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Structure of germanene/Al(111): a two-layers surface alloy
Authors:
K. Zhang,
D. Sciacca,
M. -C. Hanf,
R. Bernard,
Yves Borensztein,
A. Resta,
Y. Garreau,
A. Vlad,
A. Coati,
I. Lefebvre,
M. Derivaz,
C. Pirri,
P. Sonnet,
R. Stephan,
G. Prévot
Abstract:
Unlike silicene, for which the demonstration of its existence has been done through numerous independent studies, the possibility of growing epitaxial germanene remains highly controversial. It has been recently shown by scanning tunneling microscopy that the (3 x 3) surface reconstruction formed upon Ge deposition on Al(111) presents a honeycomb structure, and it was assigned to a pure germanene…
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Unlike silicene, for which the demonstration of its existence has been done through numerous independent studies, the possibility of growing epitaxial germanene remains highly controversial. It has been recently shown by scanning tunneling microscopy that the (3 x 3) surface reconstruction formed upon Ge deposition on Al(111) presents a honeycomb structure, and it was assigned to a pure germanene monolayer. Using quantitative measurements by surface X-ray diffraction compared to density functional theory calculations, we demonstrate that this Ge/Al(111) (3 x 3) reconstruction corresponds, in fact, to a mixed Ge--Al honeycomb layer on top of an alloyed interfacial layer. The model of a germanene monolayer on top of the Al(111) surface can be completely excluded.
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Submitted 8 November, 2021;
originally announced November 2021.
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A convolutional neural network for defect classification in Bragg coherent X-ray diffraction
Authors:
Bruce Lim,
Ewen Bellec,
Maxime Dupraz,
Steven Leake,
Andrea Resta,
Alessandro Coati,
Michael Sprung,
Ehud Almog,
Eugen Rabkin,
Tobias Schülli,
Marie-Ingrid Richard
Abstract:
Coherent diffraction imaging enables the imaging of individual defects, such as dislocations or stacking faults, in materials.These defects and their surrounding elastic strain fields have a critical influence on the macroscopic properties and functionality of materials. However, their identification in Bragg coherent diffraction imaging remains a challenge and requires significant data mining. Th…
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Coherent diffraction imaging enables the imaging of individual defects, such as dislocations or stacking faults, in materials.These defects and their surrounding elastic strain fields have a critical influence on the macroscopic properties and functionality of materials. However, their identification in Bragg coherent diffraction imaging remains a challenge and requires significant data mining. The ability to identify defects from the diffraction pattern alone would be a significant advantage when targeting specific defect types and accelerates experiment design and execution. Here, we exploit a computational tool based on a three-dimensional (3D) parametric atomistic model and a convolutional neural network to predict dislocations in a crystal from its 3D coherent diffraction pattern. Simulated diffraction patterns from several thousands of relaxed atomistic configurations of nanocrystals are used to train the neural network and to predict the presence or absence of dislocations as well as their type(screw or edge). Our study paves the way for defect recognition in 3D coherent diffraction patterns for material science
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Submitted 30 June, 2021;
originally announced June 2021.
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Co/Ni multilayers for spintronics: high spin-polarization and tunable magnetic anisotropy
Authors:
S. Andrieu,
T. Hauet,
M. Gottwald,
A. Rajanikanth,
L. Calmels,
A. M. Bataille,
F. Montaigne,
S. Mangin,
E. Otero,
P. Ohresser,
P. Le Fevre,
F. Bertran,
A. Resta,
A. Vlad,
A. Coati,
Y. Garreau
Abstract:
In this paper we analyze in details the electronic properties of (Co/Ni) multilayers, a model system for spintronics devices. We use magneto-optical Kerr (MOKE), spin-polarized photoemission spectroscopy (SRPES), x-ray magnetic circular dichroism (XMCD) and anomalous surface diffraction experiments to investigate the electronic properties and perpendicular magnetic anisotropy (PMA) in [Co(x)/Ni(y)…
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In this paper we analyze in details the electronic properties of (Co/Ni) multilayers, a model system for spintronics devices. We use magneto-optical Kerr (MOKE), spin-polarized photoemission spectroscopy (SRPES), x-ray magnetic circular dichroism (XMCD) and anomalous surface diffraction experiments to investigate the electronic properties and perpendicular magnetic anisotropy (PMA) in [Co(x)/Ni(y)] single-crystalline stacks grown by molecular beam epitaxy.
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Submitted 6 February, 2018;
originally announced February 2018.
