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Letter to the Editor Concerning "Simultaneous, Single-Particle Measurements of Size and Loading Give Insights into the Structure of Drug-Delivery Nanoparticles"
Authors:
Andrew C. Madison,
Adam L. Pintar,
Craig R. Copeland,
Natalia Farkas,
Samuel M. Stavis
Abstract:
The vexing error of excess variance in the sizing of single particles degrades accuracy in applications ranging from quality control of nanoparticle products to hazard assessment of nanoplastic byproducts. The particular importance of lipid nanoparticles for vaccine and medicine delivery motivates this comment on a publication$^{\textrm{1}}$ in ACS Nano. In ref 1, the benchmark measurements of a n…
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The vexing error of excess variance in the sizing of single particles degrades accuracy in applications ranging from quality control of nanoparticle products to hazard assessment of nanoplastic byproducts. The particular importance of lipid nanoparticles for vaccine and medicine delivery motivates this comment on a publication$^{\textrm{1}}$ in ACS Nano. In ref 1, the benchmark measurements of a nanoparticle standard manifest large errors of the size distribution that contradict the claim of validation. Such errors can bias the correlation of fluorescence intensity as an optical proxy for the molecular loading of lipid nanoparticles and give misleading insights from power-law models of intensity$-$size data. Looking forward, measurement error models have the potential to address this widespread issue.
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Submitted 9 July, 2023; v1 submitted 3 February, 2023;
originally announced February 2023.
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Simulation of Atlantic Hurricane Tracks and Features: A Deep Learning Approach
Authors:
Rikhi Bose,
Adam L. Pintar,
Emil Simiu
Abstract:
The objective of this paper is to employ machine learning (ML) and deep learning (DL) techniques to obtain from input data (storm features) available in or derived from the HURDAT2 database models capable of simulating important hurricane properties such as landfall location and wind speed that are consistent with historical records. In pursuit of this objective, a trajectory model providing the s…
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The objective of this paper is to employ machine learning (ML) and deep learning (DL) techniques to obtain from input data (storm features) available in or derived from the HURDAT2 database models capable of simulating important hurricane properties such as landfall location and wind speed that are consistent with historical records. In pursuit of this objective, a trajectory model providing the storm center in terms of longitude and latitude, and intensity models providing the central pressure and maximum 1-$min$ wind speed at 10 $m$ elevation were created. The trajectory and intensity models are coupled and must be advanced together, six hours at a time, as the features that serve as inputs to the models at any given step depend on predictions at the previous time steps. Once a synthetic storm database is generated, properties of interest, such as the frequencies of large wind speeds may be extracted from any part of the simulation domain. The coupling of the trajectory and intensity models obviates the need for an intensity decay inland of the coastline. Prediction results are compared to historical data, and the efficacy of the storm simulation models is demonstrated for three examples: New Orleans, Miami and Cape Hatteras.
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Submitted 12 August, 2022;
originally announced September 2022.
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Linearity Characterization and Uncertainty Quantification of Spectroradiometers via Maximum Likelihood and the Non-parametric Bootstrap
Authors:
Adam L. Pintar,
Zachary H. Levine,
Howard W. Yoon,
Stephen E. Maxwell
Abstract:
A technique for characterizing and correcting the linearity of radiometric instruments is known by the names the "flux-addition method" and the "combinatorial technique". In this paper, we develop a rigorous uncertainty quantification method for use with this technique and illustrate its use with both synthetic data and experimental data from a "beam conjoiner" instrument. We present a probabilist…
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A technique for characterizing and correcting the linearity of radiometric instruments is known by the names the "flux-addition method" and the "combinatorial technique". In this paper, we develop a rigorous uncertainty quantification method for use with this technique and illustrate its use with both synthetic data and experimental data from a "beam conjoiner" instrument. We present a probabilistic model that relates the instrument readout to a set of unknown fluxes via a set of polynomial coefficients. Maximum likelihood estimates (MLEs) of the unknown fluxes and polynomial coefficients are recommended, while a non-parametric bootstrap algorithm enables uncertainty quantification (e.g., it can return standard errors).
