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High-resolution spatio-temporal strain imaging reveals loss mechanisms in a surface acoustic wave device
Authors:
Tao Zhou,
Alexandre Reinhardt,
Marie Bousquet,
Joel Eymery,
Steven Leake,
Martin V. Holt,
Paul G. Evans,
Tobias Schülli
Abstract:
Surface acoustic wave devices are key components for processing radio frequency signals in wireless communication because these devices offer simultaneously high performance, compact size and low cost. The optimization of the device structure requires a quantitative understanding of energy conversion and loss mechanisms. Stroboscopic full-field diffraction x-ray microscopy studies of a prototypica…
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Surface acoustic wave devices are key components for processing radio frequency signals in wireless communication because these devices offer simultaneously high performance, compact size and low cost. The optimization of the device structure requires a quantitative understanding of energy conversion and loss mechanisms. Stroboscopic full-field diffraction x-ray microscopy studies of a prototypical one-port resonator device revealed the existence of unanticipated acoustic loss. A non-uniform acoustic excitation in the active area was responsible for the substantial end and side leakages observed at the design frequency. Quantitative analysis of the strain amplitude using a wave decomposition method allowed the determination of several key device parameters. This high-resolution spatiotemporal strain imaging technique is, more generally, suited for studying nanophononics, specifically when the feature size is smaller than optical wavelengths. The strain sensitivity allows precise measurement of acoustic waves with picometer-scale amplitude.
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Submitted 20 April, 2024;
originally announced May 2024.
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Patching-based Deep Learning model for the Inpainting of Bragg Coherent Diffraction patterns affected by detectors' gaps
Authors:
Matteo Masto,
Vincent Favre-Nicolin,
Steven Leake,
Tobias Schülli,
Marie-Ingrid Richard,
Ewen Bellec
Abstract:
We propose a deep learning algorithm for the inpainting of Bragg Coherent Diffraction Imaging (BCDI) patterns affected by detector gaps. These regions of missing intensity can compromise the accuracy of reconstruction algorithms, inducing artifacts in the final result. It is thus desirable to restore the intensity in these regions in order to ensure more reliable reconstructions. The key aspect of…
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We propose a deep learning algorithm for the inpainting of Bragg Coherent Diffraction Imaging (BCDI) patterns affected by detector gaps. These regions of missing intensity can compromise the accuracy of reconstruction algorithms, inducing artifacts in the final result. It is thus desirable to restore the intensity in these regions in order to ensure more reliable reconstructions. The key aspect of our method lies in the choice of training the neural network with cropped sections of both experimental diffraction data and simulated data and subsequently patching the predictions generated by the model along the gap, thus completing the full diffraction peak. This provides us with more experimental training data and allows for a faster model training due to the limited size, while the neural network can be applied to arbitrarily larger BCDI datasets. Moreover, our method not only broadens the scope of application but also ensures the preservation of data integrity and reliability in the face of challenging experimental conditions.
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Submitted 13 March, 2024;
originally announced March 2024.
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Scanning X-ray diffraction microscopy of a 6 GHz surface acoustic wave
Authors:
M. Hanke,
N. Ashurbekov,
E. Zatterin,
M. E. Msall,
J. Hellemann,
P. V. Santos,
T. U. Schulli,
S. Ludwig
Abstract:
Surface acoustic waves at frequencies beyond a few GHz are promising components for quantum technology applications. Applying scanning X-ray diffraction microcopy we directly map the locally resolved components of the three-dimensional strain field generated by a standing surface acoustic wave on GaAs with wavelength $λ\simeq500\,$nm corresponding to frequencies near 6 GHz. We find that the lattic…
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Surface acoustic waves at frequencies beyond a few GHz are promising components for quantum technology applications. Applying scanning X-ray diffraction microcopy we directly map the locally resolved components of the three-dimensional strain field generated by a standing surface acoustic wave on GaAs with wavelength $λ\simeq500\,$nm corresponding to frequencies near 6 GHz. We find that the lattice distortions perpendicular to the surface are phase-shifted compared to those in propagation direction. Model calculations based on Rayleigh waves confirm our measurements. Our results represent a break through in providing a full characterization of a radio frequency surface acoustic wave beyond plain imaging.
