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Brittle fracture studied by ultra-high speed synchrotron X-ray diffraction imaging
Authors:
Antoine Petit,
Sylvia Pokam,
Frederic Mazen,
Samuel Tardif,
Didier Landru,
Oleg Kononchuk,
Nadia Ben Mohamed,
Margie P. Olbinado,
Alexander Rack,
Francois Rieutord
Abstract:
Ever since the very first human-made knapped tools, the control of fracture propagation in brittle materials has been a vector of technological development. Nowadays, a broad range of applications relies on crack propagation control, from the mitigation of damages, e.g., from impacts in glass screens or windshields, to industrial processes harnessing fracture to achieve clean cuts over large dista…
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Ever since the very first human-made knapped tools, the control of fracture propagation in brittle materials has been a vector of technological development. Nowadays, a broad range of applications relies on crack propagation control, from the mitigation of damages, e.g., from impacts in glass screens or windshields, to industrial processes harnessing fracture to achieve clean cuts over large distances. Yet, studying the fracture in real time is a challenging task, since cracks can propagate up to a few km/s in materials that are often opaque. Here, we report on the in situ investigation of cracks propagating at up to 2.5 km/s along a (001) plane of a silicon single crystal, using X-ray diffraction megahertz imaging with intense and time-structured synchrotron radiation. The studied system is based on the Smart Cut process, where a buried layer in a material (typically Si) is weakened by micro-cracks and then used to drive a macroscopic crack (0.1 m) in a plane parallel to the surface with minimal deviation (1 nm). The results we report here provide the first direct confirmation that the shape of the crack front is not affected by the distribution of the micro-cracks, which had been a postulate for previous studies based on post-fracture results. We further measured instantaneous crack velocities over the centimeter-wide field-of-view, which had only been previously inferred from sparse point measurements, and evidence the effect of local heating by the X-ray beam. Finally, we also observed the post-crack movements of the separated wafer parts, which can be explained using pneumatics and elasticity. Thus, this study provides a comprehensive view of controlled fracture propagation in a crystalline material, paving the way for the in situ measurement of ultra-fast strain field propagation.
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Submitted 12 April, 2022;
originally announced April 2022.
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Interfacial closure of contacting surfaces
Authors:
F. Rieutord,
C. Rauer,
H. Moriceau
Abstract:
Understanding the contact between solid surfaces is a long standing problem which has a strong impact on the physics of many processes such as adhesion, friction, lubrication and wear. Experimentally, the investigation of solid/solid interfaces remains challenging today, due to the lack of experimental techniques able to provide sub-nanometer scale information on interfaces buried between millimet…
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Understanding the contact between solid surfaces is a long standing problem which has a strong impact on the physics of many processes such as adhesion, friction, lubrication and wear. Experimentally, the investigation of solid/solid interfaces remains challenging today, due to the lack of experimental techniques able to provide sub-nanometer scale information on interfaces buried between millimeters of materials. Yet, a strong interest exists improving the modeling of contact mechanics of materials in order to adjust their interface properties (e.g. thermal transport, friction). We show here that the essential features of the residual gap between contacting surfaces can be measured using high energy X-ray synchrotron reflectivity. The presence of this nano-gap is general to the contact of solids. In some special case however, it can be removed when attractive forces take over repulsive contributions, depending on both height and wavelength of asperity distributions (roughness). A criterion for this instability is established in the standard case of van der Waals attractive forces and elastic asperity compression repulsive forces (Hertz model). This collapse instability is confirmed experimentally in the case of silicon direct bonding, using high-energy X-ray synchrotron reflectivity and adhesion energy measurements. The possibility to achieve fully closed interfaces at room temperature opens interesting perspectives to build stronger assemblies with smaller thermal budgets.
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Submitted 13 February, 2019;
originally announced February 2019.
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Accurate strain measurements in highly strained Ge microbridges
Authors:
A. Gassenq,
S. Tardif,
K. Guilloy,
G. Osvaldo Dias,
N. Pauc,
I. Duchemin,
D. Rouchon,
J-M. Hartmann,
J. Widiez,
J. Escalante,
Y-M. Niquet,
R. Geiger,
T. Zabel,
H. Sigg,
J. Faist,
A. Chelnokov,
F. Rieutord,
V. Reboud,
V. Calvo
Abstract:
Ge under high strain is predicted to become a direct bandgap semiconductor. Very large deformations can be introduced using microbridge devices. However, at the microscale, strain values are commonly deduced from Raman spectroscopy using empirical linear models only established up to 1.2% for uniaxial stress. In this work, we calibrate the Raman-strain relation at higher strain using synchrotron b…
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Ge under high strain is predicted to become a direct bandgap semiconductor. Very large deformations can be introduced using microbridge devices. However, at the microscale, strain values are commonly deduced from Raman spectroscopy using empirical linear models only established up to 1.2% for uniaxial stress. In this work, we calibrate the Raman-strain relation at higher strain using synchrotron based microdiffraction. The Ge microbridges show unprecedented high tensile strain up to 4.9 % corresponding to an unexpected 9.9 cm-1 Raman shift. We demonstrate experimentally and theoretically that the Raman strain relation is not linear and we provide a more accurate expression.
