Dark-Field X-ray Microscopy for 2D and 3D imaging of Microstructural Dynamics at the European X-ray Free Electron Laser
Authors:
Sara J. Irvine,
Kento Katagiri,
Trygve M. Ræder,
Darshan Chalise,
Dayeeta Pal,
Jade I. Stanton,
Gabriele Ansaldi,
Ulrike Boesenberg,
Felix Brauße,
Jon H. Eggert,
Lichao Fang,
Eric Folsom,
Jörg Hallmann,
Morten Haubro,
Theodor S. Holstad,
Anders Madsen,
Johannes Möller,
Martin M. Nielsen,
Henning F. Poulsen,
Jan-Etienne Pudel,
Angel Rodriguez-Fernandez,
Frank Schoofs,
Frank Seiboth,
Yifan Wang,
Jo Wonhyuk
, et al. (4 additional authors not shown)
Abstract:
Dark field X-ray microscopy (DXFM) has enabled experiments to visualize microstructural distortions in bulk crystals. Using the femtosecond X-ray pulses generated by X-ray free-electron lasers (XFEL), DFXM can achieve ~1-um spatial resolution and <100 fs time resolution simultaneously. In this paper, we present the first ultrafast DFXM measurements at the European XFEL. In this work, we demonstrat…
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Dark field X-ray microscopy (DXFM) has enabled experiments to visualize microstructural distortions in bulk crystals. Using the femtosecond X-ray pulses generated by X-ray free-electron lasers (XFEL), DFXM can achieve ~1-um spatial resolution and <100 fs time resolution simultaneously. In this paper, we present the first ultrafast DFXM measurements at the European XFEL. In this work, we demonstrate DFXM of laser-induced phonon wavepackets propagating through dislocations inside a diamond single crystal. In addition to demonstrating this new capability, we present two new DFXM scanning techniques for XFEL applications, 3D and axial-strain scans with sub-μm spatial resolution. With this progress to XFEL DFXM, we discuss new opportunities to study multi-timescale spatio-temporal dynamics of defects, strain waves, and other localized phenomena deep inside crystals.
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Submitted 7 November, 2023;
originally announced November 2023.
