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Optimizing the Accuracy of Viscoelastic Characterization with AFM Force-Distance Experiments in the Time and Frequency Domains
Authors:
Marshall R. McCraw,
Berkin Uluutku,
Halen D. Solomon,
Megan S. Anderson,
Kausik Sarkar,
Santiago D. Solares
Abstract:
We demonstrate that the method of characterizing viscoelastic materials with Atomic Force Microscopy (AFM) by fitting analytical models to force-distance (FD) curves often yields conflicting and physically unrealistic results. Because this method involves specifying a constitutive time-dependent viscoelastic model and then fitting said model to the experimental data, we show that the inconsistenci…
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We demonstrate that the method of characterizing viscoelastic materials with Atomic Force Microscopy (AFM) by fitting analytical models to force-distance (FD) curves often yields conflicting and physically unrealistic results. Because this method involves specifying a constitutive time-dependent viscoelastic model and then fitting said model to the experimental data, we show that the inconsistencies in this method are due to a lack of sensitivity of the model with respect to its parameters. Using approaches from information theory, this lack of sensitivity can be interpreted as a narrowed distribution of information which is obtained from the experiment. Furthermore, the equivalent representation of the problem in the frequency domain, achieved via modified Fourier transformation, offers an enhanced sensitivity through a widening of the information distribution. Using these distributions, we then define restrictions for the timescales which can be reliably accessed in both the time and frequency domains, which leads to the conclusion that the analysis of experiments in the time domain can frequently lead to inaccuracies. Finally, we provide an example where we use these restrictions as a guide to optimally design an experiment to characterize a polydimethylsiloxane (PDMS) polymer sample.
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Submitted 2 October, 2022;
originally announced October 2022.
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Direct Measurement of Storage and Loss Behavior in AFM Force-Distance Experiments Using the Modified Fourier Transformation
Authors:
Berkin Uluutku,
Marshall Richards McCraw,
Santiago D. Solares
Abstract:
Force-distance curve experiments are commonly performed in Atomic Force Microscopy (AFM) to obtain the viscoelastic characteristics of materials, such as the storage and loss moduli or compliances. The classic methods used to obtain these characteristics consist of fitting a viscoelastic material model to the experimentally obtained AFM data. Here, we demonstrate a new method that utilizes the mod…
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Force-distance curve experiments are commonly performed in Atomic Force Microscopy (AFM) to obtain the viscoelastic characteristics of materials, such as the storage and loss moduli or compliances. The classic methods used to obtain these characteristics consist of fitting a viscoelastic material model to the experimentally obtained AFM data. Here, we demonstrate a new method that utilizes the modified discrete Fourier transform to approximate the storage and loss behavior of a material directly from the data, without the need for a fit. Additionally, one may still fit a model to the resulting storage and loss behavior if a parameterized description of the material is desired. In contrast to fitting the data to a model chosen a priori, departing from a model-free description of the material's frequency behavior guides the selection of the model, such that the user may choose the one that is most appropriate for the particular material under study. To this end, we also include modified Fourier domain descriptions of commonly used viscoelastic models.
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Submitted 17 February, 2022;
originally announced February 2022.
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Few-layer flakes of Molybdenum Disulphide produced by anodic arc discharge in pulsed mode
Authors:
Carles Corbella,
Sabine Portal,
M. A. S. R. Saadi,
Santiago D. Solares,
Madhusudhan N. Kundrapu,
Michael Keidar
Abstract:
Here, the synthesis of Molybdenum Disulphide (MoS2) flakes by means of anodic atmospheric arc discharge is reported for the first time. The vertical electrode configuration consisted of a compound anode (hollow graphite anode filled with MoS2 powder) and a solid graphite cathode placed just above of the compound anode. Arc processes were operated in pulsed mode to preferentially evaporate the powd…
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Here, the synthesis of Molybdenum Disulphide (MoS2) flakes by means of anodic atmospheric arc discharge is reported for the first time. The vertical electrode configuration consisted of a compound anode (hollow graphite anode filled with MoS2 powder) and a solid graphite cathode placed just above of the compound anode. Arc processes were operated in pulsed mode to preferentially evaporate the powder component from the anode and to minimize Carbon ablation. Pulsed anodic arc discharges were conducted at 2 Hz and 10% duty cycle in 300 Torr of Helium with a peak current of 250-300 A and peak voltage of 35 V. A probe made of Tungsten wire was placed in the vicinity of the arc column to collect the evaporated material. The measured thickness profile was correlated to the particle flux distribution and it was fitted by a simple model of plasma expansion. During pulse phase, electron density was estimated around 5E22 m-3 or higher, and ion current density was of the order of 10 A/mm2. Morphology, structure and composition of the samples were characterized by Raman spectroscopy, atomic force microscopy (AFM), scanning electron microscopy (SEM), transmission electron microscopy (TEM), and x-ray diffraction (XRD). The study shows that pulsed arc discharge of the compound anode leads to moderate C deposition combined with MoS2 deposition in the form of fragmented nanocrystals and few atomic monolayers of MoS2. Such synthesis technique is promising to produce new 2D nanomaterials with tailored structure and functionality thanks to the flexibility of pulsed power.
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Submitted 27 November, 2019;
originally announced January 2020.
