Development and validation of a cryogenic far-infrared diffraction grating spectrometer used to post-disperse the output from a Fourier transform spectrometer
Authors:
Alicia M. Anderson,
David A. Naylor,
Brad G. Gom,
Matthew A. Buchan,
Adam J. Christiansen,
Ian T. Veenendaal
Abstract:
Recent advances in far-infrared detector technology have led to increases in raw sensitivity of more than an order of magnitude over previous state-of-the-art detectors. With such sensitivity, photon noise becomes the dominant noise component, even when using cryogenically cooled optics, unless a method of restricting the spectral bandpass is employed. The leading instrument concept features refle…
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Recent advances in far-infrared detector technology have led to increases in raw sensitivity of more than an order of magnitude over previous state-of-the-art detectors. With such sensitivity, photon noise becomes the dominant noise component, even when using cryogenically cooled optics, unless a method of restricting the spectral bandpass is employed. The leading instrument concept features reflecting diffraction gratings which post-disperse the light that has been modulated by a polarizing Fourier transform spectrometer (FTS) onto a detector array, thereby reducing the photon noise on each detector. This paper discusses the development of a cryogenic (4 K) diffraction grating spectrometer which operates over the wavelength range from 285 - 500 $μ$m and was used to post-disperse the output from a room-temperature polarizing FTS. Measurements of the grating spectral response and diffraction efficiency are presented as a function of both wavelength and polarization to characterize the instrumental performance.
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Submitted 30 January, 2024; v1 submitted 9 January, 2024;
originally announced January 2024.
