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Reactive additive capillary stam** with double network hydrogel-derived aerogel stamps under solvothermal conditions
Authors:
Fatih Alarslan,
Martin Frosinn,
Kevin Ruwisch,
Jannis Thien,
Tim Jähnichen,
Louisa Eckert,
Jonas Klein,
Markus Haase,
Dirk Enke,
Joachim Wollschläger,
Uwe Beginn,
Martin Steinhart
Abstract:
Integration of solvothermal reaction products into complex thin-layer architectures is frequently achieved by combinations of layer transfer and subtractive lithography, whereas direct additive substrate patterning with solvothermal reaction products has remained challenging. We report reactive additive capillary stam** under solvothermal conditions as a parallel contact-lithographic access to p…
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Integration of solvothermal reaction products into complex thin-layer architectures is frequently achieved by combinations of layer transfer and subtractive lithography, whereas direct additive substrate patterning with solvothermal reaction products has remained challenging. We report reactive additive capillary stam** under solvothermal conditions as a parallel contact-lithographic access to patterns of solvothermal reaction products in thin-layer configurations. To this end, corresponding precursor inks are infiltrated into mechanically robust mesoporous aerogel stamps derived from double-network hydrogels (DNHGs). The stamp is then brought into contact with a substrate to be patterned under solvothermal reaction conditions inside an autoclave. The precursor ink forms liquid bridges between the topographic surface pattern of the stamp and the substrate. Evaporation-driven enrichment of the precursors in these liquid bridges along with their liquid-bridge-guided conversion into the solvothermal reaction products yields large-area submicron patterns of the solvothermal reaction products replicating the stamp topography. As example, we prepared thin hybrid films, which contained ordered monolayers of superparamagnetic submicron nickel ferrite dots prepared by solvothermal capillary stam** surrounded by nickel electrodeposited in a second, orthogonal substrate functionalization step. The submicron nickel ferrite dots acted as magnetic hardener halving the remanence of the ferromagnetic nickel layer. In this way, thin-layer electromechanical systems, transformers and positioning systems may be customized.
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Submitted 26 January, 2024;
originally announced January 2024.
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Structural and magnetic investigation of the interfaces of $\mathrm{Fe_3O_4/MgO(001)}$ with and without NiO interlayer
Authors:
Tobias Pohlmann,
Florian Bertram,
Jannis Thien,
Jari Rodewald,
Kevin Ruwisch,
Timo Kuschel,
Eugen Weschke,
Karsten Küpper,
Joachim Wollschläger
Abstract:
We present an investigation on the structural and magnetic properties of the interfaces of $\mathrm{Fe_3O_4/MgO(001)}$ and $\mathrm{Fe_3O_4/NiO/MgO(001)}$ by extracting cation-selective magnetooptical depth profiles by means of x-ray magnetic reflectivity (XRMR) in combination with charge-transfer multiplet simulations of x-ray magnetic circular dichroism (XMCD) data. For…
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We present an investigation on the structural and magnetic properties of the interfaces of $\mathrm{Fe_3O_4/MgO(001)}$ and $\mathrm{Fe_3O_4/NiO/MgO(001)}$ by extracting cation-selective magnetooptical depth profiles by means of x-ray magnetic reflectivity (XRMR) in combination with charge-transfer multiplet simulations of x-ray magnetic circular dichroism (XMCD) data. For $\mathrm{Fe_3O_4/MgO(001)}$, the magnetooptical depth profiles at the $\mathrm{Fe^{2+}_{oct}}$ and the $\mathrm{Fe^{3+}_{oct}}$ resonant energies follow exactly the structural profile, while the magnetooptical depth profile at the $\mathrm{Fe^{3+}_{tet}}$ resonance is offset by $3.2\pm1.3\,$Å from the interface, consistent with a B-site interface termination of $\mathrm{Fe_3O_4}$ with fully intact magnetic order. In contrast, for $\mathrm{Fe_3O_4/NiO(001)}$, the magnetooptical depth profiles at the $\mathrm{Fe^{2+}_{oct}}$ and the $\mathrm{Ni^{2+}}$ resonances agree with the structural profile, but the interface positions of the magnetooptical depth profiles at the $\mathrm{Fe^{3+}_{oct}}$ and the $\mathrm{Fe^{3+}_{tet}}$ resonances are laterally shifted by $3.3\pm 1.4\,$Å and $2.7\pm0.9\,$Å, respectively, not consistent with a magnetically ordered stoichiometric interface. This may be related to an intermixed $\mathrm{(Ni,Fe)O}$ layer at the interface. The magnetooptical depth profiles at the Ni $L_3$ edge reveal uncompensated magnetic moments throughout the NiO film.
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Submitted 25 November, 2021;
originally announced November 2021.
