple scattering with deep learning: application to strain map** from electron diffraction patterns

Authors: Joydeep Munshi, Alexander Rakowski, Benjamin H Savitzky, Steven E Zeltmann, Jim Ciston, Matthew Henderson, Shreyas Cholia, Andrew M Minor, Maria KY Chan, Colin Ophus

Abstract: Implementation of a fast, robust, and fully-automated pipeline for crystal structure determination and underlying strain map** for crystalline materials is important for many technological applications. Scanning electron nanodiffraction offers a procedure for identifying and collecting strain maps with good accuracy and high spatial resolutions. However, the application of this technique is limi… ▽ More Implementation of a fast, robust, and fully-automated pipeline for crystal structure determination and underlying strain map** for crystalline materials is important for many technological applications. Scanning electron nanodiffraction offers a procedure for identifying and collecting strain maps with good accuracy and high spatial resolutions. However, the application of this technique is limited, particularly in thick samples where the electron beam can undergo multiple scattering, which introduces signal nonlinearities. Deep learning methods have the potential to invert these complex signals, but previous implementations are often trained only on specific crystal systems or a small subset of the crystal structure and microscope parameter phase space. In this study, we implement a Fourier space, complex-valued deep neural network called FCU-Net, to invert highly nonlinear electron diffraction patterns into the corresponding quantitative structure factor images. We trained the FCU-Net using over 200,000 unique simulated dynamical diffraction patterns which include many different combinations of crystal structures, orientations, thicknesses, microscope parameters, and common experimental artifacts. We evaluated the trained FCU-Net model against simulated and experimental 4D-STEM diffraction datasets, where it substantially out-performs conventional analysis methods. Our simulated diffraction pattern library, implementation of FCU-Net, and trained model weights are freely available in open source repositories, and can be adapted to many different diffraction measurement problems. △ Less

Submitted 31 January, 2022; originally announced February 2022.

Comments: 17 pages, 7 figures

Automated Crystal Orientation Map** in py4DSTEM using Sparse Correlation Matching

Authors: Colin Ophus, Steven E Zeltmann, Alexandra Bruefach, Alexander Rakowski, Benjamin H Savitzky, Andrew M Minor, MC Scott

Abstract: Crystalline materials used in technological applications are often complex assemblies composed of multiple phases and differently oriented grains. Robust identification of the phases and orientation relationships from these samples is crucial, but the information extracted from the diffraction condition probed by an electron beam is often incomplete. We therefore have developed an automated crysta… ▽ More Crystalline materials used in technological applications are often complex assemblies composed of multiple phases and differently oriented grains. Robust identification of the phases and orientation relationships from these samples is crucial, but the information extracted from the diffraction condition probed by an electron beam is often incomplete. We therefore have developed an automated crystal orientation map** (ACOM) procedure which uses a converged electron probe to collect diffraction patterns from multiple locations across a complex sample. We provide an algorithm to determine the orientation of each diffraction pattern based on a fast sparse correlation method. We test the speed and accuracy of our method by indexing diffraction patterns generated using both kinematical and dynamical simulations. We have also measured orientation maps from an experimental dataset consisting of a complex polycrystalline twisted helical AuAgPd nanowire. From these maps we identify twin planes between adjacent grains, which may be responsible for the twisted helical structure. All of our methods are made freely available as open source code, including tutorials which can be easily adapted to perform ACOM measurements on diffraction pattern datasets. △ Less

Submitted 30 October, 2021; originally announced November 2021.

Comments: 14 pages, 7 figures

Multibeam Electron Diffraction

Authors: Xuhao Hong, Steven E Zeltmann, Benjamin H Savitzky, Luis Rangel DaCosta, Alexander Mueller, Andrew M Minor, Karen Bustillo, Colin Ophus

Abstract: One of the primary uses for transmission electron microscopy (TEM) is to measure diffraction pattern images in order to determine a crystal structure and orientation. In nanobeam electron diffraction (NBED) we scan a moderately converged electron probe over the sample to acquire thousands or even millions of sequential diffraction images, a technique that is especially appropriate for polycrystall… ▽ More One of the primary uses for transmission electron microscopy (TEM) is to measure diffraction pattern images in order to determine a crystal structure and orientation. In nanobeam electron diffraction (NBED) we scan a moderately converged electron probe over the sample to acquire thousands or even millions of sequential diffraction images, a technique that is especially appropriate for polycrystalline samples. However, due to the large Ewald sphere of TEM, excitation of Bragg peaks can be extremely sensitive to sample tilt, varying strongly for even a few degrees of sample tilt for crystalline samples. In this paper, we present multibeam electron diffraction (MBED), where multiple probe forming apertures are used to create mutiple STEM probes, all of which interact with the sample simultaneously. We detail designs for MBED experiments, and a method for using a focused ion beam (FIB) to produce MBED apertures. We show the efficacy of the MBED technique for crystalline orientation map** using both simulations and proof-of-principle experiments. We also show how the angular information in MBED can be used to perform 3D tomographic reconstruction of samples without needing to tilt or scan the sample multiple times. Finally, we also discuss future opportunities for the MBED method. △ Less

Submitted 18 September, 2020; originally announced September 2020.

