Showing 1–2 of 2 results for author: Yaghobian, F
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Tailored nano-antennas for directional Raman studies of individual carbon nanotubes
Authors:
Nicola Paradiso,
Fatemeh Yaghobian,
Christoph Lange,
Tobias Korn,
Christian Schüller,
Rupert Huber,
Christoph Strunk
Abstract:
We exploit the near field enhancement of nano-antennas to investigate the Raman spectra of otherwise not optically detectable carbon nanotubes (CNTs). We demonstrate that a top-down fabrication approach is particularly promising when applied to CNTs, owing to the sharp dependence of the scattered intensity on the angle between incident light polarization and CNT axis. In contrast to tip enhancemen…
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We exploit the near field enhancement of nano-antennas to investigate the Raman spectra of otherwise not optically detectable carbon nanotubes (CNTs). We demonstrate that a top-down fabrication approach is particularly promising when applied to CNTs, owing to the sharp dependence of the scattered intensity on the angle between incident light polarization and CNT axis. In contrast to tip enhancement techniques, our method enables us to control the light polarization in the sample plane, locally amplifying and rotating the incident field and hence optimizing the Raman signal. Such promising features are confirmed by numerical simulations presented here. The relative ease of fabrication and alignment makes this technique suitable for the realization of integrated devices that combine scanning probe, optical, and transport characterization.
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Submitted 15 June, 2015;
originally announced June 2015.
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Weak localization and Raman study of anisotropically etched graphene antidots
Authors:
Florian Oberhuber,
Stefan Blien,
Stefanie Heydrich,
Fatemeh Yaghobian,
Tobias Korn,
Christian Schüller,
Christoph Strunk,
Dieter Weiss,
Jonathan Eroms
Abstract:
We study a crystallographic etching process of graphene nanostructures where zigzag edges can be prepared selectively. The process involves heating exfoliated single-layer graphene samples with a predefined pattern of antidot arrays in an argon atmosphere at 820 C, which selectively removes carbon atoms located on armchair sites. Atomic force microscopy and scanning electron microscopy cannot reso…
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We study a crystallographic etching process of graphene nanostructures where zigzag edges can be prepared selectively. The process involves heating exfoliated single-layer graphene samples with a predefined pattern of antidot arrays in an argon atmosphere at 820 C, which selectively removes carbon atoms located on armchair sites. Atomic force microscopy and scanning electron microscopy cannot resolve the structure on the atomic scale. However, weak localization and Raman measurements - which both probe intervalley scattering at armchair edges - indicate that zigzag regions are enhanced compared to samples prepared with oxygen based reactive ion etching only.
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Submitted 9 October, 2013; v1 submitted 14 August, 2013;
originally announced August 2013.