Skip to main content

Showing 1–3 of 3 results for author: Runte, S

.
  1. arXiv:1311.3811  [pdf, other

    cond-mat.mes-hall cond-mat.mtrl-sci

    The mechanism of caesium intercalation of graphene

    Authors: M. Petrovic, I. Srut Rakic, S. Runte, C. Busse, J. T. Sadowski, P. Lazic, I. Pletikosic, Z. -H. Pan, M. Milun, P. Pervan, N. Atodiresei, R. Brako, D. Sokcevic, T. Valla, T. Michely, M. Kralj

    Abstract: Properties of many layered materials, including copper- and iron-based superconductors, topological insulators, graphite and epitaxial graphene can be manipulated by inclusion of different atomic and molecular species between the layers via a process known as intercalation. For example, intercalation in graphite can lead to superconductivity and is crucial in the working cycle of modern batteries… ▽ More

    Submitted 18 November, 2013; v1 submitted 15 November, 2013; originally announced November 2013.

    Comments: 8 pages, 7 figures in published form, supplementary information available

    Journal ref: Nat. Commun. 4:2772 (2013)

  2. arXiv:1303.1800  [pdf, other

    cond-mat.mes-hall cond-mat.mtrl-sci

    Map** Image Potential States on Graphene Quantum Dots

    Authors: Fabian Craes, Sven Runte, Jürgen Klinkhammer, Marko Kralj, Thomas Michely, Carsten Busse

    Abstract: Free electron like image potential states are observed in scanning tunneling spectroscopy on graphene quantum dots on Ir(111) acting as potential wells. The spectrum strongly depends on the size of the nanostructure as well as on the spatial position on top, indicating lateral confinement. Analysis of the substructure of the first state by spatial map** of constant energy local density of states… ▽ More

    Submitted 14 June, 2013; v1 submitted 7 March, 2013; originally announced March 2013.

    Comments: 4 figures

  3. Intrinsic and extrinsic corrugation of monolayer graphene deposited on SiO2

    Authors: V. Geringer, M. Liebmann, T. Echtermeyer, S. Runte, M. Schmidt, R. Rückamp, M. Lemme, M. Morgenstern

    Abstract: Using scanning tunneling microscopy (STM) in ultra high vacuum and atomic force microscopy, we investigate the corrugation of graphene flakes deposited by exfoliation on a Si/SiO2 (300 nm) surface. While the corrugation on SiO2 is long-range with a correlation length of about 25 nm, some of the graphene monolayers exhibit an additional corrugation with a preferential wave length of about 15 nm.… ▽ More

    Submitted 10 November, 2008; v1 submitted 5 June, 2008; originally announced June 2008.

    Comments: 10 pages, 11 figures, including supplementary material

    Journal ref: Phys. Rev. Lett. 102, 076102 (2009)