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Showing 1–3 of 3 results for author: Valencia-Zapata, G A

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  1. arXiv:2004.02988  [pdf, other

    cs.LG cs.AI stat.ML

    Probabilistic Diagnostic Tests for Degradation Problems in Supervised Learning

    Authors: Gustavo A. Valencia-Zapata, Carolina Gonzalez-Canas, Michael G. Zentner, Okan Ersoy, Gerhard Klimeck

    Abstract: Several studies point out different causes of performance degradation in supervised machine learning. Problems such as class imbalance, overlap**, small-disjuncts, noisy labels, and sparseness limit accuracy in classification algorithms. Even though a number of approaches either in the form of a methodology or an algorithm try to minimize performance degradation, they have been isolated efforts… ▽ More

    Submitted 15 April, 2020; v1 submitted 6 April, 2020; originally announced April 2020.

  2. arXiv:1709.01439  [pdf

    cs.LG stat.ML

    A Statistical Approach to Increase Classification Accuracy in Supervised Learning Algorithms

    Authors: Gustavo A Valencia-Zapata, Daniel Mejia, Gerhard Klimeck, Michael Zentner, Okan Ersoy

    Abstract: Probabilistic mixture models have been widely used for different machine learning and pattern recognition tasks such as clustering, dimensionality reduction, and classification. In this paper, we focus on trying to solve the most common challenges related to supervised learning algorithms by using mixture probability distribution functions. With this modeling strategy, we identify sub-labels and g… ▽ More

    Submitted 5 September, 2017; originally announced September 2017.

    Comments: 7 pages, 9 figures, IPSI BgD Transactions

    Journal ref: PSI BGD TRANSACTIONS ON INTERNET RESEARCH 13.2 (2017)

  3. Grain Boundary Resistance in Copper Interconnects from an Atomistic Model to a Neural Network

    Authors: Daniel Valencia, Evan Wilson, Zheng** Jiang, Gustavo A. Valencia-Zapata, Gerhard Klimeck, Michael Povolotskyi

    Abstract: Orientation effects on the resistivity of copper grain boundaries are studied systematically with two different atomistic tight binding methods. A methodology is developed to model the resistivity of grain boundaries using the Embedded Atom Model, tight binding methods and non-equilibrum Green's functions (NEGF). The methodology is validated against first principles calculations for small, ultra-t… ▽ More

    Submitted 8 October, 2017; v1 submitted 17 January, 2017; originally announced January 2017.

    Comments: 18 pages, 12 figures

    Journal ref: Phys. Rev. Applied 9, 044005 (2018)