Showing 1–1 of 1 results for author: Vermeulen, H
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Emissivity of freestanding membranes with thin metal coatings
Authors:
P. J. van Zwol,
D. F. Vles,
W. P. Voorthuijzen,
M. Péter,
H. Vermeulen,
W. J. van der Zande,
J. M. Sturm. R. W. E. van de Kruijs,
F. Bijkerk
Abstract:
Freestanding silicon nitride membranes with thicknesses down to a few tens of nanometers find use as TEM windows or soft X-ray spectral purity filters. As the thickness of a membrane decreases, emissivity vanishes, which limits radiative heat emission and resistance to heat loads. We show that thin metal layers with thicknesses in the order of 1 nm enhance the emissivity of thin membranes by two t…
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Freestanding silicon nitride membranes with thicknesses down to a few tens of nanometers find use as TEM windows or soft X-ray spectral purity filters. As the thickness of a membrane decreases, emissivity vanishes, which limits radiative heat emission and resistance to heat loads. We show that thin metal layers with thicknesses in the order of 1 nm enhance the emissivity of thin membranes by two to three orders of magnitude close to the theoretical limit of 0.5. This considerably increases thermal load capacity of membranes in vacuum environments. Our experimental results are in line with classical theory in which we adapt thickness dependent scattering terms in the Drude and Lorentz oscillators.
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Submitted 19 November, 2015;
originally announced November 2015.
