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Single ion implantation for single donor devices using Geiger mode detectors
Authors:
E. Bielejec,
J. A. Seamons,
M. S. Carroll
Abstract:
Electronic devices that are designed to use the properties of single atoms such as donors or defects have become a reality with recent demonstrations of donor spectroscopy, single photon emission sources, and magnetic imaging using defect centers in diamond. Improving single ion detector sensitivity is linked to improving control over the straggle of the ion as well as providing more flexibility…
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Electronic devices that are designed to use the properties of single atoms such as donors or defects have become a reality with recent demonstrations of donor spectroscopy, single photon emission sources, and magnetic imaging using defect centers in diamond. Improving single ion detector sensitivity is linked to improving control over the straggle of the ion as well as providing more flexibility in lay-out integration with the active region of the single donor device construction zone by allowing ion sensing at potentially greater distances. Using a remotely located passively gated single ion Geiger mode avalanche diode (SIGMA) detector we have demonstrated 100% detection efficiency at a distance of >75 um from the center of the collecting junction. This detection efficiency is achieved with sensitivity to ~600 or fewer electron-hole pairs produced by the implanted ion. Ion detectors with this sensitivity and integrated with a thin dielectric, for example 5 nm gate oxide, using low energy Sb implantation would have an end of range straggle of <2.5 nm. Significant reduction in false count probability is achieved by modifying the ion beam set-up to allow for cryogenic operation of the SIGMA detector. Using a detection window of 230 ns at 1 Hz, the probability of a false count was measured as 1E-1 and 1E-4 for operation temperatures of 300K and 77K, respectively. Low temperature operation and reduced false, dark, counts are critical to achieving high confidence in single ion arrival. For the device performance in this work, the confidence is calculated as a probability of >98% for counting one and only one ion for a false count probability of 1E-4 at an average ion number per gated window of 0.015.
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Submitted 28 September, 2009;
originally announced September 2009.
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Density imbalance effect on the Coulomb drag upturn in an electron-hole bialyer
Authors:
Christian P. Morath,
John A. Seamons,
John L. Reno,
Michael P. Lilly
Abstract:
A low-temperature upturn of the Coulomb drag resistivity measured in an undoped electron-hole bilayer (uEHBL) device, possibly manifesting from exciton formation or condensation, was recently observed. The effects of density imbalance on this upturn are examined. Measurements of drag as a function of temperature in a uEHBL with a 20 nm wide Al$_{.90}$Ga$_{.10}$As barrier layer at various density…
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A low-temperature upturn of the Coulomb drag resistivity measured in an undoped electron-hole bilayer (uEHBL) device, possibly manifesting from exciton formation or condensation, was recently observed. The effects of density imbalance on this upturn are examined. Measurements of drag as a function of temperature in a uEHBL with a 20 nm wide Al$_{.90}$Ga$_{.10}$As barrier layer at various density imbalances are presented. The results show drag increasing as the density of either two dimensional system was reduced, both within and above the upturn temperature regime. A comparison of the data with numerical calculations of drag in the presence of electron-hole pairing fluctuations, which qualitatively reproduce the drag upturn behavior, is also presented. The calculations, however, predict a peak in drag at matched densities, which is not reflected by the measurements.
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Submitted 21 November, 2008; v1 submitted 30 October, 2008;
originally announced October 2008.
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Coulomb Drag in the Exciton Regime in Electron-Hole Bilayers
Authors:
J. A. Seamons,
C. P. Morath,
J. L. Reno,
M. P. Lilly
Abstract:
We report electrical transport measurements on GaAs/AlGaAs based electron-hole bilayers. These systems are expected to make a transition from a pair of weakly coupled two-dimensional systems to a strongly coupled exciton system as the barrier between the layers is reduced. Once excitons form, phenomena such as Bose-Einstein condensation of excitons could be observed. In our devices, electrons an…
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We report electrical transport measurements on GaAs/AlGaAs based electron-hole bilayers. These systems are expected to make a transition from a pair of weakly coupled two-dimensional systems to a strongly coupled exciton system as the barrier between the layers is reduced. Once excitons form, phenomena such as Bose-Einstein condensation of excitons could be observed. In our devices, electrons and holes are confined in double quantum wells, and carriers in the devices are induced with top and bottom gates leading to variable density in each layer. Separate contact to each layer allows Coulomb drag transport measurements where current is driven in one layer while voltage is measured in the other. Coulomb drag is sensitive to interlayer coupling and has been predicted to provide a strong signature of exciton condensation. Drag measurement on EHBLs with a 30 nm barrier are consistent with drag between two weakly coupled 2D Fermi systems where the drag decreases as the temperature is reduced. When the barrier is reduced to 20 nm, we observe a consistent increase in the drag resistance as the temperature is reduced. These results indicate the onset of a much stronger coupling between the electrons and holes which leads to exciton formation and possibly phenomena related to exciton condensation.
