Showing 1–46 of 46 results for author: Schwandt, J

The CMS Fast Beam Condition Monitor for HL-LHC

Authors: G. Auzinger, H. Bakhshiansohi, A. Dabrowski, A. G. Delannoy, A. Dierlamm, M. Dragicevic, A. Gholami, G. Gomez, M. Guthoff, M. Haranko, A. Homna, M. Jenihhin, J. Kaplon, O. Karacheban, B. Korcsmáros, W. H. Liu, A. Lokhovitskiy, R. Loos, S. Mallows, J. Michel, V. Myronenko, G. Pásztor, M. Pari, J. Schwandt, M. Sedghi , et al. (6 additional authors not shown)

Abstract: The high-luminosity upgrade of the LHC brings unprecedented requirements for real-time and precision bunch-by-bunch online luminosity measurement and beam-induced background monitoring. A key component of the CMS Beam Radiation, Instrumentation and Luminosity system is a stand-alone luminometer, the Fast Beam Condition Monitor (FBCM), which is fully independent from the CMS central trigger and dat… ▽ More The high-luminosity upgrade of the LHC brings unprecedented requirements for real-time and precision bunch-by-bunch online luminosity measurement and beam-induced background monitoring. A key component of the CMS Beam Radiation, Instrumentation and Luminosity system is a stand-alone luminometer, the Fast Beam Condition Monitor (FBCM), which is fully independent from the CMS central trigger and data acquisition services and able to operate at all times with a triggerless readout. FBCM utilizes a dedicated front-end application-specific integrated circuit (ASIC) to amplify the signals from CO$_2$-cooled silicon-pad sensors with a timing resolution of a few nanoseconds, which enables the measurement of the beam-induced background. FBCM uses a modular design with two half-disks of twelve modules at each end of CMS, with four service modules placed close to the outer edge to reduce radiation-induced aging. The electronics system design adapts several components from the CMS Tracker for power, control and read-out functionalities. The dedicated FBCM23 ASIC contains six channels and adjustable sha** time to optimize the noise with regards to sensor leakage current. Each ASIC channel outputs a single binary high-speed asynchronous signal carrying time-of-arrival and time-over-threshold information. The chip output signal is digitized, encoded and sent via a radiation-hard gigabit transceiver and an optical link to the back-end electronics for analysis. This paper reports on the updated design of the FBCM detector and the ongoing testing program. △ Less

Submitted 6 February, 2024; originally announced February 2024.

Comments: 16th Topical Seminar on Innovative Particle and Radiation Detectors (IPRD23) 2023 Sept 25-29 Siena, Italy

SiPM understanding using simple Geiger-breakdown simulations

Authors: R. Klanner, J. Schwandt

Abstract: The results of a 1-D Monte-Carlo program, which simulates the avalanche multiplication in diodes with depths of the order of 1 $μ$m based on the method proposed in Ref.1, are presented. The aim of the study is to achieve a deeper understanding of silicon photo-multipliers. It is found that for a given over-voltage, $\mathit{OV}$, the maximum of the discharge current is reached at the breakdown vol… ▽ More The results of a 1-D Monte-Carlo program, which simulates the avalanche multiplication in diodes with depths of the order of 1 $μ$m based on the method proposed in Ref.1, are presented. The aim of the study is to achieve a deeper understanding of silicon photo-multipliers. It is found that for a given over-voltage, $\mathit{OV}$, the maximum of the discharge current is reached at the breakdown voltage, $U_\mathit{bd}$, and that the avalanche stops when the voltage drops to $U_\mathit{bd} - \mathit{OV}$. This is completely different to the generally accepted understanding of SiPMs, which has already been noted in Ref.1. Simulated characteristics of the avalanche breakdown, like the time dependence of the avalanche current, over-voltage dependence of the Geiger-breakdown probability and the gain for photons and dark counts, are presented and compared to the expectations from silicon photo-multipliers. △ Less

Submitted 5 March, 2024; v1 submitted 24 January, 2024; originally announced January 2024.

Comments: 10 pages, 9 figures, 1 table

Investigation of high resistivity p-type FZ silicon diodes after 60Co γ-irradiation

Authors: Chuan Liao, Eckhart Fretwurst, Erika Garutti, Joern Schwandt, Ioana Pintilie, Anja Himmerlich, Michael Moll, Yana Gurimskaya, Zheng Li

Abstract: In this work, the effects of $^\text{60}$Co $γ$-ray irradiation on high resistivity $p$-type diodes have been investigated. The diodes were exposed to dose values of 0.1, 0.2, 1, and \SI{2}{\mega Gy}. Both macroscopic ($I$--$V$, $C$--$V$) and microscopic (Thermally Stimulated Current~(TSC)) measurements were conducted to characterize the radiation-induced changes. The investigated diodes were manu… ▽ More In this work, the effects of $^\text{60}$Co $γ$-ray irradiation on high resistivity $p$-type diodes have been investigated. The diodes were exposed to dose values of 0.1, 0.2, 1, and \SI{2}{\mega Gy}. Both macroscopic ($I$--$V$, $C$--$V$) and microscopic (Thermally Stimulated Current~(TSC)) measurements were conducted to characterize the radiation-induced changes. The investigated diodes were manufactured on high resistivity $p$-type Float Zone (FZ) silicon and were further classified into two types based on the isolation technique between the pad and guard ring: $p$-stop and $p$-spray. After irradiation, the macroscopic results of current-voltage and capacitance-voltage measurements were obtained and compared with existing literature data. Additionally, the microscopic measurements focused on the development of the concentration of different radiation-induced defects, including the boron interstitial and oxygen interstitial (B$_\text{i}$O$_\text{i}$) complex, the carbon interstitial and oxygen interstitial C$_\text{i}$O$_\text{i}$ defect, the H40K, and the so-called I$_\text{P}^*$. To investigate the thermal stability of induced defects in the bulk, isochronal annealing studies were performed in the temperature range of \SI{80}{\celsius} to \SI{300}{\celsius}. These annealing processes were carried out on diodes irradiated with doses of 1 and \SI{2}{\mega Gy} and the corresponding TSC spectra were analysed. Furthermore, in order to investigate the unexpected results observed in the $C$-$V$ measurements after irradiation with high dose values, the surface conductance between the pad and guard ring was measured as a function of both dose and annealing temperature. △ Less

Submitted 27 June, 2023; originally announced June 2023.

Investigation of the Boron removal effect induced by 5.5 MeV electrons on highly doped EPI- and Cz-silicon

Authors: Chuan Liao, Eckhart Fretwurst, Erika Garutti, Joern Schwandt, Leonid Makarenko, Ioana Pintilie, Lucian Dragos Filip, Anja Himmerlich, Michael Moll, Yana Gurimskaya, Zheng Li

Abstract: This study focuses on the properties of the B$_\text{i}$O$_\text{i}$ (interstitial Boron~-~interstitial Oxygen) and C$_\text{i}$O$_\text{i}$ (interstitial Carbon~-~interstitial Oxygen) defect complexes by \SI{5.5}{\mega\electronvolt} electrons in low resistivity silicon. Two different types of diodes manufactured on p-type epitaxial and Czochralski silicon with a resistivity of about 10~$Ω\cdot$cm… ▽ More This study focuses on the properties of the B$_\text{i}$O$_\text{i}$ (interstitial Boron~-~interstitial Oxygen) and C$_\text{i}$O$_\text{i}$ (interstitial Carbon~-~interstitial Oxygen) defect complexes by \SI{5.5}{\mega\electronvolt} electrons in low resistivity silicon. Two different types of diodes manufactured on p-type epitaxial and Czochralski silicon with a resistivity of about 10~$Ω\cdot$cm were irradiated with fluence values between \SI{1e15}{\per\square\centi\meter} and \SI{6e15}{\per\square\centi\meter}. Such diodes cannot be fully depleted and thus the accurate evaluation of defect concentrations and properties (activation energy, capture cross-section, concentration) from Thermally Stimulated Currents (TSC) experiments alone is not possible. In this study we demonstrate that by performing Thermally Stimulated Capacitance (TS-Cap) experiments in similar conditions to TSC measurements and develo** theoretical models for simulating both types of B$_\text{i}$O$_\text{i}$ signals generated in TSC and TS-Cap measurements, accurate evaluations can be performed. The changes of the position-dependent electric field, the effective space charge density $N_\text{eff}$ profile as well as the occupation of the B$_\text{i}$O$_\text{i}$ defect during the electric field dependent electron emission, are simulated as a function of temperature. The macroscopic properties (leakage current and $N_\text{eff}$) extracted from current-voltage and capacitance-voltage measurements at \SI{20}{\celsius} are also presented and discussed △ Less

Submitted 26 June, 2023; originally announced June 2023.

PeakOTron: A Python Module for Fitting Charge Spectra of Silicon Photomultipliers

Authors: Jack Rolph, Erika Garutti, Robert Klanner, Tobias Quadfasel, Joern Schwandt

Abstract: A Python program has been developed which fits a published detector-response model to SiPM charge spectra to characterise SiPMs. Spectra for SiPMs illuminated by low intensity pulsed light with Poisson-distributed number of photons and a time spread of order nanoseconds or less, can be analysed. The entire charge spectra, including the intervals in-between the photoelectron peaks, are fitted, whic… ▽ More A Python program has been developed which fits a published detector-response model to SiPM charge spectra to characterise SiPMs. Spectra for SiPMs illuminated by low intensity pulsed light with Poisson-distributed number of photons and a time spread of order nanoseconds or less, can be analysed. The entire charge spectra, including the intervals in-between the photoelectron peaks, are fitted, which allows determining, in addition to the mean number of detected photons, gain, gain spread, prompt cross-talk, pedestal, and electronics noise, the dark-count rate as well as the probability and time constant of after-pulses. The starting values of the fit parameters are extracted from the charge spectra. The program performance has been evaluated using simulated charge spectra with the different SiPM parameters varied in a wide range. By analysing 100 simulated spectra for every parameter set, the biases and statistical uncertainties of the individual parameters have been determined. It is found that the parameters are precisely determined and that the entire spectra are well described, in most cases with a $χ^2$/NDF close to 1. In addition, measured spectra for two types of SiPMs for a wide range of over-voltages have been analysed. The program achieves mostly a good description of the spectra, and the parameters determined agree with the values from the producers and expectations. The program can be used for detailed analyses of single spectra, but, as it is compatible with the native \texttt{Python} multiprocessing module, also for the automatic characterisation of large samples of SiPMs. △ Less

Submitted 27 January, 2023; originally announced January 2023.

