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Direct imaging and Talbot Phase Imaging at the Matter in Extreme Conditions X-ray Imager of LCLS
Authors:
Eric Galtier,
Dimitri Khaghani,
Nina Boiadjieva,
Dileep Bhogadi,
Gilliss Dyer,
Phil Heimann,
Arianna E. Gleason,
Silvia Pandolfi,
Mikako Makita,
Frank Seiboth,
Hae Ja Lee,
Bob Nagler
Abstract:
The last decade has shown the great potential that X-ray Free Electron Lasers have to study High Energy Density matter. Experiments at FELs have made significant breakthroughs in Shock Physics and Dynamic Diffraction, Dense Plasma Physics and Warm Dense Matter Science, using techniques such as isochoric heating, inelastic scattering, small angle scattering and diffraction. In addition, and complem…
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The last decade has shown the great potential that X-ray Free Electron Lasers have to study High Energy Density matter. Experiments at FELs have made significant breakthroughs in Shock Physics and Dynamic Diffraction, Dense Plasma Physics and Warm Dense Matter Science, using techniques such as isochoric heating, inelastic scattering, small angle scattering and diffraction. In addition, and complementary to these techniques, the coherent properties of the beam can be used to image HED samples with high precision. We present new imaging diagnostics and techniques developed at the MEC instrument at LCLS over the last few years. We briefly show result of a previously used Phase Contrast Imaging setup, where the X-ray beam propagates from the target to a camera some distance away revealing its phase, as well as from a new direct imaging approach where the target is re-imaged on the camera with 300nm resolution. Last, we show a new Talbot Phase Imaging method that allows for both measuring the phase and intensity changes of the x-rays introduced by a target with sub-micron resolution.
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Submitted 12 June, 2024; v1 submitted 28 February, 2024;
originally announced May 2024.
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X-ray induced grain structure dynamics in Bi2Se3
Authors:
Kento Katagiri,
Bernard Kozioziemski,
Eric Folsom,
Yifan Wang,
Karen Appel,
Philip K. Cook,
Jon Eggert,
Sebastian Göde,
Marylesa Howard,
Sungwon Kim,
Mikako Matsuda,
Motoaki Nakatsutsumi,
Martin M. Nielsen,
Henning F. Poulsen,
Frank Seiboth,
Hugh Simons,
Bihan Wang,
Wenge Yang,
Ulf Zastrau,
Hyunjung Kim,
Leora E. Dresselhaus-Marais
Abstract:
Grain rotation in crystals often results in coarsening or refinement of the grains that modify the mechanical and thermal properties of materials. While many studies have explored how externally applied stress and temperature drive grain structure dynamics in nano-polycrystalline materials, the analogous studies on colossal grains have been limited, especially in the absence of external force. In…
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Grain rotation in crystals often results in coarsening or refinement of the grains that modify the mechanical and thermal properties of materials. While many studies have explored how externally applied stress and temperature drive grain structure dynamics in nano-polycrystalline materials, the analogous studies on colossal grains have been limited, especially in the absence of external force. In this work, we used X-ray free electron laser pulses to irradiate single-crystalline bismuth selenide (Bi2Se3) and observed grain boundary formation and subsequent grain rotation in response to the X-ray radiation. Our observations with simultaneous X-ray diffraction and transmission X-ray microscopy demonstrate how intense X-ray radiation can rapidly change grain morphologies of initially single-crystalline material.
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Submitted 12 March, 2024;
originally announced March 2024.
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Dark-Field X-ray Microscopy for 2D and 3D imaging of Microstructural Dynamics at the European X-ray Free Electron Laser
Authors:
Sara J. Irvine,
Kento Katagiri,
Trygve M. Ræder,
Darshan Chalise,
Dayeeta Pal,
Jade I. Stanton,
Gabriele Ansaldi,
Ulrike Boesenberg,
Felix Brauße,
Jon H. Eggert,
Lichao Fang,
Eric Folsom,
Jörg Hallmann,
Morten Haubro,
Theodor S. Holstad,
Anders Madsen,
Johannes Möller,
Martin M. Nielsen,
Henning F. Poulsen,
Jan-Etienne Pudel,
Angel Rodriguez-Fernandez,
Frank Schoofs,
Frank Seiboth,
Yifan Wang,
Jo Wonhyuk
, et al. (4 additional authors not shown)
Abstract:
Dark field X-ray microscopy (DXFM) has enabled experiments to visualize microstructural distortions in bulk crystals. Using the femtosecond X-ray pulses generated by X-ray free-electron lasers (XFEL), DFXM can achieve ~1-um spatial resolution and <100 fs time resolution simultaneously. In this paper, we present the first ultrafast DFXM measurements at the European XFEL. In this work, we demonstrat…
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Dark field X-ray microscopy (DXFM) has enabled experiments to visualize microstructural distortions in bulk crystals. Using the femtosecond X-ray pulses generated by X-ray free-electron lasers (XFEL), DFXM can achieve ~1-um spatial resolution and <100 fs time resolution simultaneously. In this paper, we present the first ultrafast DFXM measurements at the European XFEL. In this work, we demonstrate DFXM of laser-induced phonon wavepackets propagating through dislocations inside a diamond single crystal. In addition to demonstrating this new capability, we present two new DFXM scanning techniques for XFEL applications, 3D and axial-strain scans with sub-μm spatial resolution. With this progress to XFEL DFXM, we discuss new opportunities to study multi-timescale spatio-temporal dynamics of defects, strain waves, and other localized phenomena deep inside crystals.
