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Showing 1–2 of 2 results for author: Velasco, A E

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  1. arXiv:2108.07962  [pdf, other

    physics.app-ph

    Impedance-matched differential superconducting nanowire detectors

    Authors: Marco Colangelo, Boris Korzh, Jason P. Allmaras, Andrew D. Beyer, Andrew S. Mueller, Ryan M. Briggs, Bruce Bumble, Marcus Runyan, Martin J. Stevens, Adam N. McCaughan, Di Zhu, Stephen Smith, Wolfgang Becker, Lautaro Narváez, Joshua C. Bienfang, Simone Frasca, Angel E. Velasco, Cristián H. Peña, Edward E. Ramirez, Alexander B. Walter, Ekkehart Schmidt, Emma E. Wollman, Maria Spiropulu, Richard Mirin, Sae Woo Nam , et al. (2 additional authors not shown)

    Abstract: Superconducting nanowire single-photon detectors (SNSPDs) are the highest performing photon-counting technology in the near-infrared (NIR). Due to delay-line effects, large area SNSPDs typically trade-off timing resolution and detection efficiency. Here, we introduce a detector design based on transmission line engineering and differential readout for device-level signal conditioning, enabling a h… ▽ More

    Submitted 17 August, 2021; originally announced August 2021.

  2. arXiv:1811.03991  [pdf, other

    physics.ins-det physics.app-ph

    Superconducting nanowire single-photon detector with integrated impedance-matching taper

    Authors: Di Zhu, Marco Colangelo, Boris A. Korzh, Qing-Yuan Zhao, Simone Frasca, Andrew E. Dane, Angel E. Velasco, Andrew D. Beyer, Jason P. Allmaras, Edward Ramirez, William J. Strickland, Daniel F. Santavicca, Matthew D. Shaw, Karl K. Berggren

    Abstract: Conventional readout of a superconducting nanowire single-photon detector (SNSPD) sets an upper bound on the output voltage to be the product of the bias current and the load impedance, $I_\mathrm{B}\times Z_\mathrm{load}$, where $Z_\mathrm{load}$ is limited to 50 $Ω$ in standard r.f. electronics. Here, we break this limit by interfacing the 50 $Ω$ load and the SNSPD using an integrated supercondu… ▽ More

    Submitted 9 November, 2018; originally announced November 2018.

    Journal ref: Appl. Phys. Lett. 114, 042601 (2019)