Showing 1–2 of 2 results for author: Rairigh, R
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Finite size effects with variable range exchange coupling in thin-film Pd/Fe/Pd trilayers
Authors:
R. K. Das,
R. Misra,
S. Tongay,
R. Rairigh,
A. F. Hebard
Abstract:
The magnetic properties of thin-film Pd/Fe/Pd trilayers in which an embedded ~1.5 A-thick ultrathin layer of Fe induces ferromagnetism in the surrounding Pd have been investigated. The thickness of the ferromagnetic trilayer is controlled by varying the thickness of the top Pd layer over a range from 8 A to 56 A. As the thickness of the top Pd layer decreases, or equivalently as the embedded Fe…
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The magnetic properties of thin-film Pd/Fe/Pd trilayers in which an embedded ~1.5 A-thick ultrathin layer of Fe induces ferromagnetism in the surrounding Pd have been investigated. The thickness of the ferromagnetic trilayer is controlled by varying the thickness of the top Pd layer over a range from 8 A to 56 A. As the thickness of the top Pd layer decreases, or equivalently as the embedded Fe layer moves closer to the top surface, the saturated magnetization normalized to area and the Curie temperature decrease whereas the coercivity increases. These thickness-dependent observations for proximity-polarized thin-film Pd are qualitatively consistent with finite size effects that are well known for regular thin-film ferromagnets. The critical exponent $β$ of the order parameter (magnetization) is found to approach the mean field value of 0.5 as the thickness of the top Pd layer increases. The functional forms for the thickness dependences, which are strongly modified by the nonuniform exchange interaction in the polarized Pd, provide important new insights to understanding nanomagnetism in two-dimensions.
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Submitted 5 March, 2010;
originally announced March 2010.
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Colossal magnetocapacitance and scale-invariant dielectric response in phase-separated manganites
Authors:
Ryan P. Rairigh,
Guneeta Singh-Bhalla,
Sefaatin Tongay,
Tara Dhakal,
Amlan Biswas,
Arthur F. Hebard
Abstract:
Thin films of strongly-correlated electron materials (SCEM) are often grown epitaxially on planar substrates and typically have anisotropic properties that are usually not captured by edge-mounted four-terminal electrical measurements, which are primarily sensitive to in-plane conduction paths. Accordingly, the correlated interactions in the out-of-plane (perpendicular) direction cannot be measu…
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Thin films of strongly-correlated electron materials (SCEM) are often grown epitaxially on planar substrates and typically have anisotropic properties that are usually not captured by edge-mounted four-terminal electrical measurements, which are primarily sensitive to in-plane conduction paths. Accordingly, the correlated interactions in the out-of-plane (perpendicular) direction cannot be measured but only inferred. We address this shortcoming and show here an experimental technique in which the SCEM under study, in our case a 600 Angstrom-thick (La1-yPry)0.67Ca0.33MnO3 (LPCMO) film, serves as the base electrode in a metal-insulator-metal (MIM) trilayer capacitor structure. This unconventional arrangement allows for simultaneous determination of colossal magnetoresistance (CMR) associated with dc transport parallel to the film substrate and colossal magnetocapacitance (CMC) associated with ac transport in the perpendicular direction. We distinguish two distinct strain-related direction-dependent insulator-metal (IM) transitions and use Cole-Cole plots to establish a heretofore unobserved collapse of the dielectric response onto a universal scale-invariant power-law dependence over a large range of frequency, temperature and magnetic field.
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Submitted 1 March, 2007;
originally announced March 2007.