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Submitted 8 August, 2008;
originally announced August 2008.
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Layer interdependence of transport in an undoped electron-hole bilayer
Authors:
C. P. Morath,
J. A. Seamons,
J. L. Reno,
M. P. Lilly
Abstract:
The layer interdependence of transport in an undoped electron-hole bilayer (uEHBL) device was studied as a function of carrier density, interlayer electric field, and temperature. The uEHBL device consisted of a density tunable, independently contacted two-dimensional electron gas (2DEG) and two-dimensional hole gas (2DHG) induced via field effect in distinct GaAs quantum wells separated by a 30…
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The layer interdependence of transport in an undoped electron-hole bilayer (uEHBL) device was studied as a function of carrier density, interlayer electric field, and temperature. The uEHBL device consisted of a density tunable, independently contacted two-dimensional electron gas (2DEG) and two-dimensional hole gas (2DHG) induced via field effect in distinct GaAs quantum wells separated by a 30 nm Al$_{0.9}$Ga$_{0.1}$As barrier. Transport measurements were made simultaneously on each layer using the van der Pauw method. An increase in 2DHG mobility with increasing 2DEG density was observed, while the 2DEG mobility showed negligible dependence on the 2DHG density. Decreasing the interlayer electric-field and thereby increasing interlayer separation also increased the 2DHG mobility with negligible effects on the 2DEG mobility. The change in interlayer separation as interlayer electric-field changed was estimated using 2DHG Coulomb drag measurements. The results were consistent with mobility of each layer being only indirectly dependent on the adjacent layer density and dominated by background impurity scattering. Temperature dependencies were also determined for the resistivity of each layer.
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Submitted 7 March, 2008;
originally announced March 2008.
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Undoped Electron-Hole Bilayers in a GaAs/AlGaAs Double Quantum Well
Authors:
J. A. Seamons,
D. R. Tibbetts,
J. L. Reno,
M. P. Lilly
Abstract:
We present the fabrication details of completely undoped electron-hole bilayer devices in a GaAs/AlGaAs double quantum well heterostructure with a 30 nm barrier. These devices have independently tunable densities of the two-dimensional electron gas and two-dimensional hole gas. We report four-terminal transport measurements of the independently contacted electron and hole layers with balanced de…
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We present the fabrication details of completely undoped electron-hole bilayer devices in a GaAs/AlGaAs double quantum well heterostructure with a 30 nm barrier. These devices have independently tunable densities of the two-dimensional electron gas and two-dimensional hole gas. We report four-terminal transport measurements of the independently contacted electron and hole layers with balanced densities from $1.2 \times 10^{11}$cm$^{-2}$ down to $4 \times 10^{10}$ cm$^{-2}$ at $T = 300 mK$. The mobilities can exceed $1 \times 10^{6}$ cm$^{2}$ V$^{-1}$ s$^{-1}$ for electrons and $4 \times 10^{5}$ cm$^{2}$ V$^{-1}$ s$^{-1}$ for holes.
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Submitted 8 November, 2006;
originally announced November 2006.
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Tunneling and nonlinear transport in a vertically coupled GaAs/AlGaAs double quantum wire system
Authors:
E. Bielejec,
J. A. Seamons,
J. L. Reno,
M. P. Lilly
Abstract:
We report low-dimensional tunneling in an independently contacted vertically coupled quantum wire system. This nanostructure is fabricated in a high quality GaAs/AlGaAs parallel double quantum well heterostructure. Using a novel flip chip technique to align top and bottom split gates to form low-dimensional constrictions in each of the independently contacted quantum wells we explicitly control…
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We report low-dimensional tunneling in an independently contacted vertically coupled quantum wire system. This nanostructure is fabricated in a high quality GaAs/AlGaAs parallel double quantum well heterostructure. Using a novel flip chip technique to align top and bottom split gates to form low-dimensional constrictions in each of the independently contacted quantum wells we explicitly control the subband occupation of the individual wires. In addition to the expected 2D-2D tunneling results, we have found additional tunneling features that are related to the 1D quantum wires.
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Submitted 10 November, 2004; v1 submitted 3 November, 2004;
originally announced November 2004.