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Time-resolved diffraction and photoelectron spectroscopy investigation of the reactive molecular beam epitaxy of $\mathrm{Fe_3O_4}$ ultrathin films
Authors:
Tobias Pohlmann,
Martin Hoppe,
Jannis Thien,
Arka Bikash Dey,
Andreas Alexander,
Kevin Ruwisch,
Olof Gutowski,
Jan Röh,
Andrei Gloskovskii,
Christoph Schlueter,
Karsten Küpper,
Joachim Wollschläger,
Florian Bertram
Abstract:
We present time-resolved high energy x-ray diffraction (tr-HEXRD), time-resolved hard x-ray photoelectron spectroscopy (tr-HAXPES) and time-resolved grazing incidence small angle x-ray scattering (tr-GISAXS) data of the reactive molecular beam epitaxy (RMBE) of $\mathrm{Fe_3O_4}$ ultrathin films on various substrates. Reciprocal space maps are recorded during the deposition of $\mathrm{Fe_3O_4}$ o…
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We present time-resolved high energy x-ray diffraction (tr-HEXRD), time-resolved hard x-ray photoelectron spectroscopy (tr-HAXPES) and time-resolved grazing incidence small angle x-ray scattering (tr-GISAXS) data of the reactive molecular beam epitaxy (RMBE) of $\mathrm{Fe_3O_4}$ ultrathin films on various substrates. Reciprocal space maps are recorded during the deposition of $\mathrm{Fe_3O_4}$ on $\mathrm{SrTiO_3(001)}$, MgO(001) and NiO/MgO(001) in order to observe the temporal evolution of Bragg reflections sensitive to the octahedral and tetrahedral sublattices of the inverse spinel structure of $\mathrm{Fe_3O_4}$. A time delay between the appearance of rock salt and spinel-exclusive reflections reveals that first, the iron oxide film grows with $\mathrm{Fe_{1-δ}O}$ rock salt structure with exclusive occupation of octahedral lattice sites. When this film is 1.1$\,$nm thick, the further growth of the iron oxide film proceeds in the inverse spinel structure, with both octahedral and tetrahedral lattice sites being occupied. In addition, iron oxide on $\mathrm{SrTiO_3(001)}$ initially grows with none of these structures. Here, the formation of the rock salt structure starts when the film is 1.5$\,$nm thick. This is confirmed by tr-HAXPES data obtained during growth of iron oxide on $\mathrm{SrTiO_3(001)}$, which demonstrate an excess of $\mathrm{Fe^{2+}}$ cations in growing films thinner than 3.2$\,$nm. This rock salt phase only appears during growth and vanishes after the supply of the Fe molecular beam is stopped. Thus, it can be concluded the rock salt structure of the interlayer is a property of the dynamic growth process. The tr-GISAXS data link these structural results to an island growth mode of the first 2-3$\,$nm on both MgO(001) and $\mathrm{SrTiO_3(001)}$ substrates.
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Submitted 24 June, 2021;
originally announced June 2021.
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Cation- and lattice-site-selective magnetic depth profiles of ultrathin $\mathrm{Fe_3O_4}$(001) films
Authors:
Tobias Pohlmann,
Timo Kuschel,
Jari Rodewald,
Jannis Thien,
Kevin Ruwisch,
Florian Bertram,
Eugen Weschke,
Padraic Shafer,
Joachim Wollschläger,
Karsten Kuepper
Abstract:
A detailed understanding of ultrathin film surface properties is crucial for the proper interpretation of spectroscopic, catalytic and spin-transport data. We present x-ray magnetic circular dichroism (XMCD) and x-ray resonant magnetic reflectivity (XRMR) measurements on ultrathin $\mathrm{Fe_3O_4}$ films to obtain magnetic depth profiles for the three resonant energies corresponding to the differ…
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A detailed understanding of ultrathin film surface properties is crucial for the proper interpretation of spectroscopic, catalytic and spin-transport data. We present x-ray magnetic circular dichroism (XMCD) and x-ray resonant magnetic reflectivity (XRMR) measurements on ultrathin $\mathrm{Fe_3O_4}$ films to obtain magnetic depth profiles for the three resonant energies corresponding to the different cation species $\mathrm{Fe^{2+}_{oct}}$, $\mathrm{Fe^{3+}_{tet}}$ and $\mathrm{Fe^{3+}_{oct}}$ located on octahedral and tetrahedral sites of the inverse spinel structure of $\mathrm{Fe_3O_4}$. By analyzing the XMCD spectrum of $\mathrm{Fe_3O_4}$ using multiplet calculations, the resonance energy of each cation species can be isolated. Performing XRMR on these three resonant energies yields magnetic depth profiles that correspond each to one specific cation species. The depth profiles of both kinds of $\mathrm{Fe^{3+}}$ cations reveal a $\mathrm{3.9 \pm 1~Å}$-thick surface layer of enhanced magnetization, which is likely due to an excess of these ions at the expense of the $\mathrm{Fe^{2+}_{oct}}$ species in the surface region. The magnetically enhanced $\mathrm{Fe^{3+}_{tet}}$ layer is additionally shifted about $\mathrm{3\pm 1.5~Å}$ farther from the surface than the $\mathrm{Fe^{3+}_{oct}}$ layer.