Study of the V$_2^0$ state in neutron-irradiated silicon using photon-absorption measurements

Authors: Eckhart Fretwurst, Robert Klanner, Joern Schwandt, Annika Vauth

Abstract: Pieces of $n$-type silicon with 3.5 k$Ω\cdot $cm resistivity have been irradiated by reactor neutrons to fluences of (1, 5 and 10) $\times 10^{16}$ cm$^{-2}$. Using light-transmission measurements, the absorption coefficients have been determined for photon energies, $E_γ$, between 0.62 and 1.30 eV for the samples as irradiated and after 15 min isochronal annealing with temperatures between 80°C a… ▽ More Pieces of $n$-type silicon with 3.5 k$Ω\cdot $cm resistivity have been irradiated by reactor neutrons to fluences of (1, 5 and 10) $\times 10^{16}$ cm$^{-2}$. Using light-transmission measurements, the absorption coefficients have been determined for photon energies, $E_γ$, between 0.62 and 1.30 eV for the samples as irradiated and after 15 min isochronal annealing with temperatures between 80°C and 330°C. The radiation-induced absorption coefficient, $α_\mathit{irr}$, has been obtained by subtracting the absorption coefficient for non-irradiated silicon. The $E_γ$-dependence of $α_\mathit{irr}$ shows a resonance peak, which is ascribed to the neutral divacancy, V$_2^0$, sitting on a background, and $α_\mathit{irr} (E_γ)$ is fitted by a Breit-Wigner line shape on a parameterized background. It is found that at an annealing temperature of 210°C the V$_2^0$ intensity is reduced by a factor 2, and that at the meV level, the position and the width of the fitted Breit-Wigner do not change with irradiation dose and annealing. △ Less

Submitted 11 May, 2023; v1 submitted 14 December, 2022; originally announced December 2022.

Comments: 8 pages, 4 figures

Study of depth-dependent charge collection profiles in irradiated pad diodes

Authors: Mohammadtaghi Hajheidari, Massimiliano Antonello, Erika Garutti, Robert Klanner, Joern Schwandt, Georg Steinbrueck

Abstract: In this work, charge collection profiles of non-irradiated and irradiated 150 $μ$m $p$-type pad diodes were measured using a 5.2 GeV electron beam traversing the diode parallel to the readout electrode. Four diodes were irradiated to 1 MeV neutron equivalent fluences of 2, 4, 8, and 12E15 {cm}^{-2} with 23 MeV protons. The Charge Collection Efficiency profiles as a function of depth are extracted… ▽ More In this work, charge collection profiles of non-irradiated and irradiated 150 $μ$m $p$-type pad diodes were measured using a 5.2 GeV electron beam traversing the diode parallel to the readout electrode. Four diodes were irradiated to 1 MeV neutron equivalent fluences of 2, 4, 8, and 12E15 {cm}^{-2} with 23 MeV protons. The Charge Collection Efficiency profiles as a function of depth are extracted by unfolding the data. The results of the measurements are compared to the simulation using three radiation damage models from literature which were tuned to different irradiation types and fluences. △ Less

Submitted 23 January, 2023; v1 submitted 26 September, 2022; originally announced September 2022.

Radiation Hardness of a Wide Spectral Range SiPM with Quasi-Spherical Junction

Authors: Julius Römer, Erika Garutti, Wolfgang Schmailzl, Jörn Schwandt, Stephan Martens

Abstract: New pixel geometries are on the rise to achieve high sensitivity in near-infrared wavelengths with silicon photomultipliers (SiPMs). We test prototypes of the tip avalanche photo-diodes, which feature a quasi-spherical p-n junction and a high photodetection efficiency over a wide spectral range, and analyze the performance after neutron irradiation. The observed increase in dark count rate is sign… ▽ More New pixel geometries are on the rise to achieve high sensitivity in near-infrared wavelengths with silicon photomultipliers (SiPMs). We test prototypes of the tip avalanche photo-diodes, which feature a quasi-spherical p-n junction and a high photodetection efficiency over a wide spectral range, and analyze the performance after neutron irradiation. The observed increase in dark count rate is significantly smaller than for a SiPM with a conventional design, indicating a good radiation hardness of the pixel geometry. △ Less

Submitted 16 September, 2022; originally announced September 2022.

Comments: 8 pages, 7 figures. Submitted to NIM Proceedings. This work was presented at the NDIP20 conference

Defect characterization studies on neutron irradiated boron-doped silicon pad diodes and Low Gain Avalanche Detectors

Authors: Anja Himmerlich, Nuria Castello-Mor, Esteban Curras Rivera, Yana Gurimskaya, Vendula Maulerova-Subert, Michael Moll, Ioana Pintilie, Eckhart Fretwurst, Chuan Liao, Jorn Schwandt

Abstract: High-energy physics detectors, like Low Gain Avalanche Detectors (LGADs) that will be used as fast timing detectors in the High Luminosity LHC experiments, have to exhibit a significant radiation tolerance. Thereby the impact of radiation on the highly boron-doped gain layer that enables the internal charge multiplication, is of special interest, since due to the so-called Acceptor Removal Effect… ▽ More High-energy physics detectors, like Low Gain Avalanche Detectors (LGADs) that will be used as fast timing detectors in the High Luminosity LHC experiments, have to exhibit a significant radiation tolerance. Thereby the impact of radiation on the highly boron-doped gain layer that enables the internal charge multiplication, is of special interest, since due to the so-called Acceptor Removal Effect (ARE) a radiation-induced deactivation of active boron dopants takes place. In this paper we present defect-spectroscopy measurements (Deep-Level Transient Spectroscopy and Thermally Stimulated Current technique) on neutron irradiated p-type silicon pad diodes of different resistivity as well as LGADs irradiated at fluences up to 1 x 10^15 neq/cm2. Thereby we show that while for the silicon pad diodes irradiated with electrons, neutrons or protons the determination of defect electronic properties and defect introduction rates is straightforward, DLTS and TSC measurements on LGADs are strongly influenced by the impact of the gain layer. It is shown that the measurability of the capacitance of the gain layer shows a strong frequency and temperature dependence leading to a capacitance drop in DLTS and non-reliable measurement results. With TSC defects formed in the LGADs can be very nicely observed and compared to the defects formed in the silicon pad diodes. However the exact assignment of defects to the gain layer or bulk region remains challenging and the charge amplification effect of the LGADs impacts the exact determination of defect concentrations. Additionally, we will demonstrate that depending on the TSC measurement conditions defect induced residual internal electric fields are built up in the irradiated LGADs that are influencing the current signal of carriers emitted from the defect states. △ Less

Submitted 15 September, 2022; originally announced September 2022.

Self-heating Effect in Silicon-Photomultipliers

Authors: E. Garutti, R. Klanner, E. Popova, S. Martens, J. Schwandt, C. Villalba

Abstract: The main effect of radiation damage in a Silicon-Photolumtiplier (SiPM) is a dramatic increase in the dark current. The power dissipated, if not properly cooled, heats the SiPM, whose performance parameters depend on temperature. Heating studies were performed with a KETEK SiPM, glued on an Al$_2$O$_3$ substrate, which is either directly connected to the temperature-controlled chuck of a probe sta… ▽ More The main effect of radiation damage in a Silicon-Photolumtiplier (SiPM) is a dramatic increase in the dark current. The power dissipated, if not properly cooled, heats the SiPM, whose performance parameters depend on temperature. Heating studies were performed with a KETEK SiPM, glued on an Al$_2$O$_3$ substrate, which is either directly connected to the temperature-controlled chuck of a probe station, or through layers of material with well-known thermal resistance. The SiPM is illuminated by a LED operated in DC-mode. The SiPM current is measured and used to determine the steady-state temperature as a function of power dissipated in the multiplication region of the SiPM and thermal resistance, as well as the time dependencies for heating and cooling. This information can be used to correct the parameters determined for radiation-damaged SiPM for the effects of self-heating. The method can also be employed for packaged SiPMs with unknown thermal contact to a heat sink. The results presented in this paper are preliminary. △ Less

Submitted 14 June, 2022; v1 submitted 11 May, 2022; originally announced May 2022.

Radiation damage uniformity in a SiPM

Authors: O. Bychkova, E. Garutti, E. Popova, A. Stifutkin, S. Martens, P. Parygin, A. Kaminsky, J. Schwandt

Abstract: A dedicated single-cell SiPM structure is designed and measured to investigate the radiation damage effects on the gain and breakdown voltage of SiPMs exposed to a reactor neutron fluence up to $Φ$ = 5e13 cm$^{-2}$. The cell has a pitch of 15 $μ$m. Results of the measurements and analysis of the IV-curves are presented. Impact of the self-heating effect was investigated. The radiation damage unifo… ▽ More A dedicated single-cell SiPM structure is designed and measured to investigate the radiation damage effects on the gain and breakdown voltage of SiPMs exposed to a reactor neutron fluence up to $Φ$ = 5e13 cm$^{-2}$. The cell has a pitch of 15 $μ$m. Results of the measurements and analysis of the IV-curves are presented. Impact of the self-heating effect was investigated. The radiation damage uniformity of 1 cell and 120 cells was checked up to $U_\mathit{ov}$ = 1.7 V. Fluence dependence of the breakdown voltage from the current measurements $U^{IV}_\mathit{bd}$ was extracted and compared to that of the breakdown voltage from the gain measurements $U^{G}_\mathit{bd}$. △ Less

Submitted 2 May, 2022; originally announced May 2022.