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Submitted 15 April, 2016;
originally announced April 2016.
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Lattice strain and tilt map** in stressed Ge microstructures using X-ray Laue micro-diffraction and rainbow-filtering
Authors:
Samuel Tardif,
Alban Gassenq,
Kevin Guilloy,
Nicolas Pauc,
Guilherme Osvaldo Dias,
Jean-Michel Hartmann,
Julie Widiez,
Thomas Zabel,
Esteban Marin,
Hans Sigg,
Jérôme Faist,
Alexei Chelnokov,
Vincent Reboud,
Vincent Calvo,
Jean-Sébastien Micha,
Odile Robach,
François Rieutord
Abstract:
Micro-Laue diffraction and simultaneous rainbow-filtered micro-diffraction were used to measure accurately the full strain tensor and the lattice orientation distribution at the sub-micron scale in highly strained, suspended Ge micro-devices. A numerical approach to obtain the full strain tensor from the deviatoric strain measurement alone is also demonstrated and used for faster full strain mappi…
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Micro-Laue diffraction and simultaneous rainbow-filtered micro-diffraction were used to measure accurately the full strain tensor and the lattice orientation distribution at the sub-micron scale in highly strained, suspended Ge micro-devices. A numerical approach to obtain the full strain tensor from the deviatoric strain measurement alone is also demonstrated and used for faster full strain map**. We performed the measurements in a series of micro-devices under either uniaxial or biaxial stress and found an excellent agreement with numerical simulations. This shows the superior potential of Laue micro-diffraction for the investigation of highly strained micro-devices.
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Submitted 24 June, 2016; v1 submitted 21 March, 2016;
originally announced March 2016.
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Uniaxially stressed germanium with fundamental direct band gap
Authors:
R. Geiger,
T. Zabel,
E. Marin,
A. Gassenq,
J. -M. Hartmann,
J. Widiez,
J. Escalante,
K. Guilloy,
N. Pauc,
D. Rouchon,
G. Osvaldo Diaz,
S. Tardif,
F. Rieutord,
I. Duchemin,
Y. -M. Niquet,
V. Reboud,
V. Calvo,
A. Chelnokov,
J. Faist,
H. Sigg
Abstract:
We demonstrate the crossover from indirect- to direct band gap in tensile-strained germanium by temperature-dependent photoluminescence. The samples are strained microbridges that enhance a biaxial strain of 0.16% up to 3.6% uniaxial tensile strain. Cooling the bridges to 20 K increases the uniaxial strain up to a maximum of 5.4%. Temperature-dependent photoluminescence reveals the crossover to a…
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We demonstrate the crossover from indirect- to direct band gap in tensile-strained germanium by temperature-dependent photoluminescence. The samples are strained microbridges that enhance a biaxial strain of 0.16% up to 3.6% uniaxial tensile strain. Cooling the bridges to 20 K increases the uniaxial strain up to a maximum of 5.4%. Temperature-dependent photoluminescence reveals the crossover to a fundamental direct band gap to occur between 4.0% and 4.5%. Our data are in good agreement with new theoretical computations that predict a strong bowing of the band parameters with strain.
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Submitted 10 December, 2015;
originally announced March 2016.
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A tunable multi-color "rainbow" filter for improved stress and dislocation density field map** in polycrystals using x-ray Laue microdiffraction
Authors:
Odile Robach,
Jean-Sébastien Micha,
Olivier Ulrich,
Olivier Geaymond,
Olivier Sicardy,
Jürgen Härtwig,
François Rieutord
Abstract:
White beam x-ray Laue microdiffraction allows fast map** of crystal orientation and strain fields in polycrystals, with a submicron spatial resolution in two dimensions. In the well crystallized parts of the grains, the analysis of Laue spot positions provides the local deviatoric strain tensor. The hydrostatic part of the strain tensor may also be obtained, at the cost of a longer measuring tim…
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White beam x-ray Laue microdiffraction allows fast map** of crystal orientation and strain fields in polycrystals, with a submicron spatial resolution in two dimensions. In the well crystallized parts of the grains, the analysis of Laue spot positions provides the local deviatoric strain tensor. The hydrostatic part of the strain tensor may also be obtained, at the cost of a longer measuring time, by measuring the energy profiles of the Laue spots using a variable-energy monochromatic beam. A new "Rainbow" method is presented, which allows measuring the energy profiles of the Laue spots while remaining in the white-beam mode. It offers mostly the same information as the latter monochromatic method, but with two advantages : i) the simultaneous measurement of the energy profiles and the Laue pattern; ii) the rapid access to energy profiles of a larger number of spots, for equivalent scans on the angle of the optical element. The method proceeds in the opposite way compared to a monochromator-based method, by simultaneously removing several sharp energy bands from the incident beam, instead of selecting a single one. It uses a diamond single crystal placed upstream of the sample. Each Laue diffraction by diamond lattice planes attenuates the corresponding energy in the incident spectrum. By rotating the crystal, the filtered-out energies can be varied in a controlled manner, allowing one to determine the extinction energies of several Laue spots of the studied sample. The energies filtered-out by the diamond crystal are obtained by measuring its Laue pattern with an other 2D detector, at each rotation step. This article demonstrates the feasibility of the method, and its validation through the measurement of a known lattice parameter.