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Submitted 4 May, 2020;
originally announced May 2020.
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Enhanced magnetization of ultrathin NiFe$_2$O$_4$ films on SrTiO$_3$(001) related to cation disorder and anomalous strain
Authors:
J. Rodewald,
J. Thien,
K. Ruwisch,
F. Bertram,
K. Kuepper,
J. Wollschläger
Abstract:
NiFe$_2$O$_4$ thin films with varying thickness were grown on SrTiO$_3$(001) by reactive molecular beam epitaxy. Soft and hard x-ray photoelectron spectroscopy measurements reveal a homogeneous cation distribution throughout the whole film with stoichiometric Ni:Fe ratios of 1:2 independent of the film thickness. Low energy electron diffraction and high resolution (grazing incidence) x-ray diffrac…
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NiFe$_2$O$_4$ thin films with varying thickness were grown on SrTiO$_3$(001) by reactive molecular beam epitaxy. Soft and hard x-ray photoelectron spectroscopy measurements reveal a homogeneous cation distribution throughout the whole film with stoichiometric Ni:Fe ratios of 1:2 independent of the film thickness. Low energy electron diffraction and high resolution (grazing incidence) x-ray diffraction in addition to x-ray reflectivity experiments were conducted to obtain information of the film surface and bulk structure, respectively. For ultrathin films up to 7.3 nm, lateral tensile and vertical compressive strain is observed, contradicting an adaption at the interface of NiFe$_2$O$_4$ film and substrate lattice. The applied strain is accompanied by an increased lateral defect density, which is decaying for relaxed thicker films and attributed to the growth of lateral grains. Determination of cationic site occupancies in the inverse spinel structure by analysis of site sensitive diffraction peaks reveals low tetrahedral occupancies for thin, strained NiFe$_2$O$_4$ films, resulting in partial presence of deficient rock salt like structures. These structures are assumed to be responsible for the enhanced magnetization of up to $\sim$250\% of the NiFe$_2$O$_4$ bulk magnetization as observed by superconducting quantum interference device magnetometry for ultrathin films below 7.3 nm thickness.
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Submitted 25 March, 2020;
originally announced March 2020.
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Impact of strain and morphology on magnetic properties of Fe$_3$O$_4$/NiO bilayers grown on Nb:SrTiO$_3$(001) and MgO(001)
Authors:
Olga Kuschel,
Nico Pathé,
Tobias Schemme,
Kevin Ruwisch,
Jari Rodewald,
Ralph Buß,
Florian Bertram,
Timo Kuschel,
Karsten Kuepper,
Joachim Wollschläger
Abstract:
We present a comparative study on the morphology and structural as well as magnetic properties of crystalline Fe$_3$O$_4$/NiO bilayers grown on both MgO(001) and SrTiO$_3$(001) substrates by reactive molecular beam epitaxy. These structures are investigated by means of x-ray photoelectron spectroscopy, low energy electron diffraction, x-ray reflectivity and diffraction as well as vibrating sample…
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We present a comparative study on the morphology and structural as well as magnetic properties of crystalline Fe$_3$O$_4$/NiO bilayers grown on both MgO(001) and SrTiO$_3$(001) substrates by reactive molecular beam epitaxy. These structures are investigated by means of x-ray photoelectron spectroscopy, low energy electron diffraction, x-ray reflectivity and diffraction as well as vibrating sample magnetometry. While the lattice mismatch of NiO grown on MgO(001) is only 0.8%, it is exposed to a lateral lattice mismatch of -6.9% if grown on SrTiO$_3$. In the case of Fe$_3$O$_4$, the misfit strain on MgO(001) and SrTiO$_3$(001) amounts to 0.3% and -7.5%, respectively. To clarify the relaxation process of the bilayer system, the film thicknesses of the magnetite and nickel oxide films have been varied between 5 and 20nm. While NiO films are well ordered on both substrates, Fe$_3$O$_4$ films grown on NiO/SrTiO$_3$ exhibit a higher surface roughness as well as lower structural ordering compared to films grown on NiO/MgO. Further, NiO films grow pseudomorphic in the investigated thickness range on MgO substrates without any indication of relaxation, whereas on SrTiO$_3$ the NiO films show strong strain relaxation. Fe$_3$O$_4$ films exhibit also strong relaxation even for films of 5nm thickness on both NiO/MgO as well as on NiO/SrTiO$_3$. The magnetite layers on both substrates show a fourfold magnetic in-plane anisotropy with magnetic easy axes pointing in $\left\langle100\right\rangle$ directions. The coercive field is strongly enhanced for magnetite grown on NiO/SrTiO$_3$ due to higher density of structural defects, compared to magnetite grown on NiO/MgO.
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Submitted 5 June, 2018; v1 submitted 14 November, 2016;
originally announced November 2016.