Comments: arXiv admin note: text overlap with arXiv:2111.00483

Study of the band-gap energy of radiation-damaged silicon

Authors: R. Klanner, S. Martens, J. Schwandt, A. Vauth

Abstract: The transmission of silicon crystals irradiated by 24 GeV/c protons and reactor neutrons has been measured for photon energies, $Eγ$, between 0.95 and 1.3 eV. From the transmission data the absorption coefficient $α$ is calculated, and from $α(E_γ)$ the fluence dependence of the band-gap energy, $E_{gap}$, and the energy of transverse optical phonons, $E_{ph}$, determined. It is found that within… ▽ More The transmission of silicon crystals irradiated by 24 GeV/c protons and reactor neutrons has been measured for photon energies, $Eγ$, between 0.95 and 1.3 eV. From the transmission data the absorption coefficient $α$ is calculated, and from $α(E_γ)$ the fluence dependence of the band-gap energy, $E_{gap}$, and the energy of transverse optical phonons, $E_{ph}$, determined. It is found that within the experimental uncertainties of about 1 meV neither $E_{gap}$ nor $E_{ph}$ depend on fluence up to the maximum fluence of $1 \times 10^{17}$ cm$^{-2}$ of the measurements. The value of $E_{gap}$ agrees within about 1 meV with the generally accepted value, if an exciton-binding energy of 15 meV is assumed. A similar agreement is found for $E_{ph}$. For the extraction of $E_{gap}$ and $E_{ph}$ the second derivative of $\sqrt{α(Eγ )}$ smoothed with a Gaussian kernel has been used. △ Less

Submitted 7 April, 2022; originally announced April 2022.

Comments: 11 pages, 7 figures

Can the electric field in radiation-damaged silicon pad diodes be determined by admittance and current measurements?

Authors: R. Klanner, J. Schwandt

Abstract: A method is proposed for determining the electric field in highly-irradiated silicon pad diodes using admittance-frequency (Y-f ), and current measurements (I). The method is applied to Y-f and I data from square n+p diodes of 25mm2 area irradiated by 24 GeV/c protons to four 1MeV neutron equivalent fluences between 3E15 cm^2 and 13E15 cm^2. The measurement conditions were: Reverse voltages betwee… ▽ More A method is proposed for determining the electric field in highly-irradiated silicon pad diodes using admittance-frequency (Y-f ), and current measurements (I). The method is applied to Y-f and I data from square n+p diodes of 25mm2 area irradiated by 24 GeV/c protons to four 1MeV neutron equivalent fluences between 3E15 cm^2 and 13E15 cm^2. The measurement conditions were: Reverse voltages between 1V and 1000V, frequencies between 100Hz and 2MHz and temperatures of -20°C and -30°C. The position dependence of the electric field is parameterised by a linear dependence at the two sides of the diode, and a constant in the centre. The parameters as a function of voltage, temperature and irradiation fluence are determined by fits of the model to the data. For voltages below about 300V all data are well described by the model, and the results for the electric field agrees with expectations: Depleted high-field regions towards the two faces and a constant low electric field in the centre, with values which agrees with the field in an ohmic resistor with approximately the intrinsic resistivity of silicon. For conditions at which the low field region disappears and the diode is fully depleted, the method fails. This happens around 300V for the lowest irradiation fluence at -30°C, and at higher voltages for higher fluences and lower temperatures. In the conclusions the successes and problems of the method are discussed. △ Less

Submitted 22 November, 2021; originally announced November 2021.

Comments: 15 pages, 13 figures, 2 tables, 1 appendix

Radiation hardness study using SiPMs with single-cell readout

Authors: E. Garutti, E. Popova, P. Parygin, O. Bychkova, A. Kaminsky, S. Martens, J. Schwandt, A. Stifutkin

Abstract: A dedicated single-cell SiPM structure is designed and measured to investigate the radiation damage effects on the gain and turn-off voltage of SiPMs exposed to a reactor neutron fluence up to $Φ$ = 5e13 cm$^{-2}$. The cell has a pitch of 15 $μ$m. The fluence dependence of gain and turn-off voltage are reported. A reduction of the gain by 19% and an increase of $V_{off}$ by $\approx$0.5 V is obser… ▽ More A dedicated single-cell SiPM structure is designed and measured to investigate the radiation damage effects on the gain and turn-off voltage of SiPMs exposed to a reactor neutron fluence up to $Φ$ = 5e13 cm$^{-2}$. The cell has a pitch of 15 $μ$m. The fluence dependence of gain and turn-off voltage are reported. A reduction of the gain by 19% and an increase of $V_{off}$ by $\approx$0.5 V is observed after $Φ$ = 5e13 cm$^{-2}$. △ Less

Submitted 31 October, 2021; originally announced November 2021.

Comments: 6 pages, 11 figures

Depth-dependent charge collection profile of pad diodes

Authors: Mohammadtaghi Hajheidari, Erika Garutti, Joern Schwandt, Aliakbar Ebrahimi

Abstract: The collected charge of two pad diodes is measured along the diode width using a 5:2 GeV electron beam at the DESY II beam test facility. The electron beam enters parallel to the readout electrode plane and perpendicular to the edge of the diode. The position of the electron beam is reconstructed by three planes of an EUDET-type telescope. An in-situ procedure is developed to align the diode surfa… ▽ More The collected charge of two pad diodes is measured along the diode width using a 5:2 GeV electron beam at the DESY II beam test facility. The electron beam enters parallel to the readout electrode plane and perpendicular to the edge of the diode. The position of the electron beam is reconstructed by three planes of an EUDET-type telescope. An in-situ procedure is developed to align the diode surface parallel to the electron beam. The result of these measurements is the charge collection efficiency profile as a function of depth for each diode. For a non-irradiated diode, the charge profile is uniform as a function of the beam position for bias voltages above the full-depletion, as expected. For the irradiated diode, the charge profile is non-uniform and changes as a function of bias voltage. △ Less

Submitted 15 December, 2021; v1 submitted 7 August, 2021; originally announced August 2021.

Position reconstruction for segmented detectors

Authors: A. Ebrahimi, F. Feind, E. Fretwurst, E. Garutti, M. Hajheidari, R. Klanner, D. Pitzl, J. Schwandt, G. Steinbrueck, I. Zoi

Abstract: The topic of the paper is the position reconstruction from signals of segmented detectors. With the help of a simple simulation, it is shown that the position reconstruction using the centre-of-gravity method is strongly biased, if the width of the charge (or e.g. light) distribution at the electrodes (or photo detectors) is less than the read-out pitch. A method is proposed which removes this bia… ▽ More The topic of the paper is the position reconstruction from signals of segmented detectors. With the help of a simple simulation, it is shown that the position reconstruction using the centre-of-gravity method is strongly biased, if the width of the charge (or e.g. light) distribution at the electrodes (or photo detectors) is less than the read-out pitch. A method is proposed which removes this bias for events with signals in two or more read-out channels and thereby improves the position resolution. The method also provides an estimate of the position-response function for every event. Examples are given for which its width as a function of the reconstructed position varies by as much as an order of magnitude. A fast Monte Carlo program is described which simulates the signals from a silicon pixel detector traversed by charged particles under different angles, and the results obtained with the proposed reconstruction method and with the centre-of-gravity method are compared. The simulation includes the local energy-loss fluctuations, the position-dependent electric field, the diffusion of the charge carriers, the electronics noise and charge thresholds for clustering. A comparison to test-beam-data is used to validate the simulation. △ Less

Submitted 14 July, 2021; originally announced July 2021.

Comments: 20 pages, 17 figures, 1 Table

Position resolution with 25 um pitch pixel sensors before and after irradiation

Authors: I. Zoi, A. Ebrahimi, F. Feindt, E. Garutti, P. Gunnellini, A. Hinzmann, C. Niemeyer, D. Pitzl, J. Schwandt, G. Steinbrück

Abstract: Pixelated silicon detectors are state-of-the-art technology to achieve precise tracking and vertexing at collider experiments, designed to accurately measure the hit position of incoming particles in high rate and radiation environments. The detector requirements become extremely demanding for operation at the High-Luminosity LHC, where up to 200 interactions will overlap in the same bunch crossin… ▽ More Pixelated silicon detectors are state-of-the-art technology to achieve precise tracking and vertexing at collider experiments, designed to accurately measure the hit position of incoming particles in high rate and radiation environments. The detector requirements become extremely demanding for operation at the High-Luminosity LHC, where up to 200 interactions will overlap in the same bunch crossing on top of the process of interest. Additionally, fluences up to 2.3 10^16 cm^-2 1 MeV neutron equivalent at 3.0 cm distance from the beam are expected for an integrated luminosity of 3000 fb^-1. In the last decades, the pixel pitch has constantly been reduced to cope with the experiment's needs of achieving higher position resolution and maintaining low pixel occupancy per channel. The spatial resolution improves with a decreased pixel size but it degrades with radiation damage. Therefore, prototype sensor modules for the upgrade of the experiments at the HL-LHC need to be tested after being irradiated. This paper describes position resolution measurements on planar prototype sensors with 100x25 um^2 pixels for the CMS Phase-2 Upgrade. It reviews the dependence of the position resolution on the relative inclination angle between the incoming particle trajectory and the sensor, the charge threshold applied by the readout chip, and the bias voltage. A precision setup with three parallel planes of sensors has been used to investigate the performance of sensors irradiated to fluences up to F_eq = 3.6 10^15 cm-2. The measurements were performed with a 5 GeV electron beam. A spatial resolution of 3.2 +\- 0.1 um is found for non-irradiated sensors, at the optimal angle for charge sharing. The resolution is 5.0 +/- 0.2 um for a proton-irradiated sensor at F_eq = 2.1 10^15 cm-2 and a neutron-irradiated sensor at F_eq = 3.6 10^15 cm^-2. △ Less

Submitted 9 July, 2021; originally announced July 2021.

A computer program to simulate the response of SiPMs

Authors: E. Garutti, R. Klanner, J. Rolph, J. Schwandt

Abstract: A Monte Carlo program which simulates the response of SiPMs is presented. Input to the program are the mean number and the time distribution of Geiger discharges from light, as well as the dark-count rate. For every primary Geiger discharge from light and dark counts in an event, correlated Geiger discharges due to prompt and delayed cross-talk and after-pulses are simulated, and a table of the am… ▽ More A Monte Carlo program which simulates the response of SiPMs is presented. Input to the program are the mean number and the time distribution of Geiger discharges from light, as well as the dark-count rate. For every primary Geiger discharge from light and dark counts in an event, correlated Geiger discharges due to prompt and delayed cross-talk and after-pulses are simulated, and a table of the amplitudes and times of all Geiger discharges in a specified time window generated. A number of different physics-based models and statistical treatments for the simulation of correlated Geiger discharges can be selected. These lists for many events together with different options for the pulse shapes of single Geiger discharges are used to simulate charge spectra, as measured by a current-integrating charge-to-digital converter, or current transients convolved with an electronics response function, as recorded by a digital oscilloscope. The program can be used to compare simulations with different assumptions to experimental data, and thus find out which models are most appropriate for a given SiPM, optimise the operating conditions and readout for a given application or test programs which are used to extract SiPM parameters from experimental data. △ Less

Submitted 19 June, 2020; originally announced June 2020.

