Broad Distribution of Local I/Br Ratio in Illuminated Mixed Halide Perovskite Films Revealed by Correlative X-ray Diffraction and Photoluminescence
Authors:
Klara Suchan,
Justus Just,
Pascal Becker,
Carolin Rehermann,
Aboma Merdasa,
Roland Mainz,
Ivan G. Scheblykin,
Eva L. Unger
Abstract:
Photo-induced phase-segregation in mixed halide perovskite MAPb(BrxI1-x)3 is investigated in the full compositional range by correlative X-ray diffraction and photo-luminescence experiments.
Photo-induced phase-segregation in mixed halide perovskite MAPb(BrxI1-x)3 is investigated in the full compositional range by correlative X-ray diffraction and photo-luminescence experiments.
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Submitted 3 January, 2021;
originally announced January 2021.
Transient Analysis during Maximum Power Point Tracking (TrAMPPT) to Assess Dynamic Response of Perovskite Solar Cells
Authors:
Aniela Czudek,
Katrin Hirselandt,
Lukas Kegelmann,
Amran Al-Ashouri,
Marko Jošt,
Weiwei Zuo,
Antonio Abate,
Lars Korte,
Steve Albrecht,
Janardan Dagar,
Eva L. Unger
Abstract:
Determination of the device performance parameters of perovskite solar cells is far from trivial as transient effects may cause large discrepancies in current-voltage measurements as a function of scan rate and pre-conditioning. Maximum power point tracking, MPPT, enables to determine the steady-state maximum power conversion efficiency. However, the MPPT does not provide any information on the de…
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Determination of the device performance parameters of perovskite solar cells is far from trivial as transient effects may cause large discrepancies in current-voltage measurements as a function of scan rate and pre-conditioning. Maximum power point tracking, MPPT, enables to determine the steady-state maximum power conversion efficiency. However, the MPPT does not provide any information on the device performance parameters, which are reliable only if extracted from current-voltage curves collected under steady-state conditions. We show that is possible to determine the shorter settling or delay time suitable to carry out J-V measurements under steady-state conditions by analysis of the transient device response around the MPP. This procedure proves to be more time-efficient than measurement J-V measurements at a variety of scan rates. Furthermore, the generic algorithm presented here can be implemented to assess changes in the dynamic response of devices during long-term device ageing.
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Submitted 12 June, 2019;
originally announced June 2019.