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Submitted 28 September, 2022;
originally announced September 2022.
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Variable-wavelength quick scanning nano-focused X-ray microscopy for in situ strain and tilt map**
Authors:
Marie-ingrid Richard,
Thomas W Cornelius,
Florian Lauraux,
Jean-Baptiste Molin,
Christoph Kirchlechner,
Steven J Leake,
Jérôme Carnis,
Tobias U Schülli,
Ludovic Thilly,
Olivier Thomas
Abstract:
Compression of micro-pillars is followed in situ by a quick nano-focused X-ray scanning microscopy technique combined with three-dimensional reciprocal space map**. Compared to other attempts using 2 X-ray nanobeams, it avoids any motion or vibration that would lead to a destruction of the sample. The technique consists of scanning both the energy of the incident nano-focused X-ray beam and the…
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Compression of micro-pillars is followed in situ by a quick nano-focused X-ray scanning microscopy technique combined with three-dimensional reciprocal space map**. Compared to other attempts using 2 X-ray nanobeams, it avoids any motion or vibration that would lead to a destruction of the sample. The technique consists of scanning both the energy of the incident nano-focused X-ray beam and the in-plane translations of the focusing optics along the X-ray beam. Here, we demonstrate the approach by imaging the strain and lattice orientation of Si micro-pillars and their pedestals during in situ compression. Varying the energy of the incident beam instead of rocking the sample and map** the focusing optics instead of moving the sample supplies a vibration-free measurement of the reciprocal space maps without removal of the mechanical load. The maps of strain and lattice orientation are in good agreement with the ones recorded by ordinary rocking-curve scans. Variable-wavelength quick scanning X-ray microscopy opens the route for in situ strain and tilt map** towards more diverse and complex materials environments, especially where sample manipulation is difficult.
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Submitted 27 June, 2022;
originally announced June 2022.
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Nanoscale map** of the full strain tensor, rotation and composition in partially relaxed In$_x$Ga$_{1-x}$N layers by scanning X-ray diffraction microscopy
Authors:
Carsten Richter,
Vladimir M. Kaganer,
Armelle Even,
Amélie Dussaigne,
Pierre Ferret,
Frédéric Barbier,
Yves-Matthieu Le Vaillant,
Tobias U. Schülli
Abstract:
Strain and composition play a fundamental role in semiconductor physics, since they are means to tune the electronic and optical properties of a material and hence develop new devices. Today it is still a challenge to measure strain in epitaxial systems in a non-destructive manner which becomes especially important in strain-engineered devices that often are subjected to intense stress. In this wo…
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Strain and composition play a fundamental role in semiconductor physics, since they are means to tune the electronic and optical properties of a material and hence develop new devices. Today it is still a challenge to measure strain in epitaxial systems in a non-destructive manner which becomes especially important in strain-engineered devices that often are subjected to intense stress. In this work, we demonstrate a microscopic map** of the full tensors of strain and lattice orientation by means of scanning X-ray diffraction microscopy. We develope a formalism to extract all components of strain and orientation from a set of scanning diffraction measurements and apply the technique to a patterned In$_x$Ga$_{1-x}$N double layer to study strain relaxation and indium incorporation phenomena. The contributions due to varying indium content and threading dislocations are separated and analyzed.
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Submitted 28 March, 2022;
originally announced March 2022.
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Imaging the Breathing of a Platinum Nanoparticle in Electrochemical Environment
Authors:
Clément Atlan,
Corentin Chatelier,
Maxime Dupraz,
Isaac Martens,
Arnaud Viola,
Ni Li,
Lu Gao,
Steven J. Leake,
Tobias U. Schülli,
Joël Eymery,
Frédéric Maillard,
Marie-Ingrid Richard
Abstract:
Surface strain is widely used in gas phase catalysis and electrocatalysis to control the binding energies of adsorbates on metal surfaces. However, $in$ $situ$ or $operando$ strain measurements are experimentally challenging, especially on nanomaterials. Here, we take advantage of the 4$^{th}$ generation Extremely Brilliant Source at the European Synchrotron Radiation Facility (ESRF-EBS, Grenoble,…
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Surface strain is widely used in gas phase catalysis and electrocatalysis to control the binding energies of adsorbates on metal surfaces. However, $in$ $situ$ or $operando$ strain measurements are experimentally challenging, especially on nanomaterials. Here, we take advantage of the 4$^{th}$ generation Extremely Brilliant Source at the European Synchrotron Radiation Facility (ESRF-EBS, Grenoble, France) to quantify the distribution of strain inside a Pt nanoparticle, and to determine its morphology in an electrochemical environment. Our results show for the first time evidence of heterogeneous and potential-dependent strain distribution between highly-coordinated ({100} and {111} facets) and under-coordinated atoms (edges and corners) as well as evidence of strain propagation from the surface to the bulk of the nanoparticle. These results provide dynamic structural insights to better simulate and design efficient nanocatalysts for energy storage and conversion applications.