Comments: 13 pages, 9 figures, 1 table

On the weighting field and admittance of irradiated Si-sensors

Authors: Robert Klanner, Joern Schwandt

Abstract: In this paper the weighting field $E_W$ and the frequency dependence of the admittance Y of n$^+$p pad sensors irradiated by 24 GeV/c protons to equivalent fluences in the range $Φ_{\rm eq} = 3$ to $13\times 10^{15}$ cm$^{-2}$ are investigated. 1-D TCad simulations are used to calculate $E_W$. For $Φ_{\rm eq} < 10^{13}$ cm$^{-2}$ $E_W$ depends on position and time. However, for higher… ▽ More In this paper the weighting field $E_W$ and the frequency dependence of the admittance Y of n$^+$p pad sensors irradiated by 24 GeV/c protons to equivalent fluences in the range $Φ_{\rm eq} = 3$ to $13\times 10^{15}$ cm$^{-2}$ are investigated. 1-D TCad simulations are used to calculate $E_W$. For $Φ_{\rm eq} < 10^{13}$ cm$^{-2}$ $E_W$ depends on position and time. However, for higher $Φ_{\rm eq}$ the time constant $τ$ is much longer than the typical electronics readout time and $E_W = 1/d$ ($d$ = sensor thickness). It is demonstrated that the increase of the resistivity of the Si bulk with irradiation is responsible for the increase of $τ$. The admittance Y of irradiated pad sensors has been measured for frequencies between f = 100 Hz and 1 MHz and voltages between 1 and 1000 V at -20$^\circ$C and -30$^\circ$C. For f < 1 kHz the parallel capacitance C$_p$ shows a f dependence. A model with a position-dependent resistivity is able to describe the data. It is concluded: 1. The weighting field of a highly irradiated sensor is the same as the weighting field of a fully depleted sensor before irradiation. 2. Models with a position-dependent resistivity describe the frequency dependence of C$_p$ for irradiated sensors. △ Less

Submitted 28 November, 2019; originally announced November 2019.

Comments: 6 pages, 10 figures, IEEE Nuclear Science Symposium 2019

Determination of the electric field in highly-irradiated silicon sensors using edge-TCT measurements

Authors: R. Klanner, G. Kramberger, I. Mandic, M. Mikuz, M. Milovanovic, J. Schwandt

Abstract: A method is presented which allows to obtain the position-dependent electric field and charge density by fits to velocity profiles from edge-TCT data from silicon strip-detectors. The validity and the limitations of the method are investigated by simulations of non-irradiated $n^+p$ pad sensors and by the analysis of edge-TCT data from non-irradiated $n^+p$ strip-detectors. The method is then used… ▽ More A method is presented which allows to obtain the position-dependent electric field and charge density by fits to velocity profiles from edge-TCT data from silicon strip-detectors. The validity and the limitations of the method are investigated by simulations of non-irradiated $n^+p$ pad sensors and by the analysis of edge-TCT data from non-irradiated $n^+p$ strip-detectors. The method is then used to determine the position dependent electric field and charge density in $n^+p$ strip detectors irradiated by reactor neutrons to fluences between 1 and $10 \times 10^{15}$ cm$^{-2}$ for forward-bias voltages between 25 V and up to 550 V and for reverse-bias voltages between 50 V and 800 V. In all cases the velocity profiles are well described. The electric fields and charge densities determined provide quantitative insights into the effects of radiation damage for silicon sensors by reactor neutrons. △ Less

Submitted 11 September, 2019; originally announced September 2019.

Comments: 18 oages, 15 figures, 1 table

Megapixels @ Megahertz -- The AGIPD High-Speed Cameras for the European XFEL

Authors: Ulrich Trunk, Aschkan Allahgholi, Julian Becker, Annette Delfs, Roberto Dinapoli, Peter Göttlicher, Heinz Graafsma, Dominic Greiffenberg, Helmut Hirsemann, Stefanie Jack, Alexander Klyuev, Hans Krüger, Manuela Kuhn, Torsten Laurus, Alessandro Marras, Davide Mezza, Aldo Mozzanica, Jennifer Poehlsen, Ofir Shefer Shalev, Igor Sheviakov, Bernd Schmitt, Jörn Schwandt, Xintian Shi, Sergej Smoljanin, Jiaguo Zhang , et al. (1 additional authors not shown)

Abstract: The European XFEL is an extremely brilliant Free Electron Laser Source with a very demanding pulse structure: trains of 2700 X-Ray pulses are repeated at 10 Hz. The pulses inside the train are spaced by 220 ns and each one contains up to $10^{12}$ photons of 12.4 keV, while being $\le 100$ fs in length. AGIPD, the Adaptive Gain Integrating Pixel Detector, is a hybrid pixel detector developed by DE… ▽ More The European XFEL is an extremely brilliant Free Electron Laser Source with a very demanding pulse structure: trains of 2700 X-Ray pulses are repeated at 10 Hz. The pulses inside the train are spaced by 220 ns and each one contains up to $10^{12}$ photons of 12.4 keV, while being $\le 100$ fs in length. AGIPD, the Adaptive Gain Integrating Pixel Detector, is a hybrid pixel detector developed by DESY, PSI, and the Universities of Bonn and Hamburg to cope with these properties. It is a fast, low noise integrating detector, with single photon sensitivity (for $\text{E}_γ \ge 6$ keV) and a large dynamic range, up to $10^4$ photons at 12.4 keV. This is achieved with a charge sensitive amplifier with 3 adaptively selected gains per pixel. 352 images can be recorded at up to 6.5 MHz and stored in the in-pixel analogue memory and read out between pulse trains. The core component of this detector is the AGIPD ASIC, which consists of $64 \times 64$ pixels of $200 μ\text{m} \times 200 μ\text{m}$. Control of the ASIC's image acquisition and analogue readout is via a command based interface. FPGA based electronic boards, controlling ASIC operation, image digitisation and 10 GE data transmission interface AGIPD detectors to DAQ and control systems. An AGIPD 1 Mpixel detector has been installed at the SPB experimental station in August 2017, while a second one is currently commissioned for the MID endstation. A larger (4 Mpixel) AGIPD detector and one to employ Hi-Z sensor material to efficiently register photons up to $\text{E}_γ \approx 25$ keV are currently under construction. △ Less

Submitted 6 August, 2019; originally announced August 2019.

Comments: submitted to the proceedings of the ULITIMA 2018 conference, to be published in NIM A

On the weighting field of irradiated silicon detectors

Authors: Joern Schwandt, Robert Klanner

Abstract: The understanding of the weighting field of irradiated silicon sensors is essential for calculating the response of silicon detectors in the radiation environment at accelerators like at the CERN LHC. Using 1-D calculations of non-irradiated pad sensors and 1-D TCAD simulations of pad sensors before and after irradiation, it is shown that the time-dependence of the weighting field is related to th… ▽ More The understanding of the weighting field of irradiated silicon sensors is essential for calculating the response of silicon detectors in the radiation environment at accelerators like at the CERN LHC. Using 1-D calculations of non-irradiated pad sensors and 1-D TCAD simulations of pad sensors before and after irradiation, it is shown that the time-dependence of the weighting field is related to the resistivity of low field regions with ohmic behaviour in the sensor. A simple formula is derived, which relates the time constant of the time-dependent weighting field, $τ$, with the resistivity and the extension of the low-field region for pad detectors. As the resistivity of irradiated silicon increases with fluence and finally reaches the intrinsic resistivity, $τ$ becomes much larger than the charge-collection time and the weighting field becomes essentially independent of time. The TCAD simulations show that the transition from a time-dependent to a time-independent weighting field occurs at a neutron-equivalent fluence of $ \approx 5 \times 10^{12}$ cm$^{-2}$ for a 200 $μ$m thick pad diode operated at 40 V and $- 20^\circ$C. It is therefore concluded that the use of a time-independent weighting field calculated with the same method as for a fully-depleted non-irradiated sensor is also appropriate for the simulation of highly irradiated silicon sensors. △ Less

Submitted 18 July, 2019; v1 submitted 21 May, 2019; originally announced May 2019.

Detector Technologies for CLIC

Authors: A. C. Abusleme Hoffman, G. Parès, T. Fritzsch, M. Rothermund, H. Jansen, K. Krüger, F. Sefkow, A. Velyka, J. Schwandt, I. Perić, L. Emberger, C. Graf, A. Macchiolo, F. Simon, M. Szalay, N. van der Kolk, H. Abramowicz, Y. Benhammou, O. Borysov, M. Borysova, A. Joffe, S. Kananov, A. Levy, I. Levy, G. Eigen , et al. (107 additional authors not shown)

Abstract: The Compact Linear Collider (CLIC) is a high-energy high-luminosity linear electron-positron collider under development. It is foreseen to be built and operated in three stages, at centre-of-mass energies of 380 GeV, 1.5 TeV and 3 TeV, respectively. It offers a rich physics program including direct searches as well as the probing of new physics through a broad set of precision measurements of Stan… ▽ More The Compact Linear Collider (CLIC) is a high-energy high-luminosity linear electron-positron collider under development. It is foreseen to be built and operated in three stages, at centre-of-mass energies of 380 GeV, 1.5 TeV and 3 TeV, respectively. It offers a rich physics program including direct searches as well as the probing of new physics through a broad set of precision measurements of Standard Model processes, particularly in the Higgs-boson and top-quark sectors. The precision required for such measurements and the specific conditions imposed by the beam dimensions and time structure put strict requirements on the detector design and technology. This includes low-mass vertexing and tracking systems with small cells, highly granular imaging calorimeters, as well as a precise hit-time resolution and power-pulsed operation for all subsystems. A conceptual design for the CLIC detector system was published in 2012. Since then, ambitious R&D programmes for silicon vertex and tracking detectors, as well as for calorimeters have been pursued within the CLICdp, CALICE and FCAL collaborations, addressing the challenging detector requirements with innovative technologies. This report introduces the experimental environment and detector requirements at CLIC and reviews the current status and future plans for detector technology R&D. △ Less

Submitted 7 May, 2019; originally announced May 2019.