Comments: 14 pages, 6 figures

Journal ref: Microsc Microanal 27 (2021) 129-139

py4DSTEM: a software package for multimodal analysis of four-dimensional scanning transmission electron microscopy datasets

Authors: Benjamin H Savitzky, Lauren A Hughes, Steven E Zeltmann, Hamish G Brown, Shiteng Zhao, Philipp M Pelz, Edward S Barnard, Jennifer Donohue, Luis Rangel DaCosta, Thomas C. Pekin, Ellis Kennedy, Matthew T Janish, Matthew M Schneider, Patrick Herring, Chirranjeevi Gopal, Abraham Anapolsky, Peter Ercius, Mary Scott, Jim Ciston, Andrew M Minor, Colin Ophus

Abstract: Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a full 2D image of the diffracted electron beam at each probe position, typically a 2D grid of probe positions. These 4D-STEM datasets are rich in information, in… ▽ More Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a full 2D image of the diffracted electron beam at each probe position, typically a 2D grid of probe positions. These 4D-STEM datasets are rich in information, including signatures of the local structure, orientation, deformation, electromagnetic fields and other sample-dependent properties. However, extracting this information requires complex analysis pipelines, from data wrangling to calibration to analysis to visualization, all while maintaining robustness against imaging distortions and artifacts. In this paper, we present py4DSTEM, an analysis toolkit for measuring material properties from 4D-STEM datasets, written in the Python language and released with an open source license. We describe the algorithmic steps for dataset calibration and various 4D-STEM property measurements in detail, and present results from several experimental datasets. We have also implemented a simple and universal file format appropriate for electron microscopy data in py4DSTEM, which uses the open source HDF5 standard. We hope this tool will benefit the research community, helps to move the develo** standards for data and computational methods in electron microscopy, and invite the community to contribute to this ongoing, fully open-source project. △ Less

Submitted 20 March, 2020; originally announced March 2020.

Comments: 32 pages, 18 figures

Observation of spin-momentum locked surface states in amorphous Bi$_{2}$Se$_{3}$

Authors: Paul Corbae, Samuel Ciocys, Daniel Varjas, Ellis Kennedy, Steven Zeltmann, Manel Molina-Ruiz, Sinead Griffin, Chris Jozwiak, Zhanghui Chen, Lin-Wang Wang, Andrew M. Minor, Mary Scott, Adolfo G. Grushin, Alessandra Lanzara, Frances Hellman

Abstract: Crystalline symmetries have played a central role in the identification of topological materials. The use of symmetry indicators and band representations have enabled a classification scheme for crystalline topological materials, leading to large scale topological materials discovery. In this work we address whether amorphous topological materials, which lie beyond this classification due to the l… ▽ More Crystalline symmetries have played a central role in the identification of topological materials. The use of symmetry indicators and band representations have enabled a classification scheme for crystalline topological materials, leading to large scale topological materials discovery. In this work we address whether amorphous topological materials, which lie beyond this classification due to the lack of long-range structural order, exist in the solid state. We study amorphous Bi$_2$Se$_3$ thin films, which show a metallic behavior and an increased bulk resistance. The observed low field magnetoresistance due to weak antilocalization demonstrates a significant number of two dimensional surface conduction channels. Our angle-resolved photoemission spectroscopy data is consistent with a dispersive two-dimensional surface state that crosses the bulk gap. Spin resolved photoemission spectroscopy shows this state has an anti-symmetric spin texture resembling that of the surface state of crystalline Bi$_2$Se$_3$. These experimental results are consistent with theoretical photoemission spectra obtained with an amorphous tight-binding model that utilizes a realistic amorphous structure. This discovery of amorphous materials with topological properties uncovers an overlooked subset of topological matter outside the current classification scheme, enabling a new route to discover materials that can enhance the development of scalable topological devices. △ Less

Submitted 12 February, 2023; v1 submitted 29 October, 2019; originally announced October 2019.

Comments: 30 pages, 4 figures

Journal ref: Nature Materials, 22, 200-206 (2023)

Patterned Probes for High Precision 4D-STEM Bragg Measurements

Authors: Steven E Zeltmann, Alexander Müller, Karen C Bustillo, Benjamin Savitzky, Lauren Hughes, Andrew M Minor, Colin Ophus

Abstract: Nanoscale strain map** by four-dimensional scanning transmission electron microscopy (4D-STEM) relies on determining the precise locations of Bragg-scattered electrons in a sequence of diffraction patterns, a task which is complicated by dynamical scattering, inelastic scattering, and shot noise. These features hinder accurate automated computational detection and position measurement of the dif… ▽ More Nanoscale strain map** by four-dimensional scanning transmission electron microscopy (4D-STEM) relies on determining the precise locations of Bragg-scattered electrons in a sequence of diffraction patterns, a task which is complicated by dynamical scattering, inelastic scattering, and shot noise. These features hinder accurate automated computational detection and position measurement of the diffracted disks, limiting the precision of measurements of local deformation. Here, we investigate the use of patterned probes to improve the precision of strain map**. We imprint a "bullseye" pattern onto the probe, by using a binary mask in the probe-forming aperture, to improve the robustness of the peak finding algorithm to intensity modulations inside the diffracted disks. We show that this imprinting leads to substantially improved strain-map** precision at the expense of a slight decrease in spatial resolution. In experiments on an unstrained silicon reference sample, we observe an improvement in strain measurement precision from 2.7% of the reciprocal lattice vectors with standard probes to 0.3% using bullseye probes for a thin sample, and an improvement from 4.7% to 0.8% for a thick sample. We also use multislice simulations to explore how sample thickness and electron dose limit the attainable accuracy and precision for 4D-STEM strain measurements. △ Less

Submitted 8 November, 2019; v1 submitted 11 July, 2019; originally announced July 2019.

Comments: 29 pages, 7 figures; revision 1