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Strain-Engineered High Responsivity MoTe2 Photodetector for Silicon Photonic Integrated Circuits
Authors:
R. Maiti,
C. Patil,
T. Xie,
J. G. Azadani,
M. A. S. R. Saadi,
R. Amin,
M. Miscuglio,
D. Van Thourhout,
S. D. Solares,
T. Low,
R. Agarwal,
S. Bank,
V. J. Sorger
Abstract:
In integrated photonics, specific wavelengths are preferred such as 1550 nm due to low-loss transmission and the availability of optical gain in this spectral region. For chip-based photodetectors, layered two-dimensional (2D) materials bear scientific and technologically-relevant properties leading to strong light-matter-interaction devices due to effects such as reduced coulomb screening or exci…
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In integrated photonics, specific wavelengths are preferred such as 1550 nm due to low-loss transmission and the availability of optical gain in this spectral region. For chip-based photodetectors, layered two-dimensional (2D) materials bear scientific and technologically-relevant properties leading to strong light-matter-interaction devices due to effects such as reduced coulomb screening or excitonic states. However, no efficient photodetector in the telecommunication C-band using 2D materials has been realized yet. Here, we demonstrate a MoTe2-based photodetector featuring strong photoresponse (responsivity = 0.5 A/W) operating at 1550nm on silicon photonic waveguide enabled by engineering the strain (4%) inside the photo-absorbing transition-metal-dichalcogenide film. We show that an induced tensile strain of ~4% reduces the bandgap of MoTe2 by about 0.2 eV by microscopically measuring the work-function across the device. Unlike Graphene-based photodetectors relying on a gapless band structure, this semiconductor-2D material detector shows a ~100X improved dark current enabling an efficient noise-equivalent power of just 90 pW/Hz^0.5. Such strain-engineered integrated photodetector provides new opportunities for integrated optoelectronic systems.
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Submitted 22 December, 2019; v1 submitted 31 October, 2019;
originally announced December 2019.
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Acquisition of time-frequency localized mechanical properties of biofilms and single cells with high spatial resolution
Authors:
Enrique A. López-Guerra,
Hongchen Shen,
Santiago D. Solares,
Danmeng Shuai
Abstract:
Biofilms are a cluster of bacteria embedded in extracellular polymeric substances (EPS) that contain a complex composition of polysaccharides, proteins, and extracellular DNA (eDNA). Desirable mechanical properties of the biofilms are critical for their survival, propagation, and dispersal, and the response of mechanical properties to different treatment conditions also sheds light on biofilm cont…
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Biofilms are a cluster of bacteria embedded in extracellular polymeric substances (EPS) that contain a complex composition of polysaccharides, proteins, and extracellular DNA (eDNA). Desirable mechanical properties of the biofilms are critical for their survival, propagation, and dispersal, and the response of mechanical properties to different treatment conditions also sheds light on biofilm control and eradication in vivo and on engineering surfaces. However, it is challenging yet important to interrogate mechanical behaviors of biofilms with a high spatial resolution because biofilms are very heterogeneous. Moreover, biofilms are viscoelastic, and their time-dependent mechanical behavior is difficult to capture. Herein, we developed a powerful technique that combines the high spatial resolution of the atomic force microscope (AFM) with a rigorous history-dependent viscoelastic analysis to deliver highly spatial-localized biofilm properties within a wide time-frequency window. By exploiting the use of static force spectroscopy in combination with an appropriate viscoelastic framework, we highlight the intensive amount of time-dependent information experimentally available that has been largely overlooked. It is shown that this technique provides a detailed nanorheological signature of the biofilms even at the single-cell level. We share the computational routines that would allow any user to perform the analysis from experimental raw data. The detailed localization of mechanical properties in space and in time-frequency domain provides insights on the understanding of biofilm stability, cohesiveness, dispersal, and control.
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Submitted 11 January, 2019;
originally announced January 2019.
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Pseudomagnetic Fields in a Locally Strained Graphene Drumhead
Authors:
Shuze Zhu,
Yinjun Huang,
Nikolai K. Klimov,
David B. Newell,
Nikolai B. Zhitenev,
Joseph A. Stroscio,
Santiago D. Solares,
Teng Li
Abstract:
Recent experiments reveal that a scanning tunneling microscopy (STM) probe tip can generate a highly localized strain field in a graphene drumhead, which in turn leads to pseudomagnetic fields in the graphene that can spatially confine graphene charge carriers in a way similar to a lithographically defined quantum dot (QD). While these experimental findings are intriguing, their further implementa…
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Recent experiments reveal that a scanning tunneling microscopy (STM) probe tip can generate a highly localized strain field in a graphene drumhead, which in turn leads to pseudomagnetic fields in the graphene that can spatially confine graphene charge carriers in a way similar to a lithographically defined quantum dot (QD). While these experimental findings are intriguing, their further implementation in nanoelectronic devices hinges upon the knowledge of key underpinning parameters, which still remain elusive. In this paper, we first summarize the experimental measurements of the deformation of graphene membranes due to interactions with the STM probe tip and a back gate electrode. We then carry out systematic coarse grained, (CG), simulations to offer a mechanistic interpretation of STM tip-induced straining of the graphene drumhead. Our findings reveal the effect of (i) the position of the STM probe tip relative to the graphene drumhead center, (ii) the sizes of both the STM probe tip and graphene drumhead, as well as (iii) the applied back-gate voltage, on the induced strain field and corresponding pseudomagnetic field. These results can offer quantitative guidance for future design and implementation of reversible and on-demand formation of graphene QDs in nanoelectronics.
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Submitted 11 May, 2015;
originally announced May 2015.