Comments: 152 pages, 116 figures; published as CERN Yellow Report Monograph Vol. 1/2019; corresponding editors: Dominik Dannheim, Katja Krüger, Aharon Levy, Andreas Nürnberg, Eva Sicking

Report number: CERN-2019-001

A new model for the TCAD simulation of the silicon damage by high fluence proton irradiation

Authors: Joern Schwandt, Eckhart Fretwurst, Erika Garutti, Robert Klanner, Christian Scharf, Georg Steinbrueck

Abstract: For the high-luminosity phase of the Large Hadron Collider (HL-LHC), at the expected position of the innermost pixel detector layer of the CMS and ATLAS experiments, the estimated equivalent neutron fluence after 3000 fb$^{-1}$ is 2$\cdot$10$^{16}$ n$_{eq}$/cm$^2$, and the IEL (Ionizing Energy Loss) dose in the SiO$_2$ 12 MGy. The optimisation of the pixel sensors and the understanding of their pe… ▽ More For the high-luminosity phase of the Large Hadron Collider (HL-LHC), at the expected position of the innermost pixel detector layer of the CMS and ATLAS experiments, the estimated equivalent neutron fluence after 3000 fb$^{-1}$ is 2$\cdot$10$^{16}$ n$_{eq}$/cm$^2$, and the IEL (Ionizing Energy Loss) dose in the SiO$_2$ 12 MGy. The optimisation of the pixel sensors and the understanding of their performance as a function of fluence and dose makes a radiation damage model for TCAD simulations, which describes the available experimental data, highly desirable. The currently available bulk-damage models are not able to describe simultaneously the measurements of dark current (I-V), capacitance-voltage (C-V) and charge collection efficiency (CCE) of pad diodes for fluences $\ge 1\cdot 10^{15}$ n$_{eq}$/cm$^2$. Therefore, for the development and validation of a new accurate bulk damage model we use I-V, C-V and CCE measurements on pad diodes available within the CMS-HPK campaign and data from samples irradiated recently with 24 GeV/c protons. For the determination of the radiation-induced damage parameters we utilise the "optimiser" of Synopsys TCAD, which allows the minimisation of the difference between the measured and simulated I-V, C-V and CCE. The outcome of this optimisation, the Hamburg Penta Trap Model (HPTM), provides a consistent and accurate description of the measurements of diodes irradiated with protons in the fluence range from 3$\cdot$10$^{14}$ n$_{eq}$/cm$^2$ to 1.3$\cdot$10$^{16}$ n$_{eq}$/cm$^2$. △ Less

Submitted 23 April, 2019; originally announced April 2019.

Analysis methods for highly radiation-damaged SiPMs

Authors: S. Cerioli, E. Garutti, R. Klanner, S. Martens, J. Schwandt, M. Zvolsky

Abstract: Prototype SiPMs with 4384 pixels of dimensions $15 \times 15~μ$m$^2$ produced by KETEK have been irradiated with reactor neutrons to eight fluences between $10^9$ and $5\times 10^{14}$ cm$^{-2}$. For temperatures between $-30~^\circ $C and $+30~^\circ $C capacitance-voltage, admittance-frequency, current-forward voltage, current-reverse voltage and charge-voltage measurements with and without illu… ▽ More Prototype SiPMs with 4384 pixels of dimensions $15 \times 15~μ$m$^2$ produced by KETEK have been irradiated with reactor neutrons to eight fluences between $10^9$ and $5\times 10^{14}$ cm$^{-2}$. For temperatures between $-30~^\circ $C and $+30~^\circ $C capacitance-voltage, admittance-frequency, current-forward voltage, current-reverse voltage and charge-voltage measurements with and without illumination by a sub-nanosecond laser have been performed. The data have been analysed using different methods in order to extract the dependence on neutron fluence and temperature of the electrical parameters, the breakdown oltage, the activation energy for the current generation, the dark-count rate and the response to light pulses. The results from the different analysis methods are compared. △ Less

Submitted 15 April, 2019; originally announced April 2019.

Comments: 11 pages, 6 Figures, Talk presented by R. Klanner at the 15th Vienna Conference on Instrumentation, Vienna, Feb. 18th-22nd, 2019

The Adaptive Gain Integrating Pixel Detector at the European XFEL

Authors: Aschkan Allahgholi, Julian Becker, Annette Delfs, Roberto Dinapoli, Peter Goettlicher, Dominic Greiffenberg, Beat Henrich, Helmut Hirsemann, Manuela Kuhn, Robert Klanner, Alexander Klyuev, Hans Krueger, Sabine Lange, Torsten Laurus, Alessandro Marras, Davide Mezza, Aldo Mozzanica, Magdalena Niemann, Jennifer Poehlsen, Joern Schwandt, Igor Sheviakov, Xintian Shi, Sergej Smoljanin, Lothar Steffen, Jolanta Sztuk-Dambietz , et al. (7 additional authors not shown)

Abstract: The Adaptive Gain Integrating Pixel Detector (AGIPD) is an x-ray imager, custom designed for the European x-ray Free-Electron Laser (XFEL). It is a fast, low noise integrating detector, with an adaptive gain amplifier per pixel. This has an equivalent noise of less than 1 keV when detecting single photons and, when switched into another gain state, a dynamic range of more than 10$^4$ photons of 12… ▽ More The Adaptive Gain Integrating Pixel Detector (AGIPD) is an x-ray imager, custom designed for the European x-ray Free-Electron Laser (XFEL). It is a fast, low noise integrating detector, with an adaptive gain amplifier per pixel. This has an equivalent noise of less than 1 keV when detecting single photons and, when switched into another gain state, a dynamic range of more than 10$^4$ photons of 12 keV. In burst mode the system is able to store 352 images while running at up to 6.5 MHz, which is compatible with the 4.5 MHz frame rate at the European XFEL. The AGIPD system was installed and commissioned in August 2017, and successfully used for the first experiments at the Single Particles, Clusters and Biomolecules (SPB) experimental station at the European XFEL since September 2017. This paper describes the principal components and performance parameters of the system. △ Less

Submitted 2 October, 2018; v1 submitted 1 August, 2018; originally announced August 2018.

Comments: revised version after peer review

Study of point- and cluster-defects in radiation-damaged silicon

Authors: Elena M. Donegani, Eckhart Fretwurst, Erika Garutti, Robert Klanner, Gunnar Lindstroem, Ioana Pintilie, Roxana Radu, Joern Schwandt

Abstract: Non-ionising energy loss of radiation produces point defects and defect clusters in silicon, which result in a signifcant degradation of sensor performance. In this contribution results from TSC (Thermally Stimulated Current) defect spectroscopy for silicon pad diodes irradiated by electrons to fluences of a few $10^{14}$ cm$^{-2}$ and energies between 3.5 and 27 MeV for isochronal annealing betwe… ▽ More Non-ionising energy loss of radiation produces point defects and defect clusters in silicon, which result in a signifcant degradation of sensor performance. In this contribution results from TSC (Thermally Stimulated Current) defect spectroscopy for silicon pad diodes irradiated by electrons to fluences of a few $10^{14}$ cm$^{-2}$ and energies between 3.5 and 27 MeV for isochronal annealing between 80 and 280°C, are presented. A method based on SRH (Shockley-Read-Hall) statistics is introduced, which assumes that the ionisation energy of the defects in a cluster depends on the fraction of occupied traps. The dfference of ionisation energy of an isolated point defect and a fully occupied cluster, $ΔE_a$, is extracted from the TSC data. For the VOi (vacancy-oxygen interstitial) defect $ΔE_a = 0$ is found, which cofirms that it is a point defect, and validates the method for point defects. For clusters made of deep acceptors the $ΔE_a$ values for different defects are determined after annealing at 80°C as a function of electron energy, and for the irradiation with 15 MeV electrons as a function of annealing temperature. For the irradiation with 3.5 MeV electrons the value $ΔE_a = 0$ is found, whereas for the electron energies of 6 to 27 MeV $ΔE_a > 0$. This agrees with the expected threshold of about 5 MeV for cluster formation by electrons. The $ΔE_a$ values determined as a function of annealing temperature show that the annealing rate is different for different defects. A naive diffusion model is used to estimate the temperature dependencies of the diffusion of the defects in the clusters. △ Less

Submitted 19 March, 2018; originally announced March 2018.

Comments: 13 pages, 12 figures, 4 tables

Characterisation of highly radiation-damaged SiPMs using current measurements

Authors: E. Garutti, R. Klanner, D. Lomidze, J. Schwandt, M. Zvolsky

Abstract: The characterisation of radiation-damaged SiPMs is a major challenge, when the average time between dark counts approaches, or even exceeds, the signal decay time. In this note a collection of formulae is presented, which have been developed and used for the analysis of current measurements for SiPMs in the dark and illuminated by an LED, before and after hadron irradiation. It is shown, how param… ▽ More The characterisation of radiation-damaged SiPMs is a major challenge, when the average time between dark counts approaches, or even exceeds, the signal decay time. In this note a collection of formulae is presented, which have been developed and used for the analysis of current measurements for SiPMs in the dark and illuminated by an LED, before and after hadron irradiation. It is shown, how parameters like the breakdown voltage, the quenching resistance, the dark-count rate, the reduction of the photo-detection efficiency due to dark counts and the Geiger discharge probability can be estimated from current-voltage measurements. The only additional SiPM parameters needed are the pixel capacitance, the number of pixels and the correlated noise. Central to the method is the concept of the pixel occupancy, the probability of a Geiger discharge in a single pixel during a given time interval, for which the decay time of the SiPM signal has been assumed. As an illustration the formulae are used to characterise a KETEK SiPM before and after irradiation by a fluence of 5E13 cm$^{-2}$ of reactor neutrons for temperatures of -30°C and +20°C, where dark-count rates exceeding 1E11 Hz are observed. △ Less

Submitted 15 September, 2017; originally announced September 2017.