The synthetic data represent plausible outputs of a radiometric instrument and enable testing and validation of the method. The MLEs for these data are found to be approximately unbiased, and confidence intervals derived from the bootstrap replicates are found to be consistent with their target coverage of 95 %. For the polynomial coefficients, the relative bias was less than 1 % and the observed coverages range from 90 % to 97 %. The experimental data set is used to illustrate how a complete calibration with uncertainties can be achieved using the method plus one well-known flux level. The uncertainty contribution attributable to estimation of the instrument's nonlinear response is less than 0.02 % over most of its range.
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Submitted 29 September, 2022; v1 submitted 28 April, 2022;
originally announced April 2022.
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Sub-picoliter Traceability of Microdroplet Gravimetry and Microscopy
Authors:
Lindsay C. C. Elliott,
Adam L. Pintar,
Craig R. Copeland,
Thomas B. Renegar,
Ronald G. Dixson,
B. Robert Ilic,
R. Michael Verkouteren,
Samuel M. Stavis
Abstract:
Gravimetry typically lacks the resolution to measure single microdroplets, whereas microscopy is often inaccurate beyond the resolution limit. To address these issues, we advance and integrate these complementary methods, introducing simultaneous measurements of the same microdroplets, comprehensive calibrations that are independently traceable to the International System of Units (SI), and Monte-…
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Gravimetry typically lacks the resolution to measure single microdroplets, whereas microscopy is often inaccurate beyond the resolution limit. To address these issues, we advance and integrate these complementary methods, introducing simultaneous measurements of the same microdroplets, comprehensive calibrations that are independently traceable to the International System of Units (SI), and Monte-Carlo evaluations of volumetric uncertainty. We achieve sub-picoliter agreement of measurements of microdroplets in flight with volumes of approximately 70 pL, with ensemble gravimetry and optical microscopy both yielding 95% coverage intervals of +/- 0.6 pL, or relative uncertainties of +/- 0.9%, and root-mean-square deviations of mean values between the two methods of 0.2 pL or 0.3%. These uncertainties match previous gravimetry results and improve upon previous microscopy results by an order of magnitude. Gravimetry precision depends on the continuity of droplet formation, whereas microscopy accuracy requires that optical diffraction from an edge reference matches that from a microdroplet. Applying our microscopy method, we jet and image water microdroplets suspending fluorescent nanoplastics, count nanoplastic particles after deposition and evaporation, and transfer volumetric traceability to number concentration. We expect that our methods will impact diverse fields involving dimensional metrology and volumetric analysis of microdroplets, including inkjet microfabrication, disease transmission, and industrial sprays.
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Submitted 2 February, 2022; v1 submitted 13 August, 2021;
originally announced September 2021.
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Traceable localization enables accurate integration of quantum emitters and photonic structures with high yield
Authors:
Craig R. Copeland,
Adam L. Pintar,
Ronald G. Dixson,
Ashish Chanana,
Kartik Srinivasan,
Daron A. Westly,
B. Robert Ilic,
Marcelo I. Davanco,
Samuel M. Stavis
Abstract:
Traceability to the International System of Units (SI) is fundamental to measurement accuracy and reliability. In this study, we demonstrate subnanometer traceability of localization microscopy, establishing a metrological foundation for the maturation and application of super-resolution methods. To do so, we create a master standard by measuring the positions of submicrometer apertures in an arra…
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Traceability to the International System of Units (SI) is fundamental to measurement accuracy and reliability. In this study, we demonstrate subnanometer traceability of localization microscopy, establishing a metrological foundation for the maturation and application of super-resolution methods. To do so, we create a master standard by measuring the positions of submicrometer apertures in an array by traceable atomic-force microscopy. We perform correlative measurements of this master standard by optical microscopy, calibrating scale factor and correcting aberration effects. We introduce the concept of a localization uncertainty field due to optical localization errors and scale factor uncertainty, with regions of position traceability to within a 68 % coverage interval of +/- 1 nm. These results enable localization metrology with high throughput, which we apply to measure working standards that we fabricate by electron-beam lithography, validating the accuracy of mean pitch and closing the loop for disseminating and integrating reference arrays. We then apply our novel methods to calibrate an optical microscope with a sample cryostat, accounting for thermal contraction by use of a submicrometer pillar array in silicon as a reference material and elucidating complex distortion. This new calibration enables the accurate integration of quantum emitters and photonic structures with high yield, as we demonstrate theoretically through simulations of the dependence of the Purcell factor of radiative enhancement on registration errors across a wide field. Our study illuminates the challenges and opportunities of achieving traceable localization for comparison of position data across lithography and microscopy systems, from ambient to cryogenic temperatures.
