A Data-Driven Condition Monitoring Method for Capacitor in Modular Multilevel Converter (MMC)
Authors:
Shuyu Ou,
Mahyar Hassanifar,
Martin Votava,
Marius Langwasser,
Marco Liserre,
Ariya Sangwongwanich,
Subham Sahoo,
Frede Blaabjerg
Abstract:
The modular multilevel converter (MMC) is a topology that consists of a high number of capacitors, and degradation of capacitors can lead to converter malfunction, limiting the overall system lifetime. Condition monitoring methods can be applied to assess the health status of capacitors and realize predictive maintenance to improve reliability. Current research works for condition monitoring of ca…
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The modular multilevel converter (MMC) is a topology that consists of a high number of capacitors, and degradation of capacitors can lead to converter malfunction, limiting the overall system lifetime. Condition monitoring methods can be applied to assess the health status of capacitors and realize predictive maintenance to improve reliability. Current research works for condition monitoring of capacitors in an MMC mainly monitor either capacitance or equivalent series resistance (ESR), while these two health indicators can shift at different speeds and lead to different end-of-life times. Hence, monitoring only one of these parameters may lead to unreliable health status evaluation. This paper proposes a data-driven method to estimate capacitance and ESR at the same time, in which particle swarm optimization (PSO) is leveraged to update the obtained estimations. Then, the results of the estimations are used to predict the sub-module voltage, which is based on a capacitor voltage equation. Furthermore, minimizing the mean square error between the predicted and actual measured voltage makes the estimations closer to the actual values. The effectiveness and feasibility of the proposed method are validated through simulations and experiments.
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Submitted 20 April, 2024;
originally announced April 2024.
Semiconductor Devices Condition Monitoring Using Harmonics in Inverter Control Variables
Authors:
Shuyu Ou,
Ariya Sangwongwanich,
Subham Sahoo,
Frede Blaabjerg
Abstract:
The health status of power semiconductor devices in power converters is important but difficult to monitor. This paper analyzes the relationship between harmonics in inverter control variables and a health precursor (the on-state voltage Von of power semiconductor devices). Based on the analysis, harmonics can estimate Von without adding extra sensing circuits. The method is validated through simu…
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The health status of power semiconductor devices in power converters is important but difficult to monitor. This paper analyzes the relationship between harmonics in inverter control variables and a health precursor (the on-state voltage Von of power semiconductor devices). Based on the analysis, harmonics can estimate Von without adding extra sensing circuits. The method is validated through simulations.
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Submitted 15 April, 2024;
originally announced April 2024.