Comments: 11 pages, 7 figures, 2 tables

Neutron irradiation effect on SiPMs up to $Φ_{neq}$ = 5 $\times$ 10$^{14}$ cm$^{-2}$

Authors: M. Centis Vignali, E. Garutti, R. Klanner, D. Lomidze, J. Schwandt

Abstract: Silicon Photo-Multipliers (SiPM) are becoming the photo-detector of choice for increasingly more particle detection applications, from fundamental physics to medical and societal applications. One major consideration for their use at high-luminosity colliders is the radiation damage induced by hadrons, which leads to a dramatic increase of the dark count rate. KETEK SiPMs have been exposed to vari… ▽ More Silicon Photo-Multipliers (SiPM) are becoming the photo-detector of choice for increasingly more particle detection applications, from fundamental physics to medical and societal applications. One major consideration for their use at high-luminosity colliders is the radiation damage induced by hadrons, which leads to a dramatic increase of the dark count rate. KETEK SiPMs have been exposed to various fluences of reactor neutrons up to $Φ_{neq}$ = 5$\times$10$^{14}$ cm$^{-2}$ (1 MeV equivalent neutrons). Results from the I-V, and C-V measurements for temperatures between $-$30$^\circ$C and $+$30$^\circ$C are presented. We propose a new method to quantify the effect of radiation damage on the SiPM performance. Using the measured dark current the single pixel occupation probability as a function of temperature and excess voltage is determined. From the pixel occupation probability the operating conditions for given requirements can be optimized. The method is qualitatively verified using current measurements with the SiPM illuminated by blue LED light. △ Less

Submitted 14 September, 2017; originally announced September 2017.

Test Beam Performance Measurements for the Phase I Upgrade of the CMS Pixel Detector

Authors: M. Dragicevic, M. Friedl, J. Hrubec, H. Steininger, A. Gädda, J. Härkönen, T. Lampén, P. Luukka, T. Peltola, E. Tuominen, E. Tuovinen, A. Winkler, P. Eerola, T. Tuuva, G. Baulieu, G. Boudoul, L. Caponetto, C. Combaret, D. Contardo, T. Dupasquier, G. Gallbit, N. Lumb, L. Mirabito, S. Perries, M. Vander Donckt , et al. (462 additional authors not shown)

Abstract: A new pixel detector for the CMS experiment was built in order to cope with the instantaneous luminosities anticipated for the Phase~I Upgrade of the LHC. The new CMS pixel detector provides four-hit tracking with a reduced material budget as well as new cooling and powering schemes. A new front-end readout chip mitigates buffering and bandwidth limitations, and allows operation at low comparator… ▽ More A new pixel detector for the CMS experiment was built in order to cope with the instantaneous luminosities anticipated for the Phase~I Upgrade of the LHC. The new CMS pixel detector provides four-hit tracking with a reduced material budget as well as new cooling and powering schemes. A new front-end readout chip mitigates buffering and bandwidth limitations, and allows operation at low comparator thresholds. In this paper, comprehensive test beam studies are presented, which have been conducted to verify the design and to quantify the performance of the new detector assemblies in terms of tracking efficiency and spatial resolution. Under optimal conditions, the tracking efficiency is $99.95\pm0.05\,\%$, while the intrinsic spatial resolutions are $4.80\pm0.25\,μ\mathrm{m}$ and $7.99\pm0.21\,μ\mathrm{m}$ along the $100\,μ\mathrm{m}$ and $150\,μ\mathrm{m}$ pixel pitch, respectively. The findings are compared to a detailed Monte Carlo simulation of the pixel detector and good agreement is found. △ Less

Submitted 1 June, 2017; originally announced June 2017.

Report number: CMS-NOTE-2017-002

Determination of the p-spray profile for n+p silicon sensors using a MOSFET

Authors: E. Fretwurst, E. Garutti, R. Klanner, I. Kopsalis, J. Schwandt, M. Weberpals

Abstract: The standard technique to electrically isolate the $n^+$ implants of segmented silicon sensors fabricated on high-ohmic $p$-type silicon are $p^+$-implants. Although the knowledge of the $p^+$-implant dose and of the do** profile is highly relevant for the understanding and optimisation of sensors, this information is usually not available from the vendors, and methods to obtain it are highly we… ▽ More The standard technique to electrically isolate the $n^+$ implants of segmented silicon sensors fabricated on high-ohmic $p$-type silicon are $p^+$-implants. Although the knowledge of the $p^+$-implant dose and of the do** profile is highly relevant for the understanding and optimisation of sensors, this information is usually not available from the vendors, and methods to obtain it are highly welcome. The paper presents methods to obtain this information from circular MOSFETs fabricated as test structures on the same wafer as the sensors. Two circular MOSFETs, one with and one without a $p^+$-implant under the gate, are used for this study. They were produced on Magnetic Czochralski silicon doped with $\approx 3.5 \times 10^{12}$ cm$^{-2}$ of boron and $\langle 1 0 0 \, \rangle$ crystal orientation. The drain-source current as function of gate voltage for different back-side voltages is measured at a drain-source voltage of 50 mV in the linear MOSFET region, and the values of threshold voltage and mobility extracted using the standard MOSFET formulae. To determine the bulk do**, the implantation dose and profile from the data, two methods are used, which give compatible results. The do** profile, which varies between $3.5 \times 10^{12}$ cm$^{-3}$ and $2 \times 10^{15}$ cm$^{-3}$ for the MOSFET with $p^+$-implant, is determined down to a distance of a fraction of a $μ$m from the Si-SiO$_2$ interface. The method of extracting the do** profiles is verified using data from a TCAD simulation of the two MOSFETs. The details of the methods and of the problems encountered are discussed. △ Less

Submitted 28 March, 2017; originally announced April 2017.

Comments: 16 pages, 18 figures, 5 tables

On the characterisation of SiPMs from pulse-height spectra

Authors: V. Chmill, E. Garutti, R. Klanner, M. Nitschke, J. Schwandt

Abstract: Methods are developed, which use the pulse-height spectra of SiPMs measured in the dark and illuminated by pulsed light, to determine the pulse shape, the dark-count rate, the gain, the average number of photons initiating a Geiger discharge, the probabilities for prompt cross-talk and after-pulses, as well as the electronics noise and the gain fluctuations between and in pixels. The entire pulse-… ▽ More Methods are developed, which use the pulse-height spectra of SiPMs measured in the dark and illuminated by pulsed light, to determine the pulse shape, the dark-count rate, the gain, the average number of photons initiating a Geiger discharge, the probabilities for prompt cross-talk and after-pulses, as well as the electronics noise and the gain fluctuations between and in pixels. The entire pulse-height spectra, including the background regions in-between the peaks corresponding to different number of Geiger discharges, are described by single functions. As a demonstration, the model is used to characterise a KETEK SiPM with 4382 pixels of 15 μm x 15 μm area for voltages between 2.5 and 8 V above the breakdown voltage at 20°C. The results are compared to other methods of characterising SiPMs. Finally, examples are given, how the complete description of the pulse-eight spectra can be used to optimise the operating voltage of SiPMs, and a method for an in-situ calibration and monitoring of SiPMs, suited for large-scale applications, is proposed. △ Less

Submitted 21 February, 2017; v1 submitted 5 September, 2016; originally announced September 2016.

Comments: 18 pages 11 figures 2 appendices

Study of the breakdown voltage of SiPMs

Authors: V. Chmill, E. Garutti, R. Klanner, M. Nitschke, J. Schwandt

Abstract: The breakdown behaviour of SiPMs (Silicon PhotoMultiplier) with pixel sizes of 15$\times $15, 25$\times $25, 50$\times $50, and 100$\times $100 $μ$m$^2$, manufactured by KETEK, has been investigated. From the current-voltage characteristics measured with and without illumination by LED light of 470 nm wavelength, the current-breakdown voltage, $V_I$, and from linear fits of the voltage dependence… ▽ More The breakdown behaviour of SiPMs (Silicon PhotoMultiplier) with pixel sizes of 15$\times $15, 25$\times $25, 50$\times $50, and 100$\times $100 $μ$m$^2$, manufactured by KETEK, has been investigated. From the current-voltage characteristics measured with and without illumination by LED light of 470 nm wavelength, the current-breakdown voltage, $V_I$, and from linear fits of the voltage dependence of the SiPM gain, measured by recording pulse-area spectra, the gain-breakdown voltage, $V_G$, have been obtained. The voltage dependence of the Geiger-breakdown probability was determined from the fraction of zero photoelectron events with LED illumination. By comparing the results to a model calculation, the photodetection-breakdown voltage, $V_{PD}$, has been determined. Within experimental uncertainties, $V_I$ and $V_{PD}$ are equal and independent of pixel size. For $V_G$, a dependence on pixel size is observed. The difference $V_I - V_G$ is about 1 V for the SiPM with 15 $μ$m pixels, decreases with pixel size and is compatible with zero for the SiPM with 100 $μ$m pixels. △ Less

Submitted 4 May, 2016; originally announced May 2016.

Comments: 7 pages, 1 table, 7 figures

The influence of edge effects on the determination of the do** profile of silicon pad diodes

Authors: M. Hufschmidt, E. Fretwurst, E. Garutti, R. Klanner, I. Kopsalis, J. Schwandt

Abstract: Edge effects for square p+n pad diodes with guard rings, fabricated on high-ohmic silicon, are investigated. Using capacitance-voltage measurements of two pad diodes with different areas, the planar and the edge contributions to the diode capacitance are determined separately. It is shown that the do** concentration derived from the capacitance-voltage measurements with and without edge correcti… ▽ More Edge effects for square p+n pad diodes with guard rings, fabricated on high-ohmic silicon, are investigated. Using capacitance-voltage measurements of two pad diodes with different areas, the planar and the edge contributions to the diode capacitance are determined separately. It is shown that the do** concentration derived from the capacitance-voltage measurements with and without edge corrections differ significantly. After the edge correction, the bulk do** of the pad diodes is found to be uniform within +/- 1.5%. The voltage dependence of the edge capacitance is compared to the predictions of two simple models. △ Less

Submitted 3 May, 2016; originally announced May 2016.