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Submitted 28 February, 2023; v1 submitted 18 June, 2021;
originally announced June 2021.
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Demonstration of a laser powder bed fusion combinatorial sample for high-throughput microstructure and indentation characterization
Authors:
Jordan S. Weaver,
Adam L. Pintar,
Carlos Beauchamp,
Howie Joress,
Kil-Won Moon,
Thien Q. Phan
Abstract:
High-throughput experiments that use combinatorial samples with rapid measurements can be used to provide process-structure-property information at reduced time, cost, and effort. Develo** these tools and methods is essential in additive manufacturing where new process-structure-property information is required on a frequent basis as advances are made in feedstock materials, additive machines, a…
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High-throughput experiments that use combinatorial samples with rapid measurements can be used to provide process-structure-property information at reduced time, cost, and effort. Develo** these tools and methods is essential in additive manufacturing where new process-structure-property information is required on a frequent basis as advances are made in feedstock materials, additive machines, and post-processing. Here we demonstrate the design and use of combinatorial samples produced on a commercial laser powder bed fusion system to study 60 distinct process conditions of nickel superalloy 625: five laser powers and four laser scan speeds in three different conditions. Combinatorial samples were characterized using optical and electron microscopy, x-ray diffraction, and indentation to estimate the porosity, grain size, crystallographic texture, secondary phase precipitation, and hardness. Indentation and porosity results were compared against a regular sample. The smaller-sized regions (3 mm x 4 mm) in the combinatorial sample have a lower hardness compared to a larger regular sample (20 mm x 20 mm) with similar porosity (< 0.03 %). Despite this difference, meaningful trends were identified with the combinatorial sample for grain size, crystallographic texture, and porosity versus laser power and scan speed as well as trends with hardness versus stress-relief condition.
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Submitted 3 August, 2021; v1 submitted 2 March, 2021;
originally announced March 2021.
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A lateral nanoflow assay reveals nanoplastic fluorescence heterogeneity
Authors:
Kuo-Tang Liao,
Andrew C. Madison,
Adam L. Pintar,
B. Robert Ilic,
Craig R. Copeland,
Samuel M. Stavis
Abstract:
Plastic nanoparticles present technological opportunities and environmental concerns, but measurement challenges impede product development and hazard assessment. To meet these challenges, we advance a lateral nanoflow assay that integrates complex nanofluidic replicas, optical localization microscopy, and novel statistical analyses. We apply our sample-in-answer-out system to measure polystyrene…
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Plastic nanoparticles present technological opportunities and environmental concerns, but measurement challenges impede product development and hazard assessment. To meet these challenges, we advance a lateral nanoflow assay that integrates complex nanofluidic replicas, optical localization microscopy, and novel statistical analyses. We apply our sample-in-answer-out system to measure polystyrene nanoparticles that sorb and carry hydrophobic fluorophores. An elegant scaling of surface forces automates advection and dominates diffusion to drive the analytical separation of colloidal nanoparticles by their steric diameters. Reference nanoparticles, with a mean of 99 nm and a standard deviation of 8.4 nm, test the unknown limits of silicone replicas to function as separation matrices. New calibrations correct aberrations from microscope and device, improving the accuracy of reducing single micrographs to joint histograms of steric diameter and fluorescence intensity. A dimensional model approaches the information limit of the system to discriminate size exclusion from surface adsorption, yielding errors of the mean ranging from 0.2 nm to 2.3 nm and errors of the standard deviation ranging from 2.2 nm to 4.2 nm. A hierarchical model accounts for metrological, optical, and dimensional variability to reveal a fundamental structure-property relationship. Intensity scales with diameter to the power of 3.6 +/- 0.5 at 95 % coverage, confounding basic concepts of surface adsorption or volume absorption. Distributions of fluorescivity - the product of the number density, absorption cross section, and quantum yield of an ensemble of fluorophores - are ultrabroad and asymmetric, limiting any inference from fluorescence intensity. This surprising characterization of common nanoplastics resets expectations for optimizing products, applying standards, and understanding byproducts.
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Submitted 17 May, 2022; v1 submitted 29 December, 2020;
originally announced January 2021.