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SiPM behaviour under continuous light
Authors:
A. Nagai,
C. Alispach,
D. della Volpe,
M. Heller,
T. Montaruli,
S. Njoh,
Y. Reniera,
I. Troyano-Pujadas
Abstract:
This paper reports on the behaviour of Silicon Photomultiplier (SiPM) detectors under continuous light. Usually, the bias circuit of a SiPM has a resistor connected in series to it, which protects the sensor from drawing too high current. This resistor introduces a voltage drop when a SiPM draws a steady current, when illuminated by constant light. This reduces the actual SiPM bias and then its se…
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This paper reports on the behaviour of Silicon Photomultiplier (SiPM) detectors under continuous light. Usually, the bias circuit of a SiPM has a resistor connected in series to it, which protects the sensor from drawing too high current. This resistor introduces a voltage drop when a SiPM draws a steady current, when illuminated by constant light. This reduces the actual SiPM bias and then its sensitivity to light. As a matter of fact, this effect changes all relevant SiPM features, both electrical (i.e. breakdown voltage, gain, pulse amplitude, dark count rate and optical crosstalk) and optical (i.e. photon detection efficiency). To correctly operate such devices, it is then fundamental to calibrate them under various illumination levels.
In this work, we focus on the large area ($\sim$1~cm$^{2}$) hexagonal SiPM S10943-2832(X) produced by Hamamatsu HPK for the camera of a gamma-ray telescope with 4 m-diameter mirror, called the SST-1M. We characterize this device under light rates raging from 3~MHz up to 5~GHz of photons per sensor at room temperature (T = 25 $^{\circ}$C). From these studies, a model is developed in order to derive the parameters needed to correct for the voltage drop effect. This model can be applied for instance in the analysis of the data acquired by the camera to correct for the effect. The experimental results are also compared with a toy Monte Carlo simulation and finally, a solution is proposed to compensate for the voltage drop.
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Submitted 25 November, 2019; v1 submitted 1 October, 2019;
originally announced October 2019.
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Characterisation of a large area silicon photomultiplier
Authors:
A. Nagai,
C. Alispach,
A. Barbano,
V. Coco,
D. della Volpe,
M. Heller,
T. Montaruli,
S. Njoh,
Y. Renier,
I. Troyano-Pujadas
Abstract:
This work illustrates and compares some methods to measure the most relevant parameters of silicon photo-multipliers (\sipm{}s), such as photon detection efficiency as a function of over-voltage and wavelength, dark count rate, optical cross-talk, afterpulse probability. For the measurement of the breakdown voltage, $V_{BD}$, several methods using the current-voltage $IV$ curve are compared, such…
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This work illustrates and compares some methods to measure the most relevant parameters of silicon photo-multipliers (\sipm{}s), such as photon detection efficiency as a function of over-voltage and wavelength, dark count rate, optical cross-talk, afterpulse probability. For the measurement of the breakdown voltage, $V_{BD}$, several methods using the current-voltage $IV$ curve are compared, such as the "IV Model", the "relative logarithmic derivative", the "inverse logarithmic derivative", the "second logarithmic derivative", and the "third derivative" models. We also show how some of these characteristics can be quite well described by few parameters and allow, for example, to build a function of the wavelength and over-voltage describing the photodetection efficiency. This is fundamental to determine the working point of SiPMs in applications where external factors can affect it.
These methods are applied to the large area monolithic hexagonal SiPM S10943-2832(X), developed in collaboration with Hamamatsu and adopted for a camera for a gamma-ray telescope, called the SST-1M. We describe the measurements of the performance at room temperature of this device. The methods used here can be applied to any other device and the physics background discussed here are quite general and valid for a large phase-space of the parameters.
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Submitted 9 January, 2020; v1 submitted 4 October, 2018;
originally announced October 2018.
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SENSE: A comparison of photon detection efficiency and optical crosstalk of various SiPM devices
Authors:
A. Nagai,
C. Alispach,
T. Berghöfer,
G. Bonanno,
V. Coco,
D. della Volpe,
A. Haungs,
M. Heller,
K. Henjes-Kunst,
R. Mirzoyan,
T. Montaruli,
G. Romeo,
Y. Renier,
H. C. Schultz-Coulon,
W. Shen,
D. Strom,
H. Tajima,
I. Troyano-Pujadas
Abstract:
This paper describes a comparison of photon detection efficiency and optical crosstalk measurements performed by three partners: Geneva University, Catania Observatory and Nagoya University. The measurements were compared for three different SiPM devices with different active areas: from 9 $mm^2$ up to 93.6 $mm^2$ produced by Hamamatsu. The objective of this work is to establish the measurements a…
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This paper describes a comparison of photon detection efficiency and optical crosstalk measurements performed by three partners: Geneva University, Catania Observatory and Nagoya University. The measurements were compared for three different SiPM devices with different active areas: from 9 $mm^2$ up to 93.6 $mm^2$ produced by Hamamatsu. The objective of this work is to establish the measurements and analysis procedures for calculating the main SiPM parameters and their precision. This work was done in the scope of SENSE project which aims to build roadmap for the last developments in field of sensors for low light level detection.
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Submitted 26 February, 2019; v1 submitted 11 December, 2017;
originally announced December 2017.