Comments: 8 pages, 2 tables, 7 figures

Design and First Tests of a Radiation-Hard Pixel Sensor for the European X-Ray Free-Electron Laser

Authors: Joern Schwandt, Eckhart Fretwurst, Robert Klanner, Ioannis Kopsalis, Jiaguo Zhang

Abstract: The high intensity and high repetition rate of the European X-ray Free-Electron Laser, presently under construction in Hamburg, requires silicon sensors which can stand X-ray doses of up to 1 GGy for 3 years of operation at high bias voltage. Within the AGIPD Collaboration the X-ray-radiation damage in MOS Capacitors and Gate-Controlled Diodes fabricated by four vendors on high-ohmic n-type silico… ▽ More The high intensity and high repetition rate of the European X-ray Free-Electron Laser, presently under construction in Hamburg, requires silicon sensors which can stand X-ray doses of up to 1 GGy for 3 years of operation at high bias voltage. Within the AGIPD Collaboration the X-ray-radiation damage in MOS Capacitors and Gate-Controlled Diodes fabricated by four vendors on high-ohmic n-type silicon with two crystal orientations and dif- ferent technological parameters, has been studied for doses between 1 kGy and 1 GGy. The extracted values of oxide-charge and surface-current densi- ties have been used in TCAD simulations, and the layout and technological parameters of the AGIPD pixel sensor optimized. It is found that the op- timized layout for high X-ray doses is significantly different from the one for non-irradiated sensors. First sensors and test structures have been de-livered in early 2013. Measurement results for X-ray doses of 0 to 10 MGy and their comparison to simulations are presented. They demonstrate that the optimization has been successful and that the sensors fulfill the required specifications. △ Less

Submitted 13 February, 2014; originally announced February 2014.

Study of X-ray radiation damage in the AGIPD sensor for the European XFEL

Authors: Jiaguo Zhang, Eckhart Fretwurst, Heinz Graafsma, Robert Klanner, Ioannis Kopsalis, Joern Schwandt

Abstract: The European X-ray Free Electron Laser (XFEL), currently being constructed in Hamburg and planning to be operational in 2017 for users, will deliver 27,000 fully coherent, high brilliance X-ray pulses per second with duration less than 100 fs. The unique features of the X-ray beam pose major challenges for detectors used at the European XFEL for imaging experiments, in particular a radiation toler… ▽ More The European X-ray Free Electron Laser (XFEL), currently being constructed in Hamburg and planning to be operational in 2017 for users, will deliver 27,000 fully coherent, high brilliance X-ray pulses per second with duration less than 100 fs. The unique features of the X-ray beam pose major challenges for detectors used at the European XFEL for imaging experiments, in particular a radiation tolerance of silicon sensors for doses up to 1 GGy for 3 years of operation at an operating voltage above 500 V. One of the detectors under development at the European XFEL is the Adaptive Gain Integrating Pixel Detector (AGIPD), which is a hybrid detector system with ASICs bump-bonded to p+n silicon pixel sensors. We have designed the silicon sensors for the AGIPD, which have been fabricated by SINTEF and delivered in the beginning of February of 2013. To demonstrate the performance of the AGIPD sensor with regard to radiation hardness, mini-sensors with the same pixel and guard-ring designs as the AGIPD together with test structures have been irradiated at the beamline P11 of PETRA III with 8 keV and 12 keV monoenergetic X-rays to dose values up to 10 MGy. The radiation hardness of the AGIPD sensor has been proven and all electrical properties are within specification before and after irradiation. In addition, the oxide-charge density and surface-current density from test structures have been characterized as function of the X-ray dose and compared to previous measurements for test structures produced by four vendors. △ Less

Submitted 13 December, 2013; originally announced December 2013.

Comments: 11 pages, 7 figures

Time dependence of charge losses at the Si-SiO2 interface in p+n-silicon strip sensors

Authors: Thomas Poehlsen, Eckhart Fretwurst, Robert Klanner, Joern Schwandt, Jiaguo Zhang

Abstract: The collection of charge carriers generated in p+n strip sensors close to the Si-SiO2 interface before and after 1 MGy of X-ray irradiation has been investigated using the transient current technique with sub-nanosecond focused light pulses of 660 nm wavelength, which has an absorption length of 3.5 um in silicon at room temperature. The paper describes the measurement and analysis techniques used… ▽ More The collection of charge carriers generated in p+n strip sensors close to the Si-SiO2 interface before and after 1 MGy of X-ray irradiation has been investigated using the transient current technique with sub-nanosecond focused light pulses of 660 nm wavelength, which has an absorption length of 3.5 um in silicon at room temperature. The paper describes the measurement and analysis techniques used to determine the number of electrons and holes collected. Depending on biasing history, humidity and irradiation, incomplete collection of either electrons or holes is observed. The charge losses change with time. The time constants are different for electrons and holes and increase by two orders of magnitude when reducing the relative humidity from about 80 % to less than 1 %. An attempt to interpret these results is presented. △ Less

Submitted 2 May, 2013; originally announced May 2013.

Journal ref: T. Poehlsen, et al., Nuclear Instruments and Methods In Physics Research A (2013)

Challenges for the Adaptive Gain Integrating Pixel Detector (AGIPD) design due to the high intensity photon radiation environment at the European XFEL

Authors: J. Becker, L. Bianco, P. Göttlicher, H. Graafsma, H. Hirsemann, S. Jack, A. Klyuev, S. Lange A. Marras, U. Trunk, R. Klanner, J. Schwandt, J. Zhang, R. Dinapoli, D. Greiffenberg, B. Henrich, A. Mozzanica, B. Schmitt, X. Shi, M. Gronewald, H. Krüger

Abstract: The European X-ray Free Electron Laser (XFEL) is a new research facility currently under construction in Hamburg, Germany. With a pulse length of less than 100 fs and an extremely high luminosity of 27000 flashes per second the European XFEL will have a unique time structure that demands the development of new detectors tailored to the requirements imposed by the experiments while complying with t… ▽ More The European X-ray Free Electron Laser (XFEL) is a new research facility currently under construction in Hamburg, Germany. With a pulse length of less than 100 fs and an extremely high luminosity of 27000 flashes per second the European XFEL will have a unique time structure that demands the development of new detectors tailored to the requirements imposed by the experiments while complying with the machine specific operation parameters. The Adaptive Gain Integrating Pixel Detector (AGIPD) is one response to the need for large 2D detectors, able to cope with the 4.5 MHz frame rate, as well as with the high dynamic range needed by XFEL experiments ranging from single photons to more than 10$^4$ 12 keV photons per pixel per pulse. In addition it has to withstand doses of up to 1 GGy over three years. △ Less

Submitted 11 March, 2013; originally announced March 2013.

Comments: revised version after review

Study of the accumulation layer and charge losses at the Si-SiO2 interface in p+n-silicon strip sensors

Authors: Thomas Poehlsen, Julian Becker, Eckhart Fretwurst, Robert Klanner, Jörn Schwandt, Jiaguo Zhang

Abstract: Using the multi-channel Transient Current Technique the currents induced by electron-hole pairs, produced by a focussed sub-nanosecond laser of 660 nm wavelength close to the Si-SiO2 interface of p+n silicon strip sensors have been measured, and the charge-collection efficiency determined. The laser has been operated in burst mode, with bursts typically spaced by 1 ms, each consisting of 30 puls… ▽ More Using the multi-channel Transient Current Technique the currents induced by electron-hole pairs, produced by a focussed sub-nanosecond laser of 660 nm wavelength close to the Si-SiO2 interface of p+n silicon strip sensors have been measured, and the charge-collection efficiency determined. The laser has been operated in burst mode, with bursts typically spaced by 1 ms, each consisting of 30 pulses separated by 50 ns. In a previous paper it has been reported that, depending on X-ray-radiation damage, biasing history and humidity, situations without charge losses, with hole losses, and with electron losses have been observed. In this paper we show for sensors before and after irradiation by X-rays to 1 MGy (SiO2), how the charge losses change with the number of electron-hole pairs generated by each laser pulse, and the time interval between the laser pulses. This allows us to estimate how many additional charges in the accumulation layers at the Si-SiO2 interface have to be trapped to significantly change the local electric field, as well as the time it takes that the accumulation layer and the electric field return to the steady-state situation. In addition, results are presented on the change of the pulse shape caused by the plasma effect for high charge densities deposited close to the Si-SiO2 interface. △ Less

Submitted 25 February, 2013; originally announced February 2013.

Challenges for Silicon Pixel Sensors at the European XFEL

Authors: Robert Klanner, Julian Becker, Eckhart Fretwurst, Ioana Pintilie, Thomas Poehlsen, Jörn Schwandt, Jiaguo Zhang

Abstract: A systematic experimental study of the main challenges for silicon-pixel sensors at the European XFEL is presented. The high instantaneous density of X-rays and the high repetition rate of the XFEL pulses result in signal distortions due to the plasma effect and in severe radiation damage. The main parameters of X-ray-radiation damage have been determined and their impact on p+n sensors investigat… ▽ More A systematic experimental study of the main challenges for silicon-pixel sensors at the European XFEL is presented. The high instantaneous density of X-rays and the high repetition rate of the XFEL pulses result in signal distortions due to the plasma effect and in severe radiation damage. The main parameters of X-ray-radiation damage have been determined and their impact on p+n sensors investigated. These studies form the basis of the optimized design of a pixel-sensor for experimentation at the European XFEL. △ Less

Submitted 20 December, 2012; originally announced December 2012.

Design of the AGIPD Sensor for the European XFEL

Authors: J. Schwandt, E. Fretwurst, R. Klanner, J. Zhang

Abstract: For experiments at the European X-Ray Free-Electron Laser (XFEL) the Adaptive Gain Integrating Pixel Detector (AGIPD) is under development. The particular requirements for the detector are a high dynamic range of 0, 1 - to more than 10E4 12.4 keV photons per pixel within an XFEL pulse duration of < 100 fs, and a radiation tolerance of doses up to 1 GGy for 3 years of operation. The detector will h… ▽ More For experiments at the European X-Ray Free-Electron Laser (XFEL) the Adaptive Gain Integrating Pixel Detector (AGIPD) is under development. The particular requirements for the detector are a high dynamic range of 0, 1 - to more than 10E4 12.4 keV photons per pixel within an XFEL pulse duration of < 100 fs, and a radiation tolerance of doses up to 1 GGy for 3 years of operation. The detector will have 1024 x 1024 p+ pixels with a pixel size of 200 um x 200 um and will be manufactured on 500 um thick n-type silicon. The design value for the operating voltage is 500 V, however, for special applications an operation up to ~ 1000 V should be possible. Experimental data on the dose dependence of the surface density of oxide charges at the Si-SiO2 interface and the surface-current density have been implemented in the SYNOPSYS TCAD simulation program in order to optimize the design of the pixel and guard-ring layout. The methodology of the sensor design, the optimization of the most relevant parameters and the layout are demonstrated. Finally the simulated performance, in particular the breakdown voltage, dark current and inter-pixel capacitance as function of the X-ray dose will be presented. △ Less

Submitted 27 November, 2012; v1 submitted 1 October, 2012; originally announced October 2012.