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Submitted 7 November, 2023;
originally announced November 2023.
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Ptychographic characterization of polymer compound refractive lenses manufactured by additive technology
Authors:
Mikhail Lyubomirskiy,
Frieder Koch,
Ksenia Abrashitova,
Vladimir Bessonov,
Natalia Kokareva,
Alexander Petrov,
Frank Seiboth,
Felix Wittwer,
Maik Kahnt,
Martin Seyrich Andrey Fedyanin,
Christian David,
Christian Schroer
Abstract:
The recent success in the development of high precision printing techniques allows one to manufacture free-standing polymer structures of high quality. Two-photon polymerization lithography is a mask-less technique with down to 100 μm resolution that provides full geometric freedom. It has recently been applied to the nanofabrication of X-ray compound refractive lenses (CRLs). In this article we r…
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The recent success in the development of high precision printing techniques allows one to manufacture free-standing polymer structures of high quality. Two-photon polymerization lithography is a mask-less technique with down to 100 μm resolution that provides full geometric freedom. It has recently been applied to the nanofabrication of X-ray compound refractive lenses (CRLs). In this article we report on the characterization of two sets of CRLs of different design produced by two-photon polymerization induced lithography.
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Submitted 14 December, 2018;
originally announced December 2018.
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The Phase-Contrast Imaging Instrument at the Matter in Extreme Conditions Endstation at LCLS
Authors:
Bob Nagler,
Andreas Schropp,
Eric C. Galtier,
Brice Arnold,
Shaughnessy B. Brown,
Alan Fry,
Arianna Gleason,
Eduardo Granados,
Akel Hashim,
Jerome B. Hastings,
Dirk Samberg,
Frank Seiboth,
Franz Tavella,
Zhou Xing,
Hae Ja Lee,
Christian G. Schroer
Abstract:
We describe the Phase-Contrast Imaging instrument at the Matter in Extreme Conditions (MEC) endstation of the Linac Coherent Light Source. The instrument can image phenomena with a spatial resolution of a few hundreds of nanometers and at the same time reveal the atomic structure through X-ray diffraction, with a temporal resolution better than 100 femtosecond. It was specifically designed for stu…
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We describe the Phase-Contrast Imaging instrument at the Matter in Extreme Conditions (MEC) endstation of the Linac Coherent Light Source. The instrument can image phenomena with a spatial resolution of a few hundreds of nanometers and at the same time reveal the atomic structure through X-ray diffraction, with a temporal resolution better than 100 femtosecond. It was specifically designed for studies relevant to High-Energy-Density Science and can monitor, e.g., shock fronts, phase transitions, or void collapses. This versatile instrument was commissioned last year and is now available to the MEC user community.
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Submitted 26 October, 2016;
originally announced October 2016.
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Ptychography imaging of the phase vortices in the x-ray beam formed by nanofocusing lenses
Authors:
D. Dzhigaev,
U. Lorenz,
R. Kurta,
F. Seiboth,
T. Stankevic,
S. Mickevicius,
A. Singer,
A. Shabalin,
O. Yefanov,
M. N. Strikhanov,
G. Falkenberg,
C. G. Schroer,
R. Feidenhans`l,
I. A. Vartanyants
Abstract:
We present the ptychography reconstruction of the x-ray beam formed by nanofocusing lenses (NFLs) containing a number of phase singularities (vortices) in the vicinity of the focal plane. As a test object Siemens star pattern was used with the finest features of 50 nm for ptychography measurements. The extended ptychography iterative engine (ePIE) algorithm was applied to retrieve both complex ill…
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We present the ptychography reconstruction of the x-ray beam formed by nanofocusing lenses (NFLs) containing a number of phase singularities (vortices) in the vicinity of the focal plane. As a test object Siemens star pattern was used with the finest features of 50 nm for ptychography measurements. The extended ptychography iterative engine (ePIE) algorithm was applied to retrieve both complex illumination and object functions from the set of diffraction patterns. The reconstruction revealed the focus size of 91.4$\pm$1.1 nm in horizontal and 70$\pm$0.3 nm in vertical direction at full width at half maximum (FWHM). The complex probe function was propagated along the optical axis of the beam revealing the evolution of the phase singularities.
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Submitted 6 November, 2013;
originally announced November 2013.
