X-ray Multimodal Intrinsic-Speckle-Tracking
Authors:
Konstantin M. Pavlov,
David M. Paganin,
Heyang Li,
Sebastien Berujon,
Hélène Rougé-Labriet,
Emmanuel Brun
Abstract:
We develop X-ray Multi-modal Intrinsic-Speckle-Tracking (MIST), a form of X-ray speckle-tracking that is able to recover both the position-dependent phase shift and the position-dependent small-angle X-ray scattering (SAXS) signal of a phase object. MIST is based on combining a Fokker-Planck description of paraxial X-ray optics, with an optical-flow formalism for X-ray speckle-tracking. Only two i…
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We develop X-ray Multi-modal Intrinsic-Speckle-Tracking (MIST), a form of X-ray speckle-tracking that is able to recover both the position-dependent phase shift and the position-dependent small-angle X-ray scattering (SAXS) signal of a phase object. MIST is based on combining a Fokker-Planck description of paraxial X-ray optics, with an optical-flow formalism for X-ray speckle-tracking. Only two images need to be taken in the presence of the sample, corresponding to two different transverse positions of the speckle-generating membrane, in order to recover both the refractive and local-SAXS properties of the sample. Like the optical-flow X-ray phase-retrieval method which it generalises, the MIST method implicitly rather than explicitly tracks both the transverse motion and the diffusion of speckles that is induced by the presence of a sample. Application to X-ray synchrotron data shows the method to be efficient, rapid and stable.
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Submitted 14 September, 2020; v1 submitted 14 November, 2019;
originally announced November 2019.
Single-shot x-ray speckle-based imaging of a single-material object
Authors:
Konstantin M. Pavlov,
Heyang,
Li,
David M. Paganin,
Sebastien Berujon,
Hélène Rougé-Labriet,
Emmanuel Brun
Abstract:
We develop a means for speckle-based phase imaging of the projected thickness of a single-material object, under the assumption of illumination by spatially random time-independent x-ray speckles. These speckles are generated by passing x rays through a suitable spatially random mask. The method makes use of a single image obtained in the presence of the object, which serves to deform the illumina…
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We develop a means for speckle-based phase imaging of the projected thickness of a single-material object, under the assumption of illumination by spatially random time-independent x-ray speckles. These speckles are generated by passing x rays through a suitable spatially random mask. The method makes use of a single image obtained in the presence of the object, which serves to deform the illuminating speckle field relative to a reference speckle field (which only needs to be measured once) obtained in the presence of the mask and the absence of the object. The method implicitly rather than explicitly tracks speckles, and utilizes the transport-of-intensity equation to give a closed-form solution to the inverse problem of determining the complex transmission function of the object. Implementation using x-ray synchrotron data shows the method to be robust and efficient with respect to noise. Applications include x-ray phase--amplitude radiography and tomography, as well as time-dependent imaging of dynamic and radiation-sensitive samples using low-flux sources.
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Submitted 1 May, 2020; v1 submitted 31 July, 2019;
originally announced August 2019.
