Gaia on-board metrology: basic angle and best focus
Authors:
A. Mora,
M. Biermann,
A. G. A. Brown,
D. Busonero,
L. Carminati,
J. M. Carrasco,
F. Chassat,
M. Erdmann,
W. L. M. Gielesen,
C. Jordi,
D. Katz,
R. Kohley,
L. Lindegren,
W. Loeffler,
O. Marchal,
P. Panuzzo,
G. Seabroke,
J. Sahlmann,
E. Serpell,
I. Serraller,
F. van Leeuwen,
W. van Reeven,
T. C. van den Dool,
L. L. A. Vosteen
Abstract:
The Gaia payload ensures maximum passive stability using a single material, SiC, for most of its elements. Dedicated metrology instruments are, however, required to carry out two functions: monitoring the basic angle and refocusing the telescope. Two interferometers fed by the same laser are used to measure the basic angle changes at the level of $μ$as (prad, micropixel), which is the highest leve…
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The Gaia payload ensures maximum passive stability using a single material, SiC, for most of its elements. Dedicated metrology instruments are, however, required to carry out two functions: monitoring the basic angle and refocusing the telescope. Two interferometers fed by the same laser are used to measure the basic angle changes at the level of $μ$as (prad, micropixel), which is the highest level ever achieved in space. Two Shack-Hartmann wavefront sensors, combined with an ad-hoc analysis of the scientific data are used to define and reach the overall best-focus. In this contribution, the systems, data analysis, procedures and performance achieved during commissioning are presented
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Submitted 14 July, 2014;
originally announced July 2014.
