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Showing 1–8 of 8 results for author: Scales, J A

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  1. arXiv:1608.04747  [pdf, ps, other

    cond-mat.mtrl-sci

    Sub-THz thermally activated-electrical conductivity of CdS thin films

    Authors: Rezwanur Rahman, John A. Scales

    Abstract: The electrical conductivity of a CdS thin film, controlled by grain structures is essential to enhance its photoconductivity to be able to be fit as a window material in CdS/CdTe heterojunction solar cell. In order to characterize a thin film, electromagnetically, we employed an open cavity resonator with a sub-millimeter VNA (Vector Network Analyzer). Our technique is capable of measuring complex… ▽ More

    Submitted 16 August, 2016; originally announced August 2016.

    Comments: (In press), (2016) Applied Physics Letters

  2. arXiv:1507.07582  [pdf, ps, other

    cond-mat.soft

    Complex dielectric properties of organic-rich mudrocks as functions of maturity

    Authors: Rezwanur Rahman, John A. Scales, Manika Prasad

    Abstract: Complex dielectric variations can address neatly the maturity of organic-rich mudrocks. We, therefore, apply an open hemispherical cavity resonator to measure complex dielectric permitivitties of five thin sections of oil (bakken) shales (with different maturity) of $\sim$ 30 $μ$m thickness on glass-substrates around 2.15 mm thick in 100 - 165 GHz. The real part of complex dielectric permittivity… ▽ More

    Submitted 27 July, 2015; originally announced July 2015.

  3. arXiv:1502.04101  [pdf, other

    cond-mat.soft cond-mat.mtrl-sci

    Sub-THz complex dielectric constants of montmorillionite clay thin samples with Na$^{+}$/Ca$^{++}$-ions

    Authors: Rezwanur Rahman, Douglas K. McCarty, Manika Prasad, John A. Scales

    Abstract: We implement a technique to characterize electromagnetic properties at frequencies 100 to 165 GHz (3 cm$^{-1}$ to 4.95 cm$^{-1}$) of oriented montmorillionite samples using an open cavity resonator connected to a sub-millimeter wave VNA (Vector Network Analyzer). We measured dielectric constants perpendicular to the bedding plane on oriented Na$^{+}$ and Ca$^{++}$-ion stabilized montmorillionite s… ▽ More

    Submitted 13 February, 2015; originally announced February 2015.

  4. arXiv:1405.2948  [pdf, other

    math.NA

    Characterizing the Topography of Multi-dimensional Energy Landscapes

    Authors: H. Lydia Deng, John A. Scales

    Abstract: A basic issue in optimization, inverse theory,neural networks, computational chemistry and many other problems is the geometrical characterization of high dimensional functions. In inverse calculations one aims to characterize the set of models that fit the data (among other constraints). If the data misfit function is unimodal then one can find its peak by local optimization methods and character… ▽ More

    Submitted 2 February, 2014; originally announced May 2014.

    Comments: 14 figures and an appendix containing proof of main result

  5. arXiv:0706.3066  [pdf, ps, other

    cond-mat.soft cond-mat.mtrl-sci

    Dielectric microscopy with submillimeter resolution

    Authors: Nathan S. Greeney, John A. Scales

    Abstract: In analogy with optical near-field scanning methods, we use tapered dielectric waveguides as probes for a millimeter wave vector network analyzer. By scanning thin samples between two such probes we are able to map the spatially varying dielectric properties of materials with sub-wavelength resolution; using a 150 GHz probe in transmision mode we see spatial resolution of around 500 microns. We… ▽ More

    Submitted 20 June, 2007; originally announced June 2007.

    Journal ref: Applied Physics Letters, 91, 222909 (2007)

  6. arXiv:cond-mat/0701525  [pdf, ps, other

    cond-mat.mes-hall cond-mat.dis-nn

    Millimeter Wave Localization: Slow Light and Enhanced Absorption

    Authors: John A. Scales, L. D. Carr, D. B. McIntosh, Valentin Freilikher, Yu. P. Bliokh

    Abstract: We exploit millimeter wave technology to measure the reflection and transmission response of random dielectric media. Our samples are easily constructed from random stacks of identical, sub-wavelength quartz and Teflon wafers. The measurement allows us to observe the characteristic transmission resonances associated with localization. We show that these resonances give rise to enhanced attenuati… ▽ More

    Submitted 12 June, 2007; v1 submitted 22 January, 2007; originally announced January 2007.

    Comments: revised and expanded

    Journal ref: Physical Review B 76, 085118 (2007)

  7. arXiv:cond-mat/0606133  [pdf, ps, other

    cond-mat.mtrl-sci cond-mat.soft

    Millimeter wave analysis of the dielectric properties of oil shales

    Authors: John A. Scales, Michael Batzle

    Abstract: Natural sedimentation processes give rise to fine layers in shales. If these layers alternate between organic-rich and organic-poor sediments, then the contrast in dielectric properties gives rise to an effective birefringence as the presence of hydrocarbons suppresses the dielectric constant of the host rock. We have measured these effects with a quasioptical millimeter wave setup that is rapid… ▽ More

    Submitted 6 June, 2006; originally announced June 2006.

    Comments: to appear in Applied Physics Letters

    Journal ref: Applied Physics Letters 89, 024102 (2006)

  8. arXiv:cond-mat/0512163  [pdf, ps, other

    cond-mat.mtrl-sci cond-mat.dis-nn

    Millimeter wave spectroscopy of rocks and fluids

    Authors: John A. Scales, Michael Batzle

    Abstract: One region of the electromagnetic spectrum that is relatively unexploited for materials characterization is the millimeter wave band (frequencies roughly between 40 and 300 GHz). Millimeter wave techniques involve free-space (non-contacting) measurements which have a length scale that makes them ideal for characterizing bulk properties of multicomponent composites where the scale of homogeneity… ▽ More

    Submitted 7 December, 2005; originally announced December 2005.

    Journal ref: Applied Physics Letters 88, 062906 (2006)