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Showing 1–2 of 2 results for author: Rivero, F

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  1. arXiv:2311.00723  [pdf, ps, other

    physics.ins-det nucl-ex

    The Beta-decay Paul Trap Mk IV: Design and commissioning

    Authors: L. Varriano, G. Savard, J. A. Clark, D. P. Burdette, M. T. Burkey, A. T. Gallant, T. Y. Hirsh, B. Longfellow, N. D. Scielzo, R. Segel, E. J. Boron III, M. Brodeur, N. Callahan, A. Cannon, K. Kolos, B. Liu, S. Lopez-Caceres, M. Gott, B. Maaß, S. T. Marley, C. Mohs, G. E. Morgan, P. Mueller, M. Oberling, P. D. O'Malley , et al. (7 additional authors not shown)

    Abstract: The Beta-decay Paul Trap is an open-geometry, linear trap used to measure the decays of $^8$Li and $^8$B to search for a tensor contribution to the weak interaction. In the latest $^8$Li measurement of Burkey et al. (2022), $β$ scattering was the dominant experimental systematic uncertainty. The Beta-decay Paul Trap Mk IV reduces the prevalence of $β$ scattering by a factor of 4 through a redesign… ▽ More

    Submitted 30 October, 2023; originally announced November 2023.

    Comments: 17 pages, 7 figures

    Journal ref: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 1058, 168818 (2024)

  2. arXiv:0910.3788  [pdf

    physics.ins-det

    Preliminary results of 3D-DDTC pixel detectors for the ATLAS upgrade

    Authors: A. La Rosa, M. Boscardin, G. -F. Dalla Betta, G. Darbo, C. Gemme, H. Pernegger, C. Piemonte, M. Povoli, S. Ronchin, A. Zoboli, N. Zorzi, E. Bolle, M. Borri, C. Da Via, S. Dong, S. Fazio, P. Grenier, S. Grinstein, H. Gjersdal, P. Hansson, F. Huegging, P. Jackson, M. Kocian, F. Rivero, O. Rohne , et al. (7 additional authors not shown)

    Abstract: 3D Silicon sensors fabricated at FBK-irst with the Double-side Double Type Column (DDTC) approach and columnar electrodes only partially etched through p-type substrates were tested in laboratory and in a 1.35 Tesla magnetic field with a 180GeV pion beam at CERN SPS. The substrate thickness of the sensors is about 200um, and different column depths are available, with overlaps between junction c… ▽ More

    Submitted 20 October, 2009; originally announced October 2009.

    Comments: 8 pages, 8 figures, presented at RD09 - 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors, 30 September - 2 October 2009, Florence, Italy

    Journal ref: Proceeding of Science PoS(RD09)032 (2009)