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Submitted 2 February, 2023; v1 submitted 14 March, 2022;
originally announced March 2022.
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A convolutional neural network for defect classification in Bragg coherent X-ray diffraction
Authors:
Bruce Lim,
Ewen Bellec,
Maxime Dupraz,
Steven Leake,
Andrea Resta,
Alessandro Coati,
Michael Sprung,
Ehud Almog,
Eugen Rabkin,
Tobias Schülli,
Marie-Ingrid Richard
Abstract:
Coherent diffraction imaging enables the imaging of individual defects, such as dislocations or stacking faults, in materials.These defects and their surrounding elastic strain fields have a critical influence on the macroscopic properties and functionality of materials. However, their identification in Bragg coherent diffraction imaging remains a challenge and requires significant data mining. Th…
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Coherent diffraction imaging enables the imaging of individual defects, such as dislocations or stacking faults, in materials.These defects and their surrounding elastic strain fields have a critical influence on the macroscopic properties and functionality of materials. However, their identification in Bragg coherent diffraction imaging remains a challenge and requires significant data mining. The ability to identify defects from the diffraction pattern alone would be a significant advantage when targeting specific defect types and accelerates experiment design and execution. Here, we exploit a computational tool based on a three-dimensional (3D) parametric atomistic model and a convolutional neural network to predict dislocations in a crystal from its 3D coherent diffraction pattern. Simulated diffraction patterns from several thousands of relaxed atomistic configurations of nanocrystals are used to train the neural network and to predict the presence or absence of dislocations as well as their type(screw or edge). Our study paves the way for defect recognition in 3D coherent diffraction patterns for material science
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Submitted 30 June, 2021;
originally announced June 2021.
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Spatially-resolved luminescence and crystal structure of single core-shell nanowires measured in the as-grown geometry
Authors:
Ali AlHassan,
Jonas Lähnemann,
Steven Leake,
Hanno Küpers,
Michael Niehle,
Danial Bahrami,
Florian Bertram,
Ryan B. Lewis,
Arman Davtyan,
Tobias Schülli,
Lutz Geelhaar,
Ullrich Pietsch
Abstract:
We report on the direct correlation between the structural and optical properties of single, as-grown core-multi-shell GaAs/In$_{0.15}$Ga$_{0.85}$As/GaAs/AlAs/GaAs nanowires. Fabricated by molecular beam epitaxy on a pre-patterned Si(111) substrate, on a row of well separated nucleation sites, it was possible to access individual nanowires in the as-grown geometry. The polytype distribution along…
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We report on the direct correlation between the structural and optical properties of single, as-grown core-multi-shell GaAs/In$_{0.15}$Ga$_{0.85}$As/GaAs/AlAs/GaAs nanowires. Fabricated by molecular beam epitaxy on a pre-patterned Si(111) substrate, on a row of well separated nucleation sites, it was possible to access individual nanowires in the as-grown geometry. The polytype distribution along the growth axis of the nanowires was revealed by synchrotron-based nanoprobe X-ray diffraction techniques monitoring the axial 111 Bragg reflection. For the same nanowires, the spatially-resolved emission properties were obtained by cathodoluminescence hyperspectral linescans in a scanning electron microscope. Correlating both measurements, we reveal a blueshift of the shell quantum well emission energy combined with an increased emission intensity for segments exhibiting a mixed structure of alternating wurtzite and zincblende stacking compared with the pure crystal polytypes. The presence of this mixed structure was independently confirmed by cross-sectional transmission electron microscopy.
