Showing 1–4 of 4 results for author: Wittwer, F

Object Initialization For Ptychographic Scans With Reduced Overlap

Authors: Felix Wittwer, Peter Modregger

Abstract: X-ray ptychography utilizes overlap** illuminations to reconstruct the object's phase and absorption signal with spatial resolutions much smaller than the focus size. Usually, the illumination overlap is chosen to be between 50% and 60% in order to ensure high quality reconstructions at reasonable scan times and/or doses. Here, we experimentally demonstrate that ptychographic iteration with obje… ▽ More X-ray ptychography utilizes overlap** illuminations to reconstruct the object's phase and absorption signal with spatial resolutions much smaller than the focus size. Usually, the illumination overlap is chosen to be between 50% and 60% in order to ensure high quality reconstructions at reasonable scan times and/or doses. Here, we experimentally demonstrate that ptychographic iteration with object instead of flat initialization allows for a significant reduction of the overlap with only a modest loss in reconstruction quality. This approach could prove beneficial for dose sensitive experiments and for rapid feedback overview scans. △ Less

Submitted 27 July, 2022; originally announced July 2022.

Ptychographic reconstruction with wavefront initialization

Authors: Felix Wittwer, Peter Modregger

Abstract: X-ray ptychography is a cutting edge imaging technique providing ultra-high spatial resolutions. In ptychography, phase retrieval, i.e., the recovery of a complex valued signal from intensity-only measurements, is enabled by exploiting a redundancy of information contained in diffraction patterns measured with overlap** illuminations. For samples that are considerably larger than the probe we sh… ▽ More X-ray ptychography is a cutting edge imaging technique providing ultra-high spatial resolutions. In ptychography, phase retrieval, i.e., the recovery of a complex valued signal from intensity-only measurements, is enabled by exploiting a redundancy of information contained in diffraction patterns measured with overlap** illuminations. For samples that are considerably larger than the probe we show that during the iteration the bulk information has to propagate from the sample edges to the center. This constitutes an inherent limitation of reconstruction speed for algorithms that use a flat initialization. Here, we experimentally demonstrate that a considerable improvement of computational speed can be achieved by utilizing a low resolution sample wavefront retrieved from measured diffraction patterns as initialization. In addition, we show that this approach avoids phase singularity artifacts due to strong phase gradients. Wavefront initialization is computationally fast and compatible with non-bulky samples. Therefore, the presented approach is readily adaptable with established ptychographic reconstruction algorithms implying a wide spread use. △ Less

Submitted 22 May, 2022; originally announced May 2022.

Accelerating X-Ray Tracing for Exascale Systems using Kokkos

Authors: Felix Wittwer, Nicholas K. Sauter, Derek Mendez, Billy K. Poon, Aaron S. Brewster, James M. Holton, Michael E. Wall, William E. Hart, Deborah J. Bard, Johannes P. Blaschke

Abstract: The upcoming exascale computing systems Frontier and Aurora will draw much of their computing power from GPU accelerators. The hardware for these systems will be provided by AMD and Intel, respectively, each supporting their own GPU programming model. The challenge for applications that harness one of these exascale systems will be to avoid lock-in and to preserve performance portability. We rep… ▽ More The upcoming exascale computing systems Frontier and Aurora will draw much of their computing power from GPU accelerators. The hardware for these systems will be provided by AMD and Intel, respectively, each supporting their own GPU programming model. The challenge for applications that harness one of these exascale systems will be to avoid lock-in and to preserve performance portability. We report here on our results of using Kokkos to accelerate a real-world application on NERSC's Perlmutter Phase 1 (using NVIDIA A100 accelerators) and the testbed system for OLCF's Frontier (using AMD MI250X). By porting to Kokkos, we were able to successfully run the same X-ray tracing code on both systems and achieved speed-ups between 13% and 66% compared to the original CUDA code. These results are a highly encouraging demonstration of using Kokkos to accelerate production science code. △ Less

Submitted 16 May, 2022; originally announced May 2022.

Ptychographic characterization of polymer compound refractive lenses manufactured by additive technology

Authors: Mikhail Lyubomirskiy, Frieder Koch, Ksenia Abrashitova, Vladimir Bessonov, Natalia Kokareva, Alexander Petrov, Frank Seiboth, Felix Wittwer, Maik Kahnt, Martin Seyrich Andrey Fedyanin, Christian David, Christian Schroer

Abstract: The recent success in the development of high precision printing techniques allows one to manufacture free-standing polymer structures of high quality. Two-photon polymerization lithography is a mask-less technique with down to 100 μm resolution that provides full geometric freedom. It has recently been applied to the nanofabrication of X-ray compound refractive lenses (CRLs). In this article we r… ▽ More The recent success in the development of high precision printing techniques allows one to manufacture free-standing polymer structures of high quality. Two-photon polymerization lithography is a mask-less technique with down to 100 μm resolution that provides full geometric freedom. It has recently been applied to the nanofabrication of X-ray compound refractive lenses (CRLs). In this article we report on the characterization of two sets of CRLs of different design produced by two-photon polymerization induced lithography. △ Less

Submitted 14 December, 2018; originally announced December 2018.