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Submitted 18 December, 2012; v1 submitted 12 July, 2012;
originally announced July 2012.
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Adsorption of hydrophobic polyelectrolytes as studied by \emph{in situ} high energy X-Ray reflectivity
Authors:
Damien Baigl,
Marie-Alice Guedeau-Boudeville,
Raymond Ober,
François Rieutord,
Michele Sferrazza,
Olivier Théodoly,
Thomas A. Waigh,
Claudine E. Williams
Abstract:
A series of well-defined hydrophilic and hydrophobic polyelectrolytes of various chain lengths $N$ and effective charge fractions $f_{eff}$ have been adsorbed onto oppositely charged solid surfaces immersed in aqueous solutions. \emph{In situ} high energy X-ray reflectivity has provided the thickness $h$, the electron density and the roughness of the adsorbed layer in its aqueous environment. In…
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A series of well-defined hydrophilic and hydrophobic polyelectrolytes of various chain lengths $N$ and effective charge fractions $f_{eff}$ have been adsorbed onto oppositely charged solid surfaces immersed in aqueous solutions. \emph{In situ} high energy X-ray reflectivity has provided the thickness $h$, the electron density and the roughness of the adsorbed layer in its aqueous environment. In the case of hydrophobic polyelectrolytes, we have found $h\propto N^0 f_{eff}^{-2/3}$, in agreement with a pearl-necklace conformation for the chains induced by a Rayleigh-like instability.
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Submitted 4 March, 2004;
originally announced March 2004.
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Pairing evidence of 8CB molecules adsorbed on MoS2: Influence of 2D commensurability on the intralamellar structure
Authors:
E. Lacaze,
M. Alba,
M. Goldmann,
J. P. Michel,
F. Rieutord
Abstract:
By combining X-ray diffraction studies under grazing incidence (GIXD) and Scanning Tunneling Microscopy (STM) measurements, we have precisely determined the structure of 8CB molecules adsorbed on MoS2, under the thick organic film. The commensurability of the adsorbed network and the intracell structure have been determined, revealing a complex structure characterized by a non-equivalence of adj…
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By combining X-ray diffraction studies under grazing incidence (GIXD) and Scanning Tunneling Microscopy (STM) measurements, we have precisely determined the structure of 8CB molecules adsorbed on MoS2, under the thick organic film. The commensurability of the adsorbed network and the intracell structure have been determined, revealing a complex structure characterized by a non-equivalence of adjacent lamellae with pair associations of molecules in one lamella over two. We have interpreted such a result by a simple model of a single lamella. This pair association in one lamella over two appears as a direct evidence of the connection between the commensurabilities in the two directions. The value of the molecule-substrate potential corrugations is particularly high, indicating that the dipolar momentum of 8CB molecules could play a fundamental role in the molecule-substrate interactions
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Submitted 17 August, 2000;
originally announced August 2000.
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Investigating liquid surfaces down to the nanometer scale using grazing incidence x-ray scattering
Authors:
C. Fradin,
A. Braslau,
D. Luzet,
M. Alba,
C. Gourier,
J. Daillant,
G. Gruebel,
G. Vignaud,
J. -F. Legrand,
J. Lal J. -M. Petit,
F. Rieutord
Abstract:
Grazing incidence x-ray surface scattering has been used to investigate liquid surfaces down to the molecular scale. The free surface of water is well described by the capillary wave model (<z(q)z(-q)> ~ q-2 spectrum) up to wavevectors > 10^8 m^-1. At larger wavevectors near-surface acoustic waves must be taken into account. When the interface is bounded by a surfactant monolayer, it exhibits a…
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Grazing incidence x-ray surface scattering has been used to investigate liquid surfaces down to the molecular scale. The free surface of water is well described by the capillary wave model (<z(q)z(-q)> ~ q-2 spectrum) up to wavevectors > 10^8 m^-1. At larger wavevectors near-surface acoustic waves must be taken into account. When the interface is bounded by a surfactant monolayer, it exhibits a bending stiffness and the bending rigidity modulus can be measured. However, bending effects generally cannot be described using the Helfrich Hamiltonian and the characteristic exponent in the roughness power spectrum can smaller than 4. Finally, upon compression, tethered monolayers formed on a subphase containing divalent ions are shown to buckle in the third dimension with a characteristic wavelength on the order of 10^8 m^-1.
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Submitted 22 August, 1997;
originally announced August 1997.