Investigation of X-ray induced radiation damage at the Si-SiO2 interface of silicon sensors for the European XFEL

Authors: Jiaguo Zhang, Eckhart Fretwurst, Robert Klanner, Ioana Pintilie, Joern Schwandt, Monica Turcato

Abstract: Experiments at the European X-ray Free Electron Laser (XFEL) require silicon pixel sensors which can withstand X-ray doses up to 1 GGy. For the investigation of X-ray radiation damage up to these high doses, MOS capacitors and gate-controlled diodes built on high resistivity n-doped silicon with crystal orientations <100> and <111> produced by two vendors, CiS and Hamamatsu, have been irradiated w… ▽ More Experiments at the European X-ray Free Electron Laser (XFEL) require silicon pixel sensors which can withstand X-ray doses up to 1 GGy. For the investigation of X-ray radiation damage up to these high doses, MOS capacitors and gate-controlled diodes built on high resistivity n-doped silicon with crystal orientations <100> and <111> produced by two vendors, CiS and Hamamatsu, have been irradiated with 12 keV X-rays at the DESY DORIS III synchrotron light source. Using capacitance/conductance-voltage, current-voltage and thermal dielectric relaxation current measurements, the surface densities of oxide charges and interface traps at the Si-SiO2 interface, and the surface-current densities have been determined as function of dose. Results indicate that the dose dependence of the surface density of oxide charges and the surface-current density depend on the crystal orientation and producer. In addition, the influence of the voltage applied to the gates of the MOS capacitor and the gate-controlled diode during X-ray irradiation on the surface density of oxide charges and the surface-current density has been investigated at doses of 100 kGy and 100 MGy. It is found that both strongly depend on the gate voltage if the electric field in the oxide points from the surface of the SiO2 to the Si-SiO2 interface. Finally, annealing studies have been performed at 60 and 80 degree C on MOS capacitors and gate-controlled diodes irradiated to 5 MGy and the annealing kinetics of oxide charges and surface current determined. △ Less

Submitted 9 November, 2012; v1 submitted 1 October, 2012; originally announced October 2012.

Comments: 10 pages, 6 figures, 3 tables

Charge losses in segmented silicon sensors at the Si-SiO2 interface

Authors: Thomas Poehlsen, Eckhart Fretwurst, Robert Klanner, Sergej Schuwalow, Jörn Schwandt, Jiaguo Zhang

Abstract: Using multi-channel time-resolved current measurements (multi TCT), the charge collection of p+n silicon strip sensors for electron-hole pairs produced close to the Si-SiO2 interface by a focussed sub-nanosecond laser with a wavelength of 660 nm has been studied. Sensors before and after irradiation with 1 MGy of X-rays have been investigated. The charge signals induced in the readout strips and t… ▽ More Using multi-channel time-resolved current measurements (multi TCT), the charge collection of p+n silicon strip sensors for electron-hole pairs produced close to the Si-SiO2 interface by a focussed sub-nanosecond laser with a wavelength of 660 nm has been studied. Sensors before and after irradiation with 1 MGy of X-rays have been investigated. The charge signals induced in the readout strips and the rear electrode as a function of the position of the light spot are described by a model which allows a quantitative determination of the charge losses and of the widths of the electron-accumulation and hole-inversion layers close to the Si-SiO2 interface. Depending on the applied bias voltage, biasing history and environmental conditions, like humidity, incomplete electron or hole collection and different widths of the accumulation layers are observed. In addition, the results depend on the time after biasing the sensor, with time constants which can be as long as days. The observations are qualitatively explained with the help of detailed sensor simulations. Finally, their relevance for the detection of X-ray photons and charged particles, and for the stable operation of segmented p+n silicon sensors is discussed. △ Less

Submitted 28 December, 2012; v1 submitted 27 July, 2012; originally announced July 2012.

Journal ref: Nuclear Instruments and Methods in Physics Research A 700 (2013) 22-39

Optimization of the Radiation Hardness of Silicon Pixel Sensors for High X-ray Doses using TCAD Simulations

Authors: J. Schwandt, E. Fretwurst, R. Klanner, I. Pintilie, J. Zhang

Abstract: The European X-ray Free Electron Laser (XFEL) will deliver 27000 fully coherent, high brilliance X-ray pulses per second each with a duration below 100 fs. This will allow the recording of diffraction patterns of single molecules and the study of ultra-fast processes. One of the detector systems under development for the XFEL is the Adaptive Gain Integrating Pixel Detector (AGIPD), which consists… ▽ More The European X-ray Free Electron Laser (XFEL) will deliver 27000 fully coherent, high brilliance X-ray pulses per second each with a duration below 100 fs. This will allow the recording of diffraction patterns of single molecules and the study of ultra-fast processes. One of the detector systems under development for the XFEL is the Adaptive Gain Integrating Pixel Detector (AGIPD), which consists of a pixel array with readout ASICs bump-bonded to a silicon sensor with pixels of 200 μm \times 200 μm. The particular requirements for the detector are a high dynamic range (0, 1 up to 10E5 12 keV photons/XFEL-pulse), a fast read-out and radiation tolerance up to doses of 1 GGy of 12 keV X-rays for 3 years of operation. At this X-ray energy no bulk damage in silicon is expected. However fixed oxide charges in the SiO2 layer and interface traps at the Si-SiO2 interface will build up. As function of the 12 keV X-ray dose the microscopic defects in test structures and the macro- scopic electrical properties of segmented sensors have been investigated. From the test structures the oxide charge density, the density of interface traps and their properties as function of dose have been determined. It is found that both saturate (and even decrease) for doses above a few MGy. For segmented sensors surface damage introduced by the X-rays increases the full depletion voltage, the surface leakage current and the inter-pixel capacitance. In addition an electron accumulation layer forms at the Si-SiO2 interface which increases with dose and decreases with applied voltage. Using TCAD simulations with the dose dependent damage parameters obtained from the test struc- tures the results of the measurements can be reproduced. This allows the optimization of the sensor design for the XFEL requirements. △ Less

Submitted 21 November, 2011; originally announced November 2011.

Study of X-ray Radiation Damage in Silicon Sensors

Authors: Jiaguo Zhang, Eckhart Fretwurst, Robert Klanner, Hanno Perrey, Ioana Pintilie, Thomas Poehlsen, Joern Schwandt

Abstract: The European X-ray Free Electron Laser (XFEL) will deliver 30,000 fully coherent, high brilliance X-ray pulses per second each with a duration below 100 fs. This will allow the recording of diffraction patterns of single complex molecules and the study of ultra-fast processes. Silicon pixel sensors will be used to record the diffraction images. In 3 years of operation the sensors will be exposed t… ▽ More The European X-ray Free Electron Laser (XFEL) will deliver 30,000 fully coherent, high brilliance X-ray pulses per second each with a duration below 100 fs. This will allow the recording of diffraction patterns of single complex molecules and the study of ultra-fast processes. Silicon pixel sensors will be used to record the diffraction images. In 3 years of operation the sensors will be exposed to doses of up to 1 GGy of 12 keV X-rays. At this X-ray energy no bulk damage in silicon is expected. However fixed oxide charges in the insulating layer covering the silicon and interface traps at the Si-SiO2 interface will be introduced by the irradiation and build up over time. We have investigated the microscopic defects in test structures and the macroscopic electrical properties of segmented detectors as a function of the X-ray dose. From the test structures we determine the oxide charge density and the densities of interface traps as a function of dose. We find that both saturate (and even decrease) for doses between 10 and 100 MGy. For segmented sensors the defects introduced by the X-rays increase the full depletion voltage, the surface leakage current and the inter-pixel capacitance. We observe that an electron accumulation layer forms at the Si-SiO2 interface. Its width increases with dose and decreases with applied bias voltage. Using TCAD simulations with the dose dependent parameters obtained from the test structures, we are able to reproduce the observed results. This allows us to optimize the sensor design for the XFEL requirements. △ Less

Submitted 4 November, 2011; originally announced November 2011.

Study of radiation damage induced by 12 keV X-rays in MOS structures built on high resistivity n-type silicon

Authors: Jiaguo Zhang, Ioana Pintilie, Eckhart Fretwurst, Robert Klanner, Hanno Perrey, Joern Schwandt

Abstract: Imaging experiments at the European X-ray Free Electron Laser (XFEL) require silicon pixel sensors with extraordinary performance specifications: Doses of up to 1 GGy of 12 keV photons, up to 10^5 12 keV photons per pixel of 200 \mum \times 200 \mum arriving within less than 100 fs, and a time interval between XFEL pulses of 220 ns. To address these challenges, in particular the question of radiat… ▽ More Imaging experiments at the European X-ray Free Electron Laser (XFEL) require silicon pixel sensors with extraordinary performance specifications: Doses of up to 1 GGy of 12 keV photons, up to 10^5 12 keV photons per pixel of 200 \mum \times 200 \mum arriving within less than 100 fs, and a time interval between XFEL pulses of 220 ns. To address these challenges, in particular the question of radiation damage, the properties of the SiO_2 layer and of the Si-SiO_2 interface using MOS capacitors manufactured on high resistivity n-type silicon irradiated to X-ray doses between 10 kGy and 1 GGy, have been studied. Measurements of Capacitance/Conductance-Voltage (C/G-V) at different frequencies, as well as Thermal Dielectric Relaxation Current (TDRC) have been performed. The data can be described by a radiation dependent oxide charge density and three dominant radiation-induced interface states with Gaussian-like energy distributions in the silicon band gap. It is found that the densities of the fixed oxide charges and of the three interface states increase up to dose values of approximately 10 MGy and then saturate or even decrease. The shapes and the frequency dependences of the C/G-V measurements can be quantitatively described by a simple model using the parameters extracted from the TDRC measurements. △ Less

Submitted 10 January, 2012; v1 submitted 29 July, 2011; originally announced July 2011.

Comments: 14 pages and 7 figures