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Submitted 19 February, 2020;
originally announced February 2020.
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Surface phase transitions in BiFeO3 below room temperature
Authors:
R. Jarrier,
X. Marti,
J. Herrero-Albillos,
P. Ferrer,
R. Haumont,
P. Gemeiner,
G. Geneste,
P. Berthet,
T. Schülli,
P. Cvec,
R. Blinc,
Stanislaus S. Wong,
Tae-** Park,
M. Alexe,
M. A. Carpenter,
J. F. Scott,
G. Catalan,
B. Dkhil
Abstract:
We combine a wide variety of experimental techniques to analyze two heretofore mysterious phase transitions in multiferroic bismuth ferrite at low temperature. Raman spectroscopy, resonant ultrasound spectroscopy, EPR, X-ray lattice constant measurements, conductivity and dielectric response, specific heat and pyroelectric data have been collected for two different types of samples: single crystal…
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We combine a wide variety of experimental techniques to analyze two heretofore mysterious phase transitions in multiferroic bismuth ferrite at low temperature. Raman spectroscopy, resonant ultrasound spectroscopy, EPR, X-ray lattice constant measurements, conductivity and dielectric response, specific heat and pyroelectric data have been collected for two different types of samples: single crystals and, in order to maximize surface/volume ratio to enhance surface phase transition effects, BiFeO3 nanotubes were also studied. The transition at T=140.3K is shown to be a surface phase transition, with an associated sharp change in lattice parameter and charge density at the surface. Meanwhile, the 201K anomaly appears to signal the onset of glassy behaviour.
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Submitted 15 February, 2012;
originally announced February 2012.
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Surface morphology and magnetic anisotropy in (Ga,Mn)As
Authors:
S. Piano,
X. Marti,
A. W. Rushforth,
K. W. Edmonds,
R. P. Campion,
O. Caha,
T. U. Schulli,
V. Holy,
B. L. Gallagher
Abstract:
Atomic Force Microscopy and Grazing incidence X-ray diffraction measurements have revealed the presence of ripples aligned along the $[1\bar{1}0]$ direction on the surface of (Ga,Mn)As layers grown on GaAs(001) substrates and buffer layers, with periodicity of about 50 nm in all samples that have been studied. These samples show the strong symmetry breaking uniaxial magnetic anisotropy normally ob…
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Atomic Force Microscopy and Grazing incidence X-ray diffraction measurements have revealed the presence of ripples aligned along the $[1\bar{1}0]$ direction on the surface of (Ga,Mn)As layers grown on GaAs(001) substrates and buffer layers, with periodicity of about 50 nm in all samples that have been studied. These samples show the strong symmetry breaking uniaxial magnetic anisotropy normally observed in such materials. We observe a clear correlation between the amplitude of the surface ripples and the strength of the uniaxial magnetic anisotropy component suggesting that these ripples might be the source of such anisotropy.
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Submitted 15 November, 2011; v1 submitted 1 October, 2010;
originally announced October 2010.
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Atomic ordering in self-assembled Ge:Si(001) islands observed by X-ray scattering
Authors:
A. Malachias,
T. U. Schulli,
G. Medeiros-Ribeiro,
M. Stoffel,
O. G. Schmidt,
T. H. Metzger,
R. Magalhaes-Paniago
Abstract:
X-ray diffuse scattering in the vicinity of a basis-forbidden (200) Bragg reflection was measured for a sample with uncapped self-assembled Ge islands epitaxially grown on Si(001). Our results provide evidence of atomically ordered SiGe domains in both islands and wetting layer. The modeling of x-ray profiles reveals the presence of antiphase boundaries separating the ordered domains in a limite…
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X-ray diffuse scattering in the vicinity of a basis-forbidden (200) Bragg reflection was measured for a sample with uncapped self-assembled Ge islands epitaxially grown on Si(001). Our results provide evidence of atomically ordered SiGe domains in both islands and wetting layer. The modeling of x-ray profiles reveals the presence of antiphase boundaries separating the ordered domains in a limited region of the islands where the stoichiometry is close to Si0.5Ge0.5.
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Submitted 25 November, 2004;
originally announced November 2004.
