Resonance-enhanced multiphoton ionization in the x-ray regime
Authors:
Aaron C. LaForge,
Sang-Kil Son,
Debadarshini Mishra,
Markus Ilchen,
Stephen Duncanson,
Eemeli Eronen,
Edwin Kukk,
Stanislaw Wirok-Stoletow,
Daria Kolbasova,
Peter Walter,
Rebecca Boll,
Alberto De Fanis,
Michael Meyer,
Yevheniy Ovcharenko,
Daniel E. Rivas,
Philipp Schmidt,
Sergey Usenko,
Robin Santra,
Nora Berrah
Abstract:
Here, we report on the nonlinear ionization of argon atoms in the short wavelength regime using ultraintense x rays from the European XFEL. After sequential multiphoton ionization, high charge states are obtained. For photon energies that are insufficient to directly ionize a $1s$ electron, a different mechanism is required to obtain ionization to Ar$^{17+}$. We propose this occurs through a two-c…
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Here, we report on the nonlinear ionization of argon atoms in the short wavelength regime using ultraintense x rays from the European XFEL. After sequential multiphoton ionization, high charge states are obtained. For photon energies that are insufficient to directly ionize a $1s$ electron, a different mechanism is required to obtain ionization to Ar$^{17+}$. We propose this occurs through a two-color process where the second harmonic of the FEL pulse resonantly excites the system via a $1s \rightarrow 2p$ transition followed by ionization by the fundamental FEL pulse, which is a type of x-ray resonance-enhanced multiphoton ionization (REMPI). This resonant phenomenon occurs not only for Ar$^{16+}$, but through multiple lower charge states, where multiple ionization competes with decay lifetimes, making x-ray REMPI distinctive from conventional REMPI. With the aid of state-of-the-art theoretical calculations, we explain the effects of x-ray REMPI on the relevant ion yields and spectral profile.
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Submitted 5 November, 2021; v1 submitted 15 October, 2021;
originally announced October 2021.
